| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/09/2008 | US7423546 Device, system and method for monitoring a household electric appliance |
| 09/09/2008 | US7423449 Electronic circuit |
| 09/09/2008 | US7423447 Method for testing liquid crystal display panels |
| 09/09/2008 | US7423446 Characterization array and method for determining threshold voltage variation |
| 09/09/2008 | US7423445 Method and system for trimming voltage or current references |
| 09/09/2008 | US7423444 Digital test apparatus for testing analog semiconductor device(s) |
| 09/09/2008 | US7423443 Method of performing parallel test on semiconductor devices by dividing voltage supply unit |
| 09/09/2008 | US7423442 System and method for early qualification of semiconductor devices |
| 09/09/2008 | US7423441 Contactor assembly |
| 09/09/2008 | US7423440 Functional and stress testing of LGA devices |
| 09/09/2008 | US7423439 Probe sheet adhesion holder, probe card, semiconductor test device, and manufacturing method of semiconductor device |
| 09/09/2008 | US7423434 Cable presence detection for detecting a connection between two devices |
| 09/09/2008 | US7423433 Method and system for multi-frequency inductive ratio measurement |
| 09/09/2008 | US7423419 Chuck for holding a device under test |
| 09/09/2008 | US7423418 Module part |
| 09/09/2008 | US7423408 Monitoring device and method for determining at least one characteristic variable for the state of a battery |
| 09/09/2008 | US7423401 AC rotary machine constant measuring apparatus for measuring constants of stationary AC rotary machine |
| 09/09/2008 | US7423288 Technique for evaluating a fabrication of a die and wafer |
| 09/09/2008 | US7423287 System and method for measuring residual stress |
| 09/09/2008 | US7422914 Fabrication method of semiconductor integrated circuit device |
| 09/04/2008 | WO2008106673A2 Method and apparatus for loose wiring monitor |
| 09/04/2008 | WO2008106120A1 Distortion measurement imaging system |
| 09/04/2008 | WO2008105251A1 Driver circuit |
| 09/04/2008 | WO2008104686A2 Test installation with a test bench and method for using such a test bench in said installation |
| 09/04/2008 | WO2008104684A2 Testing installation for the performance of a domestic electric supply network |
| 09/04/2008 | WO2008104505A1 Device for testing of cables |
| 09/04/2008 | WO2008104066A1 Method and system for the inspection of integrated circuit devices having leads |
| 09/04/2008 | WO2008088986A3 Integrated time and/or capacitance measurement system, method and apparatus |
| 09/04/2008 | US20080215947 Debug Circuit and a Method of Debugging |
| 09/04/2008 | US20080215946 Semiconductor integrated circuit and memory test method |
| 09/04/2008 | US20080215945 System and method for system-on-chip interconnect verification |
| 09/04/2008 | US20080215944 Built-In Self Test (BIST) Architecture having Distributed Interpretation and Generalized Command Protocol |
| 09/04/2008 | US20080215943 Generating test sets for diagnosing scan chain failures |
| 09/04/2008 | US20080215942 Testing of integrated circuits using boundary scan |
| 09/04/2008 | US20080215941 Double-edge triggered scannable pulsed flip-flop for high frequency and/or low power applications |
| 09/04/2008 | US20080215940 Methods and apparatus for estimating a position of a stuck-at defect in a scan chain of a device under test |
| 09/04/2008 | US20080215937 Remote bist for high speed test and redundancy calculation |
| 09/04/2008 | US20080215935 Processing Configuration Data Frames |
| 09/04/2008 | US20080215282 1149.1 tap linking modules |
| 09/04/2008 | US20080215278 Method and system of calibrating sensing components in a circuit breaker system |
| 09/04/2008 | US20080215266 Method of calculating internal resistance of secondary battery for vehicle |
| 09/04/2008 | US20080215265 Electronic apparatus |
| 09/04/2008 | US20080215261 Design structure for enhancing yield and performance of cmos imaging sensors |
| 09/04/2008 | US20080213941 Bump-on-Lead Flip Chip Interconnection |
| 09/04/2008 | US20080212497 Method and system for span-based connection aggregation |
| 09/04/2008 | US20080212486 Checking of broadband network components |
| 09/04/2008 | US20080212481 Novel dynamic firewall for nsp networks |
| 09/04/2008 | US20080212478 Service based bearer control and traffic flow template operation with mobile IP |
| 09/04/2008 | US20080212476 Wlan Transmit Scheduler Comprising an Accelerated Back-Off Function |
| 09/04/2008 | US20080212471 Data Transmission |
| 09/04/2008 | US20080212467 Apparatus, transmission method, and tangible machine-readable medium thereof for relaying data signal in a milti-hop network |
