Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2008
10/01/2008CN201126468Y Multifunctional dynamic test stand for linear motor
10/01/2008CN201126467Y Switch condition detection circuit
10/01/2008CN201126466Y Short-meeting experimental rig for air-actuated electrode
10/01/2008CN201126465Y Test stand for detecting transformer direct-coupled breaker character
10/01/2008CN201126464Y Simple tristate logic LED display circuit
10/01/2008CN201126463Y Test device for printed wiring board
10/01/2008CN201126462Y Special testing device for traction inverter control board
10/01/2008CN201126461Y Circuit structure of high power impulse thyristor valve
10/01/2008CN201126460Y Cable surge voltage test terminal
10/01/2008CN201126459Y 高压无线温度监测系统 High-voltage wireless temperature monitoring system
10/01/2008CN201126458Y Power line detection apparatus
10/01/2008CN201126457Y Electric leakage detection apparatus
10/01/2008CN201126456Y Bared wire alarming idler pulley
10/01/2008CN201126455Y Signal test control tool
10/01/2008CN201126454Y Electric control unit obsolescent equipment
10/01/2008CN201126453Y Detection apparatus for touch panel
10/01/2008CN201126452Y Real-time measurement and display device for rectifying efficiency of rectifier unit
10/01/2008CN201126451Y High-power overpressure resistant test device
10/01/2008CN201126450Y Automatic detection system FOR airplane electronic equipments
10/01/2008CN201126449Y Combination test apparatus for AC/DC inverter
10/01/2008CN101278367A Device for switching at least one current
10/01/2008CN101278205A Providing precise timing control between multiple standardized test instrumentation chassis
10/01/2008CN101278204A 管脚电路驱动器 Pin Circuit Drive
10/01/2008CN101278203A Data capture in automatic test equipment
10/01/2008CN101278201A Voltage sensors and voltage sensing methods for gas insulated switchgear
10/01/2008CN101277072A Electric power transformation device and method
10/01/2008CN101277008A Arc flash elimination apparatus and method
10/01/2008CN101276949A Device and method for detecting battery performance of hybrid power vehicle
10/01/2008CN101276944A Accumulator repairing system and method with function of recovering electric energy
10/01/2008CN101276943A Evaluation method and evaluation apparatus for evaluating battery safety and battery
10/01/2008CN101276929A Detection, mark-wrapping, measurement automatic production line and process flow of mobile phone cell
10/01/2008CN101276771A Transfer and inspection devices of object to be inspected
10/01/2008CN101276505A Switch quantity composite reparable cable-type line-type heat fire detector
10/01/2008CN101276305A Automatic test system and method
10/01/2008CN101276213A System for testing electronic parts and control method thereof
10/01/2008CN101275994A Method for monitoring probe card state
10/01/2008CN101275991A Method and device for estimating battery residual capacity, and battery power supply system
10/01/2008CN101275990A Device and method for measuring accumulator internal resistance
10/01/2008CN101275989A Method of high pressure sun array electrostatic punch-through effect earth surface simulation test
10/01/2008CN101275988A Permanent magnetism synchronous electric machine test system and method
10/01/2008CN101275987A Equipment test system and method
10/01/2008CN101275986A Measuring clamp for electronic apparatus, integrated board thereof and measuring apparatus using same
10/01/2008CN101275985A Probing method, probe apparatus and storage medium
10/01/2008CN101275984A Semiconductor inspection apparatus
10/01/2008CN101275983A Test method of metal oxide semiconductor field-effect transistor threshold voltage
10/01/2008CN101275982A Detecting device and method
10/01/2008CN101275981A Diaphragm type floating apparatus
10/01/2008CN101275979A Cylindrical high Q resonant cavity for microwave test under high temperature
10/01/2008CN101275975A Mobile phone cell low-voltage testing circuit
10/01/2008CN101275970A Testing device and probe structure thereof
10/01/2008CN101275917A Defect inspection apparatus, figure drawing apparatus and figure drawing system
