| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/03/2008 | CN201110867Y Main accumulator battery data acquisition interface plate |
| 09/03/2008 | CN101258417A Scan testing methods |
| 09/03/2008 | CN101258416A Semiconductor device inspecting apparatus and power supply unit |
| 09/03/2008 | CN101258415A Electronic parts tester |
| 09/03/2008 | CN101258414A Enhanced multicast VLAN registration |
| 09/03/2008 | CN101258413A Portable manipulator for stackable semiconductor test system |
| 09/03/2008 | CN101257213A Reactive-load compensation method for high capacity high electric impedance distributing transformator attrition experiment |
| 09/03/2008 | CN101256460A Method for calibrating high-efficiency convenient handset touch panel coordinates as well as cover plate |
| 09/03/2008 | CN101256326A Array substrate tending measuring TFT features |
| 09/03/2008 | CN101256218A System for measuring charge state of vehicle power battery |
| 09/03/2008 | CN101256217A High-monitoring coverage percentage on-chip system debug platform |
| 09/03/2008 | CN101256216A Jig for checking characteristic of semiconductor element, characteristic checking device and method |
| 09/03/2008 | CN101256215A Crosstalk suppression in wireless testing of semiconductor devices |
| 09/03/2008 | CN101256214A Self-adapting testing system and method for radio-frequency power amplifier |
| 09/03/2008 | CN101256213A Apparatus for detecting defect of panel display panel electrode wire |
| 09/03/2008 | CN101256212A Comprehensive analysis testing method for extra-high voltage electric power gold tool |
| 09/03/2008 | CN101256211A Transformer multifunctional monitoring system |
| 09/03/2008 | CN101256208A Voltage measurement display device |
| 09/03/2008 | CN101256207A Method and apparatus for overvoltage detection circuit |
| 09/03/2008 | CN101256205A Instrument for measuring and recording mutation current of neutral point earthing resistor |
| 09/03/2008 | CN101256201A Probe head module group capable of detecting multiple positions |
| 09/03/2008 | CN101256199A Clamper |
| 09/03/2008 | CN101256102A Prewarning method for anti-theft and anti-damage of cable |
| 09/03/2008 | CN101256067A Method for automated optical inspection |
| 09/03/2008 | CN100416999C Detection device |
| 09/03/2008 | CN100416965C Method for detecting voltage zero cross near fault in travelling wave protection |
| 09/03/2008 | CN100416959C Traveling wave protective data acquisition plan considering asynchronous switching of 3-phase breaker |
| 09/03/2008 | CN100416788C Multifunctional probe card |
| 09/03/2008 | CN100416289C Energy storage system state of charge diagnostic |
| 09/03/2008 | CN100416288C System and method for accessing one or more electronic circuits |
| 09/03/2008 | CN100416287C Method and apparatus for testing UPS control unit |
| 09/03/2008 | CN100416286C Electronic component test device |
| 09/03/2008 | CN100416285C Integrated adjustable short-haul/long-haul time domain reflectometry |
| 09/03/2008 | CN100416284C Cable testing device and method |
| 09/03/2008 | CN100416283C Insulator charged detection instrument and its implement method |
| 09/03/2008 | CN100416282C Virtual detector for variable frequency speed regulator |
| 09/03/2008 | CN100416281C Insulation resistance tester for insulation bearing and detecting method |
| 09/03/2008 | CN100416280C Detection device for sensing radio front-end radiofrequency signal |
| 09/03/2008 | CN100416067C Apparatus and method for calibrating engine management system |
| 09/02/2008 | US7421637 Generating test input for a circuit |
| 09/02/2008 | US7421636 Semiconductor memory device having a test control circuit |
| 09/02/2008 | US7421635 System-on-chip (SOC) having built-in-self-test circuits and a self-test method of the SOC |
| 09/02/2008 | US7421634 Sequential scan based techniques to test interface between modules designed to operate at different frequencies |
| 09/02/2008 | US7421633 Controller receiving combined TMS/TDI and suppyling separate TMS and TDI |
| 09/02/2008 | US7421632 Mapping logic for controlling loading of the select ram of an error data crossbar multiplexer |
| 09/02/2008 | US7421631 Semiconductor device with termination resistor circuit |
| 09/02/2008 | US7421517 Integrated circuit having multiple modes of operation |
| 09/02/2008 | US7421510 Method and system for identifying lossy links in a computer network |
| 09/02/2008 | US7421384 Semiconductor integrated circuit device and microcomputer development supporting device |
| 09/02/2008 | US7421365 Automated circuit board test actuator system |
| 09/02/2008 | US7421364 Integrated circuit device having a test circuit to measure AC characteristics of internal memory macro |
