| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/25/2008 | WO2008114697A1 Test apparatus and electronic device |
| 09/25/2008 | WO2008114671A1 Testing apparatus, electronic device and testing method |
| 09/25/2008 | WO2008114670A1 Testing apparatus and electronic device |
| 09/25/2008 | WO2008114654A1 Tester and electronic device |
| 09/25/2008 | WO2008114602A1 Test equipment and electronic device |
| 09/25/2008 | WO2008114509A1 Clock data recovery circuit, method and test device utilizing them |
| 09/25/2008 | WO2008114508A1 Data receiving circuit, tester using same, and timing adjusting circuit for strobe signal and method |
| 09/25/2008 | WO2008114457A1 Handler with function for correcting position and method for loading device to be inspected on measuring socket |
| 09/25/2008 | WO2008114354A1 Clock skew measuring device, clock skew adjuster, and integrated circuit |
| 09/25/2008 | WO2008114307A1 Delay circuit and method for testing the circuit |
| 09/25/2008 | WO2008114169A1 Contactless transmission element and method of characterizing the same |
| 09/25/2008 | WO2008114168A1 Device for and method of characterizing an object |
| 09/25/2008 | WO2008113943A2 Impedance measuring device |
| 09/25/2008 | WO2008113470A1 Switching device for alternately testing mobile radio terminals |
| 09/25/2008 | WO2008113423A1 Method and device for evaluating fast current changes |
| 09/25/2008 | WO2008113142A2 Real-time monitoring system for capacitance graded bushings |
| 09/25/2008 | WO2008046415A3 Method for monitoring whether the switching threshold of a switching sensor lies within a predefined tolerance region |
| 09/25/2008 | WO2008002779A3 Flexible continuity and circuit tester |
| 09/25/2008 | WO2007145968A3 Methods and apparatus for multi-modal wafer testing |
| 09/25/2008 | WO2007123647A3 Desktop wafer analysis station |
| 09/25/2008 | WO2007121001A3 Method and apparatus for interactive generation of device response template and analysis |
| 09/25/2008 | WO2006130722A3 An apparatus and method for determining a faulted phase of a three-phase ungrounded power system |
| 09/25/2008 | US20080235641 Critical area computation of composite fault mechanisms using voronoi diagrams |
| 09/25/2008 | US20080235550 Test apparatus and electronic device |
| 09/25/2008 | US20080235549 Test apparatus and electronic device |
| 09/25/2008 | US20080235548 Test apparatus, and electronic device |
| 09/25/2008 | US20080235546 System and method for detecting a work status of a computer system |
| 09/25/2008 | US20080235545 Re-using production test scan paths for system test of an integrated circuit |
| 09/25/2008 | US20080235544 Built-in self-test of integrated circuits using selectable weighting of test patterns |
| 09/25/2008 | US20080235543 Conversion device, conversion method, program, and recording medium |
| 09/25/2008 | US20080235542 Electronic testing device for memory devices and related methods |
| 09/25/2008 | US20080234967 Test Sequence Optimization Method and Design Tool |
| 09/25/2008 | US20080234966 Acquiring Test Data From An Electronic Circuit |
| 09/25/2008 | US20080234961 Test apparatus and measurement circuit |
| 09/25/2008 | US20080234956 Method of calculating state variables of secondary battery and apparatus for estimating state variables of secondary battery |
| 09/25/2008 | US20080234955 Uniform Power Density Across Processor Cores at Burn-In |
| 09/25/2008 | US20080234952 Test circuit, pattern generating apparatus, and pattern generating method |
| 09/25/2008 | US20080233663 Singulated bare die testing |
| 09/25/2008 | US20080233471 Battery State Detection |
| 09/25/2008 | US20080232257 Method of generically specifying congestion control and avoidance behavior |
| 09/25/2008 | US20080231312 Structure for modeling stress-induced degradation of conductive interconnects |
| 09/25/2008 | US20080231311 Physically highly secure multi-chip assembly |
| 09/25/2008 | US20080231310 Flexible on chip testing circuit for i/o's characterization |
| 09/25/2008 | US20080231309 Performance board and cover member |
| 09/25/2008 | US20080231308 Sub-Sampling of Weakly-Driven Nodes |
| 09/25/2008 | US20080231307 Testing method using a scalable parametric measurement macro |
| 09/25/2008 | US20080231306 Integrated circuit burn-in test system and associated methods |
| 09/25/2008 | US20080231305 Contact carriers (tiles) for populating larger substrates with spring contacts |
| 09/25/2008 | US20080231304 Apparatus and method for controlling temperature in a chuck system |
| 09/25/2008 | US20080231303 Semiconductor device for electrical contacting semiconductor devices |
| 09/25/2008 | US20080231302 Wafer translator having metallization pattern providing high density interdigitated contact pads for component |
| 09/25/2008 | US20080231301 Inspection apparatus |
| 09/25/2008 | US20080231299 Vacuum chamber with two-stage longitudinal translation for circuit board testing |
