Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/1993
09/07/1993US5243303 Pseudo-random noise signal generator
09/07/1993US5243296 Method and apparatus for checking operation of solenoid
09/07/1993US5243294 Methods of and apparatus for detecting the character and location of anomalies along a conductive member using pulse propagation
09/07/1993US5243293 System utilizing optical current sensors for detecting fault location in substation
09/07/1993US5243291 Electromagnetic contactor deposition detecting apparatus which detects load current and switch current
09/07/1993US5243274 For testing a device under test
09/07/1993US5243273 General purpose, reconfigurable system for processing serial bit streams
09/07/1993US5243243 Electric motor insulation resistance fault monitor
09/07/1993US5243227 Fine/coarse wired-or tapped delay line
09/07/1993US5241870 Test head manipulator
09/07/1993CA1322036C Diagnosis arrangement for vehicle engine controller
09/03/1993CA2090654A1 Programmable timing circuit for integrated circuit device with test access port
09/02/1993WO1993017351A1 Detection of location of faults in cables
09/02/1993WO1993017345A1 Method and apparatus for electronic meter testing
09/02/1993DE4306081A1 Automatic warning appts. for breakage in cable - detects if abnormal condition exists in cable and then automatically switches over to spare cable and continues transmission if no further abnormal condition is detected
09/02/1993DE4225595C1 Cable segment test method for locating resistance variations in local area network - supplying measuring pulses and evaluating reflected pulses using analogue=to=digital converter and two separate channels, with memory storing values
09/01/1993EP0558231A2 Device for testing a plurality of functional blocks in a semiconductor integrated circuit
09/01/1993EP0558190A1 Electromagnetic contactor with condition sensing
09/01/1993EP0558177A1 Energy resolved emission microscopy system and method
09/01/1993EP0557628A1 Circuit testing system
09/01/1993EP0557488A1 Apparatus for checking the contamination condition of electric insulators.
09/01/1993EP0437423B1 Dc/dc converter
09/01/1993EP0311671B1 Identity insert for electronic modules
09/01/1993CN2141571Y Display device for short circuit
08/1993
08/31/1993US5241550 System for accurately confirming cross-connection in a cross-connection network
08/31/1993US5241444 Adaptive trip fault current indicator
08/31/1993US5241277 Test system for automatic testing of insulation resistance, capacitance and attenuation of each contact pair in a filter pin connector
08/31/1993US5241275 Method of measuring remaining capacity of a storage cell by comparing impedance plot characteristics
08/31/1993US5241269 Apparatus and method for measuring hysteresis characteristics in a high frequency range
08/31/1993US5241266 Built-in test circuit connection for wafer level burnin and testing of individual dies
08/31/1993US5241265 Logic function circuit with an array of data stores and their circuit testing
08/31/1993US5241264 IC test apparatus
08/31/1993US5239747 Method of forming integrated circuit devices
08/26/1993DE4305677A1 Test circuit, esp. for LSI circuits - has clock, test data and test control inputs, and is connected between two circuit stages
08/25/1993EP0557227A2 Method and apparatus for inspecting a printed circuit board
08/25/1993EP0557136A2 System for measuring misregistration
08/25/1993EP0556894A1 A method for testing an integrated circuitry and an integrated circuit having a plurality of functional components and having junction/switch test components in interconnecting channels between functional components
08/25/1993EP0556826A2 Microprocessor with self-diagnostic test function
08/25/1993CN2141086Y Magnetic probe insulator detector
08/25/1993CN2141085Y Acoustooptic instrument for measuring voltage
08/25/1993CN1075553A Comparing-type instrument for mesuring elements of circuit
08/25/1993CN1021928C Instrument with electronic brain for mechanical property of asynchronous motor
08/24/1993US5239536 Loop test system in an integrated circuit
08/24/1993US5239485 System and method for determining the revision history of printed circuit boards
08/24/1993US5239441 Underground power line fault locating system
08/24/1993US5239286 Battery alarm system
08/24/1993US5239270 Wafer level reliability contact test structure and method
08/24/1993US5239262 Integrated circuit chip with built-in self-test for logic fault detection
08/24/1993US5239261 Probe apparatus for testing electronic circuits immersed in a liquid cryogen
08/24/1993US5239191 Semiconductor wafer
08/24/1993US5237836 Fiber mat cryogenic cooling
