Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
01/1994
01/05/1994DE4321211A1 Semiconductor integrated circuit device for burn-in test - has mode switch for applying input signal to semiconductor circuit during normal operation and applying fixed potential during testing
01/05/1994DE4311120A1 Non-volatile semiconductor memory, e.g. EPROM or EEPROM - has switch elements controlled by selection device each connecting external contact to memory cell array
01/05/1994DE4225204A1 Shift register cell for boundary scan testing of RAM, EPROM, or ROM - has first switching multiplexer for connecting neighbouring registers as feedback shift registers and second input selection multiplexer enabling feedback shift register to generate test patterns or evaluate responses.
01/05/1994DE4223881A1 Bidirectional driver stage for boundary-scan shift register memory test - provides external and internal test modes implemented by selective input and output connections of shift register cells.
01/05/1994DE4221865A1 Partial-discharge pulse-sensor for HV appts. - has different attenuation-frequency response according to whether one of two output connections is open- or short-circuited
01/05/1994DE4221701A1 Testing performance of integrated circuit structure(s) - using test signal generator applying standard test data for output comparison and analysis
01/05/1994DE4220904A1 Testing mechanically operated switch in vehicle airbag passenger safety system - applying positive or negative voltage to end of test coil and checking for voltage change at other to sense fault caused by vibration in soldered connection on circuit board.
01/05/1994DE4220394A1 Quasi-static current measurement for triangular voltage sweep for capacitive MIS structures - separates ion current from capacitive current by multiplying voltage proportional to small-signal capacitance of structure with inverted and differentiated triangular voltage to generate compensation current for current meter.
01/05/1994CN2152317Y Three pole safety plug for circuit on-and-off test
01/05/1994CN2152217Y Comprehensive test device for transformer performance
01/05/1994CN1080447A A method for testing an integrated circuitry and an integrated circuit having a plurality of functional components and having junction/switch test components in interconnecting channels between......
01/04/1994US5276647 Static random access memory including stress test circuitry
01/04/1994US5276402 Three-phase transformer testing method and system
01/04/1994US5276401 Method for diagnosing an insulation deterioration of an electric apparatus
01/04/1994US5276400 Test circuit for imaging sensing integrated circuits
01/04/1994US5276395 Bed-of-pins test fixture
01/04/1994US5276355 Change-over circuit for tester implemented by using diode-bridge type analog switches
01/04/1994CA2029773C Automatic conveyance system
01/04/1994CA1325826C Equipment for and methods of locating the position of a fault on a power transmission line
12/1993
12/29/1993EP0575547A1 Scannable system with addressable scan reset groups
12/29/1993EP0575448A1 System for collecting measurement data in battery rooms.
12/29/1993EP0575399A1 Interactive diagnostic system for an automotive vehicle, and method
12/29/1993EP0386012B1 Triggering circuit for a vehicle air bag
12/29/1993CN2151548Y 多功能插塞 Multifunction plug
12/29/1993CN2151471Y High voltage leakage monitor with digital display
12/29/1993CN2151470Y Supersonic insulator inspector
12/29/1993CN1080058A Ground detecting method for inverter device
12/29/1993CN1023347C Measuring system for transient charges
12/28/1993US5274796 Timing generator with edge generators, utilizing programmable delays, providing synchronized timing signals at non-integer multiples of a clock signal
12/28/1993US5274668 Integrated circuit demodulator component
12/28/1993US5274575 Method of probing test
12/28/1993US5274434 Method and apparatus for inspecting foreign particles on real time basis in semiconductor mass production line
12/28/1993US5274336 For acquiring a digital electrical signal from a source conductor
12/28/1993US5274325 Method and apparatus for electro-optic sampling measurement of electrical signals in integrated circuits
12/28/1993US5274313 Method and arrangement for actuating electromechanical transducers
12/23/1993WO1993025917A1 A method and apparatus for battery testing
12/23/1993WO1993025916A1 Method and apparatus for current sensing of multiple loads in an automotive vehicle
12/23/1993WO1993025883A1 Corrosion resistant cable
12/23/1993DE4320528A1 Integrated circuit on-chip automatic test function circuit - has decoder for receiving data from control register describing test pattern generator to be used and which functional block is to be tested, and data bus for transferring test data to block.
12/23/1993DE4220409A1 Verfahren zum Ermitteln von Anomalien einer zu untersuchenden Leitung Method for determining anomalies of a line to be tested
12/23/1993DE4219970A1 Test circuit with HV generator for electrical appliances operated from single=phase or three=phase mains - has low Ohm sensor and associated current monitoring circuit for checking resistance of current path between ground conductor and housing.
