| Patents for G01Q 70 - General aspects of spm probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single spm technique covered by group (3,251) |
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| 04/28/2009 | US7525088 Optically controllable device |
| 04/28/2009 | US7524534 coating microscope tips with patterning compounds and using the coated tip to apply the compounds to substrate so as to produce a desired patterns; nanolithography |
| 04/28/2009 | US7523650 Multifunctional probe array system |
| 04/23/2009 | WO2009052338A2 Dual-tipped probe for atomic force microscopy |
| 04/23/2009 | WO2009001220A8 Functionalization of microscopy probe tips |
| 04/23/2009 | US20090106869 Method for fabricating spm and cd-spm nanoneedle probe using ion beam and spm and cd-spm nanoneedle probe thereby |
| 04/23/2009 | US20090100917 Rocking y-shaped probe for critical dimension atomic force microscopy |
| 04/21/2009 | US7521257 Using treated cantilever of an atomic force microscope operating in a tapping mode against a mechanical stop to detect and determine concentration of biopolymers: miniaturized detectors; biosensors |
| 04/21/2009 | US7520165 Micro structure, cantilever, scanning probe microscope and a method of measuring deformation quantity for the fine structure |
| 04/15/2009 | CN100478666C Micro structure, cantilever, scanning probe microscope and a method of measuring deformation quantity for the fine structure |
| 04/14/2009 | US7517546 Precipitation occurs on substrate surfaces of oxides, nitrides, or carbides of metals and semiconductors, comprising use of water-soluble salts of compounds for treatment of these surfaces as sensor platforms, implants, medical devices |
| 04/07/2009 | US7514678 Probe for scanning thermal microscope |
| 04/07/2009 | US7514214 coating a nanostructure with a passivation layer and altering the passivation layer to form biosensors capable of detecting specific molecules and changes in (inter)molecular dynamics in combination with fluorescence detection |
| 03/31/2009 | US7511828 Three-dimensional shape measuring unit, processing unit, and semiconductor device manufacturing method |
| 03/31/2009 | US7511270 Nanotube probe and a method for manufacturing the same |
| 03/31/2009 | US7510695 nanoscale array of microwells is provided on a substrate; a metal catalyst is deposited in each microwells; and a stream of hydrocarbon or CO feedstock gas is directed at the substrate under conditions that effect growth of fullerene nanotubes from each microwell |
| 03/26/2009 | WO2009037249A1 Solid immersion lens and related method for making same |
| 03/24/2009 | US7507958 Conductive carbon nanotube tip, probe having the conductive carbon nanotube tip, and method of manufacturing the conductive carbon nanotube tip |
| 03/24/2009 | US7507320 Electroplating a small quantity of noble metal on the apex of a single crystal metal wire that has been etched to form a tip in low concentration noble metal electrolyte in a base aqueous liquid; annealing in vacuum or in inert gas ambient to diffuse the additional electroplated noble metal atoms |
| 03/24/2009 | US7506455 Metrology instruments |
| 03/19/2009 | WO2009036365A2 Method and apparatus of automatic scanning probe imaging |
| 03/19/2009 | US20090077697 Method and apparatus of automatic scanning probe imaging |
| 03/18/2009 | EP1210723B1 Shaped and low density focused ion beams |
| 03/17/2009 | US7503206 Fluid delivery for scanning probe microscopy |
| 03/12/2009 | US20090070904 Oscillating scanning probe microscope |
| 03/10/2009 | US7502659 Sorting a group of integrated circuit devices for those devices requiring special testing |
| 03/10/2009 | US7500387 Dual tip atomic force microscopy probe and method for producing such a probe |
| 03/05/2009 | US20090061506 Method for precipitating mono and multiple layers of organophosphoric and organophosphonic acids and the salts thereof in addition to use thereof |