| 09/02/2008 | US7421361 Automated factory install printer test process |
| 09/02/2008 | US7421357 Inspection data analysis program, inspection tools, review apparatus and yield analysis apparatus |
| 09/02/2008 | US7420991 TCP time stamp processing in hardware based TCP offload |
| 09/02/2008 | US7420973 Context selection in a network element through subscriber flow switching |
| 09/02/2008 | US7420928 Testing of transmission quality in packet-based networks |
| 09/02/2008 | US7420927 Method and apparatus for determining troubleshooting information for completed calls in a telecommunications network |
| 09/02/2008 | US7420926 Method and apparatus for providing integral cell payload integrity verification and detecting defective modules in telecommunication devices |
| 09/02/2008 | US7420925 Duplex system of wireless LAN base stations |
| 09/02/2008 | US7420924 Transmission device |
| 09/02/2008 | US7420917 Bandwidth policing method and packet transfer apparatus with bandwidth policing function |
| 09/02/2008 | US7420860 Semiconductor memory having a dummy signal line connected to dummy memory cell |
| 09/02/2008 | US7420690 End point detection in workpiece processing |
| 09/02/2008 | US7420687 Condition assessment system for a structure including a semiconductor material |
| 09/02/2008 | US7420457 System and method for validating radio frequency identification tags |
| 09/02/2008 | US7420385 System-on-a-chip pipeline tester and method |
| 09/02/2008 | US7420384 Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfaces |
| 09/02/2008 | US7420383 Inspection unit for high frequency/high speed device connections |
| 09/02/2008 | US7420382 Apparatus and method for testing semiconductor chip |
| 09/02/2008 | US7420381 Double sided probing structures |
| 09/02/2008 | US7420380 Probe card and semiconductor testing device using probe sheet or probe card semiconductor device producing method |
| 09/02/2008 | US7420379 Semiconductor device test method and semiconductor device tester |
| 09/02/2008 | US7420378 Power grid structure to optimize performance of a multiple core processor |
| 09/02/2008 | US7420375 Method for digital bus testing |
| 09/02/2008 | US7420229 Failure analysis vehicle for yield enhancement with self test at speed burnin capability for reliability testing |
| 09/02/2008 | CA2404183C Non-contact tester for integrated circuits |
| 09/02/2008 | CA2390000C System and method for signal validation and leakage detection |
| 09/02/2008 | CA2334247C Method and system for monitoring broadband quality of services |
| 08/28/2008 | WO2008103793A1 Input/output compression and pin reduction in an integrated circuit |
| 08/28/2008 | WO2008103709A1 Design-for-test micro probe |
| 08/28/2008 | WO2008103708A1 Electrically stimulated fingerprint sensor test method |
| 08/28/2008 | WO2008103619A2 Test fixture and method for circuit board testing |
| 08/28/2008 | WO2008103600A1 Arc recovery without over-voltage plasma chamber power supplies using a shunt switch |
| 08/28/2008 | WO2008103342A1 Device and method for detecting faulted phases in a multi-phase electrical network |
| 08/28/2008 | WO2008103328A1 Test head manipulator |
| 08/28/2008 | WO2008102581A1 Device for pressing electronic component and device for testing electronic component |
| 08/28/2008 | WO2008102433A1 Lsi test apparatus, lsi test method, lsi test program, and recording medium |
| 08/28/2008 | WO2008102332A1 Optically monitoring an alox (tm) fabrication process |
| 08/28/2008 | WO2008077020A3 Safe handling of low energy, high dose arsenic, phosphorus, and boron implanted wafers |
| 08/28/2008 | WO2008058949A3 Sensor element, device and method for inspecting a printed conductor structure, production method for sensor element |
| 08/28/2008 | WO2008017056A3 Personal location code broker |
| 08/28/2008 | WO2007136977B1 Methods and apparatus for testing delay locked loops and clock skew |
| 08/28/2008 | WO2007115235B1 Application specific distributed test engine architecture system and method |
| 08/28/2008 | US20080209294 Built-in self testing of a flash memory |
| 08/28/2008 | US20080209292 Circuit for controlling voltage fluctuation in integrated circuit |
| 08/28/2008 | US20080209291 Over temperature detection apparatus and method thereof |
| 08/28/2008 | US20080209289 Partial good integrated circuit and method of testing same |
| 08/28/2008 | US20080209287 Method and Apparatus for Performing Equivalence Checking on Circuit Designs Having Differing Clocking and Latching Schemes |
| 08/28/2008 | US20080209286 Logic circuitry and recording medium |
| 08/28/2008 | US20080209285 Method and Circuit for Measuring Operating and Leakage Current of Individual Blocks Within an Array of Test Circuit Blocks |