| Patents for G01J 4 - Measuring polarisation of light (3,335) |
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| 07/09/2008 | CN101216348A Polarization degree on-line detection system in depolarized equipment manufacture |
| 07/08/2008 | US7397553 Surface scanning |
| 07/03/2008 | WO2008077839A1 An imager |
| 07/01/2008 | US7394539 Method and apparatus for improved ellipsometric measurement of ultrathin films |
| 07/01/2008 | US7394538 Device configured to enable a face to be observed |
| 06/26/2008 | WO2007143546A3 A multi-color cavity ringdown based detection method and apparatus |
| 06/26/2008 | US20080151245 method and a device for processing birefringent and/or optically active materials and phase plate |
| 06/26/2008 | US20080151244 Optical switching method and optical switch |
| 06/12/2008 | WO2008067938A1 Method for measuring birefringence and/or retardation, in particular on at least partially transparent films, and associated apparatus |
| 06/12/2008 | US20080138244 Detection and amplification of ligands |
| 06/12/2008 | US20080137083 Process monitoring system, process monitoring method, and method for manufacturing semiconductor device |
| 06/12/2008 | US20080137074 Image Splitting in Optical Inspection Systems |
| 06/12/2008 | DE102006057727A1 Verfahren zur Messung der Doppelbrechung und/oder der Retardation, insbesondere an zumindest teiltransparenten Folien sowie zugehörige Vorrichtung Method for measuring the birefringence and / or the retardation, in particular to at least partially transparent films as well as associated device |
| 06/11/2008 | EP1929266A1 Method of evaluating fiber pmd using potdr trace |
| 06/10/2008 | US7385698 System and method of selectively monitoring sample front and backside reflections in ellipsometer and the like systems |
| 06/10/2008 | US7385697 Sample analysis methodology utilizing electromagnetic radiation |
| 06/10/2008 | US7385696 Birefringence measurement of polymeric films and the like |
| 06/10/2008 | US7385695 Polarimetry |
| 06/05/2008 | US20080129999 Method and a device for measuring axial polarizing angle of polarizer |
| 06/05/2008 | DE102007054512A1 Birefringent and/or optically active material e.g. wave plate i.e. half-wavelength phase plate, processing method, involves directly or intermittently determining change of passage path from characteristic change of light |
| 06/04/2008 | EP1927881A1 Optical block with variable polarizing characteristics and method for generating different states of polarization using said block |
| 05/27/2008 | US7379183 Apparatus and methods for detecting overlay errors using scatterometry |
| 05/27/2008 | US7379182 Pointer instrument for automotive meter |
| 05/22/2008 | US20080117420 Method and apparatus for determining concentration using polarized light |
| 05/21/2008 | DE102006031006B4 Messanordnung und Verfahren zur Bestimmung von Polarisationseigenschaften einer refraktiven optischen Komponente Measuring arrangement and method for the determination of polarization properties of a refractive optical component |
| 05/21/2008 | CN100389340C Device and method for quantitatively adjusting polarization |
| 05/20/2008 | US7376346 Method of promoting skin care products |
| 05/15/2008 | WO2008058184A2 Method and apparatus for determining concentration using polarized light |
| 05/14/2008 | EP1920237A1 Differential measuring method for determining variations in concentration for determining oversaturation |
| 05/14/2008 | EP1747434A4 Systems and methods for measurement or analysis of a specimen |
| 05/13/2008 | US7373056 High-voltage component with optical fiber and method for producing it |
| 05/13/2008 | US7372568 Low cost polametric detector |
| 05/13/2008 | US7372567 Retardance measurement system and method |
| 05/08/2008 | WO2008054666A2 Fiber optic structures that allow small bend radii |
| 05/08/2008 | WO2007130990A3 Measurement of linear and circular diattenuation in optical elements |
| 05/06/2008 | US7369235 Method and system for measuring deep trenches in silicon |
| 05/06/2008 | US7369234 Method of performing optical measurement on a sample |
| 05/06/2008 | US7369232 Stokes parameter measurement device and method |
| 05/02/2008 | WO2008051211A1 System and method for setting and compensating errors in aoi and poi of a beam of em radiation |
| 05/01/2008 | US20080100843 Surface position measuring system, exposure method and semiconductor device manufacturing method |
| 05/01/2008 | US20080100842 Deviation angle self compensating substantially achromatic retarder |
| 05/01/2008 | US20080100841 Pointer instrument for automotive meter |
| 05/01/2008 | US20080100838 Evaluation apparatus and evaluation method |
| 04/30/2008 | DE102006049687A1 High resolution imaging method for capturing a test substance in a test medium comprises interacting the test substance and a reference substance bounded to a solid-phase and capturing the resulting optical changes by ellipsometer |
| 04/29/2008 | US7365856 Method of motion correction in optical coherence tomography imaging |
| 04/29/2008 | US7364697 Apparatus comprising infrared camera for rapidly screening arrays of diverse materials on single substrate surfaces; combinatorial synthesis and characterization of libraries of diverse materials |
| 04/24/2008 | WO2008048402A2 Apparatus for caries detection |
