Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
11/1993
11/09/1993US5260947 Boundary-scan test method and apparatus for diagnosing faults in a device under test
11/09/1993US5260779 Method and apparatus for inspecting a printed circuit board
11/09/1993US5260659 Method and apparatus for tracing conductors using an alternating signal having two components related in frequency and phase
11/09/1993US5260649 Powered testing of mixed conventional/boundary-scan logic
11/09/1993US5260648 Process and system for rapid analysis of the spectrum of a signal at one or several points of measuring
11/03/1993EP0568390A1 Battery charge monitoring
11/03/1993EP0568330A2 Method and apparatus for programmable integrated circuit diagnostics
11/03/1993EP0568294A2 Method for testing semiconductor integrated circuit
11/03/1993EP0568239A2 Built-in self-test network
11/03/1993EP0568132A2 Test generation by environment emulation
11/03/1993EP0363465B1 Test programme generation assisting apparatus for digital circuits
11/03/1993CN2145390Y Displayer for working state of storage battery
11/03/1993CN2145389Y No-touch-point key wire corrector for one chip machine
11/03/1993CN2145388Y Anti-steal electric remote detector
11/02/1993US5258985 Combinational data generator and analyzer for built-in self test
11/02/1993US5258706 Method for the recognition of testing errors in the test of microwirings
11/02/1993US5258705 Active matrix substrate inspecting device
11/02/1993US5258648 Composite flip chip semiconductor device with an interposer having test contacts formed along its periphery
11/02/1993US5258627 Semiconductor structure using protein as its active element
10/1993
10/28/1993DE4313594A1 Mikroprozessor Microprocessor
10/28/1993DE4243592A1 Paralleltestschaltung für Halbleiter-Speichervorrichtung Parallel test circuitry for semiconductor memory device
10/28/1993DE4130981C2 Verfahren zum Betrieb eines Zeitglieds A method for operating a timer
10/27/1993EP0566823A2 Tester calibration procedure which includes fixturing
10/27/1993EP0566805A1 Measuring probe for ignition circuit
10/27/1993EP0566604A1 Process for testing a store arranged on a semiconductor component as a macrocell on the self-testing principle and circuit for implementing said process.
10/26/1993US5257268 Cost-function directed search method for generating tests for sequential logic circuits
10/26/1993US5257267 Variable length scan string and cell for same
10/26/1993US5257223 Flip-flop circuit with controllable copying between slave and scan latches
10/26/1993US5257166 Configurable electronic circuit board adapter therefor, and designing method of electronic circuit using the same board
10/26/1993US5256977 High frequency surge tester methods and apparatus
10/26/1993US5256976 Power apparatus and method of location of a fault in a power apparatus on the basis of attenuation coefficients of electromagnetic coefficients of fault generated electromagnetic waves
10/26/1993US5256975 Manually-operated continuity/shorts test probe for bare interconnection packages
10/26/1993US5256973 Relay tester having a circuit to sense the voltage spihe caused by the armature movement
10/26/1993US5256968 Measurement of high-frequency electrical signals by electro-optical effect
10/26/1993US5256964 Tester calibration verification device
10/26/1993US5256963 Digital testing for high-impedance states in digital electronic circuits
10/26/1993US5256577 Process for determining the position of a p-n transition
10/26/1993US5256500 Battery having lifetime indicator
10/26/1993US5255554 Connecting circuit for an oxygen probe and method for checking for a correct probe connection
10/21/1993DE4311763A1 Process parameter adjusting in semiconductor prodn. - inputting several process parameters and calculating impurity concentration for semiconductor
10/21/1993DE4213271C1 Short-circuit testing of overhead line section for electric railway - increasing test voltage and monitoring current to provide short-circuit indication via threshold stage
10/21/1993DE4212890A1 Output characteristic test appts. for testing inductive or capacitive load control device - uses simulator having processor controlling components producing simulated load current
10/21/1993DE4212751A1 Measuring EM interference resistance of digital component assembly - converting noise parameter into binary output signal whose pulse width is extended and optically transferred to evaluation unit
10/20/1993EP0566386A1 Battery operated computer
10/20/1993EP0566264A1 Battery operated computer having improved battery gauge and system for measuring battery charge
10/20/1993EP0565866A2 Large-scale integrated circuit device
10/20/1993EP0565656A1 Ac/dc converter fault detector
10/20/1993CN2144313Y Monitor for insulativity of earth-free AC low-voltage network to earth
10/20/1993CN2144312Y Multifunctional miniature electric tool
10/20/1993CN1077552A Computer universal detection control apparatus
10/20/1993CN1077424A Method for expressing rest capacity of battery used in electrically driven vehicle
