Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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01/05/1994 | DE4321211A1 Semiconductor integrated circuit device for burn-in test - has mode switch for applying input signal to semiconductor circuit during normal operation and applying fixed potential during testing |
01/05/1994 | DE4311120A1 Non-volatile semiconductor memory, e.g. EPROM or EEPROM - has switch elements controlled by selection device each connecting external contact to memory cell array |
01/05/1994 | DE4225204A1 Shift register cell for boundary scan testing of RAM, EPROM, or ROM - has first switching multiplexer for connecting neighbouring registers as feedback shift registers and second input selection multiplexer enabling feedback shift register to generate test patterns or evaluate responses. |
01/05/1994 | DE4223881A1 Bidirectional driver stage for boundary-scan shift register memory test - provides external and internal test modes implemented by selective input and output connections of shift register cells. |
01/05/1994 | DE4221865A1 Partial-discharge pulse-sensor for HV appts. - has different attenuation-frequency response according to whether one of two output connections is open- or short-circuited |
01/05/1994 | DE4221701A1 Testing performance of integrated circuit structure(s) - using test signal generator applying standard test data for output comparison and analysis |
01/05/1994 | DE4220904A1 Testing mechanically operated switch in vehicle airbag passenger safety system - applying positive or negative voltage to end of test coil and checking for voltage change at other to sense fault caused by vibration in soldered connection on circuit board. |
01/05/1994 | DE4220394A1 Quasi-static current measurement for triangular voltage sweep for capacitive MIS structures - separates ion current from capacitive current by multiplying voltage proportional to small-signal capacitance of structure with inverted and differentiated triangular voltage to generate compensation current for current meter. |
01/05/1994 | CN2152317Y Three pole safety plug for circuit on-and-off test |
01/05/1994 | CN2152217Y Comprehensive test device for transformer performance |
01/05/1994 | CN1080447A A method for testing an integrated circuitry and an integrated circuit having a plurality of functional components and having junction/switch test components in interconnecting channels between...... |
01/04/1994 | US5276647 Static random access memory including stress test circuitry |
01/04/1994 | US5276402 Three-phase transformer testing method and system |
01/04/1994 | US5276401 Method for diagnosing an insulation deterioration of an electric apparatus |
01/04/1994 | US5276400 Test circuit for imaging sensing integrated circuits |
01/04/1994 | US5276395 Bed-of-pins test fixture |
01/04/1994 | US5276355 Change-over circuit for tester implemented by using diode-bridge type analog switches |
01/04/1994 | CA2029773C Automatic conveyance system |
01/04/1994 | CA1325826C Equipment for and methods of locating the position of a fault on a power transmission line |
12/29/1993 | EP0575547A1 Scannable system with addressable scan reset groups |
12/29/1993 | EP0575448A1 System for collecting measurement data in battery rooms. |
12/29/1993 | EP0575399A1 Interactive diagnostic system for an automotive vehicle, and method |
12/29/1993 | EP0386012B1 Triggering circuit for a vehicle air bag |
12/29/1993 | CN2151548Y 多功能插塞 Multifunction plug |
12/29/1993 | CN2151471Y High voltage leakage monitor with digital display |
12/29/1993 | CN2151470Y Supersonic insulator inspector |
12/29/1993 | CN1080058A Ground detecting method for inverter device |
12/29/1993 | CN1023347C Measuring system for transient charges |
12/28/1993 | US5274796 Timing generator with edge generators, utilizing programmable delays, providing synchronized timing signals at non-integer multiples of a clock signal |
12/28/1993 | US5274668 Integrated circuit demodulator component |
12/28/1993 | US5274575 Method of probing test |
12/28/1993 | US5274434 Method and apparatus for inspecting foreign particles on real time basis in semiconductor mass production line |
12/28/1993 | US5274336 For acquiring a digital electrical signal from a source conductor |
12/28/1993 | US5274325 Method and apparatus for electro-optic sampling measurement of electrical signals in integrated circuits |
12/28/1993 | US5274313 Method and arrangement for actuating electromechanical transducers |
12/23/1993 | WO1993025917A1 A method and apparatus for battery testing |
12/23/1993 | WO1993025916A1 Method and apparatus for current sensing of multiple loads in an automotive vehicle |
12/23/1993 | WO1993025883A1 Corrosion resistant cable |
12/23/1993 | DE4320528A1 Integrated circuit on-chip automatic test function circuit - has decoder for receiving data from control register describing test pattern generator to be used and which functional block is to be tested, and data bus for transferring test data to block. |
12/23/1993 | DE4220409A1 Verfahren zum Ermitteln von Anomalien einer zu untersuchenden Leitung Method for determining anomalies of a line to be tested |
12/23/1993 | DE4219970A1 Test circuit with HV generator for electrical appliances operated from single=phase or three=phase mains - has low Ohm sensor and associated current monitoring circuit for checking resistance of current path between ground conductor and housing. |
