| Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251) |
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| 01/23/2008 | EP1427983A4 Multiple plate tip or sample scanning reconfigurable scanned probe microscope with transparent interfacing of far-field optical microscopes |
| 01/23/2008 | CN101110277A Self-aligning scanning probes for a scanning probe microscope |
| 01/17/2008 | US20080013437 Probe for scanning over a substrate and a data storage device |
| 01/17/2008 | US20080011066 Atomic force microscope cantilever and method for manufacturing the same |
| 01/17/2008 | DE112006000419T5 Abtastsondenmikroskop-Versatzerfassungsmechanismus und Abtastsondenmikroskop, welches dergleichen verwendet Scanning probe displacement detection mechanism and scanning probe microscope, which uses like |
| 01/15/2008 | US7319527 Sensor with cantilever and optical resonator |
| 01/10/2008 | US20080006534 Deposition method for nanostructure materials |
| 01/09/2008 | EP1653478B1 Surface texture measuring probe and microscope utilizing the same |
| 01/09/2008 | EP1649485A4 Laser stimulated atom probe characterization of semiconductor and dielectric structures |
| 01/03/2008 | US20080000293 Spm Cantilever and Manufacturing Method Thereof |
| 01/01/2008 | US7314764 Medical and nonmedical fluorescence microscopy, histology, flow cytometry, in situ hybridization, immunoassays and nucleotide sequences separation and determination; semiconductor nanocrystal which emits light when excited; affinity molecule linked to the semiconductor nanocrystal |
| 12/27/2007 | US20070295920 Optically Controllable Device |
| 12/25/2007 | US7312619 Multiple local probe measuring device and method |
| 12/20/2007 | US20070289369 Multifunctional probe array system |
| 12/18/2007 | US7309991 Scanning probe inspection apparatus |
| 12/18/2007 | US7309863 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers |
| 12/13/2007 | WO2007078316A3 Tapered probe structures and fabrication |
| 12/13/2007 | WO2007044076A3 Cantilever probes for nanoscale magnetic and atomic force microscopy |
| 12/13/2007 | US20070285078 Probe microscope and measuring method using probe microscope |
| 12/06/2007 | WO2007121208A3 Nanometer-precision tip-to-substrate control and pattern registration for scanning-probe lithography |
| 12/06/2007 | US20070281156 Nanoscale wires and related devices |
| 12/06/2007 | US20070278405 Multi-tip surface cantilever probe |
| 12/05/2007 | EP1474836A4 Deposition method for nanostructure materials |
| 12/04/2007 | US7302832 Use of arrays of atomic force microscope/scanning tunneling microscope tips to scan nanocodes |
| 11/29/2007 | WO2007135345A1 Controlled atomic force microscope |
| 11/29/2007 | US20070272855 Scanning probe microscope probe and manufacturing method therefor, scanning probe microscope and using method therefor, needle-like body and manufacturing method therefor, electronic device and manufacturing method therefor, charge density wave quantum phase microscope, and charge density wave quantum interferometer |
| 11/29/2007 | US20070271996 Cantilever Assembly |
| 11/29/2007 | CA2653116A1 Controlled atomic force microscope |
| 11/28/2007 | EP1860424A1 Self-aligning scanning probes for scanning probe microscope |
| 11/28/2007 | CN100351300C Rubber composition and process for production thereof |
| 11/27/2007 | US7301199 Nanoscale wires and related devices |
| 11/22/2007 | US20070267385 Semiconductor probe with high resolution resistive tip and method of fabricating the same |
| 11/20/2007 | US7297933 Probe, near-field light generation apparatus including probe, exposure apparatus, and exposing method using probe |
| 11/15/2007 | US20070261480 Atomic force microscope tip arrays and methods of manufacturing same |
| 11/13/2007 | US7295495 XY platform device with nanoscale precision |
| 11/08/2007 | DE102006021289A1 Angular spacing or angle of e.g. circle, determining method, involves moving sensor relative to atomic lattice on circular path, detecting number and/or position of atoms of lattice, and determining angular spacing or angle by sensor |
| 11/01/2007 | US20070253001 Three-Dimensional Shape Measuring Unit, Processing Unit, and Semiconductor Device Manufacturing Method |
| 10/30/2007 | US7287421 Semiconductor probe with high resolution resistive tip and method of fabricating the same |
| 10/25/2007 | WO2007121208A2 Nanometer-precision tip-to-substrate control and pattern registration for scanning-probe lithography |
| 10/25/2007 | WO2007037994A3 Manufacturing of micro-objects such as miniature diamond tool tips |
| 10/25/2007 | US20070249001 Multiplex Detection Compositions, Methods, and Kits |
| 10/23/2007 | US7285792 Scratch repairing processing method and scanning probe microscope (SPM) used therefor |
| 10/17/2007 | EP1844475A1 Near-field antenna |
| 10/16/2007 | US7281419 Multifunctional probe array system |
| 10/11/2007 | WO2007114355A1 Information storage device using probe |
| 10/11/2007 | WO2007114353A1 Information storage device using probe |
| 10/11/2007 | US20070239308 Sorting a group of integrated circuit devices for those devices requiring special testing |
