Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2008
10/07/2008US7432616 Inverter device
10/07/2008US7431857 Plasma generation and control using a dual frequency RF source
10/02/2008WO2008118659A1 Hardware and method to test phase linearity of phase synthesizer
10/02/2008WO2008117732A1 State estimating device of secondary battery
10/02/2008WO2008117622A1 Tester and electronic device
10/02/2008WO2008117499A1 Electronic apparatus test device and electronic apparatus test box
10/02/2008WO2008117468A1 Tester
10/02/2008WO2008117418A1 Connection device and method, and test device and method
10/02/2008WO2008117405A1 Connection device and method, and testing device and method
10/02/2008WO2008117380A1 Semiconductor integrated circuit device and its test method
10/02/2008WO2008116966A2 Method and apparatus for monitoring condition of electric machines
10/02/2008WO2008116463A1 Method for estimating the magnetization level of one or more permanent magnets established in one or more permanent magnet rotors of a wind turbine generator and wind turbine
10/02/2008WO2008094826B1 Electronic component handler having gap set device
10/02/2008WO2008091550B1 Rotational positioner and methods for semiconductor wafer test systems
10/02/2008WO2008048418A3 Method and apparatus for injecting transient hardware faults for software testing
10/02/2008WO2008036786A3 Attachment of an electrical element to an electronic device using a conductive material
10/02/2008WO2008027644A3 Method and apparatus facilitating downstream frequency override in a data-over-cable system
10/02/2008WO2008018940A3 Systems and methods for detecting high-impedance faults in a multi-grounded power distribution system
10/02/2008WO2008010919A3 Methods and apparatus for planar extension of electrical conductors beyond the edges of a substrate
10/02/2008WO2007147048A3 Protocol manager for massive multi-site test
10/02/2008WO2007103841A3 Resource reservation and admission control for ip network
10/02/2008WO2007064143A8 System, method, and article of manufacture for determining an estimated battery parameter vector
10/02/2008US20080244346 Circuit for Compression and Storage of Circuit Diagnosis Data
10/02/2008US20080244345 Failure diagnostic apparatus, failure diagnostic system, and failure diagnostic method
10/02/2008US20080244344 Testing A Pipeline In An Ic
10/02/2008US20080244343 Structural testing using boundary scan techniques
10/02/2008US20080244342 Scan string segmentation for digital test compression
10/02/2008US20080244341 Methods and apparatus for communicating with a target circuit
10/02/2008US20080243428 System to test electronic part and method of controlling the same
10/02/2008US20080243419 Photon transfer curve test time reduction
10/02/2008US20080243405 Method and device for estimating battery residual capacity, and battery power supply system
10/02/2008US20080243402 Fault detector for a tip and ring circuit, a method of protecting such a circuit and a power supply including the fault detector
10/02/2008US20080240544 System for creating an inspection recipe, system for reviewing defects, method for creating an inspection recipe and method for reviewing defects
10/02/2008US20080240222 System and method for balancing delay of signal communication paths through well voltage adjustment
10/02/2008US20080239970 Ring topology discovery
10/02/2008US20080239954 Method and system for communication between nodes
10/02/2008US20080239944 Classification of signaling protocol errors to trigger network connectivity troubleshooting
10/02/2008US20080239942 Systems and methods for verifying recovery from an intermittent hardware fault
10/02/2008US20080239605 Semiconductor device and method for inspecting the same
10/02/2008US20080239596 Systems and Methods for Testing Ground Fault Detection Circuitry
10/02/2008US20080239593 Failure detection in a voltage regulator
10/02/2008US20080239208 Polymer Dispersed Liquid Crystal Formulations for Modulator Fabrication
10/02/2008US20080238471 Electrical inspection method and method of fabricating semiconductor display devices
10/02/2008US20080238470 Operating method of test handler
10/02/2008US20080238469 Semiconductor Device and Semiconductor Device Module
10/02/2008US20080238468 Integrated circuit chip and method for testing an integrated circuit chip
10/02/2008US20080238467 Reinforced contact elements
10/02/2008US20080238466 Temperature sensing and prediction in ic sockets
10/02/2008US20080238465 Burn-in system with heating blocks accomodated in cooling blocks
10/02/2008US20080238464 System and method of mitigating effects of component deflection in a probe card analyzer
10/02/2008US20080238462 Test device for semiconductor devices
10/02/2008US20080238461 Multi-type test interface system and method
10/02/2008US20080238460 Accurate alignment of semiconductor devices and sockets
10/02/2008US20080238459 Testing apparatus and method
