Patents
Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251)
07/2007
07/11/2007EP1805103A1 Programmable molecular manipulating processes
07/10/2007US7241994 Scanning probe microscope and specimen surface structure measuring method
07/10/2007US7240541 Optical microcantilever, manufacturing method thereof, and optical microcantilever holder
07/10/2007US7240428 Method for making probes for atomic force microscopy
07/04/2007EP1804050A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser doppler interferometer with specimen light excitation function, using the array, and cantilever
07/04/2007CN1993609A A method for fabricating spm and cd-spm nanoneedle probe using ion beam and spm and cd-spm nanoneedle probe thereby
06/2007
06/28/2007US20070144244 Probe module with integrated actuator for a probe microscope
06/20/2007EP1797568A1 Nanomanipulator used for analyzing or machining objects
06/14/2007WO2007065802A1 Y-shaped carbon nanotubes as afm probe for analyzing substrates with angled topography
06/14/2007WO2006090593A9 Displacement detection mechanism for scanning probe microscope and scanning probe microscope
06/14/2007DE112005001585T5 Verfahren zur Herstellung von SPM- und CD-SPM-Nanonadel-Sonden unter Einsatz von Ionenstrahlen und dadurch hergestellte SPM- und CD-SPM-Nanonadel-Sonden Process for the preparation of SPM and SPM CD nanoneedle probes using ion beams produced thereby and SPM and SPM CD nanoneedle probes
06/07/2007US20070125946 Y-shaped carbon nanotubes as afm probe for analyzing substrates with angled topography
06/07/2007US20070125160 Short and thin silicon cantilever with tip and fabrication thereof
05/2007
05/31/2007WO2007001397A3 Nanostructure devices and fabrication method
05/31/2007US20070121476 Data recording device with conducting microtips and production method thereof
05/31/2007US20070119372 Method and apparatus for controlling the length of a carbon nanotube
05/31/2007DE102005057218A1 Sondenvorrichtung und Messanordnung zur Messung von Mikro- und/oder Nanostrukturen A probe assembly and measuring arrangement for measurement of micro- and / or nano-structures
05/30/2007EP1218947A4 Force sensing devices with multiple filled and/or empty channels and other attributes
05/30/2007EP1130379B1 Optical cantilever for scanning microscope and method of its production
05/30/2007CN1971757A Multi-probe for writing and reading data and method of operating the same
05/29/2007US7223438 depositing a hard magnet nanostructure precursor barium ferrite on substrate from a tip; converting the precursor to form the hard magnet nanostructure on the substrate
05/24/2007WO2007058804A1 Dielectrophoretic tweezers apparatus and methods
05/24/2007US20070114457 Nano tip and fabrication method of the same
05/24/2007US20070114402 Object inspection and/or modification system and method
05/24/2007US20070114400 Probe
05/22/2007US7220962 Cantilever array and scanning probe microscope including a sliding, guiding, and rotating mechanism
05/22/2007US7219538 Balanced momentum probe holder
05/17/2007US20070111350 Semiconductor nanocrystal probes for biological applications and process for making and using such probes
05/17/2007US20070111250 Probe carrier, method of producing the probe carrier, method of evaluating the probe carrier and method of detecting a target nucleic acid using the same
05/17/2007US20070108159 Probe for scanning probe microscope and method of producing the same
05/16/2007CN1963451A Vibration-type cantilever holder and scanning probe microscope
05/16/2007CN1315623C Nanotweezers and nanomanipulator
05/10/2007US20070104079 Vibration-type cantilever holder and scanning probe microscope
05/10/2007DE102004056241B4 Nahfeldsonde Near-field probe
05/09/2007EP1782078A1 A method for providing alignment of a probe
05/09/2007EP1664387A4 Deposition method for nanostructure materials
05/09/2007CN1315169C Parallel, individually addressable probes for nanolithography
05/09/2007CN1314578C Methods utilizing scanning probe microscope tips and products therefor or produced thereby
05/08/2007US7214303 Branched cantilever comprising ferromagnetic material and tubules attached to electrode pair coupled to electrical circuit; Magnetic (Resonance) Force Microscopy
05/02/2007EP1780173A1 Nanometric mechanical oscillator, method of fabricating the same, and measurement apparatus using the same
05/02/2007EP1779391A1 Optically controllable device
05/02/2007EP1203749B1 Nanometer-order mechanical vibrator, production method thereof and measuring device using it
05/01/2007US7211795 Method for manufacturing single wall carbon nanotube tips
04/2007
04/26/2007WO2007045739A1 Reading/writing tip, head and device, and use thereof, and method for making same
04/19/2007WO2007044076A2 Cantilever probes for nanoscale magnetic and atomic force microscopy
04/19/2007US20070085002 Probe for scanning thermal microscope
04/18/2007EP1775570A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser Doppler interferometer with specimen light excitation function, using the array and cantilever
04/18/2007EP1775569A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser Doppler interferometer with specimen light excitation function, using the array and cantilever
04/18/2007EP1775568A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser Doppler interferometer with specimen light excitation function, using the array and cantilever
