Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
04/1993
04/06/1993US5200689 Battery charge monitor to determine fast charge termination
04/06/1993US5199161 Cable testing apparatus
04/06/1993CA1315858C Telecommunications wiring test apparatus and method
04/01/1993WO1993006657A1 Update synchronizer
04/01/1993WO1993006651A1 Ac/dc converter fault detector
04/01/1993WO1993006643A1 Battery-operated device
04/01/1993WO1993006629A1 A battery charge indicator
04/01/1993WO1993006612A1 Process for detecting mechanical parameters of an electric switching device
04/01/1993WO1993006544A1 Method and apparatus for clock skew reduction through absolute delay regulation
04/01/1993WO1993006497A1 Method and apparatus for complete functional testing of a complex signal path of a semiconductor chip
04/01/1993WO1993006495A1 Socket tester gauge
04/01/1993WO1993006492A1 Circuit arrangement to detect a voltage
04/01/1993WO1993006474A1 Battery with electrochemical tester
04/01/1993WO1993006473A1 Battery voltage measurement system
04/01/1993WO1993006448A1 Automatic motor testing method and apparatus
04/01/1993DE4132533A1 Verfahren und zugehoerige messanordnung zur bewertung des lichtbogens an gleitkontakten von elektrischen maschinen Procedures and related measuring arrangement for valuation of arc initiation of sliding contacts of electrical machines
04/01/1993DE4131981A1 Batteriebetriebenes geraet Geraet Battery operated
04/01/1993DE4130981A1 Timer circuit operating method for integrated circuit without test pin connection - externally selecting test mode and adjusting state of time to shorten time taken to reach end state
04/01/1993DE4130978A1 Testing protected electrical loads in vehicle electrical network - measuring voltages across load protection devices, e.g. fuses, and comparing with stored permitted values
04/01/1993CA2118590A1 Automatic motor testing method and apparatus
03/1993
03/31/1993EP0534826A1 Device for in situ ultra-high frequency broadband testing
03/31/1993EP0534702A1 Continuous monitoring electrostatic discharge system
03/31/1993EP0534362A2 Method and apparatus for testing self-commutative electric power conversion device
03/31/1993EP0534187A2 Test device for integrated circuits
03/31/1993EP0534114A2 Analog array for fast detection of short-circuits
03/31/1993EP0534113A2 Equipment for the fast recognition of short circuits
03/31/1993EP0318549B1 Test meters
03/31/1993CN1070486A DC grounding monitor alarm device
03/30/1993US5199054 Method and apparatus for high resolution inspection of electronic items
03/30/1993US5199035 Logic circuit for reliability and yield enhancement
03/30/1993US5198963 Multiple integrated circuit module which simplifies handling and testing
03/30/1993US5198778 Method for inspecting printed circuit boards with through-holes
03/30/1993US5198760 Method by which to detect direction of current flow in outputs of integrated circuits
03/30/1993US5198759 Test apparatus and method for testing digital system
03/30/1993US5198758 Method and apparatus for complete functional testing of a complex signal path of a semiconductor chip
03/30/1993US5198757 Method and apparatus for testing semiconductor integrated circuit
03/30/1993US5198754 Testing apparatus for high frequency integrated circuit chip
03/30/1993US5198753 Integrated circuit test fixture and method
03/30/1993US5198752 Electric probing-test machine having a cooling system
03/30/1993US5198707 Integrated circuit with mode detection pin for tristate level detection
03/30/1993US5198672 Signal generator and method of generating signal voltages using the same
03/30/1993US5197326 Arrangement for monitoring rotational speed sensor
03/28/1993CA2076488A1 Continuous monitoring electrostatic discharge system
03/25/1993DE4221748A1 By=pass sampling path for integrated circuit contg. complex logic - has control and observation points, and selector data transfer path contg. or by=passing shift register with series latches
03/24/1993EP0533476A2 Semiconductor integrated circuit with scan patch
03/24/1993EP0533470A1 Socket for IC devices
03/24/1993EP0533422A1 Method for inspecting stripped condition of electric wire
03/24/1993EP0533269A2 Test structure for multi-layer, thin-film modules
03/24/1993EP0532616A1 Electronic circuitry for detecting leakage of chemical substance.
03/24/1993EP0532521A1 Process for testing devices.
