| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/01/1993 | US5216673 Semiconductor memory tester |
| 06/01/1993 | US5216621 Fault detection system |
| 06/01/1993 | US5216371 Battery pack including measuring and indicating |
| 06/01/1993 | US5216362 Contactless technique for measuring epitaxial dopant concentration profiles in semiconductor wafers |
| 06/01/1993 | US5216361 Modular board test system having wireless receiver |
| 06/01/1993 | US5216360 Vacuum-tight signal lines in a testing apparatus for components |
| 06/01/1993 | US5216359 Electro-optical method and apparatus for testing integrated circuits |
| 06/01/1993 | US5216226 Apparatus for preventing and predicting deterioration of insulation in an electric equipment |
| 06/01/1993 | US5215834 Battery thermal control system and method |
| 05/27/1993 | WO1993010590A1 Battery management system |
| 05/27/1993 | WO1993010587A1 Electronic apparatus for measuring the activity of an oil transformer |
| 05/27/1993 | WO1993010466A1 Apparatus for monitoring the voltage of a dc supply |
| 05/27/1993 | WO1993010465A1 Apparatus for testing wound components |
| 05/27/1993 | WO1993010464A1 Polarity testing process and device for electrolytic capacitors |
| 05/27/1993 | DE4239463A1 Semiconductor device with semiconductor elements in substrate - has metal wiring layer in region between semiconductor elements and evaluation device insulated from wiring layer for investigation of electrical characteristics |
| 05/27/1993 | DE4138338A1 Transport arrangement for plate-shaped test objects - contains two separate conveyor belts with mounting elements on facing edges |
| 05/26/1993 | EP0543506A2 Enhanced boundary-scan interconnect test diagnosis through utilization of board topology data |
| 05/26/1993 | EP0543316A1 High frequency surge tester methods and apparatus |
| 05/26/1993 | EP0542943A1 Test circuit for a sensor |
| 05/26/1993 | EP0542856A1 Integrated memory having improved testing means. |
| 05/26/1993 | CN2134660Y Multifunctional circuit detector |
| 05/26/1993 | CN2134657Y Multipurpose test pencil |
| 05/26/1993 | CN2134655Y Acoustooptic electroscope |
| 05/26/1993 | CN2134652Y Special testing gage bar for integrated circuit block |
| 05/25/1993 | US5214784 Sequence of events detector for serial digital data which selectively outputs match signal in the series which defines detected sequence |
| 05/25/1993 | US5214680 CMOS pseudo-NMOS programmable capacitance time vernier and method of calibration |
| 05/25/1993 | US5214655 Integrated circuit packaging configuration for rapid customized design and unique test capability |
| 05/25/1993 | US5214654 Memory tester |
| 05/25/1993 | US5214653 Fault finder expert system |
| 05/25/1993 | US5214595 Abnormality diagnosing system and method for a high voltage power apparatus |
| 05/25/1993 | US5214582 Interactive diagnostic system for an automotive vehicle, and method |
| 05/25/1993 | US5214385 Apparatus and method for utilizing polarization voltage to determine charge state of a battery |
| 05/25/1993 | US5214284 Method and arrangement for testing and repairing an integrated circuit |
| 05/25/1993 | US5214240 High voltage insulator testing system |
| 05/25/1993 | CA1318414C Optical inspection system for solder joints and inspection method |
| 05/19/1993 | EP0542321A2 Method and circuit for controlling voltage reflections on transmission lines |
| 05/19/1993 | EP0542094A1 Corpuscular beam test method using voltage control |
| 05/19/1993 | EP0541843A1 Wire presence and identification system |
| 05/19/1993 | EP0541840A1 Formatter circuit |
| 05/19/1993 | EP0541839A1 Apparatus for generating test signals |
| 05/19/1993 | EP0541837A1 Detector circuit |
| 05/19/1993 | EP0541599A1 Automotive diagnostic tool |
| 05/19/1993 | EP0541537A1 Method and apparatus for high precision weighted random pattern generation. |
| 05/19/1993 | EP0269716B1 LOOK AHEAD TERMINAL COUNTER and method for generating a terminal count output signal. |
| 05/19/1993 | DE4223129A1 Optical beam induced current detection appts. - comprising light emission and scanning, detecting and depicting of current |
| 05/19/1993 | DE4137758A1 Verfahren und vorrichtung zur polaritaetspruefung von elektrolytkondensatoren Method and device for polaritaetspruefung of electrolyte capacitors |
| 05/19/1993 | CN2133983Y Overcharge alarm charger for nickel-cadmium battery |
| 05/19/1993 | CN2133849Y Detector for cable faults |
| 05/19/1993 | CN2133846Y Test pencil with light |
| 05/18/1993 | US5212651 Scan path generation with flip-flop rearrangement according to geometry of logic circuit |
| 05/18/1993 | US5212443 Event sequencer for automatic test equipment |
| 05/18/1993 | US5212442 Forced substrate test mode for packaged integrated circuits |
| 05/18/1993 | US5212410 Register circuit in which a stop current may be measured |
