| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/30/1993 | EP0548279A1 Functional at speed test system for integrated circuits on undiced wafers |
| 06/30/1993 | EP0548266A1 Electronic tester for assessing battery/cell capacity |
| 06/30/1993 | CN2137362Y Multifunctional detecting probe |
| 06/29/1993 | US5224107 Method in a parallel test apparatus for semiconductor memories |
| 06/29/1993 | US5224103 Processing device and method of programming such a processing device |
| 06/29/1993 | US5224054 Waveform capturing arrangement in distributed power network |
| 06/29/1993 | US5223830 Sensor circuit |
| 06/29/1993 | US5223821 Triac power switching and testing system |
| 06/29/1993 | US5223795 Method and apparatus for detecting arcing in electrical connections by monitoring high frequency noise |
| 06/29/1993 | US5223792 Testability architecture and techniques for programmable interconnect architecture |
| 06/29/1993 | US5223788 Functional avionic core tester |
| 06/29/1993 | US5223786 Burn-in device |
| 06/29/1993 | US5223748 Battery manager |
| 06/29/1993 | US5223682 Arc-detecting circuit breaker |
| 06/29/1993 | US5223003 Process for preparing a battery tester label |
| 06/29/1993 | US5222999 Liquified nitrogen thermal checking of electronic circuitry |
| 06/28/1993 | CA2086306A1 Process for measuring the state of charge of an electrochemical generator and device for implementing said process |
| 06/24/1993 | WO1993012488A1 Measurement analysis software system and method |
| 06/24/1993 | WO1993012438A1 Improved carrier for testing circuit boards |
| 06/24/1993 | DE4301420A1 Contact arrangement for wafer prober - has silicon base body with silicon tongues carrying metallised silicon contacting elements |
| 06/24/1993 | DE4243611A1 Test mode circuit for data memory - has data entered and read out from data memory cells inverted during test mode to detect cross interference |
| 06/24/1993 | DE4141933A1 Testing quality of electrically non-conducting protection on electrically conducting bases - involves applying AC test voltage and measuring current via test electrolyte on protective material |
| 06/24/1993 | DE4141798A1 Cold test assembly for automotive electronic components - has wind tunnel connected to both ends of cold tunnel, with cooling agent injected into cold tunnel |
| 06/23/1993 | EP0547899A1 Indication of abnormal states of a video camera or a video tape recorder |
| 06/23/1993 | EP0547693A2 Circuit arrangement comprising an end-of-life detector |
| 06/23/1993 | EP0547682A2 Memory testing system with algorithmic test data generation |
| 06/23/1993 | EP0547251A1 A method for testing a micro circuit |
| 06/23/1993 | EP0292136B1 Method and process for testing the reliability of integrated circuit (ic) chips and novel ic circuitry for accomplishing same |
| 06/23/1993 | CN2136986Y Detecting meter for regulator of alternating-current generator |
| 06/23/1993 | CN2136985Y Fast pairing device for multicore cable |
| 06/23/1993 | CN1073530A Tester of reverse second breakdown voltage for transistor |
| 06/22/1993 | US5222068 Processor circuit |
| 06/22/1993 | US5222066 Modular self-test for embedded SRAMS |
| 06/22/1993 | US5222030 Methodology for deriving executable low-level structural descriptions and valid physical implementations of circuits and systems from high-level semantic specifications and descriptions thereof |
| 06/22/1993 | US5221967 Signal quality monitoring system |
| 06/22/1993 | US5221905 Test system with reduced test contact interface resistance |
| 06/22/1993 | US5221865 Programmable input/output buffer circuit with test capability |
| 06/17/1993 | DE4240927A1 Testing-measuring unit for electrical component for device under test - has selector for connecting fault correction circuit and signal analysis/prodn. circuit and expansion bus. |
| 06/17/1993 | DE4232277A1 Non-contact semiconductor wafer height measuring appts. for circuit testing system - has platform for carrying semiconductor wafer and platform driving system for driving platform in determined direction and distance measuring unit |
| 06/16/1993 | EP0546678A1 Synthetic test circuits for short-circuit testing of high-voltage alternating current circuit-breakers, and triggered spark gaps for use in such circuits |
| 06/16/1993 | EP0546569A1 A method and device for representing a residual capacity of a battery |
| 06/16/1993 | EP0457769B1 Process for producing test patterns for a component |
| 06/16/1993 | CN2136481Y External arc-extinguishing protector for direct resistance metering of transformer |
| 06/16/1993 | CN2136480Y Wire bundle check, short circuit and break detector for polycore cable |
| 06/16/1993 | CN2136479Y Loss-of-phase accumulation timing counter |
| 06/16/1993 | CN2136478Y 多功能验电器 Multifunctional electroscope |
| 06/16/1993 | CN2136477Y Line break monitor |
| 06/16/1993 | CN2136473Y Clamp-on tester |
| 06/15/1993 | US5220519 Method and apparatus for self-testing a transducer system |
| 06/15/1993 | US5220512 System for simultaneous, interactive presentation of electronic circuit diagrams and simulation data |
| 06/15/1993 | US5220311 Direction indicating fault indicators |
| 06/15/1993 | US5220285 System for testing the electrical continuity and insulation of the electrical conductors of a portion of wiring |
