Patents for G01J 4 - Measuring polarisation of light (3,335)
11/2008
11/13/2008WO2008135438A1 A vectorial polarimetry method and apparatus for analysing the three-dimensional electromagnetic field resulting from an interaction between a focused illuminating field and a sample to be observed
11/12/2008CN201149528Y Apparatus for measuring optically-active angle of activizer
11/12/2008CN101303256A Embedded type polarization state measuring instrument based on LCD
11/11/2008US7450232 Generic interface for an optical metrology system
11/11/2008US7450231 Deviation angle self compensating substantially achromatic retarder
11/06/2008WO2008133650A2 Method and system for providing a high definition triangulation system
11/06/2008US20080273201 Signal Module With Reduced Reflections
11/06/2008US20080273200 Measurement method, measurement apparatus, exposure apparatus, and device fabrication method
11/05/2008EP1988373A1 A vectorial polarimetry method and apparatus for analysing the three-dimensional electromagnetic field resulting from an interaction between a focused illuminating field and a sample to be observed
11/04/2008US7446871 Method and apparatus for real-time polarization difference imaging (PDI) video
10/2008
10/30/2008WO2007106410A3 Real-time linear-birefringence-detecting polarization microscope
10/30/2008WO2007015954A3 Focused droplet nebulizer for evaporative light scattering detector
10/28/2008US7443504 Arbitrary and endless polarization controller and polarization-mode dispersion compensator using the same and arbitrary and endless polarization controlling method
10/28/2008US7443503 Polarization measuring apparatus
10/23/2008WO2008128024A1 Compact snapshot polarimetry camera
10/23/2008US20080259333 Method and apparatus for improved ellipsometric measurement of ultrathin films
10/22/2008CN101292145A Method of evaluating fiber pmd using potdr trace
10/21/2008US7440104 Exposure system, test mask for monitoring polarization, and method for monitoring polarization
10/21/2008US7440103 Inspection apparatus of wiring pattern, inspection method, detection apparatus, detection method
10/21/2008US7439485 Multimode optical transmission apparatus and multimode optical transmission system
10/16/2008WO2008002981A3 Circular birefringence refractometer: method and apparatus for measuring optical activity
10/16/2008US20080252889 Systems and methods for measurement of a specimen with vacuum ultraviolet light
10/16/2008US20080252888 Apparatus for polarization-specific examination, optical imaging system, and calibration method
10/14/2008US7436569 Polarization measurement and self-calibration based on multiple tunable optical polarization rotators
10/09/2008US20080246966 Surface-Inspecting Apparatus and Surface-Inspecting Method
10/09/2008US20080246948 Automatic Polarizer for Cctv Applications
10/08/2008CN101281060A Sky polarized light radiation spectrum measuring systems
10/07/2008US7433037 System for measuring periodic structures
10/02/2008US20080239317 Systems, methods, and devices for handling terahertz radiation
10/02/2008US20080239316 Method and apparatus for quantitative 3-D imaging
10/02/2008US20080239315 Apparatus and method for determining stress in solar cells
09/2008
09/30/2008CA2330115C System for contactless recognition of hand and finger lines
09/25/2008WO2008115417A1 System and method for controlling intensity of a beam of electromagnetic radiation in ellipsometers an polarimeters
09/25/2008WO2008092121A3 Purge gas flow control for high-precision film measurements using ellipsometry and reflectometry
09/25/2008US20080231855 Method for Measuring the Anisotropy in an Element Comprising at Least One Fissile Material and a Corresponding Installation
09/24/2008EP1592990A4 Purging light beam paths in optical equipment
09/24/2008CN101271024A Synchrotron radiation X-ray multilayer film synthetic polarization measuring apparatus
09/24/2008CN101271006A On-line polarized light time-domain reflection optical fiber sensing equipment
09/23/2008US7428050 Multispectral, multifusion, laser-polarimetric optical imaging system
09/23/2008US7428049 Apparatus and method for inspecting film defect
09/23/2008US7428048 Imaging elastic scattering spectroscopy
09/23/2008US7428043 Apparatus for ascertaining the light power level of a light beam, and scanning microscope
09/18/2008WO2007149930A3 Fiber optic sensing instrument and system with fiber of adjustable optical path length and method of using it
09/18/2008WO2007143374A3 Camera glare reduction system and method
09/18/2008US20080225293 Photonic crystal sensor
09/18/2008US20080225267 Optical Measurement Apparatus and Method
09/18/2008DE10392397B4 Polarimeter Polarimeter
09/17/2008EP1969344A2 Method and device for observing an object
09/17/2008EP1969323A1 Opto-electronic system and method for detecting perturbations
