Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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04/06/1993 | US5200689 Battery charge monitor to determine fast charge termination |
04/06/1993 | US5199161 Cable testing apparatus |
04/06/1993 | CA1315858C Telecommunications wiring test apparatus and method |
04/01/1993 | WO1993006657A1 Update synchronizer |
04/01/1993 | WO1993006651A1 Ac/dc converter fault detector |
04/01/1993 | WO1993006643A1 Battery-operated device |
04/01/1993 | WO1993006629A1 A battery charge indicator |
04/01/1993 | WO1993006612A1 Process for detecting mechanical parameters of an electric switching device |
04/01/1993 | WO1993006544A1 Method and apparatus for clock skew reduction through absolute delay regulation |
04/01/1993 | WO1993006497A1 Method and apparatus for complete functional testing of a complex signal path of a semiconductor chip |
04/01/1993 | WO1993006495A1 Socket tester gauge |
04/01/1993 | WO1993006492A1 Circuit arrangement to detect a voltage |
04/01/1993 | WO1993006474A1 Battery with electrochemical tester |
04/01/1993 | WO1993006473A1 Battery voltage measurement system |
04/01/1993 | WO1993006448A1 Automatic motor testing method and apparatus |
04/01/1993 | DE4132533A1 Verfahren und zugehoerige messanordnung zur bewertung des lichtbogens an gleitkontakten von elektrischen maschinen Procedures and related measuring arrangement for valuation of arc initiation of sliding contacts of electrical machines |
04/01/1993 | DE4131981A1 Batteriebetriebenes geraet Geraet Battery operated |
04/01/1993 | DE4130981A1 Timer circuit operating method for integrated circuit without test pin connection - externally selecting test mode and adjusting state of time to shorten time taken to reach end state |
04/01/1993 | DE4130978A1 Testing protected electrical loads in vehicle electrical network - measuring voltages across load protection devices, e.g. fuses, and comparing with stored permitted values |
04/01/1993 | CA2118590A1 Automatic motor testing method and apparatus |
03/31/1993 | EP0534826A1 Device for in situ ultra-high frequency broadband testing |
03/31/1993 | EP0534702A1 Continuous monitoring electrostatic discharge system |
03/31/1993 | EP0534362A2 Method and apparatus for testing self-commutative electric power conversion device |
03/31/1993 | EP0534187A2 Test device for integrated circuits |
03/31/1993 | EP0534114A2 Analog array for fast detection of short-circuits |
03/31/1993 | EP0534113A2 Equipment for the fast recognition of short circuits |
03/31/1993 | EP0318549B1 Test meters |
03/31/1993 | CN1070486A DC grounding monitor alarm device |
03/30/1993 | US5199054 Method and apparatus for high resolution inspection of electronic items |
03/30/1993 | US5199035 Logic circuit for reliability and yield enhancement |
03/30/1993 | US5198963 Multiple integrated circuit module which simplifies handling and testing |
03/30/1993 | US5198778 Method for inspecting printed circuit boards with through-holes |
03/30/1993 | US5198760 Method by which to detect direction of current flow in outputs of integrated circuits |
03/30/1993 | US5198759 Test apparatus and method for testing digital system |
03/30/1993 | US5198758 Method and apparatus for complete functional testing of a complex signal path of a semiconductor chip |
03/30/1993 | US5198757 Method and apparatus for testing semiconductor integrated circuit |
03/30/1993 | US5198754 Testing apparatus for high frequency integrated circuit chip |
03/30/1993 | US5198753 Integrated circuit test fixture and method |
03/30/1993 | US5198752 Electric probing-test machine having a cooling system |
03/30/1993 | US5198707 Integrated circuit with mode detection pin for tristate level detection |
03/30/1993 | US5198672 Signal generator and method of generating signal voltages using the same |
03/30/1993 | US5197326 Arrangement for monitoring rotational speed sensor |
03/28/1993 | CA2076488A1 Continuous monitoring electrostatic discharge system |
03/25/1993 | DE4221748A1 By=pass sampling path for integrated circuit contg. complex logic - has control and observation points, and selector data transfer path contg. or by=passing shift register with series latches |
03/24/1993 | EP0533476A2 Semiconductor integrated circuit with scan patch |
03/24/1993 | EP0533470A1 Socket for IC devices |
03/24/1993 | EP0533422A1 Method for inspecting stripped condition of electric wire |
03/24/1993 | EP0533269A2 Test structure for multi-layer, thin-film modules |
03/24/1993 | EP0532616A1 Electronic circuitry for detecting leakage of chemical substance. |
03/24/1993 | EP0532521A1 Process for testing devices. |
03/24/1993 | CN2128744Y Test instrument for multicore cable |
03/24/1993 | CN2128743Y Electric source protecting alarm for light welding machine |
03/23/1993 | US5197105 Method of reading optical image of inspected surface and image reading system employabale therein |