| 06/15/1993 | US5220281 Boundary scan cell for bi-directional input/output terminals |
| 06/15/1993 | US5220280 Method and an apparatus for testing the assembly of a plurality of electrical components on a substrate |
| 06/15/1993 | US5220278 Fixing card for use with high frequency |
| 06/15/1993 | US5220277 Arrangement for testing semiconductor wafers or the like |
| 06/15/1993 | US5220217 Circuit for the generation of a scanning clock in an operational anaylsis device of the serial type for an integrated circuit |
| 06/15/1993 | US5218860 Automatic motor testing method and apparatus |
| 06/15/1993 | CA1319205C2 Modular integrated circuit device |
| 06/15/1993 | CA1319204C2 Universal integrated circuit module |
| 06/15/1993 | CA1319203C2 Method of building a variety of complex integrated circuits from standardizable components |
| 06/15/1993 | CA1319202C2 Method of testing integrated circuit device |
| 06/14/1993 | CA2083419A1 Synthetic test circuits for short-circuit testing of high-voltage alternating current circuit-breakers, and triggered spark gaps for use in such circuits |
| 06/10/1993 | WO1993011565A1 Semiconductor structure using protein as its active element |
| 06/10/1993 | WO1993011488A1 A rom with ram cell and cyclic redundancy check circuit |
| 06/10/1993 | WO1993011487A1 Preprogramming testing in a field programmable gate array |
| 06/10/1993 | WO1993011440A1 Process and device for the optical determination of charge carrier density variations in semiconductor components |
| 06/10/1993 | WO1993011409A1 Method and apparatus for positioning and biasing an electro-optic modulator of an electro-optic imaging system |
| 06/09/1993 | EP0545286A2 Built-in test circuitry providing simple and accurate AC test of digital microcircuits with low bandwidth test equipment and probe stations |
| 06/09/1993 | EP0545070A1 Membrane probe contact bump compliancy system |
| 06/09/1993 | EP0545042A1 Dual output battery with fault detect |
| 06/09/1993 | EP0544957A1 Apparatus for inspecting internal circuit of semiconductor device |
| 06/09/1993 | EP0484341A4 A power supply |
| 06/09/1993 | DE4240543A1 Data transfer circuit for integrated circuit test appts. - has masking circuit between test system and hardware to maintain transfer with different clock rates |
| 06/09/1993 | CN2135774Y Contactless tester for motor rotator temp. and trouble |
| 06/09/1993 | CN1073040A Device to determine state of equipment, especially on-off state of electric equipment, by means of auxiliary contact |
| 06/09/1993 | CN1021167C Checkout device for fault current protective switch |
| 06/09/1993 | CN1021136C Method and apparatus for locating abnormality in gas-insulated electric device |
| 06/08/1993 | US5218433 Real time scanning device signal processing circuit including color signal and blanking signal generating circuits |
| 06/08/1993 | US5218406 Memory card features |
| 06/08/1993 | US5218307 Fault detection circuit and method for testing a multiple conductor cable having a shield |
| 06/08/1993 | US5218294 Contactless test method for testing printed circuit boards |
| 06/08/1993 | US5218292 Apparatus for inspecting internal circuit of semiconductor device |
| 06/08/1993 | US5218211 System for sampling the sizes, geometrical distribution, and frequency of small particles accumulating on a solid surface |
| 06/08/1993 | US5217907 Array spreading resistance probe (ASRP) method for profile extraction from semiconductor chips of cellular construction |
| 06/08/1993 | US5217383 Plug contact arrangement |
| 06/08/1993 | US5217120 Apparatus for loading and unloading sleeves for integrated circuit ester |
| 06/04/1993 | WO1993011610A1 Method and apparatus for monitoring operating characteristics of semiconductor electric power switching circuits |
| 06/04/1993 | CA2099671A1 Method and apparatus for monitoring operating characteristics of semiconductor electric power switching circuits |
| 06/03/1993 | DE4139438A1 Verfahren zur optischen bestimmung von ladungstraegerdichteunterschieden in halbleiterbauelementen und anordnung zu dessen durchfuehrung A method for optical determination of ladungstraegerdichteunterschieden in semiconductor devices and arrangement for its implementation |
| 06/03/1993 | DE4138901A1 Testing analogue circuit parts in digital video recording-reproducing appts. - feeding synthesised video signal to D=A converter and comparing reproduced signals with reference |
| 06/02/1993 | EP0544646A2 Apparatus for assessing insulation conditions |
| 06/02/1993 | EP0544566A1 Source monitoring module for battery monitoring unit and battery equipped with the same |
| 06/02/1993 | EP0544548A1 A sparkplug voltage probe device in an internal combustion engine |
| 06/02/1993 | EP0544121A1 A device for measuring the internal resistance of batteries, particularly of motor vehicles |
| 06/02/1993 | EP0544042A1 High voltage insulator testing system |
| 06/02/1993 | EP0543916A1 Reusable test unit for simulating electromechemical sensor signals for quality assurance of portable blood analyzer instruments |
| 06/02/1993 | EP0543851A1 Battery with charge indicator. |
| 06/02/1993 | CN2135156Y Test pencil for electrician on automotive vehicle |
| 06/01/1993 | US5216678 Test method for a semiconductor memory device applied to a margin test |