Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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12/07/1993 | US5268639 Testing timing parameters of high speed integrated circuit devices |
12/07/1993 | US5268638 Method for particle beam testing of substrates for liquid crystal displays "LCD" |
12/07/1993 | US5268637 Carrier for testing circuit boards |
12/07/1993 | US5268635 Intelligent self-diagnosing and sparing light emitting diodes |
12/07/1993 | US5268567 Charge collection control circuit for use with charge-coupled photodetector arrays |
12/01/1993 | EP0572319A1 Electrotechnical multimeter |
12/01/1993 | EP0572204A1 Method and apparatus for automated sensor diagnosis |
12/01/1993 | EP0572180A1 Wafer probe station having auxiliary chucks |
12/01/1993 | EP0572152A2 Determining battery temperature and type |
12/01/1993 | EP0572060A1 Apparatus and method for resistive detection and waveform analysis of interconnection networks |
12/01/1993 | EP0572059A1 Ultrasonic adhesion/dehesion monitoring apparatus with acoustic transducer means |
12/01/1993 | EP0571963A2 Method of connection testing electronic boards |
12/01/1993 | EP0571493A1 A method and an apparatus for charging a rechargeable battery. |
12/01/1993 | EP0533802B1 Insulator aging assessment method |
11/30/1993 | US5267247 For an information processor |
11/30/1993 | US5267217 Apparatus for and method of detecting shape of solder portion |
11/30/1993 | US5267206 Semiconductor integrated circuit with functional test mode to random access memory unit |
11/30/1993 | US5267017 Method of particle analysis on a mirror wafer |
11/30/1993 | US5266904 Printed circuit board with through-holes including a test land having two current measuring lands and two resistance measuring lands |
11/30/1993 | US5266902 High or low voltage electrical resistance tester |
11/30/1993 | US5266901 Apparatus and method for resistive detection and waveform analysis of interconenction networks |
11/30/1993 | US5266895 Probe with contact portion including Au and Cu alloy |
11/30/1993 | US5266894 Apparatus and method for testing semiconductor device |
11/30/1993 | US5266893 Method and apparatus for testing VCR servos |
11/30/1993 | US5266892 Method of measuring interface state density distribution in MIS structure |
11/30/1993 | US5266891 Auto self test of AC motor system |
11/30/1993 | US5266845 Semiconductor integrated circuit provided with emitter coupled logic input/output buffers |
11/30/1993 | US5266840 Circuit for detecting the failure of a load which is connected in series with an electronic switch |
11/30/1993 | US5266059 Generic rotatable connector assembly for testing integrated circuit packages |
11/30/1993 | CA2019773C Assembly for testing printed circuit boards and its use for testing digital signal multiplexing-demultiplexing printed circuit boards |
11/25/1993 | WO1993023915A1 Voltage measuring circuit |
11/25/1993 | WO1993023760A1 System for monitoring circuit breaker operations and alerting need of preventative maintenance |
11/25/1993 | WO1993023759A1 Method of discriminating discrimination ojbect, detector therefor and input circuit of the detector |
11/25/1993 | WO1993023757A1 High-speed, high-impedance external photoconductive-type sampling probe/pulser |
11/25/1993 | DE4317110A1 Three= phase inverter output load current detection and shut-down circuit - uses current sense coils and inverter control circuit. |
11/25/1993 | DE4220410C1 Verfahren zum Bestimmen eines Fehlers auf einer elektrischen Übertragungsleitung A method for determining a fault on an electric transmission line |
11/25/1993 | DE4217105A1 Evaluating relay noise for quality control, esp. of motor vehicle indicator relay - separating time varying component of relay actuation sound from resonant component and determining sound quality |
11/25/1993 | DE4217097A1 Interferometric detector of charge carrier densities in semiconductor material - has laser radiation source, Bragg cell as a radiation divider, and optical radiation beam former |
11/25/1993 | DE4217067A1 Test method for quality control and defect classification of electromagnetically actuated switching device - evaluating digitised acoustic signals associated with switching impact according to various criteria |
11/25/1993 | DE4217065A1 Test method for quality control of electromagnetically actuated switching device - evaluating acoustic signal associated with switching impact on magnet armature |
11/25/1993 | CA2113193A1 System for monitoring circuit breaker operations and alerting need of preventative maintenance |
11/24/1993 | EP0571252A1 Sample holder module for tests of an optical component |
11/24/1993 | EP0571179A2 Method and apparatus for the testing of connections of an electronic apparatus |
11/24/1993 | EP0570470A1 Battery tester. |
11/24/1993 | EP0300516B1 Digital data processing system |
11/24/1993 | CN2147548Y Digital IC testing instrument and testing probe |