10/01/2008CN101275895A Sample platform system for in-situ measuring Na electronic device property in transmission electron microscope
10/01/2008CN100423357C Electronic device containing device for charging for batter device
10/01/2008CN100423223C Testing method for detecting localized failure on a semiconductor wafer
10/01/2008CN100423135C Nonvolatile semiconductor storage device and row-line short defect detection method
10/01/2008CN100423134C Internal power supply voltage controller with two standard voltage generation circuit
10/01/2008CN100423133C Integrated circuit containing SRAM memory and method of testing same
10/01/2008CN100422828C Method for testing liquid crystal display
10/01/2008CN100422758C Device for determining constant of rotating machine
10/01/2008CN100422757C Compact ate with timestamp system
10/01/2008CN100422756C Semiconductor test device
10/01/2008CN100422755C Chip socket burnt-in seat
10/01/2008CN100422754C System configuration and methods for on-the-fly testing of integrated circuits
10/01/2008CN100422753C DC power amplifier for interference simulator of vehicle electronic apparatus
10/01/2008CN100422748C Universal probe device for electronic module detecting system
10/01/2008CN100422747C Probe guard
10/01/2008CN100422706C Method of testing motor torque integrity in a hybrid electric vehicle
10/01/2008CN100421993C Driving circuit for light emitting device in vehicle
09/2008
09/30/2008US7430700 Failure analysis and testing of semi-conductor devices using intelligent software on automated test equipment (ATE)
09/30/2008US7430699 Trading propensity-based clustering of circuit elements in a circuit design
09/30/2008US7430698 Method and system for an on-chip AC self-test controller
09/30/2008US7430697 Method of testing circuit blocks of a programmable logic device
09/30/2008US7430696 Zeroing circuit for performance counter
09/30/2008US7430695 Register file and its storage device
09/30/2008US7430524 Network-based system for selecting or purchasing products
09/30/2008US7430488 Method for controlling a measuring apparatus
09/30/2008US7430486 Datalog support in a modular test system
09/30/2008US7430464 Dynamic vehicle electrical system test
09/30/2008US7430214 Circuit, method and program for data queue control
09/30/2008US7430207 Preemptive weighted round robin scheduler
09/30/2008US7430206 Wireless communication method and apparatus for detecting and correcting transmission errors
09/30/2008US7430179 Quality determination for packetized information
09/30/2008US7430170 System and method for implementing protocol stack across multiple chassis
09/30/2008US7430164 Path recovery on failure in load balancing switch protocols
09/30/2008US7429970 Method for testing drive circuit, testing device and display device
09/30/2008US7429929 Safety device
09/30/2008US7429869 Method for measuring FET characteristics
09/30/2008US7429868 Socket assembly for testing semiconductor device
09/30/2008US7429867 Circuit for and method of detecting a defect in a component formed in a substrate of an integrated circuit
09/30/2008US7429864 Systems and methods for rectifying and detecting signals
09/30/2008US7429849 Method and apparatus for confirming the charge amount and degradation state of a battery, a storage medium, an information processing apparatus, and an electronic apparatus
09/30/2008US7429497 Hybrid package with non-insertable and insertable conductive features, complementary receptacle, and methods of fabrication therefor
09/25/2008WO2008115968A1 Integrated circuit having receiver jitter tolerance ('jtol') measurement
09/25/2008WO2008115755A2 A testing method using a scalable parametric measurement macro
09/25/2008WO2008115734A2 A clamping apparatus and a system and method for detecting defects in electrical wiring
09/25/2008WO2008115664A1 Apparatus, system, and method for detecting cracking within an aftertreatment device
09/25/2008WO2008115241A1 System to optimize a semiconductor probe card
09/25/2008WO2008115147A1 A material handler for devices on a reel
09/25/2008WO2008114701A1 Tester and electronic device
09/25/2008WO2008114699A1 Testing apparatus and measuring circuit
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