| Patents for G01J 4 - Measuring polarisation of light (3,335) |
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| 11/01/2007 | US20070252991 Method for determining stokes parameters |
| 10/30/2007 | US7289223 Method and apparatus for spatially resolved polarimetry |
| 10/30/2007 | US7289219 Polarimetric scatterometry methods for critical dimension measurements of periodic structures |
| 10/30/2007 | US7289211 System and method for imaging sub-surface polarization-sensitive material structures |
| 10/30/2007 | US7289210 Circularly polarized light method and device for determining wall thickness and orientations of fibrils of cellulosic fibres |
| 10/30/2007 | US7287855 Method and system for removing the effects of corneal birefringence from a polarimetric image of the retina |
| 10/25/2007 | WO2007121406A2 Polarization based interferometric detector |
| 10/25/2007 | WO2007120171A1 Combined use of oscillating means and ellipsometry to determine uncorrelated effective thickness and optical constants of material deposited from a fluid |
| 10/25/2007 | WO2007056541A3 Apparatus and method for generating light from multi - primary colors |
| 10/25/2007 | US20070247624 Spectroscopic Ellipsometers |
| 10/25/2007 | US20070247623 Polarization measuring devices, ellipsometers and polarization measuring methods |
| 10/25/2007 | US20070247622 Polarization imaging |
| 10/25/2007 | CA2649421A1 Polarization based interferometric detector |
| 10/24/2007 | EP1846739A1 Arrangement and method for microscopic optical recording of anisotropies |
| 10/24/2007 | EP1846738A2 Methods and apparatus for noninvasive determinations of analytes |
| 10/24/2007 | EP1590646B1 Method and apparatus for measuring polarization mode dispersion |
| 10/24/2007 | EP1436579A4 Accuracy calibration of birefringence measurement systems |
| 10/23/2007 | US7286245 Method and apparatus for determining the influencing of the state of polarization by an optical system; and an analyser |
| 10/23/2007 | US7286243 Beam profile complex reflectance system and method for thin film and critical dimension measurements |
| 10/23/2007 | US7286229 Detecting multi-domain states in perpendicular magnetic media |
| 10/23/2007 | US7286228 Method and apparatus for measuring circularly polarized rotating electromagnetic wave using magnetic field |
| 10/23/2007 | US7286227 Method and system for removing the effects of corneal birefringence from a polarimetric image of the retina |
| 10/23/2007 | US7286226 Method and apparatus for measuring birefringence |
| 10/23/2007 | US7285767 Methods and apparatus for inspecting an object |
| 10/18/2007 | US20070242270 Determining mode spectra for principal states of polarization |
| 10/18/2007 | US20070241265 Method and apparatus for dual polarization imaging |
| 10/18/2007 | DE102006016968A1 Polarization arrangement for visualizing energized structures in human cornea, has camera recording image of cornea, where polarized light from light source e.g. laser, is directed through cornea by beam splitter and is reflected by iris |
| 10/17/2007 | EP1844425A1 Real-time image detection using polarization data |
| 10/16/2007 | US7283234 Use of ellipsometry and surface plasmon resonance in monitoring thin film deposition or removal from a substrate surface |
| 10/16/2007 | US7283207 Exposure apparatus |
| 10/11/2007 | US20070236686 Rubbing Angle-Measuring Equipment, and Manufacturing Methods of Liquid Crystal Display Device and Optical Film |
| 10/09/2007 | US7280210 Measuring method, analyzing method, measuring apparatus, analyzing apparatus, ellipsometer, and computer program |
| 10/09/2007 | US7280209 Method and apparatus for improved ellipsometric measurement of ultrathin films |
| 10/09/2007 | US7280208 Optical characteristic analysis method, sample measuring apparatus and spectroscopic ellipsometer |
| 10/09/2007 | US7279692 Micromechanical infrared source |
| 10/04/2007 | WO2007111159A1 Optical characteristic measuring device, optical characteristic measuring method, and optical characteristic measuring unit |
| 10/04/2007 | US20070229826 Rapid material optical diagnostics method |
| 10/02/2007 | US7277182 Apparatus for polarization-specific examination, optical imaging system, and calibration method |
| 10/02/2007 | US7277172 Measuring overlay and profile asymmetry using symmetric and anti-symmetric scatterometry signals |
| 10/02/2007 | US7277171 Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems |
| 09/27/2007 | WO2007109344A2 Vibrational circular dichroism spectrometer using reflective optics |
| 09/27/2007 | WO2006014644A3 Method and system for generating a telephone alert |
| 09/27/2007 | US20070222988 Vibrational circular dichroism spectrometer using reflective optics |
| 09/25/2007 | US7274453 Methods and apparatus for calibrating an electromagnetic measurement device |
| 09/25/2007 | US7274450 Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systems |
| 09/25/2007 | US7274449 System for determining stokes parameters |
| 09/25/2007 | US7274440 Systems and methods for measuring stress in a specimen |
| 09/20/2007 | US20070216901 Ellipsometry Device Provided With A Resonance Platform |