| 09/25/2008 | US20080231298 Inspection apparatus and method |
| 09/25/2008 | US20080231297 Method for calibrating semiconductor device tester |
| 09/25/2008 | US20080231296 Test Apparatus for the Testing of Electronic Components |
| 09/25/2008 | US20080231293 Device and method for electrical contacting for testing semiconductor devices |
| 09/25/2008 | US20080231289 Clamping apparatus and a system and method for detecting defects in electrical wiring |
| 09/25/2008 | US20080231288 Semiconductor package having projected substrate |
| 09/25/2008 | US20080231287 Evaluation board and failure location detection method |
| 09/25/2008 | US20080231286 Wire abnormality detecting device |
| 09/25/2008 | US20080231285 Trailer Lighting, Control and Signaling Circuits Tester |
| 09/25/2008 | US20080231284 Method and Device for Detdermining the Ageing of a Battery |
| 09/25/2008 | US20080231260 Pusher for match plate of test handler |
| 09/25/2008 | DE112006003066T5 Prüfvorrichtung und Prüfverfahren Tester and test methods |
| 09/25/2008 | DE112006003065T5 Prüfvorrichtung, Befestigungsplatte und Stiftelektronikkarte Tester, mounting plate and pin electronics card |
| 09/25/2008 | DE112005003788T5 Dynamische Abschätzung der Lebensdauer einer Halbleitereinrichtung Dynamic estimation of the lifetime of a semiconductor device |
| 09/25/2008 | DE102008016117A1 Prüfungsvorrichtung und elektronische Vorrichtung Verification apparatus and electronic device |
| 09/25/2008 | DE102008015241A1 Stromkreisanomalie - Ermittlungsvorrichtung und dazugehöriges Verfahren Circuit abnormality - detection apparatus and associated method |
| 09/25/2008 | DE102007013757A1 Verfahren und Messvorrichtung zum Messen von Störaussendungen mit aktiver Trägerunterdrückung Methods and measuring device for measuring noise emission, with active carrier suppression |
| 09/25/2008 | DE102007013338A1 Halbleiter-Bauelement und Vorrichtung zur elektrischen Kontaktierung von Halbleiter-Bauelementen Semiconductor device and apparatus for electrically contacting semiconductor devices |
| 09/25/2008 | DE102007011815A1 Electronic switching system for feed through of automatic test series, has electrical connected switch, and switching position of switch is represented by indicating device |
| 09/25/2008 | DE102007011437A1 Testvorrichtung zum Testen von Ausgangstreibern Test apparatus for testing of output drivers |
| 09/25/2008 | CA2680385A1 Method and apparatus for evaluating rapid changes in current |
| 09/24/2008 | EP1972956A1 Battery discharge ability judging method, battery discharge ability judging device, and power supply system |
| 09/24/2008 | EP1972955A1 Charged state estimation device and charged state estimation method of secondary battery |
| 09/24/2008 | EP1972954A1 Test and installation module |
| 09/24/2008 | EP1972953A1 ESD test system calibration |
| 09/24/2008 | EP1972952A1 ESD test system calibration |
| 09/24/2008 | EP1971996A1 Storage battery circuit breaker |
| 09/24/2008 | EP1971872A1 System, method, and article of manufacture for determining an estimated battery parameter vector |
| 09/24/2008 | EP1971871A2 Reduced pin count scan chain implementation |
| 09/24/2008 | EP1971870A2 System and method for implementing a preemptive retransmit for error recovery in a communications environment |
| 09/24/2008 | EP1971869A1 Method and device for fault location in a two-terminal transmission or distribution power line |
| 09/24/2008 | CN201122617Y Battery clamper |
| 09/24/2008 | CN201122555Y Multicenter joint seat of relay for checking gas density |
| 09/24/2008 | CN201122421Y Gantry type four-dimensional automatic measurement bench for detecting optical color performance of display screen |
| 09/24/2008 | CN201122420Y Color control patch device for OLED test equipment |
| 09/24/2008 | CN201122419Y Rotating platform for OLED test equipment |
| 09/24/2008 | CN201122346Y Air conditioner testing apparatus |
| 09/24/2008 | CN201122345Y Point-to-point communication interface device of arrester leakage current on-line monitoring system |
| 09/24/2008 | CN201122179Y Mobile phone battery tumbling testing jig |
| 09/24/2008 | CN201122178Y Accumulator discharging synthetic tester |
| 09/24/2008 | CN201122177Y Generator experiment system for one PC machine driving multiple racks |
| 09/24/2008 | CN201122176Y Generator failure oscillograph circuit of blast furnace gas remaining pressure recovery turbogenerating device |
| 09/24/2008 | CN201122175Y Experimental loop for transient performance of converter valve component for high voltage direct current transmission |
| 09/24/2008 | CN201122174Y Test circuit board structure |
| 09/24/2008 | CN201122173Y Reciprocating IC batch detecting bench |
| 09/24/2008 | CN201122165Y Device materiel frame of test equipment |
| 09/24/2008 | CN201122121Y Fuel battery membrane electrode leak detector |