Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2008
09/24/2008CN201120386Y Equipment for sorting electrokinetic cell by using multi-impulse current excitation
09/24/2008CN101273447A Semiconductor analyzing device
09/24/2008CN101273275A 垂直探针卡和空气冷却探针头系统 Vertical probe card probe head and the air cooling system
09/24/2008CN101272679A Method for manufacturing electronic device
09/24/2008CN101272652A Road lamp inspection device and method
09/24/2008CN101272058A Charging device
09/24/2008CN101272057A Portable mobile charging power supply
09/24/2008CN101272049A Magnetic controlled shunt reactor exciting winding casing tube flashover detecting method and circuit
09/24/2008CN101272048A Vehicle mounted intelligent relay
09/24/2008CN101271991A Battery pack
09/24/2008CN101271990A Battery charger
09/24/2008CN101271858A Inspection apparatus
09/24/2008CN101271854A Device and method for integrating basic electric property and system function detection
09/24/2008CN101271670A Electro-optical device, method of checking the same, and electronic appatarus
09/24/2008CN101271621A Wireless monitoring lightning stroke protecting counter
09/24/2008CN101271152A Capacitance type equipment insulation on-line monitoring system calibration method and device
09/24/2008CN101271149A Testing apparatus for AC external rotor type motor stator test run
09/24/2008CN101271148A Switching current circuit tolerance confirming method based on group transconductance sensibility
09/24/2008CN101271147A Probe unit and detection apparatus
09/24/2008CN101271146A Circuit abnormality determining apparatus and method
09/24/2008CN101271145A Inspection apparatus and method
09/24/2008CN101271144A Circuit test device
09/24/2008CN101271143A Method for hot carrier injection into test MOS device
09/24/2008CN101271142A Peak detection circuit integrated on CMOS single chip
09/24/2008CN101271141A Fault travelling wave network locating method based on travelling wave time difference
09/24/2008CN101271140A Extra-high voltage electric transmission and transformation experiment hall
09/24/2008CN101271139A High-precision switching value detecting instrument and detecting method
09/24/2008CN101271138A Photo-current and photo-voltage measuring pool
09/24/2008CN101271137A Test desk for Pseudo-MOS characterization and its test method
09/24/2008CN101271136A Full-automatic on-line test approach of ballast and tester
09/24/2008CN101271127A Goods pressing head
09/24/2008CN101271126A Probe needle
09/24/2008CN101268981A Gait training system
09/24/2008CN100421346C Start and withdrawl method of synthetic all-duty experimental appts.
09/24/2008CN100421311C Socket for electronic elements
09/24/2008CN100421185C Semiconductor storage device
09/24/2008CN100421081C Digital system and a method for error detection thereof
09/24/2008CN100420956C Quick correcting method for multiple test port
09/24/2008CN100420948C Banks of elastic probe, and fabricating method
09/24/2008CN100420940C Device for measuring thermoelectric performance in wide temperature range
09/24/2008CN100420915C Light source for plane display screen detector
09/23/2008US7428694 Device for protection against error injection into a synchronous flip-flop of an elementary logic module
09/23/2008US7428683 Automatic analog test and compensation with built-in pattern generator and analyzer
09/23/2008US7428682 Semiconductor memory device
09/23/2008US7428681 Method and apparatus for reducing number of transitions generated by linear feedback shift register
09/23/2008US7428680 Programmable memory built-in-self-test (MBIST) method and apparatus
09/23/2008US7428679 Method for automated at-speed testing of high serial pin count multiple gigabit per second devices
09/23/2008US7428678 Scan testing of integrated circuits with high-speed serial interface
09/23/2008US7428677 Boundary scan apparatus and interconnect test method
09/23/2008US7428676 Boundary scan device
09/23/2008US7428675 Testing using independently controllable voltage islands
09/23/2008US7428674 Monitoring the state vector of a test access port
09/23/2008US7428673 Test method for determining the wire configuration for circuit carriers with components arranged thereon
