Patents for G01J 4 - Measuring polarisation of light (3,335) |
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10/12/1983 | EP0091068A1 Beam divider |
09/07/1983 | EP0087535A1 Apparatus and method for measuring optically active materials |
07/20/1983 | EP0083942A2 Detecting irregularities in a coating on a substrate |
02/08/1983 | CA1140771A1 Method and apparatus for studying surface properties |
12/07/1982 | US4362387 Method and apparatus for measuring visibility from the polarization properties of the daylight sky |
10/13/1982 | EP0062083A1 Device for the determination of the polarisation rate in a light-wave field and use of this device to interferometric and holographic measurements |
06/01/1982 | US4332476 Method and apparatus for studying surface properties |
01/12/1982 | US4310247 Method and apparatus for analyzing the state of polarization of radiation |
05/26/1981 | US4269511 Apparatus and method for measuring the magnitude of polarization of light |
01/07/1981 | EP0022054A2 Polarimeter |
01/06/1981 | US4243936 Method for magneto-optical current measurements |
12/09/1980 | CA1091058A1 Automatic determination of the polarization state of nanosecond laser pulses |
11/26/1980 | EP0019088A1 Ellipsometric method and ellipsometric device for testing the physical properties of the surface of a sample |
11/04/1980 | US4232264 Arrangement for the magneto-optical measurement of currents |
10/29/1980 | EP0017822A1 Apparatus of analyzing the state of polarisation of a radiation |
05/20/1980 | US4203670 System and method of fluorescence polarimetry |
02/26/1980 | CA1072362A1 Method for determining the volume and the volume distribution of suspended small particles |
12/18/1979 | CA1068100A1 Method of measuring the topography of a surface |
10/23/1979 | US4171912 Element analyzer exploiting a magneto-optic effect |
10/03/1979 | EP0004259A1 Faraday effect current measuring device and method of its use |
09/04/1979 | US4166697 Spectrophotometer employing magneto-optic effect |
08/28/1979 | US4165937 Magneto-optic spectrophotometer |
07/11/1979 | EP0002659A1 Magneto-optical method for measuring current |
06/19/1979 | US4158506 Automatic determination of the polarization state of nanosecond laser pulses |
02/20/1979 | CA1048806A1 Rotating-compensator ellipsometer |
01/16/1979 | US4134679 Determining the volume and the volume distribution of suspended small particles |
01/02/1979 | US4132653 Polarization analyzer for vacuum ultraviolet and x-ray radiation |
10/03/1978 | US4118125 Polarimeters |
08/08/1978 | US4105338 Reflection type ellipsometer for measuring thin film phase difference and thickness |
06/27/1978 | US4097110 Depolarization measurement by optical heterodyne |
03/07/1978 | US4077720 Spectroscopic auto ellipsometer |
08/16/1977 | US4042302 Broadband wavelength discriminator |
03/08/1977 | US4011014 Polarization rotation analyzer |
11/16/1976 | US3992104 Automatic polarization analyzer device |
08/31/1976 | US3977787 High-resolution fourier interferometer-spectrophotopolarimeter |