04/18/2007EP1775567A2 Cantilever array, method of manufacturing the array, and scanning probe microscope, sliding device of guide and rotating mechanism, sensor, homodyne laser interferometer, and laser Doppler interferometer with specimen light excitation function, using the array and cantilever
04/18/2007EP1775258A1 Nanometric mechanical oscillator, method of fabricating the same, and measurement apparatus using the same
04/18/2007EP1774288A1 Sensing apparatus
04/17/2007US7205069 Heating the mixture under oxidizing conditions sufficient to remove the amorphous carbon, followed by recovering a product consisting of 80% by weight of single-wall carbon nanotubes
04/12/2007WO2007040283A1 Probe and cantilever
04/05/2007WO2007037998A1 Multifunctional probe array system
04/05/2007WO2007037994A2 Manufacturing of micro-objects such as miniature diamond tool tips
04/05/2007WO2007036222A2 Method and device for positioning a movable part in a test system
04/05/2007DE10326379B4 Scansonden-Mikroskop zur Bestimmung topologischer oder elektrischer Eigenschaften eines Probenkörpers sowie Verfahren zur Herstellung eines Sondenkörpers Scanning probe microscope for determining topological or the electrical properties of a sample body and to methods for preparing a probe body
04/03/2007US7198900 forming at least one molecular complex comprising at least one analyte and at least one first probe comprising at least one reaction portion and at least one identity portion comprising at least one coded molecular tag
03/2007
03/29/2007WO2006138593A3 Atom probe component treatments
03/29/2007US20070068995 Manufacturing of micro-objects such as miniature diamond tool tips
03/28/2007EP1767490A2 Nanometric mechanical oscillator, method of fabricating the same, and measurement apparatus using the same
03/28/2007CN1937094A Scanning thermal microscope probe
03/27/2007CA2405047C Time-of-flight mass spectrometer array instrument
03/22/2007US20070062266 Optical microcantilever, manufacturing method thereof, and optical microcantilever holder
03/22/2007US20070062264 Multifunctional probe array system
03/22/2007DE102006039651A1 Cantilever und Prüfvorrichtung Cantilever and Tester
03/15/2007WO2007029499A1 Sharp end forming member, apparatus wherein such sharp end forming member is applied and method for forming sharp end forming member
03/15/2007US20070056362 Oscillating probe with a virtual probe tip
03/08/2007US20070052433 Coaxial probe, method for production thereof, and device for measuring in the near electromagnetic field on systems at a submicrometric distance
03/08/2007US20070051887 Cantilever and inspecting apparatus
03/08/2007US20070051169 Semiconductor probe with high resolution resistive tip and method of fabricating the same
03/07/2007EP1054249B1 Electronic device surface signal control probe and method of manufacturing the probe
03/01/2007WO2007024155A1 Scanning probe microscope combined with an object surface modifying device
03/01/2007US20070048209 Continuous fiber of fullerene nanotubes
02/2007
02/28/2007EP1757919A1 Probe head manufacturing method
02/27/2007US7182876 Cantilever microstructure and fabrication method thereof
02/27/2007US7181958 High aspect ratio tip atomic force microscopy cantilevers and method of manufacture
02/22/2007US20070043158 Composite of carbon nanotubes, resistant to delamination, as a template in continuous growing of macroscopic carbon fiber, three-dimensional structure of derivatized single-wall nanotube molecules
02/15/2007US20070035724 Nanoparticles functionalized probes and methods for preparing such probes
02/15/2007US20070033993 Dual tip atomic force microscopy probe and method for producing such a probe
02/15/2007US20070033992 Method for attaching rod-shaped nano structure to probe holder
02/13/2007US7176457 MEMS differential actuated nano probe and method for fabrication
02/13/2007US7176118 Circuit constructions
02/01/2007US20070022804 Scanning probe microscopy inspection and modification system
01/2007
01/31/2007EP1748447A1 Dual tip atomic force microscopy probe and method for producing such a probe
01/30/2007US7170054 Scanning probe microscopy cantilever holder and scanning probe microscope using the cantilever holder
01/30/2007US7169329 Carbon nanotube adducts and methods of making the same
01/25/2007US20070020938 Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semiconductor probe
01/25/2007US20070018098 Nanotube probe and method for manufacturing the same
01/25/2007US20070018096 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers
01/24/2007EP1622500A4 Parallel analysis of molecular interactions
01/23/2007US7166325 Carbon nanotube devices
01/17/2007EP1744143A1 Scanning probe microscope probe and production method therefor and scanning probe microscope and application method therefor and needle-like element and production method therefor and electron element and production method therefor and charge density wave quantum phase microscope and charge density wave quantum interferomet
01/16/2007US7163658 Rapid sequencing of polymers
01/11/2007US20070007142 Methods for assembly and sorting of nanostructure-containing materials and related articles
01/10/2007EP1742034A1 Spm cantilever and method of manufacturing the same
01/09/2007US7161148 Tip structures, devices on their basis, and methods for their preparation
01/09/2007US7159452 Method for measuring a configuration of an object
01/04/2007WO2007001397A2 Nanostructure devices and fabrication method
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