| Patents for G01J 4 - Measuring polarisation of light (3,335) |
|---|
| 11/24/2004 | CN1177195C Laser multiple degree-of-freedom measuring system and method |
| 11/23/2004 | US6822738 Spectroscopic rotating compensator ellipsometer system with pseudo-achromatic retarder system |
| 11/16/2004 | US6819423 High spatial resolution infrared ellipsometer |
| 11/11/2004 | US20040225477 Method and system of dynamic learning through a regression-based library generation process |
| 11/09/2004 | US6816261 Polarization analysis unit, calibration method and optimization therefor |
| 11/09/2004 | US6816260 Fiber polarimeter, the use thereof, as well as polarimetric method |
| 11/04/2004 | US20040220760 Method and system of dynamic learning through a regression-based library generation process |
| 11/02/2004 | US6813021 Method and apparatus for monitoring optical signal-to-noise ratio (OSNR) using polarization-nulling method |
| 10/27/2004 | EP1470401A1 Apparatus and method for imaging |
| 10/26/2004 | US6810141 Method for processing spatial-phase characteristics of electromagnetic energy and information conveyed therein |
| 10/21/2004 | US20040207845 Thin film optical measurement system and method with calibrating ellipsometer |
| 10/21/2004 | US20040207843 Method and apparatus for measuring polarization |
| 10/19/2004 | US6806956 Polarization detector and method for fabricating the polarization detector |
| 10/13/2004 | EP1466147A1 Polarization state conversion in optically active spectroscopy |
| 10/13/2004 | CN1536348A Double refraction detecting method and device |
| 10/12/2004 | US6804003 System for analyzing surface characteristics with self-calibrating capability |
| 10/07/2004 | WO2004085670A2 Polarization detection |
| 10/07/2004 | US20040196460 Scatterometric measuring arrangement and measuring method |
| 10/05/2004 | US6801320 Method and apparatus for a Jones vector based heterodyne optical polarimeter |
| 10/05/2004 | US6801312 Method for evaluating complex refractive indicies utilizing IR range ellipsometry |
| 09/30/2004 | WO2004083945A1 Infinite follow-up polarization controller, polarization mode dispersion compensator comprising same, and infinite follow-up polarization control method |
| 09/30/2004 | US20040189993 System for performing ellipsometry using an auxiliary pump beam to reduce effective illumination spot size |
| 09/30/2004 | US20040189992 Ellipsometry methods and apparatus using solid immersion tunneling |
| 09/29/2004 | CN1168971C Method for measuring double refraction and its device |
| 09/28/2004 | US6798514 Means and apparatus for analysing and filtering polarized light and synthesizing a scene in filtered light |
| 09/28/2004 | US6798512 Multiple beam ellipsometer |
| 09/28/2004 | US6798511 Imaging ellipsometry |
| 09/21/2004 | US6795184 Odd bounce image rotation system in ellipsometer systems |
| 09/21/2004 | US6794635 Apparatus and method for detecting an amount of depolarization of a linearly polarized beam |
| 09/16/2004 | US20040179199 Small spot ellipsometer |
| 09/16/2004 | US20040179198 Polarimeter using quantum well stacks separated by gratings |
| 09/15/2004 | CN2641641Y Reflection difference device for in-situ real time detection film growth status |
| 09/14/2004 | US6791684 Low-noise spectroscopic ellipsometer |
| 09/10/2004 | WO2004076969A1 Single wavelength ellipsometry for measuring the thickness of thin films on multilayer substrates |
| 09/09/2004 | US20040175760 Analysis of chemical data from images |
| 09/09/2004 | US20040173731 DWDM channel detection system |
| 09/08/2004 | CN1165755C Apparatus and method for detecting polarization |
| 08/31/2004 | US6785638 Method and system of dynamic learning through a regression-based library generation process |
| 08/26/2004 | US20040165623 Wavelength monitoring apparatus |
| 08/19/2004 | WO2004070341A1 Method and apparatus for measuring polarization mode dispersion |
| 08/18/2004 | EP1446641A1 Methods and apparatus for measuring refractive index and optical absorption differences |
| 08/12/2004 | US20040156051 Method and apparatus for measuring birefringence |
| 08/12/2004 | DE19745607B4 Anordnung zur Messung von optischen Parametern kristalliner Proben mittels optischer Reflexion Arrangement for measuring optical parameters of crystalline samples by optical reflection |
| 08/11/2004 | CN1519604A Polarization analysis heterodyne optical receiver |
| 08/04/2004 | EP1443688A2 Optical heterodyne receiver |
| 07/20/2004 | US6765672 Fast optical stokes polarimeter |
| 07/20/2004 | US6765671 Automated system for measurement of an optical property |
| 07/14/2004 | EP1436579A1 Accuracy calibration of birefringence measurement systems |
| 07/13/2004 | US6762837 Polarization compensator and wavelength division multiplexing apparatus using same |
| 07/13/2004 | US6762829 Measurement of optical properties of passive optical devices using the matrix method |