| 10/11/2007 | US20070235340 Nanotube with with a Y-shaped or V-shaped morphology coated with microparticulate ferromagnetic materials (iron, cobalt, nickel or alloys) capable of generating magnetic field and sensing magnetic response attached to substrate and extending outward; electrical resistance and high mechanical strength |
| 10/11/2007 | US20070234786 Nanometer-precision tip-to-substrate control and pattern registration for scanning-probe lithography |
| 10/09/2007 | US7278301 System for sensing a sample |
| 10/09/2007 | US7278298 Scanner for probe microscopy |
| 10/09/2007 | US7278297 Oscillating probe with a virtual probe tip |
| 10/09/2007 | US7278296 Scanning probe microscope |
| 10/03/2007 | EP1177153B1 Bulk synthesis of long nanotubes of transition metal chalcogenides |
| 09/27/2007 | US20070221840 Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth |
| 09/20/2007 | WO2005076832A3 Method for manufacturing single wall carbon nanotube tips |
| 09/20/2007 | US20070214875 Cantilever and cantilever manufacturing method |
| 09/19/2007 | CN100338687C Actuating and sensing device for scanning probe microscopes |
| 09/13/2007 | US20070211986 Optical microcantilever, manufacturing method thereof, and optical microcantilever holder |
| 09/13/2007 | US20070211542 Multi-probe for writing and reading data and method of operating the same |
| 09/11/2007 | US7268356 Method and apparatus for specimen fabrication |
| 09/11/2007 | US7268348 Scanning probe for data storage and microscopy |
| 09/11/2007 | US7266998 Method and apparatus for micromachines, microstructures, nanomachines and nanostructures |
| 09/07/2007 | WO2007036222A3 Method and device for positioning a movable part in a test system |
| 09/06/2007 | US20070208533 Image reconstruction method |
| 09/06/2007 | US20070205707 Electronic device containing a carbon nanotube |
| 09/06/2007 | US20070204681 Carbon thin line probe |
| 09/06/2007 | DE102006008858A1 Probe device for raster probe microscope, has extension arm and tip within nanometeric range, formed at extension arm and made by additive method to measure scanned samples |
| 09/05/2007 | EP1830367A2 Carbon nanotube probe |
| 09/05/2007 | EP1829050A1 Scanner for probe microscopy |
| 09/05/2007 | EP1502306A4 Method of fabricating probe for spm having fet channel structure utilizing self-aligned fabrication |
| 09/05/2007 | EP1502296A4 Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semiconductor probe |
| 08/29/2007 | EP1826552A1 Mechanical vibrator and production method therefor |
| 08/28/2007 | US7261352 Electrostatically driven carbon nanotube gripping device |
| 08/23/2007 | US20070195333 Atomic force microscope |
| 08/23/2007 | DE102005063127B3 Mikro- und Nanospitzen sowie Verfahren zu deren Herstellung Micro- and nano-tips as well as processes for their preparation |
| 08/21/2007 | US7259099 Strongly textured atomic ridge nanowindows |
| 08/09/2007 | WO2007088018A1 Miniaturized spring element and method for producing the latter |
| 08/09/2007 | US20070180889 Probe replacement method for scanning probe microscope |
| 08/09/2007 | DE102006004922A1 Miniaturisiertes Federelement und Verfahren zu dessen Herstellung Miniaturized spring element and process for its preparation |
| 08/09/2007 | CA2640702A1 Miniaturized spring element and method for producing the latter |
| 08/07/2007 | US7253408 Environmental cell for a scanning probe microscope |
| 08/07/2007 | US7253407 Active cantilever for nanomachining and metrology |
| 08/07/2007 | US7252749 Multilayer structure; electrolysis |
| 07/31/2007 | US7249494 Beam tracking system for scanning-probe type atomic force microscope |
| 07/25/2007 | CN101003355A Direct write nano etching method |
| 07/24/2007 | US7249002 Direct relative motion measurement for vibration induced noise and drift cancellation |
| 07/24/2007 | US7247895 Electrostatic nanolithography probe actuation device and method |
| 07/24/2007 | US7247504 Ferroelectric capacitor, process for production thereof and semiconductor device using the same |
| 07/24/2007 | US7247384 tip coated with a monolayer of ethylene glycol derivatives resists the adsorption of proteins |
| 07/19/2007 | WO2007079975A1 Microtips and nanotips, and method for their production |
| 07/19/2007 | US20070164214 Conductive carbon nanotube tip, probe having the conductive carbon nanotube tip, and method of manufacturing the conductive carbon nanotube tip |
| 07/19/2007 | US20070163335 Method and apparatus for measuring electrical properties in torsional resonance mode |
| 07/19/2007 | US20070163137 Metrology instruments |
| 07/12/2007 | WO2007079269A2 Atomic force microscope tip arrays and methods of manufacturing same |
| 07/12/2007 | WO2007078979A2 Probe module with integrated actuator for a probe microscope |
| 07/12/2007 | WO2007078316A2 Tapered probe structures and fabrication |
| 07/12/2007 | WO2007077842A1 Nano probe and fabrication method thereof |
| 07/12/2007 | US20070158554 Probe for probe microscope using transparent substrate, method of producing the same, and probe microscope device |
| 07/11/2007 | EP1806572A1 Measuring device with daisy type cantilever wheel |