03/23/1993 | US5197070 Scan register and testing circuit using the same |
03/23/1993 | US5196803 Apparatus and method for determining the voltage breakdown and conductivity of particulate material |
03/23/1993 | US5196802 Method and apparatus for characterizing the quality of electrically thin semiconductor films |
03/23/1993 | US5196788 Self-contained functional test apparatus for modular circuit cards |
03/23/1993 | US5196787 Test circuit for screening parts |
03/23/1993 | US5196786 Method for inspecting an electronic state of a surface of a semiconductor substrate and an apparatus therefor |
03/23/1993 | US5196785 Tape automated bonding test apparatus for thermal, mechanical and electrical coupling |
03/23/1993 | US5196779 Determining the need for charging a battery |
03/23/1993 | US5195366 Testing apparatus for two or four cylinder engines |
03/23/1993 | CA1315016C Cost-function directed search method for generating test for sequential logic circuits |
03/18/1993 | WO1993005404A1 Advanced cable fault locator |
03/18/1993 | WO1993000862A3 Electrosurgical apparatus for laparoscopic and like procedures |
03/18/1993 | DE4230175A1 Testing and sorting device for electronic components, e.g. IC chips - simultaneously controls blocking pins for several channels of multi-channel component discharge system |
03/18/1993 | DE4130430A1 Vehicle engine starter motor testing appts. - has hollow drive shaft with two-bearing block carrying drive gear wheel, and internal drive shaft carrying drive wheel on protruding end |
03/18/1993 | DE4129542A1 Short-circuit indicator with time measurement for monitoring medium and high voltage lines - uses signalling unit with light beam to scan indicator unit showing time elapsed since short circuit detected |
03/17/1993 | EP0532017A1 Functional avionic core tester |
03/17/1993 | EP0531428A1 Test fixture alignment system. |
03/17/1993 | EP0531323A1 Method and system for concurrent electronic component testing and lead verification |
03/17/1993 | EP0523173A4 Apparatus and method for calorimetrically determining battery charge state |
03/17/1993 | CN2128389Y Electric leakage equipment and " wire sequence " tester for building |
03/17/1993 | CN1070073A Battery Voltage alarm apparatus |
03/17/1993 | CN1020128C Portable device for detecting partial electrical discharge in live voltage distributio cable and/or equipment |
03/16/1993 | US5195097 High speed tester |
03/16/1993 | US5195095 Algorithm for identifying tests to perform for fault isolation |
03/16/1993 | US5195007 Engine-driven power generating system |
03/16/1993 | US5194932 Semiconductor integrated circuit device |
03/16/1993 | US5194817 Apparatus and method for testing insulation using a pulsed resonant power supply |
03/16/1993 | US5194816 Method and apparatus for locating electrical shorts between concealed conductive objects |
03/14/1993 | WO1993006471A1 Apparatus for checking the contamination condition of electric insulators |
03/14/1993 | CA2096129A1 Apparatus for checking the contamination condition of electric insulators |
03/11/1993 | DE4130051A1 Short circuit fault locator for multilayer circuit board assembly - passes current through one conductor and measures voltage between internal point in this conductor and a connection to the second conductor |
03/10/1993 | EP0531230A1 Electrical energy distributing device with monitoring of isolation |
03/10/1993 | EP0531177A1 Method and apparatus for fault detection and repair of a data processing system |
03/10/1993 | EP0530863A2 Method of starting up a subsystem in a distributed processing system |
03/10/1993 | EP0530835A1 Testing circuit provided in digital logic circuits |
03/10/1993 | CN1069821A 半导体存储器件应力状态的自动测试设备 Automatic Test Equipment semiconductor memory device stress state |
03/09/1993 | US5193092 Integrated parity-based testing for integrated circuits |
03/09/1993 | US5193067 Battery condition detecton apparatus |
03/09/1993 | US5192983 Apparatus for and method of checking external appearance of soldering state |
03/09/1993 | US5192913 Segmented charge limiting test algorithm for electrical components |
03/09/1993 | US5192912 Apparatus for determining wiring orientation at electrical connectors including plural light indicators and rotary switch |
03/09/1993 | US5192908 Semiconductor device testing apparatus with positioning mechanism |
03/09/1993 | US5192907 Electronic module handling device for an automatic test apparatus |
03/09/1993 | US5191956 Electronic method and circuit for analyzing analog signals |
03/09/1993 | US5191708 Manufacturing method of a probe head for semiconductor LSI inspection apparatus |
03/04/1993 | WO1993004523A1 Circuit and method for testing inverter drive logic switching patterns |
03/04/1993 | WO1993004427A1 Interface between ic operational circuitry for coupling test signal from internal test matrix |