| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 10/09/2008 | WO2008121155A1 Automatic multiplexing system for automated wafer testing |
| 10/09/2008 | WO2008121110A1 Methods and apparatus for monitoring battery charge depletion |
| 10/09/2008 | WO2008121109A1 Methods and apparatus for monitoring battery charge depletion |
| 10/09/2008 | WO2008120520A1 Tcp handling apparatus |
| 10/09/2008 | WO2008120519A1 Tcp handling apparatus |
| 10/09/2008 | WO2008120518A1 Tcp handling apparatus |
| 10/09/2008 | WO2008120362A1 Fault locating device, fault locating method, and integrated circuit |
| 10/09/2008 | WO2008120302A1 Test device for semiconductor device |
| 10/09/2008 | WO2008120151A1 Electromigration testing and evaluation apparatus and methods |
| 10/09/2008 | WO2008120143A2 Method for determining a status and/or condition of a led/oled device and diagnotic device |
| 10/09/2008 | WO2008119179A1 Testing of electronic circuits using an active probe integrated circuit |
| 10/09/2008 | WO2008076590A3 Electrical guard structures for protecting a signal trace from electrical interference |
| 10/09/2008 | WO2008067311A3 Compression and decompression of stimulus and response waveforms in automated test systems |
| 10/09/2008 | WO2008042581A3 Offset correction methods and arrangement for positioning and inspecting substrates |
| 10/09/2008 | WO2008039352A3 Spatially assisted fault reporting method, system and apparatus |
| 10/09/2008 | WO2008033971A3 Device test and debug using power and ground terminals |
| 10/09/2008 | WO2007146291A3 Method and apparatus for fixed-form multi-planar extension of electrical conductors beyond the margins of a substrate |
| 10/09/2008 | WO2007146285A3 Differential signal probe with integral balun |
| 10/09/2008 | US20080250377 Conductive dome probes for measuring system level multi-ghz signals |
| 10/09/2008 | US20080250291 Test apparatus and electronic device |
| 10/09/2008 | US20080250290 Method and Apparatus for Testing a Ring of Non-Scan Latches with Logic Built-in Self-Test |
| 10/09/2008 | US20080250289 Method for Performing a Logic Built-in-Self-Test in an Electronic Circuit |
| 10/09/2008 | US20080250288 Scan Testing Methods |
| 10/09/2008 | US20080250287 Ieee 1149.1 and p1500 test interfaces combined circuits and processes |
| 10/09/2008 | US20080250286 Boundary scan path method and system with functional and non-functional scan cell memories |
| 10/09/2008 | US20080250285 Circuit Arrangement, Electronic Mechanism, Electrical Turn out and Procedures for the Operation of One Circuit Arrangement |
| 10/09/2008 | US20080250284 Fault dictionary-based scan chain failure diagnosis |
| 10/09/2008 | US20080250282 Serial i/o using jtag tck and tms signals |
| 10/09/2008 | US20080250281 Methods and apparatus for monitoring internal signals in an integrated circuit |
| 10/09/2008 | US20080250280 Sharing routing of a test signal with an alternative power supply to combinatorial logic for low power design |
| 10/09/2008 | US20080250279 Method of Increasing Path Coverage in Transition Test Generation |
| 10/09/2008 | US20080249726 System, method, and article of manufacture for determining an estimated combined battery state-parameter vector |
| 10/09/2008 | US20080249724 System and method of battery capacity estimation |
| 10/09/2008 | US20080249723 Intelligent, self-propelled automatic grid crawler high impedance fault detector and high impedance fault detecting system |
| 10/09/2008 | US20080248954 Anionic polymers composed of dicarboxylic acids and uses thereof |
| 10/09/2008 | US20080247323 Transmitting data packets over an air interface |
| 10/09/2008 | US20080247311 Signaling in a cluster |
| 10/09/2008 | US20080247309 Method And Device For Realizing Primary-Backup Protective Of Low Order Cross Apparatus |
| 10/09/2008 | US20080247290 Optical disc drive, optical storage medium, optical storage medium inspection apparatus, and optical storage medium inspection method |
| 10/09/2008 | US20080246508 Method to determine an operating characteristic of a vehicle power converter |
| 10/09/2008 | US20080246507 Body Capacitance Electric Field Powered Device For High Voltage Lines |
| 10/09/2008 | US20080246506 Apparatus and method for measuring effective channel |
| 10/09/2008 | US20080246505 Semiconductor device test system and method |
| 10/09/2008 | US20080246504 Apparatus and method to manage external voltage for semiconductor memory testing with serial interface |
| 10/09/2008 | US20080246503 Method of testing a semiconductor integrated circuit |
| 10/09/2008 | US20080246502 Semiconductor device for testing semiconductor process and method thereof |
| 10/09/2008 | US20080246500 High density interconnect system having rapid fabrication cycle |
| 10/09/2008 | US20080246499 System and method for the electrical contacting of semiconductor devices |
| 10/09/2008 | US20080246497 Semiconductor wafer inspection apparatus |
| 10/09/2008 | US20080246492 Processing tantalum capacitors on assembled PWAs to yield low failure rate |
| 10/09/2008 | US20080246491 Scalable method for identifying cracks and fractures under wired or ball bonded bond pads |
| 10/09/2008 | US20080246487 Electric switching device |
| 10/09/2008 | US20080246464 Pusher block |
| 10/09/2008 | US20080246463 Measurement of current-voltage characteristic curves of solar cells and solar modules |
| 10/09/2008 | DE112006003034T5 Prüfgerät für elektronische Bauelemente und Verfahren zur Montage einer Leistungsplatine in dem Prüfgerät An electronic component tester and method for mounting a power board in the tester |
