| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
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| 03/30/2011 | CN101329366B Manufacture method of probe short circuit preventing structure |
| 03/30/2011 | CN101315393B Timing triggering module of integrating device system |
| 03/30/2011 | CN101300495B Method for manufacturing conductive contact holder, and conductive contact holder |
| 03/30/2011 | CN101249630B Automatically cleaning mechanism of test interface of integrated circuit test jack and cleaning method thereof |
| 03/29/2011 | US7914325 Connector, printed circuit board, connecting device connecting them, and method of testing electronic part, using them |
| 03/24/2011 | US20110068784 Eddy current inspection system and method |
| 03/24/2011 | DE202011001707U1 Federkontaktstift Spring pin |
| 03/23/2011 | EP2297590A2 Test of electronic devices with boards without sockets based on magnetic locking |
| 03/23/2011 | CN201773171U Chip acceleration soft error rate testing device |
| 03/23/2011 | CN201773163U Simple multifunctional test lamp |
| 03/23/2011 | CN201773123U High-altitude DC generator device |
| 03/23/2011 | CN201773122U Test probe for laminated semi-conductor chip |
| 03/23/2011 | CN201773121U Novel full-sealing high voltage microampere meter shell |
| 03/23/2011 | CN201773120U Supporting device and solar test tooling comprising same |
| 03/23/2011 | CN201773119U Socket checking tool box |
| 03/23/2011 | CN201773118U Novel mounting structure of electric product |
| 03/23/2011 | CN201773117U Fixed alignment device |
| 03/23/2011 | CN201773116U Connection structure of chip tester host machine and chip load board |
| 03/23/2011 | CN201773115U Single-board test support |
| 03/23/2011 | CN201773114U Product testing equipment |
| 03/23/2011 | CN201773113U 绝缘帽 Insulating cap |
| 03/23/2011 | CN101989396A Apparatus for array test with cleaner units |
| 03/23/2011 | CN101988954A Equipment and method for testing aircraft ground power supply as well as device and method for loading aircraft ground power supply |
| 03/23/2011 | CN101988933A High-voltage high-capacity impulse voltage generator |
| 03/23/2011 | CN101988932A Probe unit and testing apparatus using the same |
| 03/23/2011 | CN101988931A Modular test plug |
| 03/23/2011 | CN101988930A Winding tracking device |
| 03/23/2011 | CN101988929A Fine adjustment device |
| 03/23/2011 | CN101413978B Semiconductor encapsulation component test device |
| 03/22/2011 | US7911200 Digital multimeter having case panel structure |
| 03/22/2011 | US7911199 Method for eliminating the need to zero and calibrate a power meter before use |
| 03/17/2011 | WO2011032012A2 Electrical terminal test point and methods of use |
| 03/17/2011 | WO2011030494A1 Coaxial probe pin, coaxial cable, and method for manufacturing the coaxial probe pin |
| 03/17/2011 | WO2011030379A1 Conductive member, connecting member, testing apparatus and method for repairing connecting member |
| 03/17/2011 | WO2011029496A1 Switch spring contact pin |
| 03/17/2011 | US20110066259 Projector probing method, control device, and storage medium |
| 03/17/2011 | US20110062980 Probe device having first and second probe pins |
| 03/17/2011 | US20110062979 Test system and probe apparatus |
| 03/17/2011 | US20110062978 Multiple contact probes |
| 03/17/2011 | US20110062975 Electrical terminal test point and methods of use |
| 03/17/2011 | US20110062946 Eddy Current Probes Having Magnetic Gap |
| 03/17/2011 | US20110062945 Device for measuring a current flowing in a cable |
| 03/17/2011 | US20110062314 Pixel Cell, Method for Driving a Pixel Cell, Method for Determination of a Position of a Maximum of an Envelope Curve of an Analog Amplitude-Modulated Signal, Device for Determination of a Charge Amount, Device and Method for Determination of a Charge Amount on a Capacitive Element, Device and Method for Setting a Circuit Node at a Prede-Termined Voltage, Device and Method for Charge-Based Analog/Digital Conversion and Device and Method for Charge-Based Signal Processing |
| 03/16/2011 | EP2295990A1 Contact probe pin for semiconductor test apparatus |
| 03/16/2011 | CN201765315U Battery testing device with layered structure |
| 03/16/2011 | CN201765304U Improved circuit board test fixture structure |
| 03/16/2011 | CN201765303U Flying probe testing machine |
| 03/16/2011 | CN201765300U Integrated automatic console for alternating current pressure resistant test |
| 03/16/2011 | CN201765260U Shifting device whose power supply outputs multiple currents |
| 03/16/2011 | CN201765259U Load circuit and load testing device with load circuit |
| 03/16/2011 | CN201765258U Measuring head lifting device |
| 03/16/2011 | CN201765257U Diode bare chip electromagnet elastic probe |