10/02/2008US20080238458 Method of designing a probe card apparatus with desired compliance characteristics
10/02/2008US20080238457 Nanoscale fault isolation and measurement system
10/02/2008US20080238455 Probing method, probe apparatus and storage medium
10/02/2008US20080238454 Tester and structure of probe thereof
10/02/2008US20080238453 High accuracy and universal on-chip switch matrix testline
10/02/2008US20080238452 Vertical micro probes
10/02/2008US20080238451 Automatic multiplexing system for automated wafer testing
10/02/2008US20080238439 Methods of testing fuse elements for memory devices
10/02/2008US20080238438 Wireless portable automated harness scanner system and method therefor
10/02/2008US20080238437 Test circuit arrangement
10/02/2008US20080238436 Method and system to identify grounding concerns in an electric power system
10/02/2008US20080238435 Integrated circuit testing with laser stimulation and emission analysis
10/02/2008US20080238431 Apparatus for Detecting an Electrical Variable of a Rechargeable Battery, and Method for Producing Said Apparatus
10/02/2008US20080238430 Method of Testing an Electrochemical Device
10/02/2008US20080238419 Magnetic field measuring apparatus capable of measuring at high spatial resolution
10/02/2008US20080238233 Fault-tolerant permanent magnet machine with reconfigurable stator core slot opening and back iron flux paths
10/02/2008US20080238207 Apparatus and method for measuring battery charge level of portable terminal
10/02/2008US20080237592 Semiconductor device and its test method
10/02/2008DE112006003440T5 Prüfvorrichtung und Stiftelektronikkarte Tester pin electronics and map
10/02/2008DE112006003430T5 Prüfvorrichtung und Stiftelektronikkarte Tester pin electronics and map
10/02/2008DE112006002884T5 Verzögerungsregelkreisschaltung, Timing-Generator, Halbleitertestgerät, integrierte Halbleiterschaltung und Verzögerungsbetrieg-Kalibrierungsverfahren Delay locked loop circuit, timing generator, semiconductor test equipment, semiconductor integrated circuit and Verzögerungsbetrieg calibration method
10/02/2008DE112006002853T5 Prüfvorrichtung, Stiftelektronikkarte, elektrische Vorrichtung und Schalter Tester, pin electronics card, electrical apparatus and switch
10/02/2008DE102007041942A1 Drahtanormalitäts-Detektionsvorrichtung Drahtanormalitäts detection device
10/02/2008DE102007015576A1 Overhead wire monitoring system, has monitoring line breaking together with overhead wire during break of overhead wire, and evaluating device formed and provided to determine break of monitoring line
10/02/2008DE102007015284A1 Test card for testing e.g. programmable logic array, has contact test piece comprising drill bit that is equipped with cutting edge, where device allows drill bit to penetrate into semiconductor component
10/02/2008DE102007015283A1 Testvorrichtung für Halbleiterbauelemente Test apparatus for semiconductor devices
10/02/2008DE102007013558A1 Abschirmmessung Abschirmmessung
10/02/2008DE102007010569A1 Verfahren zum Prüfen einer Software, insbesondere eines Auslösers eines Niederspannungsleistungsschalters A method of testing a software, and in particular a trigger of a low voltage circuit breaker
10/01/2008EP1975636A2 Fully-charged battery capacity detection method
10/01/2008EP1975635A2 Method and device for estimating battery residual capacity, and battery power supply system
10/01/2008EP1975634A2 Decompressor/PRPG for Applying Pseudo-Random and Deterministic Test Patterns
10/01/2008EP1974306A2 Efficient calculation of a number of transitions and estimation of power dissipation in sequential scan tests
10/01/2008EP1974247A1 Sensing an operating state of a system
10/01/2008EP1782612B1 Cable verification unit
10/01/2008EP1745489B1 Compression of data traces for an integrated circuit with multiple memories
10/01/2008EP1643257B1 Scan test design method, scan test circuit, scan test circuit insertion cad program, large-scale integrated circuit, and mobile digital device
10/01/2008EP1380050B1 Method for producing a chalcogenide-semiconductor layer of the abc2 type with optical process monitoring
10/01/2008EP1232592B1 Active-passive data flow switch failover technology
10/01/2008EP1188061B1 Segmented contactor
10/01/2008CN201126978Y Electric car charger with self-locking button switch
10/01/2008CN201126974Y Wireless power supply for zinc oxide lightning arrester leakage current monitoring system
10/01/2008CN201126973Y Solar central power supply apparatus for zinc oxide lightning arrester leakage current monitoring system
10/01/2008CN201126968Y Emergency power supply having function of testing and measuring battery
10/01/2008CN201126631Y 6/10kV vertical compression type energy-saving high-voltage measuring box
10/01/2008CN201126531Y Wire circuit automation control and anti-theft alarming device
10/01/2008CN201126469Y Standard primary battery test equipment
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