Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2008
10/28/2008US7444196 Optimized characterization of wafers structures for optical metrology
10/28/2008US7443910 PHY control module for a multi-pair gigabit transceiver
10/28/2008US7443798 Transmit adaptive equalization for communication system with one or more serial data channels
10/28/2008US7443791 Priority mechanism for distributed sending of media data
10/28/2008US7443789 Protection switching mechanism
10/28/2008US7443786 Apparatus and methods for home agent resiliency for mobile IPv4
10/28/2008US7443658 Inspection apparatus for inspecting a display module
10/28/2008US7443643 Inverter device for automobile
10/28/2008US7443640 Apparatus for detecting arc fault
10/28/2008US7443496 Apparatus and method for testing defects
10/28/2008US7443373 Semiconductor device and the method of testing the same
10/28/2008US7443308 Enhanced AC immunity in ground fault detection
10/28/2008US7443232 Active load arrangement
10/28/2008US7443190 Method for testing micro SD devices using each test circuits
10/28/2008US7443189 Method to detect and predict metal silicide defects in a microelectronic device during the manufacture of an integrated circuit
10/28/2008US7443188 Electronic device having an interface supported testing mode
10/28/2008US7443187 On-chip power supply noise detector
10/28/2008US7443186 On-wafer test structures for differential signals
10/28/2008US7443184 Apparatus and methods for self-heating burn-in processes
10/28/2008US7443183 Motherboard test machine
10/28/2008US7443182 Coordinate transformation device for electrical signal connection
10/28/2008US7443181 High performance probe system
10/28/2008US7443180 On-chip probing apparatus
10/28/2008US7443172 Method and apparatus for the location and indication of cable splices and cable faults
10/28/2008US7443171 Devices and methods for detecting current leakage between deep trench capacitors in DRAM devices
10/28/2008US7443170 Device and method for determining at least one variable associated with the electromagnetic radiation of an object being tested
10/28/2008US7443157 Device and method for planeness testing
10/28/2008US7443156 Apparatus and method for identifying defects on objects or for locating objects
10/28/2008US7443155 Voltage detecting apparatus
10/28/2008US7443139 Battery state-of-charge estimator
10/28/2008US7442968 Chip on film (COF) package having test pad for testing electrical function of chip and method for manufacturing same
10/28/2008US7442560 Method for manufacturing anisotropic conductive sheet
10/28/2008US7442559 Method for producing an optical or electronic module provided with a plastic package
10/28/2008US7442318 Method of making thermal print head
10/28/2008US7441429 SIP-based VoIP traffic behavior profiling
10/28/2008US7441320 Method of validating manufacturing configurations during hardware assembly
10/23/2008WO2008128119A1 System and method for detecting mutually supported capabilities between mobile devices
10/23/2008WO2008127908A1 Method and apparatus for generating an emi fingerprint for a computer system
10/23/2008WO2008127878A1 Pseudowire load balancing
10/23/2008WO2008127333A1 Hybrid probe for testing semiconductor devices
10/23/2008WO2008126747A1 Test apparatus, test method, and electronic device
10/23/2008WO2008126631A1 State estimating device for secondary battery
10/23/2008WO2008126607A1 Testing apparatus, electronic device and testing method
10/23/2008WO2008126603A1 Driver circuit and semiconductor testing apparatus
10/23/2008WO2008126471A1 Semiconductor integrated circuit and its testing method
10/23/2008WO2008126173A1 Tcp handling device
10/23/2008WO2008126165A1 Test device
10/23/2008WO2008126164A1 Electronic component testing apparatus and method for transferring electronic component
10/23/2008WO2008125998A1 Analog circuit testing and test pattern generation
10/23/2008WO2008125718A1 Voltage sag generating equipment
10/23/2008WO2008125011A1 Method and apparatus for testing system-in-package devices, micro sd devices
10/23/2008WO2008106673A3 Method and apparatus for loose wiring monitor
10/23/2008WO2008088986A9 Integrated time and/or capacitance measurement system, method and apparatus
10/23/2008WO2007146186A3 Knee probe having increased scrub motion
10/23/2008WO2007143220A3 Reconfigurable scan array structure
10/23/2008US20080263482 Method and Apparatus for Small Die Low Power System-on-Chip Design with Intelligent Power Supply Chip