10/19/1993US5255381 Mode switching for a memory system with diagnostic scan
10/19/1993US5255271 Integrated circuit internal test mode indicator circuit
10/19/1993US5255230 Method and apparatus for testing the continuity of static random access memory cells
10/19/1993US5255229 Dynamic random access memory including stress test circuitry
10/19/1993US5255208 On-line processor based diagnostic system
10/19/1993US5254996 Charge monitoring system for a remote control system
10/19/1993US5254954 Defect detecting apparatus and method for detecting a defect in an insulator using an electric discharge sense by an optical pickup
10/19/1993US5254953 Identification of pin-open faults by capacitive coupling through the integrated circuit package
10/19/1993US5254952 Automatic battery and charging system tester with motor-driven carbon pile loading
10/19/1993US5254951 Circuit for measuring discharging and charging current of a battery providing offset/drift voltage for correcting amplifier output
10/19/1993US5254943 Integrated circuit device with a test circuit for a main circuit
10/19/1993US5254942 Single chip IC tester architecture
10/19/1993US5254941 Structure and method for determining isolation of integrated circuit
10/19/1993US5254939 For testing semiconductor wafers
10/19/1993US5254928 Power management system for battery powered computers
10/19/1993US5254839 Oven for burning in electronics modules
10/19/1993CA1323453C Automated laminography system for inspection of electronics
10/19/1993CA1323398C Method and apparatus for providing thermal protection for large motors based on accurate calculations of slip dependent rotor resistance
10/14/1993WO1993020523A1 Designing and evaluating filters for suppressing undesired signals
10/14/1993WO1993020457A1 Ic testing device
10/14/1993WO1993020456A1 Process for testing terminal resistances in ecl networks
10/14/1993WO1993020426A1 Automotive diagnostic testing apparatus
10/14/1993DE4310619A1 Detecting reduction in degree of vacuum of vacuum switching valve - determining discharge current caused by bulge, e.g. in protective shield, whilst holding shield at same potential as electrodes
10/13/1993EP0565405A1 Simulator for thermic cell
10/13/1993EP0565326A2 Electrical fault detector
10/13/1993EP0565156A2 Voltage burn-in scheme for BICMOS circuits
10/13/1993EP0565080A2 Inspection device for inspecting continuity of terminal in a connector
10/13/1993EP0565079A1 Semiconductor device including voltage stress test shunting circuit
10/13/1993EP0564865A1 Semiconductor device with test-only contacts and method for making the same
10/13/1993CN1022450C Line breakdown detecting instrument
10/13/1993CN1022397C Conveyor system and conveying method thereof
10/12/1993US5253209 Integrated semiconductor memory
10/12/1993US5253188 Built-in system for antenna calibration, performance monitoring and fault isolation of phased array antenna using signal injections and RF switches
10/12/1993US5253180 Apparatus and method for diagnosis of power appliances
10/12/1993US5252936 Reed relay and switch matrix device using the same
10/12/1993US5252927 Device for monitoring corona discharge in a dynamoelectric machine with detection probe movable in longitudinal and circumferential direction
10/12/1993US5252926 Apparatus and method for distinguishing between faults due to alternator failure and interruption of stator phase signals in automotive battery charging systems
10/12/1993US5252917 Scanning circuit apparatus for test
10/12/1993US5252915 Method and apparatus for detecting stator faults in rotary dynamoelectric machines
10/12/1993US5252914 Radio communication transceiver
10/12/1993US5252507 Very high density wafer scale device architecture
10/11/1993CA2065811A1 Method and apparatus for measuring dielectric properties of materials
10/08/1993CA2093473A1 Electrical fault detector
10/07/1993DE4302223A1 Semiconductor flash EPROM used as one-time programmable ROM if cells excessively erased - has information memory indicating if cell has been classified as over-erased by energy beam or not during testing
10/07/1993DE4211548A1 Two=dimensional testing of current distribution in printed circuit board - using array of magnetoresistive sensors, each having screening part shaped to define detection depth
10/07/1993DE4210914A1 Measuring system for investigating semiconductor material using SAW - has piezoelectric delay line with gate for coupling adjustable pulsating DC field and interdigitated input=output transducers and two-channel detector for evaluating orthogonal components.
10/07/1993DE4210797A1 Signal line monitoring for vehicle speed pulse signal - delivering pulse from microprocessor via transistor and resistor having lower resistance than internal resistance of tachograph transmitter during absence of pulse signal from tachograph.
10/06/1993EP0564280A2 Circuit for generating an internal source voltage
10/06/1993EP0563829A2 Device for inspecting printed cream solder
1 ... 1406 1407 1408 1409 1410 1411 1412 1413 1414 1415 1416 1417 1418 1419 1420 1421 1422 1423 1424 1425 1426 ... 1523