12/23/1993 | DE4219630A1 Test circuit for synthetic test of switching characteristic of electrical switch - has at least one high current circuit with sensor unit for detection of zero crossings and at least one HV circuit to be triggered connectable to current circuit |
12/22/1993 | EP0575205A1 Network for minimizing current imbalances in a faradaic battery |
12/22/1993 | EP0575100A1 Patching panel scanner |
12/22/1993 | EP0575061A1 Method of testing continuity of a connection between an IC and a PCB |
12/22/1993 | EP0574919A2 State transition diagram generator and test pattern generator |
12/22/1993 | EP0574672A1 Adjustable weighted random test pattern generator for logic circuits |
12/22/1993 | EP0356538B1 Arrangement in data processing system for system initialization and reset |
12/22/1993 | EP0290111B1 Digital data processing system |
12/22/1993 | CN2150564Y Combined parametric testing device for electric power system |
12/21/1993 | US5272763 Apparatus for inspecting wiring pattern formed on a board |
12/21/1993 | US5272756 Method and apparatus for determining phase correlation of a stereophonic signal |
12/21/1993 | US5272440 Isolation monitors and measuring device for an electrical power system with isolated neutral |
12/21/1993 | US5272439 Method and apparatus for the detection and location of faults and partial discharges in shielded cables |
12/21/1993 | US5272438 Field test unit for circuit breaker |
12/21/1993 | US5272434 Method and apparatus for electro-optically testing circuits |
12/21/1993 | US5272397 Basic DCVS circuits with dual function load circuits |
12/21/1993 | US5272390 Method and apparatus for clock skew reduction through absolute delay regulation |
12/21/1993 | US5272342 Diffused layer depth measurement apparatus |
12/21/1993 | US5271268 Ionic current sensing apparatus |
12/16/1993 | DE4219284A1 Checking occupancy of battery charging station - passing AC through battery and detecting flow by LED in bridge rectifier |
12/16/1993 | DE4218832A1 Power failure detecting for sensing drop=out of AC mains voltage - using digital evaluation of frequency of mains voltage by passing through frequency multiplier, rectifier and monostable flip=flop to controller. |
12/15/1993 | EP0574253A2 A diagnostic procedure |
12/15/1993 | EP0574149A1 Wafer probe station having integrated guarding, Kelvin connection and shielding systems |
12/15/1993 | EP0574026A2 Semiconductor integrated logic circuit with a test mode |
12/15/1993 | EP0573816A2 Data output impedance control |
12/15/1993 | EP0573596A1 Line disturbance monitor and recorder system |
12/15/1993 | EP0353027B1 Programmable time advance |
12/15/1993 | CN2149634Y Arrangement for indicating short-circuit of power equipment |
12/15/1993 | CN2149633Y Automatic delecting instrument for the power source of electric locomotives |
12/15/1993 | CN1079552A Corrosion resistant cable |
12/14/1993 | US5271019 Scannable system with addressable scan reset groups |
12/14/1993 | US5271015 Self-diagnostic system for semiconductor memory |
12/14/1993 | US5270977 Dynamic random access memory device capable of performing test mode operation and method of operating such memory device |
12/14/1993 | US5270961 Control law simulator |
12/14/1993 | US5270774 Testing device for electrophotographic imaging apparatus |
12/14/1993 | US5270661 Method of detecting a conductor anomaly by applying pulses along the conductor in opposite directions |
12/14/1993 | US5270658 Means and method for testing and monitoring a circuit breaker panel assembly |
12/14/1993 | US5270643 Pulsed laser photoemission electron-beam probe |
12/14/1993 | US5270642 Partitioned boundary-scan testing for the reduction of testing-induced damage |
12/14/1993 | US5270640 Method for incipient failure detection in electric machines |
12/14/1993 | US5270582 High speed timing generator |
12/14/1993 | CA1325252C Branched sensor system |
12/09/1993 | WO1993024996A1 Automatic calibration system for a ramp voltage generator |
12/09/1993 | WO1993024942A1 Electrical high-voltage switchgear with at least one sensor |
12/09/1993 | WO1993024845A1 Testing process for the quality control of electromagnetically actuated switching devices |
12/09/1993 | DE4218319A1 Time and frequency distribution signal analysis arrangement - contains convolution device fed via mixers converting frequency range |
12/08/1993 | EP0573179A2 Non-fully-decoded test address generator |
12/08/1993 | EP0573159A2 Identification of pin-open faults by capacitive coupling through the integrated circuit package |
12/08/1993 | EP0572940A2 Automatic functional test system for household electrical appliances |
12/08/1993 | EP0572767A2 Monitoring diagnostic apparatus using neural network |
12/08/1993 | EP0572736A1 IC test clip with flexible contacts |
12/08/1993 | EP0572515A1 Method of protecting an integrated circuit against fraudulent use |
12/08/1993 | EP0334940B1 Method and apparatus for isolating faults in an antenna system |
12/08/1993 | CN1023032C Digital wire searcher |
12/07/1993 | US5268852 Self diagnostic pH sensor |
12/07/1993 | US5268845 Portable electronic system |
12/07/1993 | US5268645 Method of and apparatus for testing circuit boards and the like with an inhomogeneous electric field |
12/07/1993 | US5268644 automotive electrical system |
12/07/1993 | US5268643 Apparatus for failure identification for use in vehicle occupant protecting system |