| 09/04/2008 | US20080212466 Apparatus, transmission method, and tangible machine-readable medium thereof for relaying a data signal in a milti-hop network |
| 09/04/2008 | US20080212246 Systems and Methods for Detecting Shorts in Electrical Distribution Systems |
| 09/04/2008 | US20080211531 Integrated circuit testing methods using well bias modification |
| 09/04/2008 | US20080211530 Integrated circuit testing methods using well bias modification |
| 09/04/2008 | US20080211529 Integrated circuit for being applied to electronic device, and associated testing system |
| 09/04/2008 | US20080211528 Inspection contact structure and probe card |
| 09/04/2008 | US20080211527 Heat-resistant lens kit |
| 09/04/2008 | US20080211526 Wafer holder, heater unit used for wafer prober and having wafer holder, and wafer prober |
| 09/04/2008 | US20080211523 Inspection contact structure and probe card |
| 09/04/2008 | US20080211512 Test circuit arrangement and testing method for testing of a circuit section |
| 09/04/2008 | US20080211511 Method of Generating Fault Indication in Feeder Remote Terminal Unit for Power Distribution Automation System |
| 09/04/2008 | US20080211508 Load Bank |
| 09/04/2008 | US20080211500 Detection and Reduction of Dielectric Breakdown in Semiconductor Devices |
| 09/04/2008 | US20080211487 Apparatus, method, and computer program product for monitoring and controlling a microcomputer using a single existing pin |
| 09/04/2008 | US20080211486 Auto-handler comprising pushers each including peltier device |
| 09/04/2008 | DE202008006570U1 Nachrüstbare Scheinwerferladeanzeige Retrofit headlights charging indicator |
| 09/04/2008 | DE202008005030U1 Prüfvorrichtung für Generator Tester for generator |
| 09/04/2008 | DE19735022B4 Verfahren zur Ermittlung der Wirkleistung von Asynchron-Elektromotoren Method for determining the active power of asynchronous electric motors |
| 09/04/2008 | DE102007009878A1 Vorrichtung und Verfahren zum Durchführen eines Tests von Halbleiter-Bauelementen mit optischer Schnittstelle Apparatus and method for performing a test of semiconductor devices with optical interface |
| 09/04/2008 | DE102007007776B3 Testsystem und Verfahren zum Prüfen einer Baugruppe Test system and method of testing a module |
| 09/03/2008 | EP1965218A1 Device for testing of cables |
| 09/03/2008 | EP1964143A2 Fault interrupting and reclosing device |
| 09/03/2008 | EP1963875A2 Systems and methods for testing conductive members employing electromagnetic back scattering |
| 09/03/2008 | EP1963872A1 Measurement arrangement for determining the characteristic line parameters by measuring scattering parameters |
| 09/03/2008 | EP1692531A4 Supporting sdh/sonet aps bridge selector functionality for ethernet |
| 09/03/2008 | EP1379849B1 Circuit arrangement with several sensor elements in matrix circuit design |
| 09/03/2008 | CN201111167Y Battery state data record device |
| 09/03/2008 | CN201111026Y Notebook zero slot controller |
| 09/03/2008 | CN201110926Y Testing jig |
| 09/03/2008 | CN201110891Y Battery tester |
| 09/03/2008 | CN201110890Y Battery tester |
| 09/03/2008 | CN201110889Y Secondary batteries electrochemistry performance test apparatus |
| 09/03/2008 | CN201110888Y Self-starting rare-earth permanent magnet rotor type electric motor microcomputer integrated test apparatus |
| 09/03/2008 | CN201110887Y Starting motor brake durability test apparatus |
| 09/03/2008 | CN201110886Y Simulating load and multifunctional switch testing device |
| 09/03/2008 | CN201110885Y Universal type circuit breaker overcurrent characteristic detecting device |
| 09/03/2008 | CN201110884Y Universal type circuit breaker multiple stations characteristic detect control device |
| 09/03/2008 | CN201110883Y Semiconductor lighting device thermal performance measuring apparatus |
| 09/03/2008 | CN201110882Y Low-resistance single crystal service life tester |
| 09/03/2008 | CN201110881Y Real time on-line detect lightning arrestor |
| 09/03/2008 | CN201110880Y Satellite earth surface feed electrical distribution testing system |
| 09/03/2008 | CN201110879Y Connector testing device |
| 09/03/2008 | CN201110878Y Aging test system |
| 09/03/2008 | CN201110877Y Portable electric activator check meter |
| 09/03/2008 | CN201110876Y High-temperature superconduction material superconductivity test system |
| 09/03/2008 | CN201110875Y Test tool power supply linkage |
| 09/03/2008 | CN201110874Y Relay protection contact point tester |
| 09/03/2008 | CN201110873Y Three phase power supply phase sequence and phase failure automatic detection alarm |
| 09/03/2008 | CN201110871Y Porcelain capacitor measuring template |