Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2008
09/10/2008CN201113493Y Battery voltage sampling circuit
09/10/2008CN201113411Y Battery protector
09/10/2008CN201113397Y Garden tool operating status indicator
09/10/2008CN201113388Y Fault electric arc protector
09/10/2008CN201112805Y 9 wire metal packaging high power circuit element aging testing socket
09/10/2008CN201112804Y 6 wire high power plug-in type element aging testing socket
09/10/2008CN201112803Y 40 wire ceramic lead-wire-free sheet type carrier aging testing socket
09/10/2008CN201112802Y 6 wire surface mounting type high-power device aging testing socket
09/10/2008CN201112801Y 160 wire ceramic four-side lead wire sheet type carrier aging testing socket
09/10/2008CN201112800Y 84 wire ceramic four-side lead wire sheet type carrier aging testing socket
09/10/2008CN201112799Y 64 wire ceramic four-side lead wire sheet type carrier aging testing socket
09/10/2008CN201112798Y 36 wire ceramic four-side lead wire flat packaging integrated circuit aging testing socket
09/10/2008CN201112797Y 44 wire plastic packaging lead wire sheet type carrier aging testing socket
09/10/2008CN201112796Y 28 wire ceramic flat packaging integrated circuit aging testing socket
09/10/2008CN201112795Y 16 wire ceramic flat packaging integrated circuit aging testing socket
09/10/2008CN201112794Y 44 wire ceramic small-shape packaging integrated circuit aging testing socket
09/10/2008CN201112793Y 48 wire flat packaging integrated circuit aging testing socket
09/10/2008CN201112792Y 24 wire ceramic double-row packaging integrated circuit aging testing socket
09/10/2008CN201112791Y 24 wire ceramic double-row packaging integrated circuit aging testing socket
09/10/2008CN201112790Y 14 wire metal packaging solid relay aging testing socket
09/10/2008CN201112532Y Battery electric quantity remote prompting apparatus
09/10/2008CN201112372Y Clamp used for semiconductor package and test
09/10/2008CN201112281Y Signal relay connection point irregular degree debugging device
09/10/2008CN201111991Y Supply line with electric leakage testing conductor
09/10/2008CN201111844Y LED unit board test target stand
09/10/2008CN201111843Y Clamp for OLED aging testing
09/10/2008CN201111704Y Transmission line lightning stroke tripping operation accident property recognition system
09/10/2008CN101263588A Method of preparing electrode
09/10/2008CN101263396A Control electronics for Li-ion batteries
09/10/2008CN101263395A TCP processing device
09/10/2008CN101263394A A method for fault location in electric power lines
09/10/2008CN101262194A A motor parameter marking method for mixed dynamic motor
09/10/2008CN101262153A Cage inductive electromotor with detection loop and detection method for its rotor broken bar
09/10/2008CN101262142A Method and device for prevent vehicles from mistaken lighting
09/10/2008CN101262130A Three-end line optical differential synchronous phase algorithm based on sampling circle
09/10/2008CN101262079A Battery management systems, battery pack and battery pack charging method
09/10/2008CN101261598A Mainboard test circuit
09/10/2008CN101261373A LCD panel and its common electrode lines mending method
09/10/2008CN101261312A Battery safety integrated tester
09/10/2008CN101261311A Output contact for feedback in integrated circuit motor driver
09/10/2008CN101261310A Electromagnetic relay dynamic environmental test system
09/10/2008CN101261309A Test equipment
09/10/2008CN101261308A Path delay fault simulation method and apparatus
09/10/2008CN101261307A Full-automatic each specification wafer test and discriminating device
09/10/2008CN101261306A Full-automatic wafer test method and equipment accomplishing the method
09/10/2008CN101261305A Full-automatic wafer test platform device
09/10/2008CN101261304A Low current grounding system distribution circuit single-phase earth fault automatic position setting method
09/10/2008CN101261303A Non-contact type coil turn-to-turn short circuit test device
09/10/2008CN101261302A Open circuit detection system and its method
09/10/2008CN101261301A Locomotive control loop grounding detection circuit and grounding detection method and wire break detection method
09/10/2008CN101261300A Method for measuring digital storage oscillographs storage depth
09/10/2008CN101261299A Electro-static discharging generator
09/10/2008CN101261298A Detection method for seeking cause of transformer substation switch fault-free trip caused power failure
