| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 05/02/1989 | US4827272 Overhead power line clamp and antenna |
| 05/02/1989 | US4827211 Wafer probe |
| 05/02/1989 | US4826441 Test board connectors and method for attaching |
| 05/02/1989 | CA1253570A1 Current measurement shunt |
| 04/26/1989 | EP0313001A2 Test adapter for integrated circuit carrier |
| 04/26/1989 | EP0312623A1 Dielectric probe, method and apparatus including its use |
| 04/26/1989 | EP0312605A1 Detector for force, acceleration and magnetism using resistor element |
| 04/25/1989 | US4825155 X-band logic test jig |
| 04/25/1989 | US4825154 Current probe |
| 04/25/1989 | US4825153 Shunt element for measuring current comprising compensation means |
| 04/25/1989 | US4824392 Burn-in socket for gull wing integrated circuit package |
| 04/25/1989 | US4824389 Socket for electronic component |
| 04/25/1989 | US4823572 Lockable terminal cover for bottom connected metering devices |
| 04/20/1989 | DE3832410A1 Contact device |
| 04/19/1989 | EP0311750A2 Technique for eliminating of static in printed circuit board test fixtures |
| 04/18/1989 | US4823079 Device for equipping an adapter with contact pins used with a circuit board test equipment |
| 04/18/1989 | US4822295 Small outline SMT test connector |
| 04/11/1989 | US4820976 Test fixture capable of electrically testing an integrated circuit die having a planar array of contacts |
| 04/11/1989 | US4820975 Test apparatus for printed circuit boards |
| 04/11/1989 | US4820190 Electrical component mounting and connection assembly |
| 04/06/1989 | DE3732197A1 Arrangement for testing a printed circuit board |
| 04/06/1989 | DE3732144A1 Electronically controllable scale and dial |
| 04/05/1989 | EP0310302A2 Multipurpose socket |
| 04/04/1989 | US4819178 Automatic circuit adjusting system and circuit adjusting tool therefor |
| 04/04/1989 | US4819129 Removable watt-hour meter socket compartment panel cover with safety partition |
| 04/04/1989 | US4818933 Board fixturing system |
| 04/04/1989 | US4818238 Test socket for leadless chip carrier |
| 04/04/1989 | US4818072 Method for remotely detecting an electric field using a liquid crystal device |
| 04/04/1989 | CA1252221A1 Wafer probe with mounted amplifier |
| 03/29/1989 | EP0309116A2 Fixture for an integrated circuit chip |
| 03/29/1989 | EP0309109A2 Testing process for electronic devices |
| 03/28/1989 | US4816754 Contactor and probe assembly for electrical test apparatus |
| 03/28/1989 | US4816752 Method and apparatus for low power offset correction of amplified sensor signals |
| 03/22/1989 | EP0308348A1 Test head robot for automatic testing |
| 03/22/1989 | EP0308347A1 Test head robot having a modified suspension |
| 03/22/1989 | EP0307503A1 A grid-based, "cross-check" test structure for testing integrated circuits |
| 03/21/1989 | US4814698 Technique for elimination of static in printed circuit board test fixtures |
| 03/21/1989 | US4814697 For the contacting of conductor plates |
| 03/15/1989 | EP0306741A2 Device for making contacts on an electrical circuit board |
| 03/14/1989 | US4812901 Probe apparatus |
| 03/14/1989 | US4812755 Base board for testing integrated circuits |
| 03/14/1989 | US4812754 Circuit board interfacing apparatus |
| 03/14/1989 | US4812747 Transducer linearizing system |
| 03/14/1989 | US4812745 Probe for testing electronic components |
| 03/14/1989 | US4812740 Coating detector for low emissivity glass |
| 03/14/1989 | CA1251288A1 Piezoelectric pressure sensing apparatus for integrated circuit testing stations |
| 03/08/1989 | EP0306393A1 A short-wire bed-of-nails test fixture |
| 03/08/1989 | EP0305951A1 Testing of integrated circuit devices on loaded printed circuit boards |
| 03/08/1989 | EP0305734A2 Test arrangement for circuit boards |
| 03/07/1989 | US4811246 Micropositionable piezoelectric contactor |
| 03/07/1989 | US4810956 Mounting bracket for test probes |
| 03/01/1989 | EP0305076A2 Personality board |
