| Patents for G01J 4 - Measuring polarisation of light (3,335) |
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| 04/09/2009 | WO2008130383A9 Molecular and photonic nanostructures, optical biomaterials, photosensitizers, molecular contrast agents, and metamaterials |
| 04/09/2009 | WO2005038877A3 MOLECULAR AIRBORNE CONTAMINANTS (MACs) REMOVAL AND WAFER SURFACE SUSTAINING SYSTEM AND METHOD |
| 04/09/2009 | US20090091758 Method of constructing a deviation angle self compensating substantially achromatic retarder to compensate beam traslation |
| 04/07/2009 | US7515266 System and method for enhancing confocal reflectance images of tissue specimens |
| 04/07/2009 | US7515265 Imaging systems and methods to improve backscattering imaging using circular polarization memory |
| 04/01/2009 | CN101398293A Measurement system and method for measuring critical dimensions using ellipsometry |
| 03/31/2009 | US7511815 Device and method for measuring optical parameters of liquid crystal display |
| 03/26/2009 | WO2009039274A2 Method for mapping of dispersion and other optical properties of optical waveguides |
| 03/26/2009 | US20090079983 Surface inspection device |
| 03/26/2009 | US20090079982 Method and system for stokes polarization imaging |
| 03/25/2009 | EP2038622A1 Method of characterizing the anisotropy of a scattering medium and device for implementing such a method |
| 03/25/2009 | CN201212852Y 1/4 wave plate quick shaft position real-time measuring device |
| 03/24/2009 | US7508511 Method and apparatus for improved ellipsometric measurement of ultrathin films |
| 03/24/2009 | US7508510 System for and method of investigating the exact same point on a sample substrate with multiple wavelengths |
| 03/19/2009 | US20090073443 Method And Equipment For Detecting Pattern Defect |
| 03/19/2009 | US20090073442 Local non-perturbative remote sensing devices and method for conducting diagnostic measurements of magnetic and electric fields of optically active mediums |
| 03/19/2009 | US20090073441 Polarization-modulating element, illumination optical apparatus, exposure apparatus, and exposure method |
| 03/18/2009 | EP1706725A4 Circularly polarized light method and device for determining wall thickness and orientations of fibrils of cellulosic fibres |
| 03/17/2009 | US7505134 Automated ellipsometer and the like systems |
| 03/17/2009 | US7505133 Optical metrology systems and methods |
| 03/12/2009 | US20090066954 Detector configurations for optical metrology |
| 03/12/2009 | US20090066953 Spectroscopic ellipsometer and film thickness measuring apparatus |
| 03/12/2009 | US20090066952 Apparatus and system for electro magnetic field measurements and automatic analyses of phase modulated optical signals from electrooptic devices |
| 03/12/2009 | US20090066951 Method for Evaluating an Optical Imaging Process |
| 03/11/2009 | CN100468035C System and method for measuring low PMD in optical fiber using turbulent motion aroused low mode coupling |
| 03/10/2009 | US7502111 Differential optical technique for chiral analysis |
| 03/10/2009 | US7501627 Integrated ultra-sensitive infrared sensor |
| 03/05/2009 | US20090059228 Spectroscopic ellipsometer, film thickness measuring apparatus, and method of focusing in spectroscopic ellipsometer |
| 03/05/2009 | US20090059227 Method and system for the polarmetric analysis of scattering media utilising polarization difference sensing (pds) |
| 03/04/2009 | EP1290417B1 Low-noise spectroscopic ellipsometer |
| 03/03/2009 | US7499162 Method and apparatus for observing and inspecting defects |
| 02/26/2009 | WO2009002524A3 Electric-field-enhancement structure and detection apparatus using same |
| 02/26/2009 | US20090051916 Measuring Apparatus, Measuring Method, and Characteristic Measurement Unit |
| 02/26/2009 | DE102007038056A1 Method for determining polarization-optical characteristic of micro lithographic projection exposure system, involves determining transmission factor of projection lens for both orthogonal polarization directions |
| 02/24/2009 | US7495765 Fiber polarimeter, the use thereof, as well as polarimetric method |
| 02/24/2009 | US7495764 Coherent radar and ladar polarimeter |
| 02/24/2009 | US7495219 Radiation detection apparatus |
| 02/19/2009 | WO2008130383A4 Molecular and photonic nanostructures, optical biomaterials, photosensitizers, molecular contrast agents, and metamaterials |
| 02/19/2009 | US20090047014 Optical transmitting module and a method to sense a fluctuation of light emitted from the same |
| 02/19/2009 | US20090045341 Systems for observing reactions using infrared imaging |
| 02/18/2009 | EP2024718A2 Method for monitoring and measuring optical properties of device in polarization maintaining fibers by using reference fiber bragg grating and fiber components manufactured thereby |
| 02/17/2009 | US7492455 Discrete polarization state spectroscopic ellipsometer system and method of use |
| 02/12/2009 | WO2009019887A1 Image processing device and image processing method |
| 02/10/2009 | US7489400 System and method of applying xenon arc-lamps to provide 193 nm wavelengths |
| 02/10/2009 | US7489399 Spectroscopic multi angle ellipsometry |
| 02/10/2009 | US7488929 Perimeter detection using fiber optic sensors |
| 02/05/2009 | WO2009016345A1 Polarimetric imaging apparatus |
| 02/05/2009 | WO2009015723A1 Substance concentration sensor and production method therefor |
| 02/05/2009 | US20090033944 Coded polarization-dependent interferometry |
