Patents
Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251)
09/2008
09/04/2008WO2008105919A2 Nanomechanical characterization of cellular activity
09/04/2008WO2008104672A2 Method for growing a carbon nanotube on a nanometric tip
09/04/2008US20080210864 Local Injector of Spin-Polarized Electrons with Semiconductor Tip Under Light
09/03/2008EP1089066B1 Optical micro cantilever, method of manufacture thereof, and micro cantilever holder
09/02/2008US7419651 Composite of carbon nanotubes, resistant to delamination, as a template in continuous growing of macroscopic carbon fiber, three-dimensional structure of derivatized single-wall nanotube molecules
09/02/2008US7419624 Methods for producing composites of fullerene nanotubes and compositions thereof
08/2008
08/26/2008US7416699 Carbon nanotube devices
08/21/2008WO2008054476A3 Electrostatic nanolithography probe actuation device and method
08/20/2008EP1958207A1 Dielectrophoretic tweezers apparatus and methods
08/20/2008EP1957954A1 Y-shaped carbon nanotubes as afm probe for analyzing substrates with angled topography
08/14/2008US20080193752 Near-Field Antenna
08/14/2008US20080191151 Method and apparatus for specimen fabrication
08/13/2008EP1956607A1 AFM probe with variable stiffness
08/12/2008US7411210 Semiconductor probe with resistive tip having metal shield thereon
08/12/2008US7411189 Cantilever array, method for fabricating the same, scanning probe microscope, sliding apparatus of guiding and rotating mechanism, sensor, homodyne laser interferometer, laser doppler interferometer having optically exciting function for exciting sample, each using the same, and method for exciting cantilevers
08/05/2008US7408835 Optically readable molecular memory obtained using carbon nanotubes, and method for storing information in said molecular memory
07/2008
07/31/2008WO2007079975A8 Microtips and nanotips, and method for their production
07/30/2008EP1950551A1 Probe and cantilever
07/22/2008US7402849 Parallel, individually addressable probes for nanolithography
07/22/2008US7402736 Method of fabricating a probe having a field effect transistor channel structure
07/15/2008US7398678 Probe for a scanning microscope
07/10/2008US20080166560 surface of carbon nanotube is coated with a ferromagnetic alloy film consisting a Co Fe alloy or a Co Ni alloy; minimizing magnetic leakage, controlling surface smoothness; evaluate magnetic storage media on which data has been magnetically recorded at ultra-high density
07/08/2008US7396564 discharging electrode mounted on one side of the positioning platform whose position can be calibrated with the platform to cut the carbon nanotube; applying a voltage pulse to the electrode
07/02/2008EP1938335A1 Reading/writing tip, head and device, and use thereof, and method for making same
07/02/2008EP1938081A1 Multifunctional probe array system
07/01/2008US7393713 Method of fabricating near field optical probe
06/2008
06/26/2008US20080149829 Scanning probe microscope with automatic probe replacement function
06/25/2008EP1535300A4 Improved method and system for scanning apertureless fluorescence microscope
06/24/2008US7390767 Deposting a catalytic metal at the end of fullerene nanotubes, activating the catalytic metal; removing the end caps by an oxidative treatment
06/24/2008US7390477 Fullerene nanotube compositions
06/17/2008US7388199 Probe manufacturing method, probe, and scanning probe microscope
06/17/2008US7387035 Method of making a force curve measurement on a sample
06/11/2008EP1929267A2 Method and device for positioning a movable part in a test system
06/05/2008WO2008065790A1 Metallic probe, method of forming the same and metallic probe forming apparatus
06/05/2008WO2007079269A3 Atomic force microscope tip arrays and methods of manufacturing same
06/05/2008WO2007078979A3 Probe module with integrated actuator for a probe microscope
06/04/2008EP1927845A1 Cantilever holder and scanning probe microscope including the same
05/2008
05/29/2008US20080121800 Cantilever holder and scanning probe microscope including the same
05/29/2008US20080121029 For Atomic Force Microscope (AFM); reproducibility, high resolution, reliability and durability
05/29/2008US20080121028 Scanning Probe Microscopy Inspection and Modification System
05/21/2008CN101182312A Pyrazinamide derivatives as well as preparation method and uses thereof
05/20/2008US7375324 Stylus system for modifying small structures
05/20/2008US7375322 Cantilever holder and scanning probe microscope
05/15/2008US20080113099 controlling deposition from scanning probe microscope tips to substrates, using electrical, magnetic, chemical or analogous forces
05/14/2008CN100387968C Atomic force microscope and driving method therefor
05/13/2008US7372025 Scanning probe microscope using a surface drive actuator to position the scanning tip
05/13/2008US7372013 Near field scanning microscope probe and method for fabricating same
05/13/2008US7370515 Probes for use in scanning probe microscopes and methods of fabricating such probes
05/08/2008WO2008054476A2 Electrostatic nanolithography probe actuation device and method
05/08/2008WO2008054467A2 Monolithic high aspect ratio nano-size scanning probe microscope (spm) tip formed by nanowire growth
