Patents
Sitemap › G01 - Measuring; Testing › G01J - Measurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infra-red, visible or ultra-violet light; Colorimetry; Radiation pyrometry › G01J 4 - Measuring polarisation of light
Patents for G01J 4 - Measuring polarisation of light (3,335)
12/2010
12/16/2010WO2010144866A2 Microgrid imaging polarimeters with frequency domain reconstruction
12/16/2010US20100315641 Polarimeter
12/16/2010US20100315640 Polarization controller
12/16/2010US20100315567 Liquid crystal based broadband filter for fast polarization imaging
12/09/2010US20100309469 System and method for entangled photons generation and measurement
12/07/2010US7847937 Optical measurment systems and methods
12/02/2010US20100302541 System and Method for Performing Ellipsometric Measurements on an Arbitrarily Large or Continuously Moving Sample
12/01/2010CN101903759A Method and device for one-shot measurement of the transient birefringence induced by a perturbation lying within the terahertz frequency range
11/2010
11/30/2010US7843564 Apparatus and method of non-sampling-based Q-factor measuring
11/25/2010US20100296092 Single-polarizer focused-beam ellipsometer
11/25/2010US20100296088 Method and apparatus for detecting polarizing direction of electromagnetic wave
11/25/2010US20100296039 Photo-aligned liquid-crystal micropolarimeter array and its manufacturing method
11/24/2010CN101893659A Method and device for detecting polarization direction of electromagnetic wave
11/23/2010US7839506 Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method
11/23/2010US7839505 Optical rotating power measurement method and optical rotating power measurement apparatus
11/18/2010DE102009020923A1 System for partially removing interconnection between photons and for detecting partially removed interconnection, has high temperature-superconductor disks arranged in center of connecting line between detectors
11/11/2010WO2010128307A1 Imaging system
11/11/2010WO2010128014A1 Method for identifying a scene from multiple wavelength polarised images
11/11/2010US20100282945 Two-dimensional solid-state image capture device and polarization-light data processing method therefor
11/10/2010CN101881659A Electromagnetic wave detector
11/09/2010US7830512 System and method for controlling intensity of a beam of electromagnetic radiation in ellipsometers and polarimeters
11/09/2010US7830511 Apparatus and method for measuring polarization direction of polarizing plate
11/04/2010WO2010127273A1 Liquid crystal optical switch configured to reduce polarization dependent loss
11/03/2010CN201622116U Static total stokes imaging spectrum polarimeter based on liquid crystal tunable filter
11/02/2010USRE41906 Two dimensional beam deflector
11/02/2010US7826041 Register mark detection apparatus
10/2010
10/28/2010US20100271475 Compact snapshot polarimetry camera
10/27/2010CN1811383B Method and system for analyzing one or more characteristics of film
10/27/2010CN101871880A Detection system and detection method of four-channel time division multiplexing atmosphere polarization diagram
10/26/2010US7821654 System for scatterometric measurements and applications
10/26/2010US7821637 System for controlling intensity of a beam of electromagnetic radiation and method for investigating materials with low specular reflectance and/or are depolarizing
10/21/2010US20100266156 Optical sedimentation recorder
10/21/2010US20100265504 Optical device with superimposed photonic circuits for coupling to one or more optical waveguides
10/20/2010CN101303256B Embedded type polarization state measuring instrument based on LCD
10/14/2010US20100259759 Polarimeter employing a fizeau interferometer
10/14/2010DE19807649B4 Vorrichtung und Verfahren zur dreidimensionalen Messung und Beobachtung dünner Schichten Apparatus and method for three-dimensional measurement and observation of thin layers
10/13/2010CN1768258B Optical rotation measuring instrument
10/13/2010CN101271024B Synchrotron radiation X-ray multilayer film synthetic polarization measuring apparatus
10/07/2010DE19953528B4 Vorrichtung und Verfahren zur automatischen Messung der Spannungsdoppelbrechung mit feststehendem Analysator Apparatus and method for automatic measurement of stress birefringence with fixed analyzer
10/06/2010CN101852614A Miniature polarized light detecting device of navigation sensor
10/05/2010US7808637 Method and apparatus for determining liquid crystal cell parameters from full mueller matrix measurements
10/05/2010US7808636 Systems, methods, and devices for handling terahertz radiation
09/2010
09/30/2010US20100245823 Methods and Systems for Imaging Skin Using Polarized Lighting
09/30/2010US20100245819 Method and apparatus for phase-compensated sensitivity-enhanced spectroscopy (PCSES)
09/29/2010CN101846553A Device and method for measuring polarization state by two-slit interference method
09/29/2010CN101846549A Electromagnetic wave detection device and detection method
09/29/2010CN101476975B Method and apparatus for measuring polarization mode dispersion vector
09/23/2010US20100239245 Polarization Mode Emulators and Polarization Mode Dispersion Compensators Based on Optical Polarization Rotators with Discrete Polarization States
09/23/2010US20100238443 Multi-channel surface plasmon resonance instrument
