Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2008
10/21/2008US7439752 Methods of providing semiconductor components within sockets
10/21/2008US7439751 Apparatus and method for testing conductive bumps
10/21/2008US7439747 Location of high resistance ground faults on buried power-cables
10/21/2008US7439746 Electrostatic voltmeter
10/21/2008US7439745 Nickel-hydride battery life determining method and life determining apparatus
10/21/2008US7439744 Automated arc generator and method to repeatably generate electrical arcs for AFCI testing
10/21/2008US7439731 Temporary planar electrical contact device and method using vertically-compressible nanotube contact structures
10/21/2008US7439730 Apparatus and method for detecting photon emissions from transistors
10/21/2008US7439729 Integrated systems testing
10/21/2008US7439728 System and method for test socket calibration using composite waveform
10/21/2008US7439724 On-chip jitter measurement circuit
10/21/2008US7439710 Battery pack capacity control system
10/21/2008US7439500 Analyzing system and charged particle beam device
10/21/2008US7439084 Predictions of leakage modes in integrated circuits
10/21/2008US7437934 Self-contained apparatus for inspection of electric conductors
10/21/2008US7437813 Probe repair methods
10/18/2008CA2585820A1 Localizing faults on an electrical network using distributed voltage measurement
10/16/2008WO2008124152A1 System and method for dynamically changing service characteristics based on device and network connectivity attributes
10/16/2008WO2008124068A1 Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
10/16/2008WO2008123608A1 Conductive contact holder and conductive contact unit
10/16/2008WO2008123470A1 Demodulation device, test device, and electronic device
10/16/2008WO2008123282A1 Noise immunity evaluation apparatus
10/16/2008WO2008123156A1 Testing apparatus and electronic device
10/16/2008WO2008123076A1 Connecting board, probe card and electronic component testing apparatus provided with the probe card
10/16/2008WO2008122937A1 Testable integrated circuit and test data generation method
10/16/2008WO2008104686A3 Test installation with a test bench and method for using such a test bench in said installation
10/16/2008WO2008104684A3 Testing installation for the performance of a domestic electric supply network
10/16/2008WO2008103619A3 Test fixture and method for circuit board testing
10/16/2008WO2008096284B1 A method for processing data pertaining to an activity of partial electrical discharges
10/16/2008WO2008082717A3 Power-based resource sharing in a mesh network
10/16/2008WO2008038202A3 Remaining time indication for a rechargeable implantable medical device
10/16/2008WO2008019362A3 Controlling critical dimensions in track lithography tools
10/16/2008WO2008019263A3 Adjustment mechanism
10/16/2008WO2005051055A3 Independently adjustable circuit board carrier
10/16/2008US20080256407 Process and system for the verification of correct functioning of an on-chip memory
10/16/2008US20080256406 Testing System
10/16/2008US20080256405 Compilable memory structure and test methodology for both asic and foundry test environments
10/16/2008US20080256404 Fault location estimation system, fault location estimation method, and fault location estimation program for multiple faults in logic circuit
10/16/2008US20080256387 Automated error recovery of a licensed internal code update on a storage controller
10/16/2008US20080255792 Test system and computer program for determining threshold voltage variation using a device array
10/16/2008US20080255791 Interface to full and reduce pin jtag devices
10/16/2008US20080255784 Simultaneous physical and protocol layer analysis
10/16/2008US20080255783 Fully-charged battery capacity detection method
10/16/2008US20080255781 Transducer array self-diagnostics and self-healing
10/16/2008US20080255780 Ic Testing Methods and Apparatus
10/16/2008US20080253298 Method and System for Managing Routes in a Wireless Network of Nodes
10/16/2008US20080253295 Network system and node apparatus
10/16/2008US20080253281 Bandwidth Management for MPLS Fast Rerouting
10/16/2008US20080253103 Manufacturing method of a tray, a socket for inspection, and a semiconductor device
10/16/2008US20080252437 Battery run down indicator
10/16/2008US20080252344 Timing vernier using a delay locked loop
10/16/2008US20080252330 Method and apparatus for singulated die testing
10/16/2008US20080252329 On-chip frequency degradation compensation
10/16/2008US20080252327 Substrate test probing equipment having forcing part for test head and force-receiving pattern for probe card and methods of using the same
