| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/27/1993 | EP0524837A1 System for inspecting electrically conductive pattern |
| 01/27/1993 | EP0524377A1 Accumulator battery with control device in an intercell connector |
| 01/26/1993 | US5182717 Device for testing a network of components, in particular an electronic circuit |
| 01/26/1993 | US5182518 Inverter and battery testing for uninterruptible power systems |
| 01/26/1993 | US5182421 Printed wiring board with test pattern for through holes |
| 01/26/1993 | CA1313223C Electro-optic measurements of voltage waveforms on electrical conductors |
| 01/26/1993 | CA1313222C Identity insert for electronic modules |
| 01/21/1993 | WO1993000862A2 Electrosurgical apparatus for laparoscopic and like procedures |
| 01/21/1993 | DE4223658A1 Test appts. for semiconductor chips with relatively many connectors - uses tape automated bonding band with adhesive surface for connecting lines to test card and dendritically grown metal test points |
| 01/21/1993 | DE4223454A1 Digital signal processor with direct memory access controller - performs different transfers of data according to relationship of input-output period to task processing time |
| 01/21/1993 | DE4223127A1 Test state switching on circuit for memory testing - has level detector, Schmitt trigger, flip=flop and latch, and switches output between reference and operating voltage |
| 01/21/1993 | DE4123676A1 Partial discharge HV cable defect locator - has digital storage oscilloscope and computer with HV AC supply and coupling sections |
| 01/20/1993 | EP0524015A2 Socket |
| 01/20/1993 | EP0523973A2 A configurable self-test for embedded RAMs |
| 01/20/1993 | EP0523953A1 Digital testing techniques for very high frequency phase-locked loops |
| 01/20/1993 | EP0523901A1 Battery with integral condition tester |
| 01/20/1993 | EP0523817A2 Improved programmable logic device |
| 01/20/1993 | EP0523736A1 Burn-in apparatus and method |
| 01/20/1993 | EP0523735A1 Burn-in apparatus and method |
| 01/20/1993 | EP0523734A1 Burn-in apparatus and method |
| 01/20/1993 | EP0523729A1 Burn-in apparatus and method |
| 01/20/1993 | EP0523594A1 Method for testing substrater for liquid crystal displays (LCD) using a corpuscular beam |
| 01/20/1993 | EP0523526A2 Monitoring device for accumulators |
| 01/20/1993 | EP0523173A1 Apparatus and method for calorimetrically determining battery charge state |
| 01/20/1993 | CA2073916A1 Burn-in apparatus and method |
| 01/20/1993 | CA2073899A1 Burn-in apparatus and method |
| 01/20/1993 | CA2073896A1 Burn-in apparatus and method |
| 01/20/1993 | CA2073886A1 Burn-in apparatus and method |
| 01/20/1993 | CA2047111A1 Circuit tester |
| 01/19/1993 | US5181203 Testable power-on-reset circuit |
| 01/19/1993 | US5181191 Built-in test circuitry providing simple and accurate AC test of digital microcircuits with low bandwidth test equipment and probe stations |
| 01/19/1993 | US5180983 Ignition plug for an internal combustion engine provided with an ionization current detector electrode |
| 01/19/1993 | US5180977 Membrane probe contact bump compliancy system |
| 01/19/1993 | US5180976 Integrated circuit carrier having built-in circuit verification |
| 01/19/1993 | US5180975 Positioning device and IC conveyor utilizing the same |
| 01/19/1993 | US5180974 Semiconductor testing and shipping system |
| 01/14/1993 | DE4122635A1 Einrichtung zur defekterkennung bei sensoren Means for defect detection in sensors |
| 01/14/1993 | DE4122183A1 Triac testing device for water heater - uses voltage supply, changeover device and indicator LEDs to direct triacs which are not blocking |
| 01/14/1993 | DE4121710A1 Error locating appts. detecting circuit board connections requiring correction - has soldering iron with reflective probe and having heat detected by IR camera monitoring location |
| 01/13/1993 | EP0522907A1 Control of a heated window |
| 01/13/1993 | EP0522614A1 Method of determining an electrical spectrum |
| 01/13/1993 | EP0522572A1 Method and device for measuring a semiconductor element with bumps, and method and device for manufacturing a semiconductor device |
| 01/13/1993 | EP0522460A2 Semiconductor device testing apparatus |
| 01/13/1993 | EP0522413A2 A high impedance technique for testing interconnections in digital systems |
| 01/13/1993 | EP0521990A1 Measurement device and method for sorting used batteries and accumulators. |
| 01/13/1993 | CA2073119A1 Method and device for measuring a semiconductor element with bumps, and method and device for manufacturing a semiconductor device |
| 01/12/1993 | US5179537 Semiconductor memory device having monitoring function |
| 01/12/1993 | US5179433 Breakdown evaluating test element |
| 01/12/1993 | US5179349 Start coincidence circuit of asynchronous signals |
| 01/12/1993 | US5179345 Method and apparatus for analog testing |
| 01/12/1993 | US5179343 Apparatus for checking the connection between male and female connector housings by forming a detecting circuit when the connection is proper |