09/22/2010CN201589659U Optical structure of simultaneous polarization imaging detection system
09/21/2010US7800756 Method and apparatus for analyzing coatings on curved surfaces
09/21/2010US7800755 High-speed polarimeter having a multi-wavelength source
09/16/2010US20100234704 Non-Invasive Polarimetric Apparatus and Method for Analyte Sensing in Birefringent Media
09/16/2010US20100231911 Circular Birefringence Refractometer: Method And Apparatus For Measuring Optical Activity
09/15/2010CN101832819A Method for synchronously measuring non-orthogonal polarization angle and elliptic polarization angle of dual-frequency laser
09/15/2010CN101832818A Method and apparatus for determining liquid crystal cell parameters from full mueller matrix measurements
09/14/2010US7796260 System and method of controlling intensity of an electromagnetic beam
09/14/2010US7796259 Rapid acquisition ellipsometry
09/14/2010US7796258 Apparatus and method of non-sampling-based Q-factor measuring
09/14/2010US7796257 Measuring apparatus, measuring method, and characteristic measurement unit
09/14/2010CA2453307C Polarization state conversion in optically active spectroscopy
09/09/2010US20100225915 Prism for inducing Brewster's angle transmission and fluorescence detection apparatus for improving signal-to-noise ratio using thereof
09/09/2010US20100225914 Method for monitoring and measuring optical properties of device in polarization maintaining fibers by using reference fiber bragg grating and fiber components manufactured thereby
09/07/2010US7792367 System, method and apparatus for image processing and image format
09/07/2010US7791725 Method and equipment for detecting pattern defect
09/07/2010US7791724 Characterization of transmission losses in an optical system
09/02/2010WO2010098740A1 Terahertz-infrared ellipsometer system, and method of use
09/02/2010US20100220324 Downhole sensors using manufactured anisotropic permittivity
09/02/2010US20100220313 Terahertz-infrared ellipsometer system, and method of use
09/02/2010DE102009015393B3 Messverfahren und Messsystem zur Messung der Doppelbrechung Measurement method and measuring system for measuring the birefringence
09/01/2010CN101441169B Plane four-channel atmosphere polarization information detection sensor
08/2010
08/26/2010WO2010096637A1 Polarization monitoring reticle design for high numerical aperture lithography systems
08/26/2010WO2010096407A1 Polarization imaging
08/25/2010CN101319958B Quarter-wave plate fast axis direction real-time measurement apparatus and method
08/24/2010US7781725 Optical fiber based sensor system suitable for monitoring remote aqueous infiltration
08/19/2010US20100208264 Polarization monitoring reticle design for high numerical aperture lithography systems
08/18/2010CN101806625A Static Fourier transform interference imaging spectrum full-polarization detector
08/17/2010US7777883 Ellipsometric investigation of anisotropic samples
08/17/2010US7777882 Method for the in-situ and real-time determination of the thickness, optical properties and quality of transparent coatings during their growth onto polymeric substrates and determination of the modification, activation and the modification depth of polymeric materials surfaces
08/17/2010US7777881 Laser device and microscope
08/17/2010US7777880 Metrological characterisation of microelectronic circuits
08/17/2010US7777879 Rotary encoders
08/17/2010US7777878 Application of digital light processor in scanning spectrometer and imaging ellipsometer and the like systems
08/17/2010US7777177 System for responding to a superposition of quantum states
08/17/2010CA2407918C Method and apparatus for imaging using polarimetry and matrix based image reconstruction
08/12/2010US20100201985 Delivering Light Via Optical Waveguide and Multi-View Optical Probe Head
08/10/2010US7773219 Process and apparatus for measurements of Mueller matrix parameters of polarized light scattering
08/05/2010US20100195101 Method and Apparatus for Determining Concentration Using Polarized Light
08/05/2010DE10006239B4 Verfahren zur Charakterisierung von Polarisationstransformatoren A method of characterizing polarization transformers
08/03/2010US7768660 Non-destructive approach to ellipsometric monitoring of a film coating on the inner surface of a tube shaped sample
08/03/2010US7768643 Apparatus and method for classifying and sorting articles
07/2010
07/27/2010US7764376 Systems and methods for measurement of a specimen with vacuum ultraviolet light
07/27/2010US7764375 Imaging device for imaging microscopic or macroscopic objects
07/22/2010WO2010082000A1 Device and method for determining a piece of polarisation information and polarimetric imaging device
07/22/2010WO2010081999A1 Device and method for determining a piece of polarisation information and polarimetric imaging device
07/22/2010US20100182603 Surface Inspection Device
07/22/2010US20100182602 Defect inspection method and apparatus
07/22/2010US20100182593 Surface state detecting apparatus
07/22/2010US20100182582 Passive reticle tool, a lithographic apparatus and a method of patterning a device in a lithography tool
07/21/2010CN101782433A Static all-optical interference imaging spectrum full-polarization detection method
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