12/23/1993DE4219630A1 Test circuit for synthetic test of switching characteristic of electrical switch - has at least one high current circuit with sensor unit for detection of zero crossings and at least one HV circuit to be triggered connectable to current circuit
12/22/1993EP0575205A1 Network for minimizing current imbalances in a faradaic battery
12/22/1993EP0575100A1 Patching panel scanner
12/22/1993EP0575061A1 Method of testing continuity of a connection between an IC and a PCB
12/22/1993EP0574919A2 State transition diagram generator and test pattern generator
12/22/1993EP0574672A1 Adjustable weighted random test pattern generator for logic circuits
12/22/1993EP0356538B1 Arrangement in data processing system for system initialization and reset
12/22/1993EP0290111B1 Digital data processing system
12/22/1993CN2150564Y Combined parametric testing device for electric power system
12/21/1993US5272763 Apparatus for inspecting wiring pattern formed on a board
12/21/1993US5272756 Method and apparatus for determining phase correlation of a stereophonic signal
12/21/1993US5272440 Isolation monitors and measuring device for an electrical power system with isolated neutral
12/21/1993US5272439 Method and apparatus for the detection and location of faults and partial discharges in shielded cables
12/21/1993US5272438 Field test unit for circuit breaker
12/21/1993US5272434 Method and apparatus for electro-optically testing circuits
12/21/1993US5272397 Basic DCVS circuits with dual function load circuits
12/21/1993US5272390 Method and apparatus for clock skew reduction through absolute delay regulation
12/21/1993US5272342 Diffused layer depth measurement apparatus
12/21/1993US5271268 Ionic current sensing apparatus
12/16/1993DE4219284A1 Checking occupancy of battery charging station - passing AC through battery and detecting flow by LED in bridge rectifier
12/16/1993DE4218832A1 Power failure detecting for sensing drop=out of AC mains voltage - using digital evaluation of frequency of mains voltage by passing through frequency multiplier, rectifier and monostable flip=flop to controller.
12/15/1993EP0574253A2 A diagnostic procedure
12/15/1993EP0574149A1 Wafer probe station having integrated guarding, Kelvin connection and shielding systems
12/15/1993EP0574026A2 Semiconductor integrated logic circuit with a test mode
12/15/1993EP0573816A2 Data output impedance control
12/15/1993EP0573596A1 Line disturbance monitor and recorder system
12/15/1993EP0353027B1 Programmable time advance
12/15/1993CN2149634Y Arrangement for indicating short-circuit of power equipment
12/15/1993CN2149633Y Automatic delecting instrument for the power source of electric locomotives
12/15/1993CN1079552A Corrosion resistant cable
12/14/1993US5271019 Scannable system with addressable scan reset groups
12/14/1993US5271015 Self-diagnostic system for semiconductor memory
12/14/1993US5270977 Dynamic random access memory device capable of performing test mode operation and method of operating such memory device
12/14/1993US5270961 Control law simulator
12/14/1993US5270774 Testing device for electrophotographic imaging apparatus
12/14/1993US5270661 Method of detecting a conductor anomaly by applying pulses along the conductor in opposite directions
12/14/1993US5270658 Means and method for testing and monitoring a circuit breaker panel assembly
12/14/1993US5270643 Pulsed laser photoemission electron-beam probe
12/14/1993US5270642 Partitioned boundary-scan testing for the reduction of testing-induced damage
12/14/1993US5270640 Method for incipient failure detection in electric machines
12/14/1993US5270582 High speed timing generator
12/14/1993CA1325252C Branched sensor system
12/09/1993WO1993024996A1 Automatic calibration system for a ramp voltage generator
12/09/1993WO1993024942A1 Electrical high-voltage switchgear with at least one sensor
12/09/1993WO1993024845A1 Testing process for the quality control of electromagnetically actuated switching devices
12/09/1993DE4218319A1 Time and frequency distribution signal analysis arrangement - contains convolution device fed via mixers converting frequency range
12/08/1993EP0573179A2 Non-fully-decoded test address generator
12/08/1993EP0573159A2 Identification of pin-open faults by capacitive coupling through the integrated circuit package
12/08/1993EP0572940A2 Automatic functional test system for household electrical appliances
12/08/1993EP0572767A2 Monitoring diagnostic apparatus using neural network
12/08/1993EP0572736A1 IC test clip with flexible contacts
12/08/1993EP0572515A1 Method of protecting an integrated circuit against fraudulent use
12/08/1993EP0334940B1 Method and apparatus for isolating faults in an antenna system
12/08/1993CN1023032C Digital wire searcher
12/07/1993US5268852 Self diagnostic pH sensor
12/07/1993US5268845 Portable electronic system
12/07/1993US5268645 Method of and apparatus for testing circuit boards and the like with an inhomogeneous electric field
12/07/1993US5268644 automotive electrical system
12/07/1993US5268643 Apparatus for failure identification for use in vehicle occupant protecting system