| Patents for G01J 4 - Measuring polarisation of light (3,335) |
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| 03/08/2007 | US20070052959 Positioning device for positioning a user by using both eyes as position markers |
| 03/08/2007 | US20070052955 Method and equipment for detecting pattern defect |
| 03/08/2007 | US20070051890 Sensor having differential polarization capability and a network comprised of several such sensors |
| 03/07/2007 | CN1926414A Tamper-proof container |
| 03/06/2007 | US7187443 Method of determining bulk refractive indicies of liquids from thin films thereof |
| 03/06/2007 | US7187442 Polarized optical probes |
| 03/01/2007 | WO2006127049A3 System and method for determining gas optical density changes in a non-linear measurement regime |
| 03/01/2007 | US20070046928 Method of evaluating fiber pmd using potdr trace |
| 03/01/2007 | US20070046922 Exposure apparatus and device fabrication method |
| 02/27/2007 | US7184145 Achromatic spectroscopic ellipsometer with high spatial resolution |
| 02/22/2007 | US20070041014 Simultaneous 4-stokes parameter determination using a single digital image |
| 02/20/2007 | US7180599 Polarization effect averaging |
| 02/20/2007 | US7180051 Polarization state detecting system, light source, and exposure apparatus |
| 02/15/2007 | DE19715232B4 Verfahren zur Bestimmung optischer Wegdifferenzen Method for the determination of optical path differences |
| 02/13/2007 | US7177491 Fiber-based optical low coherence tomography |
| 02/13/2007 | US7176671 Current measuring device |
| 02/08/2007 | US20070030485 Multiple beam ellipsometer |
| 02/06/2007 | US7173700 Normal incidence rotating compensator ellipsometer |
| 02/06/2007 | US7173699 Spectroscopic scatterometer system |
| 02/06/2007 | US7173698 Simultaneous 4-stokes parameter determination using a single digital image |
| 02/06/2007 | US7173563 Calibration method, device and computer program |
| 02/01/2007 | WO2006052644A3 Apparatus and methods to measure optical rotation with electro-optic polarization modulation |
| 02/01/2007 | US20070024851 Method and smart device to determine the substrate optical constant and the film thickness of absorbing-film-absorbing-substrate systems in an absorbing medium using a closed-form formula and reflection ellipsometry |
| 02/01/2007 | US20070024850 Complete system identification of film-substrate systems using single-angle-of-incidence ellipsometry: A fast genetic algorithm |
| 01/31/2007 | EP1747434A2 Systems and methods for measurement or analysis of a specimen |
| 01/31/2007 | EP1747433A2 Microarray scanning |
| 01/31/2007 | EP1747432A2 Imaging method and apparatus |
| 01/25/2007 | US20070019196 Edge bead removal inspection by reflectometry |
| 01/24/2007 | CN2862014Y Semi-automatic polarimeter |
| 01/23/2007 | US7167244 Dermoscopy epiluminescence device employing multiple color illumination sources |
| 01/23/2007 | US7167243 Dermoscopy epiluminescence device employing cross and parallel polarization |
| 01/23/2007 | US7167242 Sample analysis method |
| 01/23/2007 | US7167241 Dielectric function of thin metal films determined by combined transmission spectroscopic ellipsometry and intensity measurements |
| 01/18/2007 | WO2007008335A1 Sample orientation system and method |
| 01/17/2007 | CN2859479Y Laser beam diffusing angle measuring plate |
| 01/11/2007 | US20070008530 Systems and methods for chiral detection and analysis |
| 01/10/2007 | CN1894568A System and method for measuring birefringence in an optical material |
| 01/09/2007 | US7161675 Beam splitting apparatus, transmittance measurement apparatus, and exposure apparatus |
| 01/04/2007 | WO2007002182A1 Improved systems and methods for chiral detection and analysis |
| 01/04/2007 | US20070002321 Method and System for Determining a Polarization Dependent Characteristic of Optical and Opto-Electrical Devices |
| 01/04/2007 | US20070002320 Birefringence calculating method and birefringence calculating apparatus |
| 01/04/2007 | DE102005062180B3 Infrared ellipsometer has interferometer and sample holder with preceding polariser serving as interferometer beam splitter |
| 01/03/2007 | EP1738682A1 Electronic polarimetric imaging system for colposcopy device |
| 01/03/2007 | CN1890542A Differential optical technique for chiral analysis |
| 01/02/2007 | US7158275 Polarization modulator |
| 01/02/2007 | US7158231 Spectroscopic ellipsometer and polarimeter systems |
| 12/28/2006 | US20060290932 Photographing device with auto focusing function |
| 12/28/2006 | US20060290931 System for Measuring Periodic Structures |
| 12/26/2006 | US7154601 Testing method for a polarizing plate |
| 12/26/2006 | US7154082 Frequency division and/or wavelength division multiplexed recursive fiber optic telemetry scheme for an optical sensor array |
| 12/21/2006 | WO2006135681A2 Method and apparatus for determining liquid crystal cell parameters from full mueller matrix measurements |
| 12/21/2006 | WO2006135375A2 Catalytically grown nano-bent nanostructure and method for making the same |