| 01/12/1993 | US5179342 Superconductor quench measuring device which evaluates reflected pulses |
| 01/12/1993 | US5179340 Apparatus for monitoring the state of charge of a battery |
| 01/12/1993 | US5179339 Holiday light bulb tester with light bulb socket insertable probes |
| 01/12/1993 | US5179333 Apparatus for measuring the electrical characteristics of a semiconductor wafer |
| 01/12/1993 | US5179279 Non-contact electrical pathway |
| 01/12/1993 | US5178465 Optical fiber laying structure for electric power cable line trouble occurrence location detecting system |
| 01/12/1993 | CA1312651C Method and apparatus for identifying a faulted phase |
| 01/10/1993 | CA2073289A1 Electrical power distribution device with isolation monitoring |
| 01/10/1993 | CA2073078A1 Semiconductor device testing apparatus |
| 01/07/1993 | WO1993000746A1 Programmable input/output buffer circuit with test capability |
| 01/07/1993 | WO1993000592A1 Inspection of a dynamo-electric machine in a gap between stator and rotor |
| 01/07/1993 | EP0521805A1 Defect indicator for arrester |
| 01/07/1993 | EP0521234A2 Computerized remote resistance measurement system with fault detection |
| 01/07/1993 | DE4221075A1 Test appts. using continuous movement device for probing PCB - determines electrical characteristics of node located on surface of substrate e.g. printed circuit board |
| 01/07/1993 | DE4122371A1 Microprocessor-controlled electronic measurement appts. - involves operating, control and measurement programme stored in internal memory, flash memory erasure and programme logic |
| 01/06/1993 | CN1067773A Circuit for sensing back-bias level in semiconductor memory device |
| 01/06/1993 | CN1067745A Multifunctional integrated circuit tester |
| 01/05/1993 | US5177745 Memory device with a test mode |
| 01/05/1993 | US5177630 Method and apparatus for generating and transferring high speed data for high speed testing applications |
| 01/05/1993 | US5177621 Self-diagnostic system for image reading equipment |
| 01/05/1993 | US5177555 Method and apparatus for testing electrical connectors |
| 01/05/1993 | US5177483 Multilevel configurable logic analyzer |
| 01/05/1993 | US5177469 Safety device for an IC handler and method for its operation |
| 01/05/1993 | US5177447 Automated breakout box for automotive testing |
| 01/05/1993 | US5177440 Testing of integrated circuits using clock bursts |
| 01/05/1993 | US5177437 High-density optically-addressable circuit board probe panel and method for use |
| 01/05/1993 | US5177435 IC test equipment |
| 01/05/1993 | US5177434 IC test equipment having a horizontally movable chuck carrier |
| 01/05/1993 | US5177419 Apparatus for controlling a load lifting element of a vehicle in response to the wearing of a motor brush |
| 01/05/1993 | US5177371 Auxiliary battery operation detection circuit |
| 01/05/1993 | US5177351 Method and apparatus for determining the minority carrier diffusion length from linear constant photon flux photovoltage measurements |
| 01/05/1993 | US5176524 IC socket structure |
| 12/30/1992 | EP0520841A1 Composite flip chip semi-conductor device and method for making and burning-in the same |
| 12/30/1992 | EP0520356A1 Semiconductor integrated circuit equipped with diagnostic circuit |
| 12/30/1992 | EP0520193A1 Method for measuring partial discharges |
| 12/30/1992 | EP0507782A4 Electric arc and radio frequency spectrum detection |
| 12/30/1992 | CN2126428U Cable fault detecting instrument |
| 12/29/1992 | US5175580 Camera with image stabilizing device |
| 12/29/1992 | US5175531 Battery condition monitoring system for batteries connected in parallel |
| 12/29/1992 | US5175496 Dual contact beam assembly for an IC test fixture |
| 12/29/1992 | US5175495 Detection of semiconductor failures by photoemission and electron beam testing |
| 12/29/1992 | US5175494 Test simplifying circuit contained in digital integrated circuit |
| 12/29/1992 | US5175447 Multifunctional scan flip-flop |
| 12/29/1992 | US5174160 Method of diagnosing electric wires and cables for deterioration of their polymer-insulation and a measuring apparatus used therefor |
| 12/25/1992 | CA2072183A1 Process for measuring partial discharges |
| 12/24/1992 | DE4220145A1 Durch manuell betaetigbare tasten gesteuertes system By manually operable key controlled system |
| 12/24/1992 | DE4135148A1 Schaltkreis zum feststellen des rueckwaertigen vorspannungspegels in einer halbleiterspeichervorrichtung Circuit to determine the rearward bias level in a semiconductor memory device |
| 12/24/1992 | DE4121003A1 Testing condition of trolley wire lines of electrical tracks - standardising measured max. line current and voltage to simultaneously measured charged-up capacitor voltage differentiation between short-circuit and normal condition of line |
| 12/23/1992 | WO1992022822A1 Method and apparatus for charging and testing batteries |