10/23/2008US20080263423 System and Method for Nonlinear Statistical Encoding in Test Data Compression
10/23/2008US20080263422 Control of the integrity of a memory external to a microprocessor
10/23/2008US20080263421 Electrical Diagnostic Circuit and Method for the Testing and/or the Diagnostic Analysis of an Integrated Circuit
10/23/2008US20080263420 Test standard interfaces and architectures
10/23/2008US20080263419 Removable and replaceable tap domain selection circuitry
10/23/2008US20080263418 System and Method for Adaptive Nonlinear Test Vector Compression
10/23/2008US20080262777 System for testing processor cores
10/23/2008US20080262769 Using multivariate health metrics to determine market segment and testing requirements
10/23/2008US20080262761 Apparatus for creating test pattern and calculating fault coverage or the like and method for creating test pattern and calculating fault coverage or the like
10/23/2008US20080262760 Semiconductor inspecting apparatus
10/23/2008US20080262759 System and method for testing information handling system components
10/23/2008US20080260140 Method and System for Scanning and Detecting Metallic Cross-Connects
10/23/2008US20080259814 Method and apparatus for adjusting value of statistic parameter
10/23/2008US20080259807 Method, system and maintenance point for controlling continuity check of ethernet link
10/23/2008US20080259804 Device and methods for increasing wireless connection speeds
10/23/2008US20080259803 Method and Apparatus for Adaptive Bandwidth Control with a Bandwidth Guarantee
10/23/2008US20080259789 Method and apparatus for re-establishing anonymous data transfers
10/23/2008US20080259788 Method For Routing Mobile Node In Wireless Mesh Network And A Communication System Thereof
10/23/2008US20080259787 Backup cell controller
10/23/2008US20080259785 Link Adaptation
10/23/2008US20080259784 Failure notification in a network having serially connected nodes
10/23/2008US20080258758 Embedded system and control method therefor
10/23/2008US20080258754 Security element for an integrated circuit, integrated circuit including the same, and method for securing an integrated circuit
10/23/2008US20080258752 Method and apparatus for measuring device mismatches
10/23/2008US20080258751 On-Chip Power Supply Noise Detector
10/23/2008US20080258750 Method for determining threshold voltage variation using a device array
10/23/2008US20080258749 Test apparatus, and electronic device
10/23/2008US20080258748 Method for fabricating a probing pad of an integrated circuit chip
10/23/2008US20080258747 Test equipment for automated quality control of thin film solar modules
10/23/2008US20080258744 Electronic Circuit Testing Apparatus
10/23/2008US20080258737 Insulation Inspection Apparatus
10/23/2008US20080258736 Magnetic flowmeter output verification
10/23/2008US20080258734 Method for Determining the Internal Resistance of a Battery
10/23/2008US20080258714 Delay circuit and test apparatus
10/23/2008US20080258712 Modular interface
10/23/2008US20080258709 System and method for detecting the presence of an unsafe line condition in a disconnected power meter
10/23/2008US20080258667 Test module for motor control center subunit
10/23/2008DE69937559T2 Nicht-flüchtige Speicher mit Erkennung von Kurzschlüssen zwischen Wortleitungen Non-volatile memory with detection of shorts between word lines
10/23/2008DE102007018096A1 Verfahren zur Ermittlung von Zeitunterschieden zwischen durch zumindest zwei gekoppelte Messgeräte gemessenen Signalen sowie Messsystem und entsprechende Umschaltvorrichtung Method for determining time differences between measured by at least two coupled signals and measuring instruments measuring system and corresponding switching device
10/23/2008DE102004043063B4 Verfahren zum Betreiben eines Halbleiter-Bauelements mit einem Test-Modul A method of operating a semiconductor device with a test module
10/23/2008DE102004031424B4 Mikrochemischer Chip und Verfahren zu dessen Herstellung Microchemical chip and process for its preparation
10/22/2008EP1983602A1 Lithium secondary cell degradation detection method, degradation detector, degradation suppressing device, and cell pack using the same, battery charger
10/22/2008EP1983552A1 Semiconductor production system
10/22/2008EP1983551A1 Semiconductor production system
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