10/16/2008US20080252325 Vertical probe array arranged to provide space transformation
10/16/2008US20080252324 Active thermal control unit for maintaining the set point temperature of a DUT
10/16/2008US20080252323 Method for testing micro SD devices
10/16/2008US20080252322 Method for testing system-in-package devices
10/16/2008US20080252321 Apparatus for testing micro SD devices
10/16/2008US20080252320 Apparatus for testing micro SD devices
10/16/2008US20080252319 Apparatus for testing system-in-package devices
10/16/2008US20080252318 Method for testing micro sd devices using each test circuits
10/16/2008US20080252317 Apparatus for testing system-in-package devices
10/16/2008US20080252316 Membrane probing system
10/16/2008US20080252314 Apparatus for testing system-in-package devices
10/16/2008US20080252313 Method for testing system-in-package devices
10/16/2008US20080252312 Apparatus for testing system-in-package devices
10/16/2008US20080252311 Verifying an assembly manufacturing process
10/16/2008US20080252309 Method and apparatus for generating an EMI fingerprint for a computer system
10/16/2008US20080252308 Power Grid Structure to Optimize Performance of a Multiple Core Processor
10/16/2008US20080252300 Detecting device
10/16/2008US20080252246 Detection Method for an Electrical Polyphase Machine
10/16/2008US20080251071 Method and system for motor failure detection
10/16/2008US20080250847 Detector and production method thereof
10/16/2008DE19810746B4 Platine mit einer Schaltung zur Überwachung einer mehrzelligen Akkumulatorenbatterie Board with a circuit for monitoring a multi-cell battery of accumulators
10/16/2008DE112004002615B4 Verfahren zur Kalibrierung eines Zeitsteuertakts A method for calibrating a timing clock
10/16/2008DE102007010988B3 Verfahren und Vorrichtung zur Bestimmung einer Ausgleichsladung eines Akkumulators Method and apparatus for determining an equalizing charge a battery
10/16/2008DE102007010604A1 Switching contact for electromechanical switchgear, has fuse-resistant intermediate element arranged between contact piece and contact holder, where conductivity of intermediate element is smaller than conductivity of contact piece
10/16/2008DE102005006370B4 Diagnose des Ladungszustands eines Energiespeicher-Systems Diagnosis of the state of charge of an energy storage system
10/16/2008DE102004003164B4 Verfahren und System zum Berechnen einer zulässigen Ladeleistung einer Batterie Method and system for calculating an allowable charging power of a battery
10/16/2008DE10135798B4 Verfahren und Vorrichtung zur Diagnose diskreter Endstufen über Digitaleingänge Method and apparatus for diagnosing discrete amplifiers with digital inputs
10/15/2008EP1981143A1 Power source device, electric vehicle mounted with the power source device, and control method for power source device
10/15/2008EP1980964A1 Method and computer program product for performing failure mode and effects analysis of an integrated circuit
10/15/2008EP1979758A1 Method for a one-time calibration of a multiple branches digital measurement system working in minimum number of branches mode
10/15/2008EP1979757A1 An integrated circuit package, and a method for producing an integrated circuit package having two dies with input and output terminals of integrated circuits of the dies directly addressable for testing of the package
10/15/2008EP1979756A1 Calibrating signals by time adjustment
10/15/2008EP1979048A2 Power supply monitoring for an implantable device
10/15/2008EP1872146B1 Simultaneous core testing in multi-core integrated circuits
10/15/2008EP1853934B1 Capacity degradation determination in a lead acid battery method and apparatus
10/15/2008CN201134683Y Alarm circuit for battery discharging
10/15/2008CN201134640Y Hand-hold number modifying device
10/15/2008CN201134614Y Electrical distribution box with alarm for failure of neutral line
10/15/2008CN201134474Y On-line control interface device of series storage battery
10/15/2008CN201134163Y Corona current measurement mechanism
10/15/2008CN201134154Y On-line monitoring system of leakage current of zinc oxide lightning arrester of high-voltage grid system
10/15/2008CN201134098Y Data collecting card based on PXI bus
10/15/2008CN201134094Y Testing device of voltage limit
10/15/2008CN201133981Y Test device for chip packaged in glass
10/15/2008CN201133980Y LCD cleaning screen test tool equipment
10/15/2008CN201133932Y Power supply apparatus monitoring system
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