Patents for G01J 4 - Measuring polarisation of light (3,335)
10/1983
10/12/1983EP0091068A1 Beam divider
09/1983
09/07/1983EP0087535A1 Apparatus and method for measuring optically active materials
07/1983
07/20/1983EP0083942A2 Detecting irregularities in a coating on a substrate
02/1983
02/08/1983CA1140771A1 Method and apparatus for studying surface properties
12/1982
12/07/1982US4362387 Method and apparatus for measuring visibility from the polarization properties of the daylight sky
10/1982
10/13/1982EP0062083A1 Device for the determination of the polarisation rate in a light-wave field and use of this device to interferometric and holographic measurements
06/1982
06/01/1982US4332476 Method and apparatus for studying surface properties
01/1982
01/12/1982US4310247 Method and apparatus for analyzing the state of polarization of radiation
05/1981
05/26/1981US4269511 Apparatus and method for measuring the magnitude of polarization of light
01/1981
01/07/1981EP0022054A2 Polarimeter
01/06/1981US4243936 Method for magneto-optical current measurements
12/1980
12/09/1980CA1091058A1 Automatic determination of the polarization state of nanosecond laser pulses
11/1980
11/26/1980EP0019088A1 Ellipsometric method and ellipsometric device for testing the physical properties of the surface of a sample
11/04/1980US4232264 Arrangement for the magneto-optical measurement of currents
10/1980
10/29/1980EP0017822A1 Apparatus of analyzing the state of polarisation of a radiation
05/1980
05/20/1980US4203670 System and method of fluorescence polarimetry
02/1980
02/26/1980CA1072362A1 Method for determining the volume and the volume distribution of suspended small particles
12/1979
12/18/1979CA1068100A1 Method of measuring the topography of a surface
10/1979
10/23/1979US4171912 Element analyzer exploiting a magneto-optic effect
10/03/1979EP0004259A1 Faraday effect current measuring device and method of its use
09/1979
09/04/1979US4166697 Spectrophotometer employing magneto-optic effect
08/1979
08/28/1979US4165937 Magneto-optic spectrophotometer
07/1979
07/11/1979EP0002659A1 Magneto-optical method for measuring current
06/1979
06/19/1979US4158506 Automatic determination of the polarization state of nanosecond laser pulses
02/1979
02/20/1979CA1048806A1 Rotating-compensator ellipsometer
01/1979
01/16/1979US4134679 Determining the volume and the volume distribution of suspended small particles
01/02/1979US4132653 Polarization analyzer for vacuum ultraviolet and x-ray radiation
10/1978
10/03/1978US4118125 Polarimeters
08/1978
08/08/1978US4105338 Reflection type ellipsometer for measuring thin film phase difference and thickness
06/1978
06/27/1978US4097110 Depolarization measurement by optical heterodyne
03/1978
03/07/1978US4077720 Spectroscopic auto ellipsometer
08/1977
08/16/1977US4042302 Broadband wavelength discriminator
03/1977
03/08/1977US4011014 Polarization rotation analyzer
11/1976
11/16/1976US3992104 Automatic polarization analyzer device
08/1976
08/31/1976US3977787 High-resolution fourier interferometer-spectrophotopolarimeter
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