| 03/16/2011 | CN201765256U Self-adaptive polymer battery clamp |
| 03/16/2011 | CN201765255U Heavy-current test clamp |
| 03/16/2011 | CN201765254U Ems test carrier |
| 03/16/2011 | CN201765253U Extra-high voltage cable fault point searching test signal input terminal of general type GIS (geographic information system) equipment |
| 03/16/2011 | CN201765252U Portable mobile working platform suitable for relay protection field test |
| 03/16/2011 | CN101986428A Power semiconductor component, power semiconductor assembly including the same and a method for operating the power semiconductor assembly |
| 03/15/2011 | US7906957 High voltage connector and method having integrated voltage measurement probe points |
| 03/10/2011 | WO2011026608A1 Hf test prod |
| 03/10/2011 | US20110057678 Ceramic Substrate, Functional Ceramic Substrate, Probe Card and Method for Manufacturing Ceramic Substrate |
| 03/10/2011 | US20110057676 Universal spring contact pin and ic test socket therefor |
| 03/10/2011 | US20110057675 Perpendicular fine-contact probe having a variable-stiffness structure |
| 03/10/2011 | US20110057645 Method and Pulse-Width-Modulated Current Control Circuit For Driving Inductive Loads in Motor Vehicles |
| 03/10/2011 | CA2761235A1 Hf test prod |
| 03/09/2011 | EP2293086A1 A probe for testing electrical properties of a rest sample |
| 03/09/2011 | EP2293085A1 Measuring device |
| 03/09/2011 | EP2291666A1 Method for detecting the contact between measuring needles and a device under test |
| 03/09/2011 | CN201757775U Dual-purpose conversion structure of point measuring machine and dual-purpose point measuring machine thereof |
| 03/09/2011 | CN201757769U Lightning protection device tester with drawer for storing testing accessories |
| 03/09/2011 | CN201757757U Double flow passage unit device of QFN integrated circuit test separator |
| 03/09/2011 | CN101984357A Mixed linear amplified megawatt resonant power supply used in partial discharge measurement |
| 03/09/2011 | CN101515000B Method and device for improving measuring precision of current magnitude |
| 03/09/2011 | CN101308194B Probe apparatus |
| 03/08/2011 | US7901958 Fabrication method of semiconductor integrated circuit device |
| 03/03/2011 | WO2011024344A1 Contact block |
| 03/03/2011 | WO2011024303A1 Probe, probe card and electronic component testing apparatus |
| 03/03/2011 | WO2011024295A1 Interface apparatus and semiconductor testing apparatus |
| 03/03/2011 | US20110050274 Maintaining A Wafer/Wafer Translator Pair In An Attached State Free Of A Gasket Disposed Therebetween |
| 03/03/2011 | US20110050273 Fast testable wafer and wafer test method |
| 03/03/2011 | US20110050267 Electromagnetic shield for testing integrated circuits |
| 03/03/2011 | US20110050265 Method and apparatus for multilayer support substrate |
| 03/03/2011 | US20110050263 Probe and method of manufacturing probe |
| 03/03/2011 | US20110049709 Method of manufacturing a semiconductor device |
| 03/03/2011 | DE112009000739T5 Empfänger zum Rückgewinnen und Neutakten elektromagnetisch gekoppelter Daten A receiver for recovering and retiming electromagnetically coupled data |
| 03/02/2011 | EP2290378A2 An elastic unit as a separate elastic member to be mounted at an elastic unit receiving section of an align fixture |
| 03/02/2011 | EP2290377A2 Two abutting sections of an align fixture together floatingly engaging an electronic component |
| 03/02/2011 | EP2290376A2 An elastic unit for clamping an electronic component and extending below an electronic component receiving volume of an align fixture |
| 03/02/2011 | EP2290375A2 Carrier for aligning electronic components with slidably arranged plates |
| 03/02/2011 | EP2290374A2 Elastic unit exerting two angled force components on an abutting section of an align fixture |
| 03/02/2011 | CN201754169U Lifting type test car |
| 03/02/2011 | CN201754160U Magnetic-sensing probe of amorphous glass coated wire and current measurement device comprising the probe |
| 03/02/2011 | CN201754159U CT high-voltage comprehensive tester |
| 03/02/2011 | CN101982790A Analysis experimental device and analysis experimental method for protection malfunction caused by direct current (DC) grounding cause |
| 03/02/2011 | CN101583860B Optical device inspecting apparatus |
| 03/02/2011 | CN101430356B Directly tandem high-voltage impulse power supply for insulation detection |
| 03/01/2011 | US7898273 Probe for testing a device under test |
| 03/01/2011 | US7897435 Re-assembly process for MEMS structures |
| 02/24/2011 | WO2011022301A2 Wafer level contactor |
| 02/24/2011 | US20110043240 Method and apparatus for providing active compliance in a probe card assembly |