08/24/1993CA1321484C Method of characterizing bistable semiconductor lasers
08/19/1993WO1993016433A1 Hardware emulation accelerator and method
08/19/1993DE4303739A1 Line section test equipment for railway electric power supply system
08/19/1993DE4204911A1 Line section test equipment for railway electric power supply system
08/19/1993DE4204910A1 Line testing unit for DC railway installations for short circuit protection - has three=phase transformer connected to supply system of DC sub station and operates prim. winding using open star point with test rectifier connected to free ends
08/18/1993EP0555946A2 Line testing device for traction current systems, especially standard gauge railway systems
08/18/1993EP0555538A2 Connecteur test means
08/18/1993EP0555530A2 Device for testing a connector and cable assembly
08/18/1993EP0464021B1 Measuring device with auxiliary electrode for a gas-insulated, encased high-voltage installation
08/18/1993EP0457809B1 Conductor tracing system
08/18/1993CN2140528Y Insulator and electrical connector on-line detector
08/18/1993CN2140525Y Multifunctional acoustooptic low voltage test pencil
08/18/1993CN1075365A Method for measurement of resistive current first harmonics of gapless metal oxide lightning arrester and its apparatus
08/17/1993US5237282 Computer controlled measurement and switching circuit for cable testing
08/17/1993US5237267 Wafer probe station having auxiliary chucks
08/17/1993US5237266 Process and apparatus for determining the carrier concentration in semiconductors
08/17/1993US5237219 Methods and apparatus for programming cellular programmable logic integrated circuits
08/17/1993US5236076 Apparatus for automatically unloading device in handler
08/17/1993CA2016528C Battery system
08/12/1993DE4203757A1 Testing vacuum of enclosed switchgear - measuring emission current or detecting x=ray radiation before and after capacitive arc discharge
08/11/1993EP0555133A1 Method for evaluating semiconductor wafers and a device carrying out the same
08/11/1993EP0555012A2 Method for monitoring battery discharge
08/11/1993EP0554622A2 Apparatus and method for testing bare dies
08/11/1993EP0554403A1 Method and apparatus for measuring minority carrier concentration in semiconductor materials.
08/11/1993EP0515577A4 Making and testing an integrated circuit using high density probe points
08/11/1993EP0428663B1 Process and device for rapid spectral analysis of a signal at one or more measurement points
08/11/1993EP0346404B1 Process for determining the energy content of an electrochemical storage battery
08/11/1993CN2140066Y Multifunction voltage indicator for automobile storage battery
08/11/1993CN2140065Y Hall light signal and electrical equipment load monitor
08/11/1993CA2080239A1 Method of measuring junction temperature
08/10/1993US5235600 Scannable system with addressable clock suppress elements
08/10/1993US5235566 Clock skew measurement technique
08/10/1993US5235527 Method for diagnosing abnormality of sensor
08/10/1993US5235273 Apparatus for setting pin driver/sensor reference voltage level
08/10/1993US5235271 System and method for testing manufactured lots of electronic devices
08/05/1993WO1993015412A1 Battery charge monitor and fuel gauge
08/05/1993WO1993015411A1 Method for predicting shortcircuit and apparatus therefor
08/05/1993DE4302509A1 Testing characteristics of high density circuit board - using matrix of test electrodes identical to board electrodes with precision alignment to obtain maximum inter-electrode conductivity
08/05/1993DE4203467A1 Monitor for single earth faults on insulated electric traction system - has artificial earth point and bridge connected detector circuit with fault indication via independent DC source
08/05/1993DE4202655A1 Test instrument for single and three=phase equipment - has phase selection switching, earth continuity and conductivity verification and phase sequence indication
08/05/1993CA2106672A1 Battery charge monitor and fuel gauge
08/04/1993EP0554118A2 Testing integrated circuits
08/04/1993EP0554021A2 Circuits for use in the detection and location of a fault or faults in a device under test
08/04/1993EP0553472A2 Process and appliance for testing an apparatus which comprises at least one microprocessor
08/04/1993EP0553451A2 Process and means for monitoring the functioning of inductances
08/04/1993EP0553080A1 High speed tester and method of providing successive loops of data signals at a predetermined clock rate.
08/04/1993EP0374224B1 Portable identifier apparatus for communication cables
08/04/1993CA2084154A1 Method for monitoring battery discharge
08/03/1993US5233637 System for generating an analog regulating voltage