03/24/1993CN2128744Y Test instrument for multicore cable
03/24/1993CN2128743Y Electric source protecting alarm for light welding machine
03/23/1993US5197105 Method of reading optical image of inspected surface and image reading system employabale therein
03/23/1993US5197070 Scan register and testing circuit using the same
03/23/1993US5196803 Apparatus and method for determining the voltage breakdown and conductivity of particulate material
03/23/1993US5196802 Method and apparatus for characterizing the quality of electrically thin semiconductor films
03/23/1993US5196788 Self-contained functional test apparatus for modular circuit cards
03/23/1993US5196787 Test circuit for screening parts
03/23/1993US5196786 Method for inspecting an electronic state of a surface of a semiconductor substrate and an apparatus therefor
03/23/1993US5196785 Tape automated bonding test apparatus for thermal, mechanical and electrical coupling
03/23/1993US5196779 Determining the need for charging a battery
03/23/1993US5195366 Testing apparatus for two or four cylinder engines
03/23/1993CA1315016C Cost-function directed search method for generating test for sequential logic circuits
03/18/1993WO1993005404A1 Advanced cable fault locator
03/18/1993WO1993000862A3 Electrosurgical apparatus for laparoscopic and like procedures
03/18/1993DE4230175A1 Testing and sorting device for electronic components, e.g. IC chips - simultaneously controls blocking pins for several channels of multi-channel component discharge system
03/18/1993DE4130430A1 Vehicle engine starter motor testing appts. - has hollow drive shaft with two-bearing block carrying drive gear wheel, and internal drive shaft carrying drive wheel on protruding end
03/18/1993DE4129542A1 Short-circuit indicator with time measurement for monitoring medium and high voltage lines - uses signalling unit with light beam to scan indicator unit showing time elapsed since short circuit detected
03/17/1993EP0532017A1 Functional avionic core tester
03/17/1993EP0531428A1 Test fixture alignment system.
03/17/1993EP0531323A1 Method and system for concurrent electronic component testing and lead verification
03/17/1993EP0523173A4 Apparatus and method for calorimetrically determining battery charge state
03/17/1993CN2128389Y Electric leakage equipment and " wire sequence " tester for building
03/17/1993CN1070073A Battery Voltage alarm apparatus
03/17/1993CN1020128C Portable device for detecting partial electrical discharge in live voltage distributio cable and/or equipment
03/16/1993US5195097 High speed tester
03/16/1993US5195095 Algorithm for identifying tests to perform for fault isolation
03/16/1993US5195007 Engine-driven power generating system
03/16/1993US5194932 Semiconductor integrated circuit device
03/16/1993US5194817 Apparatus and method for testing insulation using a pulsed resonant power supply
03/16/1993US5194816 Method and apparatus for locating electrical shorts between concealed conductive objects
03/14/1993WO1993006471A1 Apparatus for checking the contamination condition of electric insulators
03/14/1993CA2096129A1 Apparatus for checking the contamination condition of electric insulators
03/11/1993DE4130051A1 Short circuit fault locator for multilayer circuit board assembly - passes current through one conductor and measures voltage between internal point in this conductor and a connection to the second conductor
03/10/1993EP0531230A1 Electrical energy distributing device with monitoring of isolation
03/10/1993EP0531177A1 Method and apparatus for fault detection and repair of a data processing system
03/10/1993EP0530863A2 Method of starting up a subsystem in a distributed processing system
03/10/1993EP0530835A1 Testing circuit provided in digital logic circuits
03/10/1993CN1069821A 半导体存储器件应力状态的自动测试设备 Automatic Test Equipment semiconductor memory device stress state
03/09/1993US5193092 Integrated parity-based testing for integrated circuits
03/09/1993US5193067 Battery condition detecton apparatus
03/09/1993US5192983 Apparatus for and method of checking external appearance of soldering state
03/09/1993US5192913 Segmented charge limiting test algorithm for electrical components
03/09/1993US5192912 Apparatus for determining wiring orientation at electrical connectors including plural light indicators and rotary switch
03/09/1993US5192908 Semiconductor device testing apparatus with positioning mechanism
03/09/1993US5192907 Electronic module handling device for an automatic test apparatus
03/09/1993US5191956 Electronic method and circuit for analyzing analog signals
03/09/1993US5191708 Manufacturing method of a probe head for semiconductor LSI inspection apparatus
03/04/1993WO1993004523A1 Circuit and method for testing inverter drive logic switching patterns
03/04/1993WO1993004427A1 Interface between ic operational circuitry for coupling test signal from internal test matrix