| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/03/1993 | US5233612 Test device for an electronic chip |
| 08/03/1993 | US5233538 Waveform capturing arrangement in a distributed power network |
| 08/03/1993 | US5233496 Electronic equipment incorporating an integrated btl circuit |
| 08/03/1993 | US5233307 Process and apparatus for the qualification of a capacitive system |
| 08/03/1993 | US5233305 Partial discharge detecting device for resin-molded transformer |
| 08/03/1993 | US5233291 Method of and apparatus for measuring electric characteristics of semiconductor wafer |
| 08/03/1993 | US5233290 Switch probe |
| 08/03/1993 | US5233191 Method and apparatus of inspecting foreign matters during mass production start-up and mass production line in semiconductor production process |
| 08/03/1993 | US5233161 Method for self regulating CMOS digital microcircuit burn-in without ovens |
| 08/03/1993 | US5231885 Method for checking multilayer printed wiring board |
| 07/28/1993 | EP0553001A1 Method and system for test of function and/or for the presence of elements connected in parallel |
| 07/28/1993 | EP0552991A2 Method and apparatus for detecting stator faults in rotary dynamoelectric machines |
| 07/28/1993 | EP0552910A1 Socket |
| 07/28/1993 | EP0552895A2 Method for improving performance in an automated test system |
| 07/28/1993 | EP0552532A2 A method of testing printed circuit boards |
| 07/28/1993 | CN2139270Y Apparatus for testing residual capacity of batteries |
| 07/27/1993 | US5231637 Apparatus for testing a PLA by measuring a current consumed by the PLO when activated with known codes |
| 07/27/1993 | US5231598 Direct digital synthesis measurement signal skew tester |
| 07/27/1993 | US5231357 Apparatus for testing a wire harness and method of use |
| 07/27/1993 | US5231356 Flexible battery tester with a variable length resistive heater |
| 07/27/1993 | US5231350 Method and apparatus for potential measurement on conductive tracks of a program-controlled integrated circuit |
| 07/27/1993 | US5231348 Method and apparatus for testing dynamoelectric machine rotors |
| 07/27/1993 | US5231345 Semiconductor integrated circuit device having a test circuit |
| 07/27/1993 | US5231314 Programmable timing circuit for integrated circuit device with test access port |
| 07/27/1993 | US5230632 Dual element electrical contact and connector assembly utilizing same |
| 07/27/1993 | CA1320755C Control method and device for a contactor-using facility |
| 07/27/1993 | CA1320754C Contacting apparatus control method and device |
| 07/25/1993 | CA2087688A1 Method and system for testing the operation and/or the presence of parallel connected elements |
| 07/22/1993 | WO1993014412A1 Waveform shaping circuit for semiconductor testing device |
| 07/22/1993 | WO1993014411A1 Method and apparatus for non-destructive testing electric insulation by measuring its voltage response signal |
| 07/22/1993 | WO1993014410A1 Method for determining the short-circuit inductance of an asynchronous machine |
| 07/22/1993 | DE4202113A1 Fault detection device - contains X=ray unit and digitised image memory, compares digitised images with reference images and controls light signal on screen to show fault location |
| 07/22/1993 | DE4201182A1 Test arrangement for electric strength of electric choke annular core insulation - contains two sprung bronze wire contact units forced against the inner and=or outer test object edges |
| 07/22/1993 | DE4143327A1 Fault detection device - contains X=ray unit and digitised image memory, compares digitised images with reference images and controls light signal on screen to show fault location |
| 07/21/1993 | EP0552048A2 A system for measuring timing relationship between two signals |
| 07/21/1993 | EP0552036A1 A probing apparatus having an automatic probe card installation mechanism and a semiconductor wafer testing system including the same |
| 07/21/1993 | EP0551648A2 Method of, system and board for testing an electronic equipment, particularly a telecommunication equipment |
| 07/21/1993 | EP0551631A2 Functional redundancy control system |
| 07/21/1993 | EP0551564A2 Non-contact test probe |
| 07/21/1993 | EP0551337A1 Monitoring gas insulated substations |
| 07/21/1993 | CN2138797Y Fast line correcting box |
| 07/21/1993 | CN1074562A Method of eliminating capacitive earth current for small current earthing system |
| 07/20/1993 | US5230001 Method for testing a sequential circuit by splicing test vectors into sequential test pattern |
| 07/20/1993 | US5230000 Built-in self-test (bist) circuit |
| 07/20/1993 | US5229999 Method and apparatus for integrity testing of fault monitoring logic |
| 07/20/1993 | US5229725 Electrical fault detector in remote systems using a saturable core |
| 07/20/1993 | US5229704 Current supply arrangement |
| 07/20/1993 | US5229651 Method and apparatus for line power monitoring for uninterruptible power supplies |
| 07/20/1993 | US5229304 Evaluating the reflective spectrum of doped wafer |