| 09/20/2007 | DE102006012022A1 Moving metal band`s requirement determining method, involves selecting conversion function and/or parameter for conversion function by evaluation unit based on selection factor from set of conversion functions stored in database |
| 09/19/2007 | CN100338446C Method and device used for polarized measurement |
| 09/18/2007 | US7271902 Generic interface for an optical metrology system |
| 09/18/2007 | US7271901 Thin-film characteristic measuring method using spectroellipsometer |
| 09/18/2007 | US7271900 Magneto-optical imaging method and device |
| 09/18/2007 | US7271899 Millimetre-wave detection device for discriminating between different materials |
| 09/13/2007 | WO2006047653A3 Polariscope toy and ornament with accompanying photoelastic and/or photoplastic devices |
| 09/13/2007 | US20070211252 Optical waveform measurement apparatus and optical waveform measurement method |
| 09/12/2007 | EP1636556A4 Multispectral, multifusion, laser-polarimetric optical imaging system |
| 09/12/2007 | CN100337135C Soft x-ray transmission type multilayer film wide-band phase shift sheet and its preparing method |
| 09/11/2007 | US7268876 General virtual interface algorithm for in-situ spectroscopic ellipsometric data analysis |
| 09/11/2007 | US7268875 Method and apparatus for optically measuring absolute displacement |
| 09/05/2007 | EP1828712A1 Metrological characterization of microelectronic circuits |
| 09/05/2007 | EP1334339B1 Method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope |
| 09/05/2007 | EP1250575A4 Calibration process for birefringence measurement system |
| 09/05/2007 | CN100335876C Passive light splitting offset detector |
| 09/04/2007 | US7265839 Horizontal attenuated total reflection system |
| 09/04/2007 | US7265838 Method of calibrating effects of multi-AOI-system for easy changing angles-of-incidence in ellipsometers and the like |
| 09/04/2007 | US7265837 Sensitive polarization monitoring and controlling |
| 09/04/2007 | US7265836 In-line optical polarimeter using free-space polarization sampling elements |
| 09/04/2007 | US7265834 Polarization analyzer |
| 08/30/2007 | US20070201017 High resolution monitoring of CD variations |
| 08/29/2007 | EP1470401A4 Apparatus and method for imaging |
| 08/29/2007 | CN200941068Y Coherent polarization matrix measuring system |
| 08/29/2007 | CN101025477A High-precision quartz wave-plate stack bonding method |
| 08/28/2007 | US7262849 Method of polishing thin film formed on substrate |
| 08/28/2007 | US7262848 Fiber polarimeter, the use thereof, as well as polarimetric method |
| 08/28/2007 | US7262837 Noninvasive method for characterizing and identifying embedded micropatterns |
| 08/28/2007 | CA2261469C Method and apparatus for measurement of absolute biaxial birefringence in monolayer and multilayer films, sheets and shapes |
| 08/23/2007 | WO2007077312A3 Method and device for observing an object |
| 08/22/2007 | CN101021447A Method and apparatus for measuring 1/4 wave plate phase delay and quick shaft direction |
| 08/21/2007 | US7259851 Optical measurements of properties in substances using propagation modes of light |
| 08/21/2007 | US7259850 Approach to improve ellipsometer modeling accuracy for solving material optical constants N & K |
| 08/21/2007 | US7259802 Liquid crystal panel, apparatus for inspecting the same, and method of fabricating liquid crystal display thereof |
| 08/16/2007 | US20070188755 Device for ellipsometric two-dimensional display of a sample, display method and ellipsometric measurement method with spatial resolution |
| 08/15/2007 | EP1818658A1 Method for approximating the influence of an optical system on the state of polarisation of optical radiation |
| 08/09/2007 | WO2007087670A1 A photoelastic modulator |
| 08/09/2007 | US20070182967 Method and apparatus for precision measurement of phase shifts |
| 08/09/2007 | US20070182964 Lithographic system, sensor, and method of measuring properties of a substrate |
| 08/07/2007 | US7253901 Laser-based cleaning device for film analysis tool |
| 08/07/2007 | US7253900 Ellipsometer or polarimeter and the like system with multiple detector element detector in environmental control chamber including secure sample access |
| 08/07/2007 | US7253899 Apparatus and method for measuring optically active materials |
| 08/02/2007 | US20070179381 Arrangement and method for assessing tissue qualities |
| 08/01/2007 | CN101008792A Measurement method |
| 07/31/2007 | US7251029 Birefringence measurement apparatus, strain remover, polarimeter and exposure apparatus |
| 07/26/2007 | US20070171420 Pulsed ellipsometer device |
| 07/26/2007 | US20070171419 Retardance measurement system and method |
| 07/26/2007 | US20070171418 Communication Terminal Apparatus And Wireless Transmission Method |
| 07/25/2007 | CN2927092Y Device for adjusting polarized state quantitatively |
| 07/24/2007 | US7248364 Apparatus and method for optical characterization of a sample over a broadband of wavelengths with a small spot size |
| 07/19/2007 | WO2007080790A1 Measurement apparatus, measurement method, and characteristic measurement unit |
| 07/19/2007 | US20070165228 Method and apparatus for improved ellipsometric measurement of ultrathin films |