| 07/08/2004 | WO2004045113A3 Method of evaluating fiber pmd using polarization optical time domain reflectometry |
| 07/08/2004 | WO2004042967A3 Optical communications apparatus |
| 07/08/2004 | US20040130718 Concurrent measurement and cleaning of thin films on silicon-on-insulator (SOI) |
| 07/08/2004 | US20040130717 Liquid crystal based polarimetric system, a process for the calibration of this polarimetric system, and a polarimetric measurement process |
| 07/07/2004 | EP1435517A1 Method for analyzing thin-film layer structure using spectroscopic ellipsometer |
| 07/07/2004 | EP1434977A1 Scatterometric measuring array and measuring method |
| 07/07/2004 | EP1049913A4 Video imaging of superficial biological tissue layers using polarized light |
| 07/01/2004 | US20040124344 Polarization mode dispersion compensator based on degree of polarization |
| 06/30/2004 | CN1155797C Ellipsometer measuring instrument |
| 06/29/2004 | US6756195 Polymerization method from the combinatorial synthesis and analysis of organometallic compounds and catalysts |
| 06/24/2004 | WO2004053442A1 Optical power limiting devices and a method for protecting imaging and non-imaging sensors |
| 06/24/2004 | US20040119984 Method for measuring the microrelief of an object and optical characteristics of near-surface layer, modulation interference microscope for carrying out said method |
| 06/22/2004 | US6753962 Thin film optical measurement system and method with calibrating ellipsometer |
| 06/22/2004 | US6753961 Spectroscopic ellipsometer without rotating components |
| 06/17/2004 | US20040114150 Method and apparatus for determining the influencing of the state of polarization by an optical system; and an analyser |
| 06/17/2004 | US20040114142 Birefringence measurement at deep-ultraviolet wavelengths |
| 06/16/2004 | EP1429128A1 Method and apparatus for measuring birefringence |
| 06/15/2004 | US6750968 Differential numerical aperture methods and device |
| 06/09/2004 | CN2620258Y Spectrum polarized radiation meter |
| 06/02/2004 | EP1095259A4 Spectroscopic ellipsometer |
| 06/01/2004 | US6744509 Retardance sweep polarimeter and method |
| 05/27/2004 | WO2004045113A2 Method of evaluating fiber pmd using polarization optical time domain reflectometry |
| 05/27/2004 | US20040100633 Optical inspection equipment for semiconductor wafers with precleaning |
| 05/26/2004 | EP1421717A1 Polarization mode dispersion compensator based on degree of polarization |
| 05/21/2004 | WO2004042967A2 Optical communications apparatus |
| 05/21/2004 | WO2004007017A3 Method of noise cancellation in an unpolarized-laser instrument |
| 05/19/2004 | CN1497249A Measuring system of fibre-optical residual stress |
| 05/18/2004 | US6738529 Analysis of chemical data from images |
| 05/18/2004 | US6738138 Small spot ellipsometer |
| 05/18/2004 | US6738137 Measurement of waveplate retardation using a photoelastic modulator |
| 05/12/2004 | EP1417476A1 Multiple beam ellipsometer |
| 05/11/2004 | US6734968 System for analyzing surface characteristics with self-calibrating capability |
| 05/06/2004 | WO2004038351A1 Polarization conversion unit for reducing polarization dependent measurement errors |
| 05/06/2004 | US20040085539 Detector configurations for optical metrology |
| 05/06/2004 | US20040084611 Method of evaluating fiber PMD using polarization optical time domain reflectometry |
| 04/29/2004 | WO2004036163A1 Vector representation of polarization dependent loss |
| 04/28/2004 | EP0974042B1 Polarimeter and corresponding measuring method |
| 04/22/2004 | US20040075826 Residual stress measuring system for optical fibers |
| 04/21/2004 | EP1411339A2 Wavelength dispersion measuring apparatus and polarization dispersion measuring appparatus |
| 04/21/2004 | EP1411334A2 Residual stress measuring system for optical fibers |
| 04/21/2004 | EP1411333A1 A liquid crystal based polarimetric system, a process for its calibration, and a polarimetric measurement process |
| 04/20/2004 | US6724387 Method and device to calculate and display the phase transformation of optical polarization |
| 04/15/2004 | US20040071381 System and method for PMD measurement from coherent spectral analysis |
| 04/15/2004 | US20040070766 Method and apparatus for a Jones vector based heterodyne optical polarimeter |
| 04/15/2004 | US20040070760 Compact spectroscopic ellipsometer |
| 04/15/2004 | US20040070759 Vector representation of polarization dependent loss |
| 04/14/2004 | CN1145905C System for contactless recognition of hand and finger lines |
| 04/13/2004 | US6721050 Method and device for the spectral analysis of light |
| 04/06/2004 | US6717706 State of polarization detector |
| 03/31/2004 | CN1486444A Method for measuring the microrelief of an object and optical characteristics of near-surface layer, modulation interference microscope for carrying out said method |