05/08/2008US20080107586 Method for producing a catalyst support and compositions thereof
05/08/2008CA2642875A1 Monolithic high aspect ratio nano-size scanning probe microscope (spm) tip formed by nanowire growth
05/07/2008EP1680782B1 Data-recording device comprising conductive microtips and production method thereof
05/06/2008US7368712 Y-shaped carbon nanotubes as AFM probe for analyzing substrates with angled topography
05/06/2008US7368305 High aspect ratio micromechanical probe tips and methods of fabrication
05/01/2008US20080099339 Forming a suspension of pre-formed nanostructure-containing material in a liquid medium; adding a charger, immersing the electrode and the multilayer structure in the suspension, applying a current to the electrode and the multilayer structure
04/2008
04/30/2008DE102006004922B4 Miniaturisiertes Federelement und Verfahren zu dessen Herstellung, Balkensonde, Rasterkraftmikroskop sowie Verfahren zu dessen Betrieb Miniaturized spring element and method for its manufacture, probe beam, atomic force microscope and method for its operation
04/29/2008US7366704 System and method for deconvoluting the effect of topography on scanning probe microscopy measurements
04/24/2008US20080094089 Semiconductor probe having embossed resistive tip and method of fabricating the same
04/23/2008CN101165816A Semiconductor probe having embossed resistive tip and method of fabricating the same
04/22/2008US7361821 Using oligonucleotide probes for detection, identification and/or sequencing of nucleic acids and/or biomolecules; for use in medical diagnostics, forensics, toxicology, pathology, biological warfare
04/17/2008US20080089830 using inexpensive carbon feedstocks at moderate temperatures; high yield, single step method for producing large quantities of continuous macroscopic carbon fiber from molecular array of single-wall CNTs as a template; felt comprises bucky paper material
04/16/2008EP1290431B1 Method for producing a device for simultaneously carrying out an electrochemical and a topographical near-field microscopy
04/15/2008US7357906 Method for fractionating single-wall carbon nanotubes
04/10/2008US20080083270 Carbon nanotube detection system
04/09/2008CN101159171A Semiconductor probe having wedge shape resistive tip and method of fabricating the same
04/08/2008US7354563 Method for purification of as-produced fullerene nanotubes
04/03/2008US20080078932 Scanning probe microscope capable of measuring samples having overhang structure
04/03/2008US20080078240 Scanner for probe microscopy
04/03/2008US20080078239 Semiconductor probe having wedge shape resistive tip and method of fabricating the same
04/03/2008US20080078229 Caliper method, system, and apparatus
04/02/2008EP1362230A4 Balanced momentum probe holder
04/01/2008US7351604 Microstructures
03/2008
03/19/2008EP1685391A4 An oscillating probe with a virtual probe tip
03/18/2008US7344756 Method for scanning probe contact printing
03/13/2008WO2008031076A2 Atomic force microscope
03/13/2008WO2008029561A1 Scan type probe microscope and active damping drive control device
03/13/2008US20080063588 heating to remove amorphous carbon deposits and other impurities, then recovering and washing in nonionic surfactants
03/13/2008US20080061798 Microcoaxial probes made from strained semiconductor bilayers
03/13/2008US20080061231 Nanowire scanning probe microscopy probe for molecular recognition imaging
03/13/2008US20080060426 Atomic force microscope
03/12/2008CN100375295C Method of fabricating probe for SPM having FET channel structure utilizing self-aligned fabrication
03/04/2008US7337656 Surface characteristic analysis apparatus
02/2008
02/28/2008US20080048115 Scanning probe microscope displacement detecting mechanism and scanning probe microscope using same
02/27/2008EP1892499A2 Atomic force microscope for generating a small incident beam spot
02/26/2008US7335942 Field effect transistor sensor
02/26/2008US7334460 Method and apparatus of manipulating a sample
02/20/2008EP1889031A1 Nanometric emitter/receiver guides
02/20/2008EP1292361B1 Methods utilizing scanning probe microscope tips and products therefor or produced thereby
02/14/2008US20080038538 Method of Producing Nanostructure Tips
02/14/2008DE102006008858A9 Sondeneinrichtung The probe assembly
02/13/2008EP1315968B1 Method for precipitating mono and multiple layers of organophosphoric and organophosphonic acids and the salts thereof in addition to use thereof
02/06/2008EP1883932A1 Local injector of spin-polarized electrons with semiconductor tip under light excitation
02/06/2008EP1340112B1 Micropositioning device
02/05/2008US7328446 Apparatus for reducing sensitivity of an article to mechanical shock
01/2008
01/31/2008DE112006000452T5 Rastersondenmikroskop und Messverfahren damit Scanning probe microscope and measuring procedures so
01/24/2008US20080018993 Self-aligning scanning probes for a scanning probe microscope
01/24/2008US20080017809 Scanning Probe Microscope System
01/24/2008US20080017609 Probe Head Manufacturing Method
01/23/2008EP1881317A1 Scanning probe microscope system
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