| 03/04/2009 | EP2029998A1 Controlled atomic force microscope |
| 03/04/2009 | CN101379383A Miniaturized spring element and method for producing the spring element |
| 03/04/2009 | CN100465627C A scanning probe inspection apparatus |
| 02/24/2009 | US7496250 Optical microcantilever |
| 02/24/2009 | US7495215 Probe for a scanning magnetic force microscope, method for producing the same, and method for forming ferromagnetic alloy film on carbon nanotubes |
| 02/24/2009 | US7494575 Method for manufacturing a split probe |
| 02/24/2009 | US7493794 Method of calibrating a caliper AFM |
| 02/19/2009 | US20090045336 Scanning probe microscopy cantilever, corresponding manufacturing method, scanning probe microscope, and scanning method |
| 02/17/2009 | US7491422 Direct-write nanolithography method of transporting ink with an elastomeric polymer coated nanoscopic tip to form a structure having internal hollows on a substrate |
| 02/12/2009 | WO2009020658A1 Independently-addressable, self-correcting inking for cantilever arrays |
| 02/12/2009 | WO2009019513A1 Vibration compensation in probe microscopy |
| 02/12/2009 | US20090038382 Probe and cantilever |
| 02/12/2009 | CA2690723A1 Independently-addressable, self-correcting inking for cantilever arrays |
| 02/11/2009 | EP1929267B1 Method and device for positioning a movable part in a test system |
| 02/05/2009 | DE102007038280A1 Actuator, for the deposition of nano sized materials, has a nano tube with a reservoir and electrodes at the tube and/or reservoir |
| 02/04/2009 | EP1243915B1 Apparatus for evaluating electrical characteristics |
| 02/03/2009 | US7485857 Microcoaxial probes made from strained semiconductor bilayers |
| 02/03/2009 | US7485856 Scanning probe microscopy inspection and modification system |
| 01/29/2009 | US20090025465 Miniaturized Spring Element and Method for Producing the Spring Element |
| 01/27/2009 | US7482826 Probe for scanning over a substrate and a data storage device |
| 01/27/2009 | US7481989 cutting fullerene nanotubes. In one embodiment, the present invention provides for preparation of homogeneous populations of short fullerene nanotubes by cutting and annealing (reclosing) the nanotube pieces followed by fractionation. The cutting and annealing processes may be carried out on a purified |
| 01/22/2009 | WO2009012180A1 Ultrananocrystalline diamond film deposition for spm probes |
| 01/22/2009 | US20090022456 Optical fiber probe tips and methods for fabricating same |
| 01/14/2009 | EP2013609A2 Atomic force microscope tip arrays and methods of manufacturing same |
| 01/13/2009 | US7476786 Using nanoparticles to identify and/or sequence biomolecules; forensic analysis; medical diagnostics |
| 01/13/2009 | US7476418 Etching and planarizing a substrate by irradiation with a focused ion beam, decomposing and depositing an organic gas into a columnar electrode, and then attaching the nanotubes to the electrode; maintained electroconductivity between nanotubes and electrodes |
| 01/08/2009 | US20090009033 Nanomanipulator Used for Analyzing or Machining Objects |
| 01/06/2009 | US7474410 Nanometer-precision tip-to-substrate control and pattern registration for scanning-probe lithography |
| 01/02/2009 | DE102007031112A1 Vorrichtung und Verfahren zur Untersuchung von Oberflächeneigenschaften verschiedenartiger Materialien Device and method for the examination of surface properties of various materials |
| 01/01/2009 | US20090004094 cutting fullerene nanotubes. In one embodiment, the present invention provides for preparation of homogeneous populations of short fullerene nanotubes by cutting and annealing the nanotube pieces followed by fractionation. The cutting and annealing processes may be carried out on a purified paper |
| 12/31/2008 | WO2009001220A2 Functionalization of microscopy probe tips |
| 12/31/2008 | WO2009000885A1 Apparatus and method for investigating surface properties of different materials |