| 10/09/2008 | DE102008016711A1 Earth-fault-afflicted-line section localizing method for branched power network, involves checking which of branches guided from point for conducting current using sensor, and modulating current with sample using modulator |
| 10/09/2008 | DE102008016205A1 Verfahren und Schaltung zur Belastung von Zwischenverbindungen auf hoher Ebene in Halbleiterbauelementen Method and circuit for load of high-level interconnects in semiconductor devices |
| 10/09/2008 | DE102008007801A1 Verfahren und Vorrichtung zum Überwachen einer Fahrzeugbatterie A method and apparatus for monitoring a vehicle battery |
| 10/09/2008 | DE102007026589A1 Prüfgerät und Struktur der Prüfspitze desselben The same instrument and structure of the probe |
| 10/09/2008 | DE102007016818A1 Verfahren und Vorrichtung zur Bestimmung der Polarität eines piezoelektrischen Bauelements Method and apparatus for determining the polarity of a piezoelectric component |
| 10/09/2008 | DE102007016720A1 Electrical switching device e.g. high voltage circuit breaker, has testing device connected with monitoring device and switching device pole and comprising valve for separating switching device pole from monitoring device |
| 10/09/2008 | DE102007016672A1 Measuring device for determining electromagnetic radio-frequent radiation of wiring harness, has multiple individual conductive single wires, and radiation antenna, where radiation antenna is aligned on measuring antenna |
| 10/09/2008 | DE102007013063A1 Vorrichtung und Verfahren zur elektrischen Kontakierung von Halbleiter-Bauelementen zu Testzwecken For testing apparatus and method for electrically Kontakierung of semiconductor devices |
| 10/09/2008 | DE102007013062A1 Vorrichtung und Verfahren zur elektrischen Kontaktierung zum Testen von Halbleiter-Bauelementen Apparatus and method for making electrical contact for testing of semiconductor devices |
| 10/09/2008 | DE102007009549A1 Vorrichtung und Verfahren zur Messung der Stromaufnahme und der Kapazität eines Halbleiterbauelements Apparatus and method for measuring the current consumption and the capacity of a semiconductor device |
| 10/09/2008 | DE102006062711B4 Verfahren zur Überwachung und zum Schutz von einzelnen Solar-Panels vor Überhitzung Procedures for monitoring and protection of individual solar panels from overheating |
| 10/08/2008 | EP1978527A1 Tester |
| 10/08/2008 | EP1978446A1 Compressing test responses using a compactor |
| 10/08/2008 | EP1978371A1 Electromigration testing and evaluation apparatus and methods |
| 10/08/2008 | EP1978370A1 Processing tantalum capacitors on assembled PWAs to yield low failure rate |
| 10/08/2008 | EP1977502A2 Method and electronic regulator with a current measuring circuit for measuring the current by sense-fet and sigma-delta modulation |
| 10/08/2008 | EP1977493A1 Battery balancing apparatus |
| 10/08/2008 | EP1977366A2 Peer-to-peer radio frequency communications for management of rfid readers |
| 10/08/2008 | EP1977263A1 Device for monitoring cell voltage |
| 10/08/2008 | EP1977262A2 Testable integrated circuit and ic test method |
| 10/08/2008 | EP1977261A2 Method of evaluating a delay of an input/output circuit and corresponding device |
| 10/08/2008 | EP1977260A2 A probe array structure and a method of making a probe array structure |
| 10/08/2008 | EP1718981B1 An electronic stream processing circuit with test access |
| 10/08/2008 | EP1642145B1 Apparatus and method for electromechanical testing and validation of probe cards |
| 10/08/2008 | EP1610135B1 Test device and test method |
| 10/08/2008 | EP1573345B1 Jtag testing arrangement |
| 10/08/2008 | EP1275183B1 Method and apparatus for providing optimized access to circuits for debug, programming, and test |
| 10/08/2008 | EP1110095B1 Method and apparatus for electromagnetic emissions testing |
| 10/08/2008 | CN201130906Y Power supply self-adapting apparatus of accumulator on-line monitoring terminal |
| 10/08/2008 | CN201130874Y Wireless power supply for zinc oxide lightning arrester leakage current monitoring system |
| 10/08/2008 | CN201130865Y Pulse generator for intelligent accumulator test charger |
| 10/08/2008 | CN201130852Y Relay protection intelligentized check apparatus for power system |
| 10/08/2008 | CN201130244Y Detection of flexible package battery inner short circuit and voltage measurement clamp |
| 10/08/2008 | CN201130243Y Apparatus for testing single string lithium ion battery set static state self-consumption |
| 10/08/2008 | CN201130242Y Apparatus for real-time measurement of AC motor transient performance |
| 10/08/2008 | CN201130241Y Numeralization motor experimental station |
| 10/08/2008 | CN201130240Y Experimental device for synthesizing high pressure series thyristor valve |
| 10/08/2008 | CN201130239Y Multifunctional test pen |
| 10/08/2008 | CN201130238Y Device for detecting overload characteristic of minitype breaker |
| 10/08/2008 | CN201130237Y Experimental device for plate post-insertion type circuit breaker |
| 10/08/2008 | CN201130236Y Full-automatic control mechanism durability test bed |
| 10/08/2008 | CN201130235Y Chip detecting device |
| 10/08/2008 | CN201130234Y Circuit structure of voltage monitoring plate of DC transmission thyristor flow-exchanging valve |
| 10/08/2008 | CN201130233Y Improved all-purpose test mold for printed circuit board |
| 10/08/2008 | CN201130232Y Electrode assembly for sorting and testing wafer |