Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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12/15/1988 | DE3734365A1 An additional indicator display for a digital measuring device |
12/15/1988 | DE3717528A1 Circuit board tester |
12/14/1988 | EP0295007A2 Film carrier, method for manufacturing a semiconductor device utilizing the same and an associated tester |
12/14/1988 | EP0294939A2 Multiple lead probe for integrated circuits in wafer form |
12/14/1988 | EP0294836A2 Voltage detector |
12/14/1988 | EP0294815A2 Voltage detecting device |
12/14/1988 | EP0294593A1 Mechanical probe for the optical measurement of electrical signals |
12/14/1988 | EP0294592A1 Contact device for the technique of testing circuit boards |
12/13/1988 | US4791376 Multi-probe, hand-held circuit tester |
12/13/1988 | US4791363 Ceramic microstrip probe blade |
12/13/1988 | US4790186 Device for mounting a terminal to an electric indicator |
12/08/1988 | DE3717782A1 Contact-making device for test devices |
12/07/1988 | EP0294205A2 Electromagnetic anechoic chamber with an inner electromagnetic wave reflection surface and an electromagnetic wave absorption small ball disposed in the chamber |
12/07/1988 | EP0293922A2 Voltage detector |
12/07/1988 | EP0293842A1 Voltage detector |
12/07/1988 | EP0293841A1 Voltage detector |
12/07/1988 | EP0293840A2 Voltage detector |
12/07/1988 | EP0293788A1 Voltage detector |
12/07/1988 | EP0293497A1 Arrangement of probes with a device for accurate positioning |
12/06/1988 | US4789829 Method and apparatus for determining RE gasket shielding effectiveness |
12/06/1988 | US4789822 Three-electrode sensor for phase comparison and pulse phase adjusting circuit for use with the sensor |
12/01/1988 | WO1988009489A1 Test meters |
12/01/1988 | DE3715700A1 Measuring capacitor |
11/30/1988 | EP0293304A1 High-speed side access edge connector testing assembly |
11/30/1988 | EP0292590A1 Contact device for testing equipment |
11/30/1988 | CN87217010U Miniature electromagnetic apparatus |
11/30/1988 | CN87102142A Automatically protected driving circuit |
11/29/1988 | US4788496 Adapter for a printed circuit board testing device |
11/29/1988 | US4787861 Resilient contact pin and a method of its manufacture |
11/23/1988 | CN88102678A Electroforming emp shieldiing elements |
11/22/1988 | US4786867 Wafer prober |
11/22/1988 | US4786862 Watchdog circuit for transmission line sensor module |
11/17/1988 | EP0291190A1 Woven cable with multiple lossy transmission lines |
11/09/1988 | EP0290182A1 High frequency passive probe |
11/09/1988 | EP0289618A1 Electric resistor equipped with thin film conductor and power detector |
11/08/1988 | US4783719 Test connector for electrical devices |
11/08/1988 | US4783625 Wideband high impedance card mountable probe |
11/08/1988 | US4783624 Contact probe devices and method |
11/08/1988 | CA1244557A1 Apparatus for electronically testing printed circuit boards and the like |
11/03/1988 | WO1988008522A1 Detector for force, acceleration and magnetism using resistor element |
11/03/1988 | DE3812654A1 Vorrichtung zum pruefen von schaltungsplatinen Apparatus for testing circuit circuit boards |
11/02/1988 | EP0288801A2 Probe card apparatus and method of providing same with reconfigurable probe card circuitry |
11/02/1988 | EP0288528A1 Testing device for electric printed circuit boards. |
11/01/1988 | US4782289 Positioning fixture for integrated circuit chip testing board |
10/25/1988 | US4780836 Method of testing semiconductor devices using a probe card |
10/25/1988 | US4780670 Active probe card for high resolution/low noise wafer level testing |
10/25/1988 | US4780086 Electrical interface arrangement |
10/19/1988 | EP0287451A1 Test and mounting connection method for an electronic component |
10/19/1988 | EP0286660A1 Method and configuration for testing electronic circuits and integrated circuit chips using a removable overlay layer. |
10/18/1988 | US4778771 Preliminary testing and selection for completion |
