Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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03/04/1993 | WO1993004375A1 Burn-in technologies for unpackaged integrated circuits |
03/04/1993 | WO1993004351A1 Method and apparatus for liquid cooled generator stator test and preparation therefor |
03/04/1993 | DE4226719A1 Testing instrument for LSI circuits, transistors, etc. - controls slave-subsystems using master-subsystem with synchronised control signals through clock pulse distributor |
03/04/1993 | DE4223436A1 Electrical and electronic component testing instrument - has test bus in addition to digital and analogue buses and control unit allowing separate processing of digital, analogue and test signals |
03/04/1993 | DE4128668A1 Testing device for electronic overcurrent releases - uses external voltage generators for regular testing of each successive phase |
03/03/1993 | EP0529670A2 Test pattern generating apparatus |
03/03/1993 | EP0529290A1 Hybrid pattern self-testing of integrated circuits |
03/03/1993 | EP0529281A2 Method of detecting a contacting of measuring leads |
03/03/1993 | EP0444023A4 System and method for depassivating a passivated lithium battery in a battery powered microprocessor control device |
03/03/1993 | EP0272288B1 Testable multi-mode counter network and method for operating its test. |
03/03/1993 | CN2127790Y Data maintainer of digital pressure-tight tester |
03/03/1993 | CN1020001C Action monitor of switchgears |
03/02/1993 | US5191295 Phase shift vernier for automatic test systems |
03/02/1993 | US5191291 Method and apparatus for determining the performance capabilities of secondary batteries |
03/02/1993 | US5191282 Unitized test system with bi-directional transport feature |
03/02/1993 | US5191281 IC tester capable of changing strobe position in accordance with a predetermined reference signal |
03/02/1993 | US5191213 Integrated circuit structure analysis |
02/25/1993 | DE4227251A1 Delay time calculator for logic block contg. MOS transistor - uses layout memory and stores delay times according to input signal gradient for each layout |
02/25/1993 | DE4201516A1 Vorrichtung zum automatischen testen eines beanspruchungsbetriebes einer halbleiterspeichervorrichtung An apparatus for automatically testing a stress-operation of a semiconductor memory device |
02/25/1993 | DE4142453C1 Laboratory or test desk working station - has measuring and control structure spatially sepd. from operating and indicating manual appts. in data communication with bus-system network |
02/25/1993 | DE4127569A1 DC interruption detection circuit for telephone line - senses sign changes in difference between slowly and rapidly reacting current sensor outputs |
02/24/1993 | EP0528744A2 Latch assisted fuse testing for customized integrated circuits |
02/24/1993 | EP0528608A2 Connector assembly for testing integrated circuit packages |
02/24/1993 | EP0528598A2 Digitizer fault detection apparatus and method |
02/24/1993 | EP0528430A1 Method of temporary static fault imaging |
02/24/1993 | EP0528031A1 Method of automatically detecting defects of object to be inspected |
02/24/1993 | CN1069386A Inspection equipmen for illuminating system state |
02/23/1993 | US5189675 Self-diagnostic circuit for logic circuit block |
02/23/1993 | US5189674 Fault locating system capable of quickly locating a fault in a hierarchical communication network |
02/23/1993 | US5189374 Method for pulse propagation analysis of a well casing or the like by transmitted pulse interaction |
02/23/1993 | US5189365 Method of locating a fault in a logic IC device |
02/23/1993 | US5189363 Integrated circuit testing system having a cantilevered contact lead probe pattern mounted on a flexible tape for interconnecting an integrated circuit to a tester |
02/23/1993 | US5189350 Monitoring the instantaneous operating capacity of rated electric motor |
02/23/1993 | CA1313913C Apparatus for inspecting printed circuit boards with surface mounted components |
02/18/1993 | WO1993003530A1 Process and arrangement for recognizing defects in power converters |
02/18/1993 | WO1993003434A1 Process for testing integrated circuits with at least one logic circuit and testable integrated circuit |
02/18/1993 | WO1993003389A1 Process and device for testing and locating electrical short circuits for lines, especially for electric railway catenaries |
02/18/1993 | WO1993003386A1 Process for measuring and evaluating the inductance of a relay |
02/18/1993 | DE4214083A1 Elektronische einrichtung zur pruefung des zustandes von leistungsversorgungen Electronic device for pruefung of a condition of power supplies |
02/18/1993 | DE4127197A1 Electrically conducting connection testing and evaluation of press, crimped or crush connections - applying thermal shocks to test and comparison objects using liquids above and below test temp. |
02/18/1993 | DE4127009A1 Testing photopolymer masks on glass-reinforced epoxide PCB - by applying needle of dial gauge with recording instrument to spots on surface and measuring movements when they are suitably heated |
02/18/1993 | DE4126868A1 Partial discharge pulse detecting arrangement in gas insulated HV system - contains measurement points at boundaries of sub-regions of system which produce logical direction signals for evaluation of discharge location |
02/18/1993 | CA2114543A1 Process and arrangement for recognizing defects in power converters |