| 12/21/2006 | US20060285111 Apparatuses and methods for enhanced critical dimension scatterometry |
| 12/21/2006 | US20060285110 Apparatus and method for enhanced critical dimension scatterometry |
| 12/20/2006 | CN1881063A Active control and detection of two nearly orthogonal polarizations in a fiber for heterodyne interferometry |
| 12/19/2006 | US7151605 Methodology for providing good data at all wavelengths over a spectroscopic range |
| 12/14/2006 | WO2006133258A2 Measuring overlay and profile asymmetry using symmetric and anti-symmetric scatterometry signals |
| 12/14/2006 | WO2006047422A3 Birefringence measurement of polymeric films and the like |
| 12/07/2006 | US20060274310 Measuring overlay and profile asymmetry using symmetric and anti-symmetric scatterometry signals |
| 12/07/2006 | DE102006025122A1 Vorrichtung zur Messung einer optischen Charakteristik An apparatus for measuring an optical characteristic |
| 12/05/2006 | US7145655 Methods and apparatus for measuring refractive index and optical absorption differences |
| 12/05/2006 | US7145654 Method and apparatus to reduce spotsize in an optical metrology instrument |
| 11/30/2006 | US20060268274 System and method for enhancing confocal reflectance images of tissue specimens |
| 11/30/2006 | US20060268273 Combined use of oscillating means and ellipsometry to determine uncorrelated effective thickness and optical constants of material deposited from a fluid |
| 11/30/2006 | US20060268272 Combined spatial filter and relay systems in rotating compensator ellipsometer/polarimeter |
| 11/30/2006 | US20060268271 Combined spatial filter and relay systems |
| 11/30/2006 | DE19515267B4 Verfahren und Anordnung für die Auswertung der Drehung der Polarisationsebene eines Meßwandlers Method and arrangement for evaluating the rotation of the polarization plane of a transducer |
| 11/28/2006 | US7142301 Method and apparatus for adjusting illumination angle |
| 11/28/2006 | US7142300 Edge bead removal inspection by reflectometry |
| 11/23/2006 | WO2006124396A2 Optical beam-shaper |
| 11/23/2006 | US20060262307 Fiber polarimeter, the use thereof, as well as polarimetric method |
| 11/21/2006 | US7138621 Optical fiber sensors based on pressure-induced temporal periodic variations in refractive index |
| 11/16/2006 | WO2006120982A1 Catheter surgery simulation |
| 11/16/2006 | US20060256335 Optical beam-shaper |
| 11/16/2006 | US20060256334 Polarization state conversion in optically active spectroscopy |
| 11/16/2006 | DE102005020911A1 Polarized optical radiation`s polarization condition change measuring method, involves adjusting measured light polarization condition of light radiation based on value of polarization condition quantity |
| 11/14/2006 | US7136164 Multiple beam ellipsometer |
| 11/14/2006 | US7136163 Differential evaluation of adjacent regions for change in reflectivity |
| 11/14/2006 | US7136162 Alignment of ellipsometer beam to sample surface |
| 11/09/2006 | WO2006023277A3 Frequency division and/or wavelength division multiplexed recursive fiber optic telemetry scheme for an optical sensor array |
| 11/09/2006 | US20060250615 Method for testing a polarization state, method for manufacturing a semiconductor device, and test substrate for testing a polarization state |
| 11/02/2006 | WO2006116701A2 Imaging systems and methods to improve backscattering imaging using circular polarization memory |
| 11/02/2006 | US20060244966 Generic interface for an optical metrology system |
| 11/02/2006 | DE102005056653A1 Optiksignalanalysesystem Optical signal analysis system |
| 10/31/2006 | US7130048 Method and apparatus for forming substrate for semiconductor or the like |
| 10/31/2006 | US7130047 Method of producing polarizers for polarized optical probes |
| 10/26/2006 | US20060238760 Method and apparatus for observing and inspecting defects |
| 10/26/2006 | US20060238759 Spectroscopic polarimetry |
| 10/26/2006 | US20060238758 Near-field polarized-light measurement apparatus |
| 10/26/2006 | DE102005019125A1 Compound layer, with opto-mechanical reaction to light, has sensor layer on pliable substrate which gives distorting bending action when exposed to electromagnetic radiation |
| 10/25/2006 | EP1715322A2 Near-field polarized-light measurement apparatus |
| 10/24/2006 | US7126688 Microarray scanning |
| 10/24/2006 | US7126683 Direct method for the correction of pressure induced scrambling of polarized fluorescence intensities |
| 10/17/2006 | US7123414 Method for producing library |
| 10/17/2006 | US7122783 Seismic activity monitor based on optical fiber Bragg gratings |
| 10/11/2006 | EP1709687A2 Method and apparatus for dual polarization imaging |
| 10/10/2006 | US7119900 Pollen sensor and method |
| 10/05/2006 | US20060220670 Method for measuring cell gap variation of liquid crystal panel and apparatus thereof |
| 10/05/2006 | US20060220653 Measuring low dielectric constant film properties during processing |
| 10/04/2006 | EP1707929A1 Spectroscopic polarimetry |