10/18/1988 | CA1243355A1 Probe having low battery detection/transmission feature |
10/12/1988 | EP0285799A2 Device for the functional electric testing of wiring arrays, in particular of circuit boards |
10/12/1988 | EP0285798A2 Device for the functional electric testing of wiring arrays, in particular of circuit boards |
10/11/1988 | US4777432 Device for electrically checking printed circuit boards |
10/11/1988 | US4777326 Woven cable with multiple lossy transmission lines |
10/06/1988 | DE3710093A1 Circuit board tester for circuit boards equipped on both sides with SMDs |
10/04/1988 | US4775020 Electronic appliance |
09/28/1988 | EP0284195A2 Extended spindle electric gauge mechanism |
09/28/1988 | EP0283545A1 Contact-pins arrangement for the electrical contacting of a test device with circular contact surfaces of a test sample |
09/27/1988 | US4774462 For printed circuit board |
09/27/1988 | US4774459 Adapter for a printed circuit board testing apparatus |
09/27/1988 | US4773877 Contactor for an electronic tester |
09/21/1988 | EP0283219A2 Apparatus for automatically scrubbing a surface |
09/20/1988 | US4772760 Nonorthogonal EMP shielding elements |
09/15/1988 | DE3706632A1 Device for testing free or connected cable conductors, in particular telephone conductors |
09/13/1988 | US4771234 Vacuum actuated test fixture |
09/13/1988 | US4771233 Printed curcuit board lead ammeter |
09/13/1988 | US4771230 Electro-luminescent method and testing system for unpopulated printed circuit boards, ceramic substrates, and the like having both electrical and electro-optical read-out |
09/13/1988 | CA1241992A1 Electrical test probe |
09/08/1988 | DE3739705A1 Device for testing electronic circuit boards |
09/08/1988 | DE3703030A1 Test arrangement for high-speed ICs |
09/07/1988 | WO1988006424A1 Apparatus for measuring data of living body |
09/06/1988 | US4769591 Testing apparatus for leadless package containing a high-frequency integrated circuit chip |
09/06/1988 | US4768972 Test clip for PLCC |
09/06/1988 | US4768461 Indicating device |
09/01/1988 | DE3705714A1 Test assembly for integrated circuits - has test head in form of integrated circuit with test points aligned esp. as mirror image with points on circuit being tested |
08/31/1988 | EP0280565A2 Test socket incorporating circuit elements |
08/30/1988 | US4767985 Claw grip contact probe for flat packs |
08/30/1988 | US4767983 Test fixture for electronic device packages |
08/24/1988 | EP0279700A2 Electrical connector (cut-off through the cover) |
08/24/1988 | EP0279649A2 Electrical connector with telescoping for sealing |
08/23/1988 | US4765471 Electrical component carrier |
08/23/1988 | CA1241060A1 Electronic probe having automatic readout of identification and status |
08/17/1988 | EP0278073A1 Probe for an adapter for a device for testing printed circuit boards |
08/16/1988 | US4764723 Wafer probe |
08/16/1988 | US4764722 Coaxial probe |
08/16/1988 | US4764719 Electro-luminescent automatic testing apparatus and method for ceramic substrates, printed circuit boards and like items with background illumination suppression |
08/03/1988 | EP0276280A1 Method for remotely detecting an electric field. |
08/03/1988 | CN87208638U Telemeter for industrial frequency current and voltage |
07/28/1988 | WO1988005544A1 Test connector for electrical devices |
07/28/1988 | DE3701072A1 Indicating (pointer-type) instrument |
07/27/1988 | EP0275634A1 Integrated-circuit chip test probe card |
07/26/1988 | US4760342 For determining the charge distribution |
07/26/1988 | US4760335 Large scale integrated circuit test system |
07/26/1988 | US4760334 Digital panel meter |
07/20/1988 | EP0274529A1 Liquid crystal display. |
07/20/1988 | CN87209275U Radio remotecontrolling and protecting unit for microamperemeter |
07/19/1988 | US4758962 Electrical power line and substation monitoring apparatus and systems |
07/19/1988 | US4758785 Pressure control apparatus for use in an integrated circuit testing station |
07/19/1988 | US4758784 Air core gauge with zero pointer return related application |