02/17/1993 | EP0527566A1 Enhanced grounding system for short-wire lengthed fixture |
02/17/1993 | EP0527526A1 Device and method for generating an oscilloscope trigger signal from a video signal |
02/17/1993 | EP0527366A1 Variable delay circuit |
02/17/1993 | EP0527337A1 Semiconductor integrated circuit |
02/17/1993 | EP0527321A1 Method for automatic error diagnosis of electrical circuit boards |
02/17/1993 | EP0527214A1 Battery testing |
02/17/1993 | EP0527127A1 Driver circuit for testing bi-directional transceiver semiconductor products |
02/17/1993 | CN2127176Y Battery work state indicator |
02/17/1993 | CN1069125A Ac/dc voltage ceramic-type insulation leakage current sensor |
02/17/1993 | CA2067903A1 Method of detecting, identifying, and alarming short-circuited outputs in electrostatic precipitator rapper and vibrator controls |
02/16/1993 | US5187785 Algorithm for representing component connectivity |
02/16/1993 | US5187712 Method of configuring a digital integrated circuit |
02/16/1993 | US5187441 Portable information apparatus for sensing battery voltage drop |
02/16/1993 | US5187431 Universal multicontact connection between an ews probe card and a test card of a "test-on-wafer" station |
02/16/1993 | US5187430 Method and apparatus for determining nets among nodes in a circuit board |
02/16/1993 | US5187424 Process for determining the state of a battery |
02/16/1993 | US5187393 Reconfigurable programmable interconnect architecture |
02/16/1993 | US5187382 Apparatus for detecting the existence of an abnormality in a vehicle operator protection system |
02/11/1993 | DE4221513A1 Residual capacity indicator eg for video recorder power pack - includes input and output current detector, arithmetic unit and indicator, to determine battery pack deterioration |
02/11/1993 | DE4126534A1 Verfahren zur messung und wertung der induktivitaet eines relais Method for measurement and evaluation of the inductance of a relay |
02/10/1993 | EP0526996A2 Test head manipulator |
02/10/1993 | EP0526922A2 Modular board test system having wireless receiver |
02/10/1993 | EP0526734A2 Noncontact probe and active matrix array inspection apparatus using the same |
02/10/1993 | EP0324012B1 Shorted-coaxial-cable detector for local-area networks |
02/10/1993 | CN2126919Y Ac.acoustooptic detecting instrument |
02/09/1993 | US5185769 Easily testable high speed digital counter |
02/09/1993 | US5185745 Scan path diagnostic method |
02/09/1993 | US5185687 Chaos sensing arc detection |
02/09/1993 | US5185686 Direction sensing arc detection |
02/09/1993 | US5185685 Field sensing arc detection |
02/09/1993 | US5185684 Frequency selective arc detection |
02/09/1993 | US5185638 Computer controlled, multiple angle illumination system |
02/09/1993 | US5185580 Electrical transmission cable termination device having short and open-circuit cable test capabilities |
02/09/1993 | US5185571 Process and system for the asynchronous measurement of signal courses |
02/09/1993 | US5185570 Telecommunications signal detector |
02/09/1993 | US5184768 Solder interconnection verification |
02/04/1993 | WO1993002415A1 Device for testing electronic components of a unit interconnected according to the application |
02/04/1993 | WO1993002353A1 Battery with integral condition tester |
02/04/1993 | DE4127440C1 Electrical lead identifying and testing equipment - assigns code number to resistors of various values between pairs of leads in sequence for resistance measuring to test for short and/or open circuits including connected terminal sockets |
02/04/1993 | DE4125446A1 Verfahren und einrichtung zur elektrischen kurzschlusspruefung und -ortung fuer leitungen, insbesondere fuer fahrleitungen elektrischer bahnen Pave method and device for electrical kurzschlusspruefung and location for pipes, especially for electric overhead equipment |
02/03/1993 | EP0525990A1 Testing integrated circuit pad input and output structures |
02/03/1993 | EP0525983A2 Device for measuring the state of charge of a battery |
02/03/1993 | EP0525522A2 Drive circuit fault detection device |
02/03/1993 | EP0525421A2 Circuit arrangement for converting a voltage drop tapped from a test object from a predetermined input voltage range to a desired output voltage range |
02/03/1993 | EP0525350A2 Method and arrangement for testing control apparatus |
02/03/1993 | CN1068659A Economic run tester for electric motor |
02/03/1993 | CN1068658A Electric mornitoring instrument for machine tool |
02/02/1993 | US5184308 Fault simulation method |
02/02/1993 | US5184162 Testing integrated circuit using an A/D converter built in a semiconductor chip |
02/02/1993 | US5184081 Fault location |
02/02/1993 | US5184068 Electronic device test handler |
02/02/1993 | US5184067 Signature compression circuit |
02/02/1993 | US5184029 Driver circuit for circuit tester |
02/02/1993 | CA1313426C Adapter for electronic testing equipment for circuit boards and similar |
02/02/1993 | CA1313394C Control and monitoring circuit for electric seat heaters, especially in automotive vehicles |
01/28/1993 | DE4220202A1 Einrichtung zum pruefen von geraetefunktionen, insbesondere bei einem elektrofotografischen drucker Means for checking device functions, especially in an electrophotographic printer |
01/28/1993 | DE4124708A1 Einrichtung zum pruefen von entsprechend dem anwendungsfall miteinander verbundenen elektronischen komponenten einer baugruppe Means for testing according to the use case interconnected electronic components of a module |