11/24/1993 | CN2147547Y Multi-way wire distributing corrector |
11/24/1993 | CN2147546Y Automatic measurer for strong field electric property of electronic material |
11/24/1993 | CN1022876C Synthetic equivalent test circuit of circuit breaker |
11/24/1993 | CN1022862C Method and device for measuring beam diameter of cathode-ray tube |
11/23/1993 | US5265201 Master-slave processor human interface system |
11/23/1993 | US5265102 Test pattern generator |
11/23/1993 | US5265101 Function array sequencing for VLSI test system |
11/23/1993 | US5265051 Semiconductor memory device having an internal signal detector |
11/23/1993 | US5265028 Optimization system |
11/23/1993 | US5264799 Automatic transformer testing apparatus |
11/23/1993 | US5264796 Fault detection and isolation in automotive wiring harness including dedicated test line |
11/23/1993 | US5264788 Adjustable strap implemented return line for a probe station |
11/23/1993 | US5264787 Device for testing an electrical circuit element |
11/23/1993 | US5264742 Security locks for integrated circuit |
11/23/1993 | US5264377 Integrated circuit electromigration monitor |
11/23/1993 | US5263775 Apparatus for handling devices under varying temperatures |
11/23/1993 | US5263240 Method of manufacturing printed wiring boards for motors |
11/18/1993 | EP0570206A2 Arc detection system |
11/18/1993 | EP0570189A2 A spark plug voltage detecting probe device for use in internal combustion engine |
11/18/1993 | EP0570067A2 Control device for interface control between a test machine and multi-channel electronic circuitry, in particular acording to Boundary Test Standard |
11/18/1993 | EP0569581A1 Method and apparatus for monitoring operating characteristics of semiconductor electric power switching circuits |
11/18/1993 | EP0569354A1 Battery with strength indicator |
11/18/1993 | EP0549718A4 Apparatus and methods for simulating electromagnetic environments |
11/18/1993 | EP0524964B1 Process for the assembly and insulation-testing of electronic power components fitted to cooling elements |
11/18/1993 | DE4243910A1 Aufgeteiltes Grenzabtasttesten zum Vermindern des durch Testen hervorgerufenen Schadens Split Grenzabtasttesten for reducing the damage caused by testing |
11/18/1993 | DE4225464A1 Testing cable end contact shoe for latching into connector - inserting pin in connector next to connector hook and measuring depth and=or contacting test needle with contact shoe. |
11/17/1993 | CN2146719Y Integral characteristic tester for high-voltage breaker |
11/16/1993 | US5263195 Superheterodyne radio receiver with digital automatic frequency control for a local oscillator |
11/16/1993 | US5263149 Integrated circuit logic functions simulator for selectively connected series of preprogrammed PLA devices using generated sequence of address signals being provided between simulated clock cycles |
11/16/1993 | US5263029 Memory efficient topological converter assembly |
11/16/1993 | US5262729 Method of measuring characteristics of electronic parts |
11/16/1993 | US5262728 Combination flashlight/lantern electric continuity tester |
11/16/1993 | US5262721 Electronic circuit testing apparatus and testing method using the same |
11/16/1993 | US5262720 Circuit for controlling the lines of a display screen and including test means with a single output |
11/16/1993 | US5262719 Test structure for multi-layer, thin-film modules |
11/16/1993 | US5262716 Tester calibration procedure which includes fixturing |
11/16/1993 | US5262034 Electrochemical sensor for monitoring electrochemical potentials of fuel cell components |
11/16/1993 | US5261775 IC test equipment |
11/11/1993 | WO1993022724A1 Process for testing modules fitted with a plurality of different components |
11/11/1993 | WO1993022667A1 Electronic battery tester with automatic compensation for low state-of-charge |
11/11/1993 | WO1993022666A1 Testing a battery connected to operating equipment |
11/11/1993 | DE4214841A1 Integrated circuit with timing element contg. two counter units - tests counter units independently in separate test modes using internal and external clocking |
11/10/1993 | EP0569136A2 Methods and apparatus for programming cellular programmable logic integrated circuits |
11/10/1993 | EP0569014A2 Semiconductor memory device with a circuit |
11/10/1993 | EP0568804A2 Communication control apparatus |
11/10/1993 | EP0568800A1 Rechargeable light hardening device |
11/10/1993 | EP0568767A1 Method for determining the state of charge of an electrochemical cell |
11/10/1993 | EP0317571B1 Transformer life consumption indicator |
11/10/1993 | CN1078308A Detection of grounding fault for armoured cable |
11/10/1993 | CN1022708C Discharge testing chest |
11/09/1993 | US5260952 Fault tolerant logic system |
11/09/1993 | US5260950 Boundary-scan input circuit for a reset pin |
11/09/1993 | US5260949 Scan path system and an integrated circuit device using the same |
11/09/1993 | US5260948 Bidirectional boundary-scan circuit |