| 03/01/1989 | EP0304868A2 Multiple lead probe for integrated circuits in wafer form |
| 02/28/1989 | US4808919 Adjustable device for measuring the characteristics of a microwave component |
| 02/28/1989 | US4808119 Zero insertion force mounting housings for electronic device packages |
| 02/28/1989 | CA1250619A1 Meter mounting ring |
| 02/23/1989 | WO1989001389A1 Registration of hole centres for cutting printed board samples |
| 02/21/1989 | US4806856 Adjustable quick-mount test probe assembly |
| 02/14/1989 | US4804917 Current detection device having an extended frequency range of response |
| 02/14/1989 | US4804903 System for measuring load current in an electronically controlled switch |
| 02/09/1989 | WO1989001166A1 Current detection device having an extended frequency range of response |
| 02/07/1989 | US4803424 Short-wire bed-of-nails test fixture |
| 02/07/1989 | US4803423 Input circuit for a probe of a logic analyser and probe and logic analyser provided with such a circuit |
| 02/07/1989 | US4803419 Testing head device for a microwave network analyzer |
| 02/07/1989 | US4802953 Continuous on-line conductivity probe |
| 02/07/1989 | US4802869 Probeable electrical connector |
| 01/31/1989 | US4802163 Test-facilitating circuit and testing method |
| 01/31/1989 | US4801876 Printed wiring board tester |
| 01/31/1989 | US4801866 Electric circuit testing equipment |
| 01/31/1989 | US4801561 Method for making a pre-testable semiconductor die package |
| 01/31/1989 | US4801273 Socket |
| 01/31/1989 | CA1249632A1 Polyphase electrical signal measuring apparatus |
| 01/26/1989 | DE3823928A1 Method and arrangement for the determination of geometric data in the electrical testing of printed circuit boards |
| 01/24/1989 | US4799897 IC tester socket |
| 01/24/1989 | CA1249340A1 Electrical connector for electrical circuit test probe and connector |
| 01/24/1989 | CA1249339A1 Electrical circuit test probe and connector |
| 01/19/1989 | DE3722619A1 Device for measuring the stray parameters of a planar structure in the millimetre wave range |
| 01/18/1989 | EP0299427A2 Voltage detector |
| 01/18/1989 | EP0299232A1 Circuit board test fixture |
| 01/17/1989 | US4799009 Semiconductor testing device |
| 01/17/1989 | US4799007 Bendable pin board test fixture |
| 01/17/1989 | US4799006 Automatic testing equipment |
| 01/12/1989 | DE3722485A1 Elastic contact needle and contacting device |
| 01/11/1989 | EP0298377A1 Contact probe arrangement |
| 01/11/1989 | EP0298219A2 Method and apparatus for testing unpackaged integrated circuits in a hybrid circuit environment |
| 01/10/1989 | US4797610 Electronic test fixture |
| 01/10/1989 | US4797118 Test adapter for integrated circuit carrier |
| 01/05/1989 | DE3721312A1 Adjustable universal spring contact pin for making contact with test points at any desired coordinates on a predetermined grid area |
| 01/04/1989 | EP0297562A2 Voltage detector |
| 01/04/1989 | EP0297231A2 Electroforming shielding elements against electromagnetic pulses |
| 01/04/1989 | CN2030326U High-resistance thermostatic trough with small volume and low energy consumption |
| 01/04/1989 | CN2030325U Multi-functional light-control device for digital microammeter |
| 01/03/1989 | US4795989 MMW microstrip coupler having movable test probe |
| 01/03/1989 | US4795977 Interface system for interfacing a device tester to a device under test |
| 01/03/1989 | US4795975 Thermal and electromagnetic shield for power meter |
| 12/28/1988 | CN88211492U Electric connecting socket for monitoring the dynamic reliability of electronic elements |
| 12/27/1988 | US4794326 Transducer for current measurements |
| 12/22/1988 | DE3719275A1 Arrangement for the interference-free and low-reaction measurement of an electrical quantity |
| 12/21/1988 | EP0295413A1 Mechanical probe for the optical measurement of electrical potentials |
| 12/20/1988 | CA1247255A1 Measuring and damping resistor arrangement for a high- voltage apparatus |