| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/16/2008 | US7426448 Method and apparatus for diagnosing broken scan chain based on leakage light emission |
| 09/16/2008 | US7426225 Optical sub-assembly having a thermo-electric cooler and an optical transceiver using the optical sub-assembly |
| 09/16/2008 | US7426186 Data path provisioning in a reconfigurable data network |
| 09/16/2008 | US7426185 Backpressure mechanism for switching fabric |
| 09/16/2008 | US7426181 Slow-start adaptive mechanisms to improve efficiency of bandwidth allocation |
| 09/16/2008 | US7425896 Tag testing device, tag testing method, and tag testing program |
| 09/16/2008 | US7425840 Semiconductor device with multipurpose pad |
| 09/16/2008 | US7425839 Systems and methods for testing packaged microelectronic devices |
| 09/16/2008 | US7425838 Body for keeping a wafer and wafer prober using the same |
| 09/16/2008 | US7425837 Spatial transformer for RF and low current interconnect |
| 09/16/2008 | US7425834 Method and apparatus to select a parameter/mode based on a time measurement |
| 09/16/2008 | US7425833 Broad-band low-inductance cables for making Kelvin connections to electrochemical cells and batteries |
| 09/16/2008 | US7425832 System and method for measuring internal resistance of electrochemical devices |
| 09/16/2008 | US7425822 Functional and stress testing of LGA devices |
| 09/16/2008 | US7425814 Battery pack and remaining battery power calculation method |
| 09/16/2008 | US7425462 Methods relating to the reconstruction of semiconductor wafers for wafer-level processing |
| 09/16/2008 | US7425457 Method and apparatus for irradiating simulated solar radiation |
| 09/16/2008 | US7424775 Captive wired test fixture |
| 09/16/2008 | CA2317526C Method of magnetic resonance investigation |
| 09/14/2008 | CA2617724A1 Method and system for passively detecting and locating wire harness defects |
| 09/12/2008 | WO2008109481A2 Generating test benches for pre-silicon validation of retimed complex ic designs against a reference design |
| 09/12/2008 | WO2008109213A1 System and method for testing and providing an integrated circuit having multiple modules or submodules |
| 09/12/2008 | WO2008109171A2 Image sensing integrated circuit test apparatus and method |
| 09/12/2008 | WO2008109166A1 Peer-to-peer, gaming, and application traffic detection & treatment |
| 09/12/2008 | WO2008108979A1 Methods and apparatus for battery monitoring |
| 09/12/2008 | WO2008108902A1 Circuitry to prevent peak power problems during scan shift |
| 09/12/2008 | WO2008108503A1 Impulse immunity evaluating device |
| 09/12/2008 | WO2008108455A1 Electric vehicle, method for estimating state of charge, and computer readable recording medium recording program for executing state of charge estimation method on computer |
| 09/12/2008 | WO2008108195A1 Driver circuit |
| 09/12/2008 | WO2008107996A1 Tester |
| 09/12/2008 | WO2008107959A1 Method for replacing tray |
| 09/12/2008 | WO2008107380A1 Method for determining asymmetrical signal lag of a signal path inside an integrated circuit |
| 09/12/2008 | WO2008107287A1 Moment-based method and system for evaluation of the reliability of a metal layer in an integrated circuit |
| 09/12/2008 | WO2008106910A1 Electric machine and method for measuring the potential present on a movable element of an electric machine |
| 09/12/2008 | WO2008086282A3 Methods and systems for using electrical information for a device being fabricated on a wafer to perform one or more defect-related functions |
| 09/12/2008 | WO2008085944A3 Method and system to measure series-connected cell voltages using a flying capacitor |
| 09/12/2008 | WO2008082150A3 Test socket for semiconductor |
| 09/12/2008 | WO2008017006A3 Double data rate test interface and architecture |
| 09/12/2008 | WO2007120990A3 Method and apparatus for automatic generation of system test libraries |
| 09/12/2008 | WO2007100189A8 System and method for determining both an estimated battery state vector and an estimated battery parameter vector |
| 09/11/2008 | US20080222583 Method and system for logic verification using mirror interface |
| 09/11/2008 | US20080222579 Moment-Based Method and System for Evaluation of Metal Layer Transient Currents in an Integrated Circuit |
| 09/11/2008 | US20080222474 Pseudorandom number generator, semiconductor integrated circuit, pseudorandom number generator control apparatus, pseudorandom number generator control method, and computer product |
| 09/11/2008 | US20080222473 Test pattern generating device and test pattern generating method |
| 09/11/2008 | US20080222472 Method for automatic test pattern generation for one test constraint at a time |
| 09/11/2008 | US20080222471 Circuitry to prevent peak power problems during scan shift |
| 09/11/2008 | US20080222470 Scan test circuit, semiconductor integrated circuit and scan enable signal time control circuit |
| 09/11/2008 | US20080222469 Method and Dual Interlocked Storage Cell Latch for Implementing Enhanced Testability |
| 09/11/2008 | US20080222468 Method and Dual Interlocked Storage Cell Latch for Implementing Enhanced Testability |
| 09/11/2008 | US20080222467 Method of controlling a test mode of circuit |