| 04/24/2008 | WO2008048312A2 System for and method of investigating the exact same point on a sample substrate with multiple wavelengths |
| 04/24/2008 | WO2008046820A1 Polarimetric imaging system having a matrix of programmable waveplates based on a material with an isotropic electrooptic tensor |
| 04/24/2008 | US20080094628 Surface inspection apparatus and surface inspection method |
| 04/22/2008 | US7362435 Method of determining initial thickness value for sample surface layer, and use of splines for fitting ellipsometric data |
| 04/17/2008 | US20080088842 System and method for imaging through an irregular water surface |
| 04/17/2008 | US20080088841 Coded aperture imaging photopolarimetry |
| 04/17/2008 | US20080088828 Apparatus and method for measuring polarization direction of polarizing plate |
| 04/15/2008 | US7359052 Systems and methods for measurement of a specimen with vacuum ultraviolet light |
| 04/10/2008 | US20080084567 System for Scatterometric Measurements and Applications |
| 04/10/2008 | US20080084563 Polarization evaluation mask, polarization evaluation method, and polarization determination device |
| 04/09/2008 | EP1907036A2 Focused droplet nebulizer for evaporative light scattering detector |
| 04/09/2008 | EP1466147A4 Polarization state conversion in optically active spectroscopy |
| 04/08/2008 | US7355708 Normal incidence rotating compensator ellipsometer |
| 04/08/2008 | US7355707 Systems and methods for analyzing dew in a system of interest |
| 04/03/2008 | WO2008037392A1 Method for determining the colour components of light |
| 04/03/2008 | US20080079940 Microstructuring optical wave guide devices with femtosecond optical pulses |
| 04/03/2008 | US20080079939 Instrument for measuring the angular distribution of light produced by an illumination system of a microlithographic projection exposure apparatus |
| 04/03/2008 | DE102007045891A1 Light polarization state measuring device for microlithography projection exposure system, has quarter wavelength plate and half wavelength plate, which are firmly connected with each other and are rotatable around common axis of rotation |
| 04/02/2008 | CN101153821A Measurement apparatus and measurement method |
| 04/02/2008 | CN101153820A Measurement apparatus and measurement method |
| 03/27/2008 | US20080076328 Method for producing surface coatings on components |
| 03/27/2008 | US20080074642 Opto-electrical sensor arrangement |
| 03/27/2008 | US20080074598 Sample for measuring alignment axis for liquid crystal display, method of manufacturing sample, and method of measuring alignment axis |
| 03/26/2008 | EP1676107A4 Differential optical technique for chiral analysis |
| 03/26/2008 | CN101151513A Methods and apparatus for noninvasive determinations of analytes |
| 03/26/2008 | CN100376916C Polarization filtering method and apparatus for astronomical optical telescope |
| 03/25/2008 | US7349092 System for reducing stress induced effects during determination of fluid optical constants |
| 03/25/2008 | US7349091 Optical object discriminating device |
| 03/25/2008 | US7349090 Methods and systems for determining a property of a specimen prior to, during, or subsequent to lithography |
| 03/25/2008 | US7349088 Process monitoring system, process monitoring method, and method for manufacturing semiconductor device |
| 03/25/2008 | US7349087 Method for determining stokes parameters |
| 03/25/2008 | US7349086 Systems and methods for optical measurement |
| 03/20/2008 | WO2008033779A2 Polarization imaging |
| 03/20/2008 | WO2008033218A1 Apparatus for caries detection |
| 03/20/2008 | US20080068607 Measuring Polarization Mode Dispersion |
| 03/19/2008 | CN101147049A Imaging method and apparatus |
| 03/18/2008 | US7345765 Optical monitoring of thin films using fiber optics |
| 03/18/2008 | US7345762 Control of beam spot size in ellipsometer and the like systems |
| 03/18/2008 | US7345761 Film measurement |
| 03/13/2008 | WO2008030224A1 Lithium-niobate fiber optic sensor and system |
| 03/12/2008 | EP1896811A2 Measuring overlay and profile asymmetry using symmetric and anti-symmetric scatterometry signals |
| 03/11/2008 | US7342661 Method for noise improvement in ellipsometers |
| 03/06/2008 | US20080055597 Method for characterizing line width roughness (lwr) of printed features |
| 03/06/2008 | US20080055596 Detecting the orientation of carbon nanotubes |
| 03/06/2008 | DE102006034776B3 Parametrs determining method for structural elements of sample on semi-conductor wafer, involves providing semi-conductor wafer that has sample of structural elements, which is periodically arranged on main surface |
| 03/05/2008 | CN201032473Y Device for measuring phase delay and fast axis direction of 1/4 wave plate |
| 02/28/2008 | WO2008024910A2 Lidar-based level measurement |
| 02/28/2008 | WO2007147959A8 Method of characterizing the anisotropy of a scattering medium and device for implementing such a method |
| 02/28/2008 | US20080049224 Polarization modulation imaging ellipsometer |
| 02/28/2008 | US20080049223 Optical displacement-detecting mechanism and probe microscope using the same |
| 02/26/2008 | US7336361 Spectroscopic ellipsometer and polarimeter systems |
| 02/26/2008 | US7336360 Imaging polarimetry |
| 02/26/2008 | US7336359 System and method for nonlinear optical null ellipsometry |