| 05/18/1993 | US5212390 Lead inspection method using a plane of light for producing reflected lead images |
| 05/18/1993 | US5212374 Method and apparatus for positioning and biasing an electro-optic modulator of an electro-optic imaging system |
| 05/18/1993 | CA1318016C Current fault detection system and method for ac controllers |
| 05/13/1993 | WO1993009445A1 Device and process for testing the charge of a nickel-cadmium battery |
| 05/13/1993 | WO1993009444A1 Adaptable multiport test fixture system |
| 05/13/1993 | WO1993009443A1 Switch probe |
| 05/13/1993 | DE4137543A1 Measuring armature current in AC circuit of power converter - synchronously switching channels and measuring current through last commutated current path |
| 05/13/1993 | DE4136752A1 Electrical characteristic measuring appts. for testing single power transistor - holds transistor in high accuracy device with clamp connection for contacts and movable contact part |
| 05/13/1993 | DE4136639A1 Electrical detection system for non dissolved gas in HF plant - uses fluid-filled capacitors to detect change in dielectric constant caused by gas penetrating liquid |
| 05/12/1993 | EP0541240A1 High speed testing of field-effect transistors |
| 05/12/1993 | EP0541139A2 Method of and device for the measurement of an electric signal in an electronic component |
| 05/12/1993 | EP0540967A2 A method for generating test patterns for use with a scan circuit |
| 05/12/1993 | EP0540764A1 Demodulator unit arranged to check for system failures during operation |
| 05/12/1993 | EP0531428A4 Test fixture alignment system |
| 05/12/1993 | EP0489052B1 Device for the operational electrical testing of wired areas, especially printed circuit boards |
| 05/12/1993 | EP0460050B1 A method for testing the operational efficiency of a component of an electronic circuit |
| 05/12/1993 | CN2133087Y Monitoring instrument for storage battery and dc. power supply system |
| 05/12/1993 | CN2132998Y Maintenance test instrument for overhead cable |
| 05/12/1993 | CN2132997Y Electronic pointer for power wire short fault |
| 05/12/1993 | CN2132996Y Multifunction base check apparatus |
| 05/12/1993 | CN2132995Y Conducting wire seeker |
| 05/11/1993 | US5210759 Data processing system having scan testing using set latches for selectively observing test data |
| 05/11/1993 | US5210498 Detector for locating underground cables and faults therein using high-powered electromagnet |
| 05/11/1993 | US5210497 Cable fault tracing systems |
| 05/11/1993 | US5210487 Double-gated integrating scheme for electron beam tester |
| 05/11/1993 | US5210486 Circuit test method |
| 05/11/1993 | US5210445 Change-over type loading device assembly |
| 05/11/1993 | US5210424 Cooling means for components in a vacuum chamber |
| 05/11/1993 | US5209833 Method and apparatus for large-area electrical contacting of a semiconductor crystal body with the assistance of electrolytes |
| 05/11/1993 | US5209132 Semiconductor handling device having a self-check function and method of self-checking a semiconductor handling device |
| 05/11/1993 | US5209110 Over-loading monitoring system for electric motor in automotive engine simulating apparatus |
| 05/06/1993 | DE4235317A1 Variable width current mirror DAC for IC testing in computer test system |
| 05/06/1993 | DE4136231A1 Arc-detecting protection device for electrical machine with slip ring - causes thyristor-controlled power supply to be switched off by photodiode in close proximity to commutator |
| 05/06/1993 | DE4136089A1 Crystal orientation determination in wafer having zinc blende structure - performing reflectometry of four angles between edges of etched groove and longer sides of mask opening |
| 05/05/1993 | EP0539900A1 Insulation fault detection process and spark tester for executing the process |
| 05/05/1993 | EP0539832A2 CMOS pseudo-NMOS programmable capacitance time vernier system and method for controlled delay of timing edges |
| 05/05/1993 | EP0539831A2 Pseudo-NMOS programmable capacitance delay element |
| 05/05/1993 | EP0539830A2 Pseudo-NMOS fine/coarse wired-or tapped delay line |
| 05/05/1993 | EP0539828A2 Variable width current mirror digital-to-analog converter (DAC) system and method for generating a control voltage for delay generation |
| 05/05/1993 | EP0539358A1 Multi-state eeprom read and write circuits and techniques. |
| 05/05/1993 | EP0455653B1 Integrated semiconductor store |
| 05/05/1993 | CN2132355Y Wire breakage detector |
| 05/05/1993 | CN2132302Y Electricity tester for single-phase three-hole socket |
| 05/05/1993 | CN2132192Y Earthing detector |
| 05/05/1993 | CN2132191Y Multifunction torch testing device |
| 05/05/1993 | CN2132190Y Power controlled cable electronic wire butt device |
| 05/05/1993 | CN2132189Y Multifunction test pencil for leakproof protector |