Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2008
08/21/2008WO2008065516A3 Device for detecting and signalling malfunctions in the use of electrical appliances
08/21/2008WO2008060781A3 Device and method for testing an electrical power branch circuit
08/21/2008WO2008053329A3 Automated arc generator and method to repeatably generate electrical arcs for afci testing
08/21/2008WO2008042168A3 Tester input/output sharing
08/21/2008US20080201670 Using constrained scan cells to test integrated circuits
08/21/2008US20080201624 Sequential semiconductor device tester
08/21/2008US20080201099 Pulse width adjustment circuit, pulse width adjustment method, and test apparatus for semiconductor device
08/21/2008US20080200748 Capacitor failure detection
08/21/2008US20080199978 System and method for film stress and curvature gradient mapping for screening problematic wafers
08/21/2008US20080199391 forming a metal layer to increase contrast between conductive layer and adjacent area; metal layer is removed by a mixture of nitric acid, hydrogen peroxide and fluoride boric acid (fluoboric); Silver, Nickel or Tin; deposit metal can be removed by inter diffusion and form intermetallic compounds Cu6Sn5
08/21/2008US20080198758 Communication Monitoring Apparatus, Communication Monitoring Method, Communication Monitoring Program, and Recording Medium
08/21/2008US20080198740 Service take-over system of multi-host system and method therefor
08/21/2008US20080198700 Duty cycle measurment circuit for measuring and maintaining balanced clock duty cycle
08/21/2008US20080198699 Method for built in self test for measuring total timing uncertainty in a digital data path
08/21/2008US20080197874 Test apparatus having multiple test sites at one handler and its test method
08/21/2008US20080197873 Clock signal distributing circuit, information processing device and clock signal distributing method
08/21/2008US20080197872 Semiconductor chip, multi-chip semiconductor device, inspection method of the same, and electric appliance integrating the same
08/21/2008US20080197871 Sequential semiconductor device tester
08/21/2008US20080197870 Apparatus and Method For Determining Reliability Of An Integrated Circuit
08/21/2008US20080197868 Circuit board testing device with self aligning plates
08/21/2008US20080197859 Module For Testing Electromagnetic Compatibility of a High-Speed Ethernet Interface Onboard an Aircraft
08/21/2008US20080197857 Multi-mea test station and multi-mea test method using the same
08/21/2008US20080197856 Circuit Arrangement to Diagnose a Heating Resistor
08/21/2008US20080197855 Insulation Resistance Drop Detector and Failure Self-Diagnosis Method for Insulation Resistance Drop Detector
08/21/2008US20080197854 Harmonic Derived Arc Detector
08/21/2008US20080197852 System For Monitoring a Group of Electrochemical Cells and Device Therefor
08/21/2008US20080196474 Method and apparatus for aligning and/or leveling a test head
08/21/2008DE102008010580A1 Partial load position locating device for gas insulated switch gear, has correlator interconnected with data processing device, which determines delay time and position of loads between sensors from relative frequency of time difference
08/21/2008DE102008006755A1 Batterie-Überwachungsvorrichtung für die Verwendung in einem Fahrzeug Battery monitoring apparatus for use in a vehicle
08/21/2008DE102007053726A1 Method for open-circuit voltage measurement of battery of vehicle, involves determining defined time period after switching on ignition
08/21/2008DE102007007357A1 Integrierte Schaltungsanordnung An integrated circuit device
08/21/2008DE102007007356A1 Hochfrequenzschaltung High frequency circuit
08/21/2008DE102007007339A1 Electronic printed circuit board's production error e.g. process error, detecting method, involves subjecting pin of circuit with direct current voltage source and/or charging unit in relation to remaining pins
08/21/2008DE102007007268A1 Verfahren zur Steuerung oder Regelung der Spannung einzelner Zellen in einem Zellstapel eines Energiespeichers Method for controlling or regulating the voltage of individual cells in a cell stack of an energy store
08/21/2008DE102007007140A1 Verfahren und Anordnung zur Detektion mechanischer Defekte eines Halbleiter-Bauelements, insbesondere einer Solarzelle oder Solarzellen-Anordnung Method and apparatus for detecting mechanical defects of a semiconductor device, particularly a solar cell or solar panel
08/21/2008DE102007006897A1 Warning device for electrical system of motor vehicle, has electromagnet and diode connected in series to each other and parallel to another electromagnet, where diode is oriented corresponding to another diode
08/21/2008DE102006061523B4 Diagnoseverfahren sowie Diagnosesystem und zugehöriger Messwertaufnehmer Diagnostic procedures and diagnostic system and associated transducers
08/21/2008DE10158316B4 Bestimmungsverfahren für einen Schaltzustand eines Kontakts und hiermit korrespondierende Auswerteschaltung Determination of a switching state of the contact and corresponding thereto evaluation
08/21/2008DE10125029B4 Verwendung einer Halbleitervorrichtung mit Nebenschaltung im Kerf-Bereich und Verfahren Use of a semiconductor device having sub-circuit in the kerf area and procedures
08/20/2008EP1959561A2 Drive device for a brushless motor