| 12/31/2008 | EP2009629A1 Information storage device using probe |
| 12/25/2008 | US20080315745 Electronic device containing carbon nanotubes and method for manufacturing the same |
| 12/25/2008 | US20080315092 Scanning probe microscopy inspection and modification system |
| 12/18/2008 | US20080311025 Method for forming a patterned array of fullerene nanotubes |
| 12/17/2008 | EP2003645A1 Information storage device using probe |
| 12/11/2008 | WO2008054467A3 Monolithic high aspect ratio nano-size scanning probe microscope (spm) tip formed by nanowire growth |
| 12/10/2008 | EP1999458A2 Monolithic high aspect ratio nano-size scanning probe microscope (spm) tip formed by nanowire growth |
| 12/09/2008 | US7462270 Nanotube with with a Y-shaped or V-shaped morphology coated with microparticulate ferromagnetic materials (iron, cobalt, nickel or alloys) capable of generating magnetic field and sensing magnetic response attached to substrate and extending outward; electrical resistance and high mechanical strength |
| 12/04/2008 | WO2008031076A3 Atomic force microscope |
| 12/03/2008 | EP1341183B1 Optically readable molecular memory obtained using carbon nanotubes, and method for storing information in said molecular memory |
| 12/03/2008 | CN101317080A Method and device for positioning a movable part in a test system |
| 11/26/2008 | CN101313206A Y-shaped carbon nanotubes as afm probe for analyzing substrates with angled topography |
| 11/25/2008 | US7455757 Deposition method for nanostructure materials |
| 11/20/2008 | WO2008105919A3 Nanomechanical characterization of cellular activity |
| 11/19/2008 | EP1993103A1 Cantilever assembly and process of manufacturing the same |
| 11/19/2008 | EP1993102A1 Cantilever assembly and process of manufacturing the same |
| 11/18/2008 | US7453789 Data recording device with conducting microtips and production method thereof |
| 11/18/2008 | US7453193 Electronic device containing a carbon nanotube |
| 11/18/2008 | US7451638 Harmonic cantilevers and imaging methods for atomic force microscopy |
| 11/13/2008 | WO2008104672A3 Method for growing a carbon nanotube on a nanometric tip |
| 11/06/2008 | WO2007078979B1 Probe module with integrated actuator for a probe microscope |
| 11/06/2008 | US20080272301 Micro-protruding structure |
| 11/06/2008 | US20080272087 Method for fabricating probe for use in scanning probe microscope |
| 11/04/2008 | US7446324 Methods utilizing scanning probe microscope tips and products thereof or produced thereby |
| 10/30/2008 | DE112006003492T5 Sondermodul mit integriertem Stellglied für ein Rastersondenmikroskop Special module with integrated actuator for a scanning probe microscope |
| 10/28/2008 | US7442926 Nano tip and fabrication method of the same |
| 10/28/2008 | US7442571 Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semiconductor probe |
| 10/28/2008 | US7441444 AFM cantilevers and methods for making and using same |
| 10/23/2008 | US20080258059 Scanning Probe Microscope System |
| 10/22/2008 | EP1410436B1 Parallel, individually addressable probes for nanolithography |
| 10/16/2008 | US20080253020 Read/Write Tip, Head and Device, and Use Thereof, and Method for Manufacturing Same |
| 10/15/2008 | CN101286373A 悬臂组件 Cantilever assembly |
| 10/02/2008 | US20080239931 Recording and reproducing apparatus provided with probe memory |
| 10/01/2008 | EP1975598A2 Optical microcantilever, manufacturing method thereof, and optical microcantilever holder |
| 09/25/2008 | US20080230856 Intermediate probe structures for atomic force microscopy |
| 09/25/2008 | US20080230696 Surface treatment and surface scanning |
| 09/18/2008 | US20080224100 Methods for producing composites of fullerene nanotubes and compositions thereof |
| 09/17/2008 | EP1969606A1 Microtips and nanotips, and method for their production |
| 09/10/2008 | EP1540378A4 Nanotube cantilever probes for nanoscale magnetic microscopy |
| 09/09/2008 | US7423264 Atomic force microscope |