| 09/11/2008 | US20080222466 Meeting point thread characterization |
| 09/11/2008 | US20080222465 Checkpointing user design states in a configurable IC |
| 09/11/2008 | US20080222463 Apparatus, method and product for testing communications components |
| 09/11/2008 | US20080222282 Analyzing virtual private network failures |
| 09/11/2008 | US20080221824 Test apparatus, test method and recording medium |
| 09/11/2008 | US20080220545 System and method for testing and providing an integrated circuit having multiple modules or submodules |
| 09/11/2008 | US20080219166 Node and fair rate calculating method |
| 09/11/2008 | US20080219161 Method for generating burst in a communication system |
| 09/11/2008 | US20080219153 Constructing a repair path in the event of failure of an inter-routing domain system link |
| 09/11/2008 | US20080219152 Method and apparatus for providing packet ring protection |
| 09/11/2008 | US20080218195 Power supply noise measuring circuit and power supply noise measuring method |
| 09/11/2008 | US20080218194 Stacked package screening |
| 09/11/2008 | US20080218193 Semiconductor device evaluation method and apparatus using the same |
| 09/11/2008 | US20080218190 Testing device |
| 09/11/2008 | US20080218188 Jig for printed substrate inspection and printed substrate inspection apparatus |
| 09/11/2008 | US20080218187 Probe testing structure |
| 09/11/2008 | US20080218186 Image sensing integrated circuit test apparatus and method |
| 09/11/2008 | US20080218185 Probe navigation method and device and defect inspection device |
| 09/11/2008 | US20080218179 Test apparatus and test method |
| 09/11/2008 | US20080218176 Power Supply Device |
| 09/11/2008 | US20080218175 Open-Circuit Testing System and Method |
| 09/11/2008 | US20080218174 Apparatus and method for identifying proper orientation and electrical conductivity between a semiconductor device and a socket or contactor |
| 09/11/2008 | US20080218173 Methods and apparatus for testing a circuit |
| 09/11/2008 | US20080217471 Intelligent aircraft secondary power distribution system that facilitates condition based maintenance |
| 09/11/2008 | US20080216306 Resistor Device and Method of Manufacturing the Same |
| 09/11/2008 | DE202008009469U1 Messsonde Probe |
| 09/11/2008 | DE202008001608U1 Werkzeug mit Wechselspannungsdetektor Tool with AC voltage detector |
| 09/11/2008 | DE112006002864T5 Vorrichtung zur Prüfung der Störungsunanfälligkeit Device for testing the disruption- |
| 09/11/2008 | DE102008000218A1 Halbleiteranordnungsteststrukturen und Verfahren A semiconductor device test structures and procedures |
| 09/11/2008 | DE102007015490B3 Method for measuring partial discharge in high voltage component, involves interconnecting series connection of capacitance with one or more inductances to electrical resonant circuit by laminated series connection of capacitances |
| 09/11/2008 | DE102007011760A1 Motoranordnung Engine location |
| 09/11/2008 | DE102007011519A1 Method for determining charging condition of vehicle battery, involves starting timer during determination of ignition-off signal, and determining, whether engine of vehicle is operating or not directly before ignition-off signal |
| 09/11/2008 | DE102004032585B4 Anordnung zum Steuern eines Personenschutzmittels eines Kraftfahrzeugs Arrangement for controlling an occupant protection means a motor vehicle |
| 09/11/2008 | DE10035705B4 Verfahren zum Analysieren des Ersatzes fehlerhafter Zellen in einem Speicher und Speichertestvorrichtung mit einem Fehleranalysator, der von dem Verfahren Gebrauch macht A method for analyzing the replacement of defective cells in a memory and memory testing apparatus with a error analyzer, which makes use of the procedure |
| 09/10/2008 | EP1967861A2 Voltage Monitor Circuit |
| 09/10/2008 | EP1967860A1 Ring oscillator |
| 09/10/2008 | EP1967859A1 Method and device for transmitting data or signals with various synchronisation sources |
| 09/10/2008 | EP1967289A2 Rotor shaft assembly for magnetic bearings for use in corrosive environments |
| 09/10/2008 | EP1967288A2 Rotor and stator assemblies that utilize magnetic bearings for use in corrosive environments |
| 09/10/2008 | EP1967287A2 Method for testing a rotor and stator assembly |
| 09/10/2008 | EP1966619A1 Discharge state indicator |
| 09/10/2008 | EP1966617A1 Test apparatus and test method for a pv concentrator module |
| 09/10/2008 | EP1966616A2 Connection verification technique |
| 09/10/2008 | EP1817596B1 Integrated circuit and a method for testing a multi-tap integrated circuit |
| 09/10/2008 | EP1709455B1 Testing of circuits with multiple clock domains |
| 09/10/2008 | EP1506428B1 Method for calibrating and de-embedding, set of devices for de-embedding and vector network analyzer |
| 09/10/2008 | EP1272861B1 A method and test interface for testing digital circuitry |
| 09/10/2008 | EP1159629B1 Efficient parallel testing of integrated circuit devices using a known good device to generate expected responses |
| 09/10/2008 | EP1027615B1 Inspection system for inspecting discrete wiring patterns formed on a continuous substrate sheet of a flexible material |
| 09/10/2008 | CN201113500Y Electric power device |