08/20/2008EP1959456A1 Test device and test method
08/20/2008EP1959266A1 Integrated circuit, test method, corresponding computer program and device
08/20/2008EP1959265A1 Testing integrated circuits on a wafer with a cartridge leaving exposed a surface thereof
08/20/2008EP1959262A1 Test of electronic devices using boards without sockets
08/20/2008EP1959261A1 Probe card
08/20/2008EP1959260A1 Probe card
08/20/2008EP1958364A2 Vpls remote failure indication
08/20/2008EP1957994A2 Ring oscillator for determining select-to-output delay of a multiplexer
08/20/2008EP1957993A1 Circuit arrangement and method for testing the function of a power transistor
08/20/2008EP1957992A2 Diagnostic system for power converter
08/20/2008EP1747475B1 Carrier module for adapting non-standard instrument cards to test systems
08/20/2008EP1590679B1 State variable and parameter estimator comprising several partial models for an electrical energy storage device
08/20/2008EP1034479B1 TEST CIRCUITRY FOR ASICs
08/20/2008EP0879484B1 Electrochemical cell having a label with integrated tester
08/20/2008CN201104280Y Remote power monitoring apparatus
08/20/2008CN201104271Y Encapsulated lead acid accumulator on-line monitoring instrument
08/20/2008CN201104270Y Simple electrical heating wire testing apparatus
08/20/2008CN201104260Y Device for monitoring equipment with current
08/20/2008CN101248654A Method and device for determining a leak resistance for at least one wire of a subscriber connection line comprising several wires in a communications network
08/20/2008CN101248365A System and method for estimating a state vector associated with a battery
08/20/2008CN101248364A Battery system
08/20/2008CN101248363A Semiconductor device, semiconductor chip, method for testing wiring between chips and method for switching wiring between chips
08/20/2008CN101248362A Device, system and method for testing and analysing integrated circuits
08/20/2008CN101248361A Electronic device testing device and its temperature control method
08/20/2008CN101248360A Method and apparatus for managing a communication link
08/20/2008CN101247050A DC power device and its charge and discharge monitoring method
08/20/2008CN101247045A Electric voltage safety monitoring method based on voltage stabilization field in partition load space
08/20/2008CN101246977A Reminding method and apparatus for mobile terminal battery power
08/20/2008CN101246973A Vehicle-use battery monitoring apparatus
08/20/2008CN101246832A Method of manufacturing a semiconductor integrated circuit device
08/20/2008CN101246830A Method for emending output current by amending semiconductor pin test voltage
08/20/2008CN101246797A Gaseous discharge cavity used for detection of flat display panel electrode line defect
08/20/2008CN101246659A Display screen capable of self-checking trouble point and method thereof
08/20/2008CN101246629A Switch double-temperature alarm short-circuit fault reporting linear detector and alarm method
08/20/2008CN101246444A Module testing method and system
08/20/2008CN101246267A Inspection apparatus for pattern
08/20/2008CN101246202A AC electric power electronic switch triggering condition real-time detection circuit adopting double single-chips
08/20/2008CN101246201A Indicia for channels collected into a group
08/20/2008CN101246200A Analog PCB intelligent test system based on neural network
08/20/2008CN101246199A Method and device for wirelessly detecting grounded screen fault
08/20/2008CN101246198A Electric network power-fail detection circuit
08/20/2008CN101246197A Method for detecting defect of flat panel display electrode line by gaseous discharge
08/20/2008CN101246196A Double-segment zinc oxide lightning arrester insulation status testing method
08/20/2008CN101246195A System, device and method for electric arc fault detection
08/20/2008CN101246194A Built-in multi-point condition intelligent scanning circuit
08/20/2008CN101246193A Method of transferring test trays in a handler
08/20/2008CN101246190A Idem lever multi-loop overhead transmission line zero sequence equivalent impedance computing method in different modes
08/20/2008CN101246043A On-line monitoring method for vibration and noise of AC power transformer influenced by DC magnetic biasing
08/20/2008CN100413216C Circuit device of monitoring power voltage
08/20/2008CN100413178C Integrity testing of isolation means in an uninterruptible power supply
08/20/2008CN100413141C Galvanic battery with detection unit
08/20/2008CN100413134C Method of selecting non-humidification operating condition for proton exchange membrane fuel cell
08/20/2008CN100413072C Semiconductor integrated circuit device
08/20/2008CN100413045C Anisotropically conductive connector, probe material member, wafer inspection apparatus, and wafer inspection method
08/20/2008CN100412564C Battery pack and remaining battery capacity calculation method
08/20/2008CN100412563C Method and device of changing parameter caused by aging for use in detecting technology system
08/20/2008CN100412562C Information collecting device and information collecting and analytical system
08/20/2008CN100412561C Electromigration test apparatus and an electromigration test method
08/20/2008CN100412560C Imaging device and method
08/20/2008CN100412559C Chip testing method and relevant apparatus