09/10/2008CN101261297A Electric power transformer windings parameter on-line real-time identification device and method
09/10/2008CN101261296A Semiconductor element test structure
09/10/2008CN101261295A Automatic socketing tool equipment and its control circuit for LCD television set debugging production line
09/10/2008CN101261294A Permanent-magnetic electric machine inductance parameter measuring apparatus and method
09/10/2008CN101261290A Battery voltage supervisory circuit
09/10/2008CN101261288A Load dump transient voltage generator
09/10/2008CN101261287A Probe assembling
09/10/2008CN101261285A Method and system for automatically managing probe mark shifts
09/10/2008CN101261284A Wafer adsorption and unloading device capable of longitudinally elevating and horizontally rotating
09/10/2008CN101261283A Test bench wafer suction disc device
09/10/2008CN101259921A Full-automatic conveying device for wafer
09/10/2008CN101259920A Chip suction nozzle structure with elastic pad and manufacturing method thereof
09/10/2008CN100418280C Circuit breaker
09/10/2008CN100418275C Transducer assembly for semiconductor device testing processors
09/10/2008CN100418203C LED epitaxial wafer electroluminescent nondestructive detection method
09/10/2008CN100418195C Failure analysis methods and systems
09/10/2008CN100418190C Method for controlling temperature and device
09/10/2008CN100417950C Method for constructing two-stage sweep test structure with low test power dissipation
09/10/2008CN100417949C Method and apparatus for accelerated determination of electromigration characteristics of semiconductor wiring
09/10/2008CN100417948C Method and device capable of testing remote controller function of electric appliances
09/10/2008CN100417946C Probe structure of preventing noise interference for semiconductor test board
09/10/2008CN100417940C Damage-free and non-contact analysis system
09/09/2008US7424660 Synchronization point across different memory BIST controllers
09/09/2008US7424659 System-in-package and method of testing thereof
09/09/2008US7424658 Method and apparatus for testing integrated circuits
09/09/2008US7424657 Method and device for testing an integrated circuit, integrated circuit to be tested, and wafer with a large number of integrated circuits to be tested
09/09/2008US7424656 Clocking methodology for at-speed testing of scan circuits with synchronous clocks
09/09/2008US7424655 Utilizing multiple test bitstreams to avoid localized defects in partially defective programmable integrated circuits
09/09/2008US7424654 Method and apparatus for performing multi-site integrated circuit device testing
09/09/2008US7424652 Method and apparatus for detection of transmission unit loss and/or replication
09/09/2008US7424650 Circuit to measure skew
09/09/2008US7424642 Method for synchronization of a controller
09/09/2008US7424417 System and method for clock domain grouping using data path relationships
09/09/2008US7424406 Filter characteristic measuring method and system
09/09/2008US7424400 Method of monitoring line faults in a medium voltage network
09/09/2008US7424393 Wafer inspection device
09/09/2008US7424268 System and method for management of a shared frequency band
09/09/2008US7424143 Method for recognizing working position of a device transfer apparatus in semiconductor test handler
09/09/2008US7424035 Method for routing information over a network
09/09/2008US7424028 Cable modem for connecting customer premises equipment and method of controlling flow of data between cable modem and customer premises equipment
09/09/2008US7423973 Methods and apparatus for hybrid multicast and unicast transmissions in a data network
09/09/2008US7423971 Method and apparatus providing automatic RESV message generation for non-RESV-capable network devices
09/09/2008US7423970 Cross-layer rate adaptation mechanism for WLAN
09/09/2008US7423968 Systems and methods to convey additional signaling information in a wireless local area network
09/09/2008US7423967 Fairness scheme method and apparatus for pause capable and pause incapable ports
09/09/2008US7423964 Apparatus and method to set the signaling rate of a network disposed within an information storage and retrieval system
09/09/2008US7423617 Light emissive element having pixel sensing circuit
1 ... 774 775 776 777 778 779 780 781 782 783 784 785 786 787 788 789 790 791 792 793 794 ... 1523