Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2008
10/15/2008CN201133931Y LCD television set or display energy supply dedicated tester
10/15/2008CN201133930Y Multi-string lithium ionic cell protective plate partial-automatic checking test device
10/15/2008CN201133929Y Two stage type vacuum fixture
10/15/2008CN201133928Y Temperature controlling stand for measuring semiconductor lighting device
10/15/2008CN201133927Y Fault indicator line-cliping structure
10/15/2008CN201133926Y Fault indication device
10/15/2008CN201133925Y Turn-to-turn short circuit test device
10/15/2008CN201133924Y Differential voltage transformer turn-to-turn short circuit detection device
10/15/2008CN201133923Y Kinetic cell short circuit checking machine
10/15/2008CN201133922Y Looped network cabinet failure diagnosis device
10/15/2008CN201133921Y Alternating-current extra-high voltage power transmission sequence breezee vibration monitoring device
10/15/2008CN201133920Y Corona cage artificial rainwater discharging system
10/15/2008CN101287994A Method of preparing an integrated circuit die for imaging
10/15/2008CN101287355A Radio frequency testing device and shielding method thereof
10/15/2008CN101286855A Network data transmission server, detecting system constituted thereby and power saving method
10/15/2008CN101286675A Insulation design method of frequency conversion drive motor and manufacturing method of frequency conversion drive motor
10/15/2008CN101286580A Method of making sets of valve controlling type accumulator
10/15/2008CN101286579A Method of making sets of valve controlling type accumulator by computer
10/15/2008CN101286263A Parallel single wire digital temperature sensor fire disaster detector and alarming method
10/15/2008CN101286184A Integrated circuit test line generation method and system
10/15/2008CN101286126A Spatial processor single particle experiment automatized test system and method
10/15/2008CN101286050A Test instrumentation control system and method, instrument control device
10/15/2008CN101285948A LCM half-finished product electrostatic resistance limit voltage resistant test method
10/15/2008CN101285875A Detection circuit and alternating-current /direct current coupling configuration checking method
10/15/2008CN101285874A Battery full charge capacity detection method
10/15/2008CN101285873A Estimation method, device and electronic system
10/15/2008CN101285872A Improved type carbon-pile type accumulator tester
10/15/2008CN101285871A Scanning chain diagnosis vector generation method and device and scanning chain diagnosis method
10/15/2008CN101285870A Semiconductor testing device
10/15/2008CN101285869A LED parameter test method
10/15/2008CN101285868A Differential pressure type multifunctional vacuum oil immersion equipment
10/15/2008CN101285867A Electrical insulation electric heating ageing testing equipment
10/15/2008CN101285866A Electronic soft label checking sensor
10/15/2008CN101285865A Method and apparatus for detecting tip position of probe, alignment method, and probe apparatus
10/15/2008CN101285864A Testing method of semiconductor integrated circuit and integrated circuit tester
10/15/2008CN101285863A Circuit board measurement method and device
10/15/2008CN101285848A Method and device for correcting and obtaining reference voltage
10/15/2008CN101285783A Substrate detection device
10/15/2008CN101284600A Carrying disk transferring device for conveying and detecting interface
10/15/2008CN100426908C Method and arrangement of testing device in mobile station
10/15/2008CN100426001C Multi-field coupling measuring system
10/15/2008CN100426000C Plastic-casing circuit breaker instantaneous characteristic test device
10/15/2008CN100425999C Circuit board fault self-positioning device and method based on programmable logic device
10/14/2008US7437647 Mode entry circuit and method
10/14/2008US7437646 Test pattern generating method and apparatus and storing medium for storing test pattern generating program
10/14/2008US7437645 Test circuit for semiconductor device
10/14/2008US7437644 Automatic self-testing of an internal device in a closed system
10/14/2008US7437643 Automated BIST execution scheme for a link
10/14/2008US7437642 Model train command protocol using front and back error bytes
10/14/2008US7437641 Systems and methods for signature circuits
10/14/2008US7437640 Fault diagnosis of compressed test responses having one or more unknown states
10/14/2008US7437639 Response bits as stimulus in subdivided scan path delay test
10/14/2008US7437638 Boundary-Scan methods and apparatus
10/14/2008US7437637 Apparatus and method for programmable fuse repair to support dynamic relocate and improved cache testing
10/14/2008US7437636 Method and apparatus for at-speed testing of digital circuits
10/14/2008US7437635 Testing hard-wired IP interface signals using a soft scan chain
10/14/2008US7437634 Test scan cells
10/14/2008US7437633 Duty cycle characterization and adjustment
10/14/2008US7437628 Data transmission apparatus and method
10/14/2008US7437624 Method and apparatus for analyzing serial data streams
10/14/2008US7437615 Storage system and a method for diagnosing failure of the storage system
10/14/2008US7437596 Self-healing control network for building automation systems
10/14/2008US7437531 Testing memories
10/14/2008US7437340 Designing of a logic circuit for testability
10/14/2008US7437271 Methods and apparatus for data analysis
10/14/2008US7437261 Method and apparatus for testing integrated circuits
10/14/2008US7437258 Use of I2C programmable clock generator to enable frequency variation under BMC control
10/14/2008US7436802 Frequency hopping method in orthogonal frequency division multiplexing system
10/14/2008US7436781 Method and apparatus for determining the location of a node in a wireless system
10/14/2008US7436777 Failed link training
10/14/2008US7436772 Available bandwidth estimation
10/14/2008US7436766 Telecommunication network support for service based policy in roaming configurations
10/14/2008US7436764 Notification of control information in wireless communication system
10/14/2008US7436644 Switching circuit, switching method, protective device and battery pack
10/14/2008US7436506 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool
10/14/2008US7436222 Circuit and method for trimming integrated circuits
10/14/2008US7436211 Transparent latch circuit
10/14/2008US7436200 Apparatus for testing a power supply
10/14/2008US7436199 Stack-type semiconductor package sockets and stack-type semiconductor package test systems
10/14/2008US7436198 Test pattern of semiconductor device and test method using the same
10/14/2008US7436197 Virtual test head for IC
10/14/2008US7436196 Method and apparatus for measuring die-level integrated circuit power variations
10/14/2008US7436195 Test apparatus for semiconductor elements on a semiconductor wafer, and a test method using the test apparatus
10/14/2008US7436194 Shielded probe with low contact resistance for testing a device under test
10/14/2008US7436192 Probe skates for electrical testing of convex pad topologies
10/14/2008US7436191 Differential measurement probe having a ground clip system for the probing tips
10/14/2008US7436190 Transparent conductive film roll and production method thereof, touch panel using it, and non-contact surface resistance measuring device
10/14/2008US7436189 Real-time load current detecting circuit for CPU
10/14/2008US7436171 Apparatus for probing multiple integrated circuit devices
10/14/2008US7436170 Probe station having multiple enclosures
10/14/2008US7436169 Mechanical stress characterization in semiconductor device
10/14/2008US7436168 Test error detection method and system
10/14/2008US7435990 Arrangement for testing semiconductor chips while incorporated on a semiconductor wafer
10/14/2008US7434450 Method and apparatus for detecting exhaust gas sensor defect
10/14/2008CA2403069C Multifunction circuit continuity and sensor tester
10/09/2008WO2008122016A1 A multi-type test interface system and method
10/09/2008WO2008121937A1 Micro probe assembly
10/09/2008WO2008121934A1 Vertical micro probes
10/09/2008WO2008121264A1 Method and system to identify grounding concerns in an electric power system
10/09/2008WO2008121177A1 Hdmi format video pattern and audio frequencies generator for field test and built-in self test