09/16/2008US7426030 Reduced gas flow purging system in reflectometer, ellipsometer, polarimeter and the like systems
09/11/2008US20080218754 System and method for active optical target detection with polarized receiver
09/04/2008WO2008105277A1 Compensating layer optical property evaluating method and compensating layer optical property evaluating device
09/04/2008WO2008054558A3 Deviation angle self compensating substantially achromatic retarder
09/04/2008US20080212096 Property determination with light impinging at characteristic angle
09/04/2008US20080212070 Kit and method for multi-analyte determination
09/03/2008EP1963822A1 A broadband ellipsometer/polarimeter system
09/02/2008US7420681 Gas purge system and methods
09/02/2008US7420675 Multi-wavelength imaging system
08/2008
08/28/2008US20080204751 Optical Rotating Power Measurement Method And Optical Rotating Power Measurement Apparatus
08/28/2008US20080204750 Image acquisition, processing, and display
08/28/2008US20080204713 Methods and Apparatus for Label-Independent Monitoring of Biological Interactions on Sensitized Substrates
08/28/2008DE10329360B4 Doppelbrechungsmessgerät, Spannungsentfernungseinrichtung, Polarimeter und Belichtungsgerät Birefringence meter, tension remover, polarimeter and exposure apparatus
08/27/2008CN201107118Y Ellipse polarized light analytical apparatus
08/21/2008WO2008058184A3 Method and apparatus for determining concentration using polarized light
08/21/2008US20080200817 Electronic Polarimetric Imaging System for a Colposcopy Device and an Adapter Housing
08/19/2008US7414733 Azimuthal scanning of a structure formed on a semiconductor wafer
08/19/2008US7414721 In-situ metrology system and method for monitoring metalization and other thin film formation
08/14/2008WO2008097562A1 Utilizing polarization differencing method for detect, sense and avoid systems
08/13/2008EP1956434A2 Lithographic apparatus and methods for use thereof
08/13/2008EP1495293B1 Imaging spectrometer
08/12/2008US7411677 Driverless ellipsometer and ellipsometry
08/12/2008US7411676 Polarization mitigation technique
08/12/2008US7411675 Optical rotation angle measuring apparatus
08/07/2008US20080186491 Rotary encoders
08/07/2008US20080186472 Apparatus and method for inspecting a wafer
08/07/2008DE10320658B4 Polarisationszustandserfassungssystem, Lichtquelle und Belichtungsgerät Polarization state detecting system, light source and exposure apparatus
08/06/2008EP1952198A2 Apparatus and method for generating light from milti-primary colors
08/06/2008EP1952107A2 Combined spatial filter and relay systems in ellipsometers and polarimeters
08/05/2008US7408641 Measurement systems configured to perform measurements of a specimen and illumination subsystems configured to provide illumination for a measurement system
08/05/2008US7408640 Fluorescence polarization instruments and methods for detection of exposure to biological materials by fluorescence polarization immunoassay of saliva, oral or bodily fluids
07/2008
07/31/2008WO2008048402A3 Apparatus for caries detection
07/31/2008US20080180799 Laminated wave plate and optical pickup using the same
07/31/2008US20080180668 Marker structure for optical alignment of a substrate, a substrate including such a marker structure, an alignment method for aligning to such a marker structure, and a lithographic projection apparatus
07/31/2008US20080180667 Recursive-reflective photoelectric sensor
07/29/2008US7405826 Systems and methods for chiroptical heterodyning
07/29/2008US7405817 Method and apparatus for classifying defects of an object
07/24/2008WO2008039825A3 Detection system for birefringence measurement
07/24/2008US20080174763 Color Measuring head and Scanner Device Equipped Therewith
07/23/2008EP1828712B1 Metrological characterization of microelectronic circuits
07/23/2008EP1631577A4 Method and apparatus for recognizing molecular compounds
07/17/2008WO2008086406A2 Method and system for enhancing polarimetric and/or multi-band images
07/17/2008US20080170227 Apparatus and Method for Determining Anisotropies Using Optical Microscopy
07/17/2008CA2674854A1 System, device and method for dermal imaging
07/15/2008US7400403 Beam profile ellipsometer with rotating compensator
07/15/2008US7400402 Modulated scatterometry
07/15/2008US7400401 Measuring low dielectric constant film properties during processing
07/10/2008US20080165359 Method for enhancing polarimeter systems that use micro-polarizers
07/10/2008US20080165358 Optical Scanning Device and Method of Deriving Same
07/10/2008US20080165357 Method and system for providing a high definition triangulation system
07/10/2008US20080165346 Methods and systems for simultaneous real-time monitoring of optical signals from multiple sources
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