| 07/20/1993 | CA1320546C Electrical connectors and ic chip tester embodying same |
| 07/15/1993 | DE4200404A1 Electrical testing arrangement, pref. for circuit boards, - has deflectable laser beam for changing conducting state of semiconducting contact arrangement |
| 07/14/1993 | EP0551199A2 Electrical insulation and continuity tester |
| 07/14/1993 | EP0550432A1 Improved interconnection structure and test method. |
| 07/14/1993 | EP0376967B1 Battery state of charge indicator |
| 07/14/1993 | EP0287303B1 Scan test apparatus for digital systems having dynamic random access memory |
| 07/14/1993 | CN2138303Y Unit of LED tester |
| 07/13/1993 | US5228139 Semiconductor integrated circuit device with test mode for testing CPU using external signal |
| 07/13/1993 | US5228072 Multiwire-pair telecommunications test system |
| 07/13/1993 | US5228045 Test driver for connecting a standard test port integrated circuit chip to a controlling computer |
| 07/13/1993 | US5228040 Testable implementations of finite state machines and methods for producing them |
| 07/13/1993 | US5227984 Instrument with continuity capture feature |
| 07/13/1993 | US5227766 Abnormality detecting system |
| 07/13/1993 | US5227729 Fusion detecting system for relays |
| 07/13/1993 | US5227717 Contact assembly for automatic test handler |
| 07/13/1993 | US5227259 Means for determining condition of cells in a battery network and alterning electrical connections between cells in response to signals from determining means |
| 07/13/1993 | US5226827 Test connector |
| 07/13/1993 | CA1320291C Remote testing of metallic loops with a trans hybrid signal |
| 07/08/1993 | WO1993013582A1 Flashover between power lines suspended in parallel |
| 07/08/1993 | WO1993013568A1 Device for improving the current output of a chargeable battery at low outside temperatures |
| 07/08/1993 | WO1993013431A1 System for detecting the condition of ignition assemblies |
| 07/08/1993 | DE4244431A1 Ribbon or parallel cable test appts. - connects alternate plug connections at each end of cable, and includes battery, resistor and LED |
| 07/08/1993 | CA2127092A1 System for detecting the condition of ignition assemblies |
| 07/08/1993 | CA2126321A1 Device for improving the current output of a chargeable battery at low outside temperatures |
| 07/07/1993 | EP0550403A2 Apparatus for assessing insulation conditions |
| 07/07/1993 | EP0550389A1 A device for detecting the condition of batteries, particularly on board motor vehicles |
| 07/07/1993 | EP0550263A2 Diagnostic adaptor module for a domestic appliance |
| 07/07/1993 | EP0550135A2 Powered testing of mixed conventional/Boundary-Scan Logic |
| 07/07/1993 | EP0549949A2 Built-in self test circuit |
| 07/07/1993 | EP0549718A1 Apparatus and methods for simulating electromagnetic environments |
| 07/07/1993 | CN1074043A Numerical megger |
| 07/06/1993 | US5226048 At-speed testing of core logic |
| 07/06/1993 | US5225891 Wire bonding external appearance inspecting apparatus |
| 07/06/1993 | US5225834 Semiconductor integrated circuit boundary scan test with multiplexed node selection |
| 07/06/1993 | US5225815 Monitor for a polyphase rectifier which detects open diodes by sensing a signal below a predetermined threshold |
| 07/06/1993 | US5225814 Device for detecting defective core wires of a multi-core cable |
| 07/06/1993 | US5225775 Ic testing device for permitting adjustment of timing of a test signal |
| 07/06/1993 | US5225774 Semiconductor integrated circuit |
| 07/06/1993 | US5225772 Automatic test equipment system using pin slice architecture |
| 07/06/1993 | US5225771 Making and testing an integrated circuit using high density probe points |
| 07/06/1993 | US5225724 Operational analysis device of the scan path type having a single scanning clock and a single output phase for an integrated circuit |
| 07/06/1993 | CA1319951C Automatic charger capable of charging several batteries |
| 07/06/1993 | CA1319949C Method and apparatus for controlling the magnetic flux of an induction motor |
| 07/04/1993 | CA2086469A1 Diagnostic adaptor module for a domestic appliance |
| 07/01/1993 | DE4239443A1 Electron beam appts. for testing IC logic circuit - contains remote focus beam generator, beam gate, deflection unit, magnetic lens and secondary electron detector |
| 07/01/1993 | DE4142775A1 Operating series-connected logic chain timing element in IC - involves converting timing element to shift register, and evaluating predefined pulse sequence |
| 06/30/1993 | EP0549464A1 Method and apparatus for measuring the state of charge of an electrochemical generator |
| 06/30/1993 | EP0549240A2 Socket |
| 06/30/1993 | EP0549130A2 Partial-scan built-in self-test technique |
| 06/30/1993 | EP0548817A2 Process and apparatus for insulation testing of insulated electrical conductors, and for measurements of the length of insulation faults |
| 06/30/1993 | EP0548585A2 Clocking mechanism for delay, short path and stuck-at testing |