09/23/2008US7428663 Electronic device diagnostic methods and systems
09/23/2008US7428662 Testing a data store using an external test unit for generating test sequence and receiving compressed test results
09/23/2008US7428237 Fast convergence with topology switching
09/23/2008US7428210 Fail over method and a computing system having fail over function
09/23/2008US7428209 Network failure recovery mechanism
09/23/2008US7428208 Multi-service telecommunication switch
09/23/2008US7428132 Protection device with lockout test
09/23/2008US7427870 Test system for testing integrated circuits and a method for configuring a test system
09/23/2008US7427869 Resilient contact probe apparatus
09/23/2008US7427868 Active wafer probe
09/23/2008US7427867 Method and system for non-destructive evaluation of conducting structures
09/23/2008US7427865 Method for detecting a discharge condition fault in an electrical system of a vehicle or piece of machinery
09/23/2008US7427857 Resistor structures to electrically measure unidirectional misalignment of stitched masks
09/23/2008US7427855 Circuit for measuring inrush current
09/23/2008US7427850 Method of measuring the battery level in a mobile telephone
09/23/2008US7427768 Apparatus, unit and method for testing image sensor packages
09/23/2008US7426779 Method of fabricating wire member
09/23/2008CA2454808C Built-in test system for aircraft indication switches
09/18/2008WO2008111962A1 Method and apparatus for measuring the voltage of a power source
09/18/2008WO2008111594A1 Secondary battery control device and vehicle
09/18/2008WO2008111135A1 Method for creating inter-device connection test circuit, creation device and creation program
09/18/2008WO2008111044A2 Converting video data into video streams
09/18/2008WO2008088976A3 Method and apparatus for on-chip phase error measurement to determine jitter in phase-locked loops
09/18/2008WO2008055839A3 Electrical contact arrangement
09/18/2008WO2008053032A8 Method for measuring the sheet resistance of at least two-layered electronic components via isolation trenches
09/18/2008WO2008051922A3 Continuous linear scanning of large flat panel media
09/18/2008WO2008050265A3 High impedance load detection
09/18/2008WO2008042520A9 Probe array wafer
09/18/2008WO2008019134A3 A probe head assembly for use in testing multiple wafer die
09/18/2008WO2008011106A3 Methods and apparatus for flexible extension of electrical conductors beyond the edges of a substrate
09/18/2008WO2007127895A3 Control signal synchronization of a scannable storage circuit
09/18/2008WO2007121218A3 Field device editor tool
09/18/2008WO2007121158A3 Integrating camp-on telephony feature with wlan resource management and admission control
09/18/2008US20080229264 Semiconductor evaluation apparatus, semiconductor evaluation method and semiconductor evaluation program
09/18/2008US20080229166 Accelerating Test, Debug and Failure Analysis of a Multiprocessor Device
09/18/2008US20080229165 Address translation system for use in a simulation environment
09/18/2008US20080228415 Semiconductor testing instrument to determine safe operating area
09/18/2008US20080225746 Method and system for generating packet delay variation with a uniform distribution
09/18/2008US20080225742 Scheduling method and system for guaranteeing real-time service quality of WiBro CPE
09/18/2008US20080225739 Method and Apparatus for Monitoring Events in Network Traffic
09/18/2008US20080225733 Methods and Arrangements to Detect A Failure In A Communication Network
09/18/2008US20080225727 Communication system and router
09/18/2008US20080225698 Controlling multicast source selection in an anycast source audio/video network
09/18/2008US20080225696 Virtual path restoration scheme using fast dynamic mesh restoration in an optical network
09/18/2008US20080225660 Optical disc drive, optical storage medium, optical storage medium inspection apparatus, and optical storage medium inspection method
09/18/2008US20080224725 Test circuit, wafer, measuring apparatus, measuring method, device manufacturing method and display apparatus
09/18/2008US20080224724 Photoconductive Based Electrical Testing of Transistor Arrays