| 02/05/2009 | US20090033938 Process and apparatus for measurements of Mueller matrix parameters of polarized light scattering |
| 02/04/2009 | EP2020620A2 Adjustment method, exposure method, device manufacturing method, and exposure apparatus |
| 01/27/2009 | US7483148 Ellipsometric investigation of very thin films |
| 01/20/2009 | US7480050 Lithographic system, sensor, and method of measuring properties of a substrate |
| 01/20/2009 | US7480049 Circular dichroism detection system |
| 01/20/2009 | US7480047 Time-domain computation of scattering spectra for use in spectroscopic metrology |
| 01/15/2009 | WO2009009478A1 Optical sensors for downhole measurements using birefringent materials |
| 01/15/2009 | WO2009007479A1 Method and system for detecting light polarisation with passband response |
| 01/15/2009 | US20090015834 Optical sensors for downhole measurements using birefringent materials |
| 01/15/2009 | US20090015833 Device and method for improving the measurement accuracy in an optical cd measurement system |
| 01/15/2009 | US20090015821 Scatterometry target and method |
| 01/14/2009 | EP2013594A2 Measurement of linear and circular diattenuation in optical elements |
| 01/13/2009 | US7477388 Sample masking in ellipsometer and the like systems including detection of substrate backside reflections |
| 01/13/2009 | US7477387 Method and apparatus for analyzing optical characteristics of optical medium and method for production monitoring |
| 01/13/2009 | US7477386 Polariscope toy and ornament with accompanying photoelastic and/or photoplastic devices |
| 01/13/2009 | US7477385 Method of determining physical properties of an optical layer or layer system |
| 01/08/2009 | US20090009764 Method and apparatus for measuring the presence and concentration of pharmaceutical substances in a medical fluid administered by a medication delivery system |
| 01/07/2009 | EP2010877A2 Polarization based interferometric detector |
| 01/01/2009 | US20090002708 Methods and apparatus for spectroscopic imaging of materials in an array |
| 01/01/2009 | US20090002706 Wafer level alignment structures using subwavelength grating polarizers |
| 01/01/2009 | US20090002686 Sheet Metal Oxide Detector |
| 12/31/2008 | EP2008067A1 Combined use of oscillating means and ellipsometry to determine uncorrelated effective thickness and optical constants of material deposited from a fluid |
| 12/30/2008 | US7471394 Optical detection system with polarizing beamsplitter |
| 12/30/2008 | US7471378 Method and system for determining a polarization dependent characteristics of optical and opto-electrical devices |
| 12/25/2008 | US20080318266 Fluorescence polarization instruments and methods for detection of exposure to biological materials by fluorescence polarization immunoassay of saliva, oral or bodily fluids |
| 12/25/2008 | US20080316486 Target substance-detecting apparatus and target substance-detecting method |
| 12/24/2008 | WO2007121406A3 Polarization based interferometric detector |
| 12/23/2008 | US7468794 Rotating compensator ellipsometer system with spatial filter equivalent |
| 12/23/2008 | US7468792 Evaluation apparatus and evaluation method |
| 12/23/2008 | US7468788 Systems and methods for chiral detection and analysis |
| 12/18/2008 | US20080309938 Apparatus And Method Of Non-Sampling-Based Q-Factor Measuring |
| 12/17/2008 | EP2002229A2 Real-time linear-birefringence-detecting polarization microscope |
| 12/16/2008 | US7466471 Optical instrument and measurements using multiple tunable optical polarization rotators |
| 12/16/2008 | US7465591 Evaluating a geometric or material property of a multilayered structure |
| 12/11/2008 | WO2008130383A3 Molecular and photonic nanostructures, optical biomaterials, photosensitizers, molecular contrast agents, and metamaterials |
| 12/11/2008 | US20080304061 Polarimetric Raman System and Method For Analysing a Sample |
| 12/10/2008 | CN101319958A Quarter-wave plate fast axis direction real-time measurement apparatus and method |
| 12/09/2008 | US7463361 Optical apparatus having a polarization splitter and multiple interferometers |
| 12/09/2008 | US7463355 Nondestructive optical technique for simultaneously measuring optical constants and thickness of thin films |
| 12/04/2008 | WO2008147575A2 Systems, methods, and devices for handling terahertz radiation |
| 12/02/2008 | US7460230 Deviation angle self compensating substantially achromatic retarder |
| 11/27/2008 | US20080291447 Optical Chromatic Aberration Correction and Calibration in Digital Cameras |
| 11/26/2008 | EP1660841A4 Method and apparatus for precision measurement of phase shifts |
| 11/25/2008 | US7456965 Optical measurements of properties in substances using propagation modes of light |
| 11/25/2008 | US7456964 Detector configurations for optical metrology |
| 11/25/2008 | US7456963 Method and equipment for detecting pattern defect |
| 11/25/2008 | US7456962 Conical refraction polarimeter |
| 11/20/2008 | WO2008086311A3 System, device and method for dermal imaging |
| 11/20/2008 | US20080285035 Information maintenance during intensity attenuation in focused beams |
| 11/20/2008 | US20080285034 Single-lens 3-D imaging device using a polarization-coded aperture maks combined with a polarization-sensitive sensor |
| 11/20/2008 | US20080285033 Method and Device for Characterizing Analyte using Electro-Optically Modulated Surface Plasmon Resonance Based on Phase Detection |