| Patents for G01J 4 - Measuring polarisation of light (3,335) |
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| 01/23/2001 | CA2278981A1 Ellipsometer |
| 01/16/2001 | US6175412 Optical component for polarization modulation, a mueller polarimeter and ellipsometer containing such an optical component, a process for the calibration of this ellipsometer, and an ellipsometric measurement process |
| 12/26/2000 | US6166807 Method of urinalysis, urinalysis apparatus, method of measuring angle of rotation and polarimeter |
| 12/20/2000 | EP1060369A1 Birefringence measurement system |
| 12/05/2000 | US6157449 Depolarized light scattering array apparatus and method of using same |
| 12/05/2000 | US6157448 Birefringence measurement optical system and high spatial resolution polarimetric apparatus |
| 11/21/2000 | US6151116 Evaluation method for thin film molecular orientation, evaluation apparatus for the orientation and recording medium |
| 11/16/2000 | WO2000068656A1 System for non-destructive measurement of samples |
| 11/14/2000 | US6147757 Apparatus and method employing depolarization to eliminate effect of polarization dependent loss |
| 11/08/2000 | EP1049913A1 Video imaging of superficial biological tissue layers using polarized light |
| 11/07/2000 | US6144450 Apparatus and method for improving the accuracy of polarization mode dispersion measurements |
| 11/02/2000 | WO2000065331A2 System for analyzing surface characteristics with self-calibrating capability |
| 11/02/2000 | EP1047921A1 Reflectance spectrophotometric apparatus with toroidal mirrors |
| 10/31/2000 | US6141102 Single trianglular shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems |
| 10/25/2000 | EP1038165A4 Regression calibrated spectroscopic rotating compensator ellipsometer system with photo array detector |
| 10/17/2000 | US6134281 Method and apparatus for calibration of a signal processing system utilizing digital down converters |
| 10/17/2000 | US6134012 Broadband spectroscopic rotating compensator ellipsometer |
| 10/17/2000 | US6134011 Optical measurement system using polarized light |
| 10/17/2000 | US6134010 Imaging system using polarization effects to enhance image quality |
| 10/17/2000 | US6134009 Imaging system using polarization effects to enhance image quality |
| 10/05/2000 | WO2000058699A1 Integrated diagnostic system for photoelastic modulator |
| 10/03/2000 | US6128085 Reflectance spectroscopic apparatus with toroidal mirrors |
| 09/27/2000 | EP1038165A1 Regression calibrated spectroscopic rotating compensator ellipsometer system with photo array detector |
| 09/27/2000 | EP0876590A4 Pvc and pet plastic article sorting apparatus and method |
| 09/19/2000 | US6121051 Inexpensive, noninvasive optical method of quantitatively determining the volume fraction of anisotropic material in sample having mixed anisotropic and isotropic material |
| 09/13/2000 | EP1034413A1 Ellipsometer measuring instrument |
| 09/06/2000 | CN1265737A Ellipsometer measuring instrument |
| 08/29/2000 | US6111416 Electro-optical and magneto-optical sensing apparatus and method for characterizing free-space electromagnetic radiation |
| 08/17/2000 | WO2000047961A1 System for measuring polarimetric spectrum and other properties of a sample |
| 08/15/2000 | US6104486 Fabrication process of a semiconductor device using ellipsometry |
| 08/10/2000 | WO2000046579A1 Detector for micro-organisms |
| 08/09/2000 | EP1026495A2 Adjustable beam alignment compensator/retarder |
| 08/08/2000 | US6100981 Dual horizontally oriented triangle shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems |
| 08/02/2000 | CN1261958A Ellipsometer with two lasers |
| 08/01/2000 | US6097488 Method and apparatus for measuring micro structures, anisotropy and birefringence in polymers using laser scattered light |
| 07/27/2000 | WO1998015969A3 Mass spectrometers and methods for rapid screening of libraries of different materials |
| 07/26/2000 | EP1021711A4 Systems and methods for characterization of materials and combinatorial libraries with mechanical oscillators |
| 07/26/2000 | EP1021711A2 Systems and methods for characterization of materials and combinatorial libraries with mechanical oscillators |
| 07/19/2000 | EP1019947A2 Mass spectrometers and methods for rapid screening of libraries of different materials |
| 07/18/2000 | US6091499 Method and device for automatic relative adjustment of samples in relation to an ellipsometer |
| 07/06/2000 | WO2000039546A1 Device for the remote measurement of the optical and physical parameters of objects |
| 07/05/2000 | EP0901615A4 Method and apparatus for monitoring the state of a liquid-crystal polarization modulator |
| 07/04/2000 | US6084675 Adjustable beam alignment compensator/retarder with application in spectroscopic ellipsometer and polarimeter systems |
| 06/28/2000 | EP1012641A1 Sensor apparatus with polarization maintaining fibers |
| 06/27/2000 | US6081337 Method and apparatus for measuring liquid crystal cell properties |
| 06/13/2000 | US6075235 High-resolution polarization-sensitive imaging sensors |
| 06/07/2000 | EP1006348A1 Measurement system and method for measuring critical dimensions using ellipsometry |
| 06/07/2000 | CN1255625A Device and method for measuring critical measurement by ellipsometry |
| 05/31/2000 | EP1004862A2 Polarimeter |
| 05/24/2000 | EP1002221A1 Micropolarimeter |
| 05/17/2000 | EP1000330A1 Measurement of waveplate retardation using a photoelastic modulator |
| 05/09/2000 | US6060710 Infrared Mueller matrix detection and ranging system |
| 04/26/2000 | EP0995087A1 Measurement of brightness, flow velocity and temperature of radiant media |
| 04/20/2000 | WO2000022416A1 Apparatus for optically characterising thin layered material |
| 04/18/2000 | US6052188 Spectroscopic ellipsometer |
| 04/18/2000 | US6052187 Hyperspectral polarization profiler for remote sensing |
| 04/11/2000 | US6049377 Five-axis/six-axis laser measuring system |
| 04/06/2000 | WO2000019518A1 Optical inspection equipment for semiconductor wafers with precleaning |
| 04/06/2000 | DE19842364C1 Mikropolarimeter und Ellipsometer Micropolarimeter and ellipsometer |
| 04/04/2000 | US6046811 Method and apparatus for determining electrical conductivity of a surface of an object |
| 04/04/2000 | US6046805 Method and apparatus for transfusing liquid specimen for optical characteristic measurement and polarimeter using the same |
| 03/28/2000 | US6043887 Polarimeter |
| 03/22/2000 | EP0987537A2 Micropolarimeter and ellipsometer |
| 03/07/2000 | US6034775 Optical systems and methods for rapid screening of libraries of different materials |
| 03/01/2000 | EP0981724A1 Opto-mechanical device |
| 03/01/2000 | EP0696345B1 Self aligning in-situ ellipsometer and method of using for process monitoring |
| 02/29/2000 | US6031614 Measurement system and method for measuring critical dimensions using ellipsometry |
| 02/29/2000 | US6030917 Synthesizing metal-binding ligands on separate regions on substrate; delivering metal ions; activating metal-ligand compound with activator selected from alkylation agents or ionization agents to form activated compound |
| 02/23/2000 | EP0980519A1 Ellipsometer with two lasers |
| 02/15/2000 | US6025917 Polarization characteristic measuring method and apparatus |
| 02/10/2000 | DE19826294C1 Polarimetrisches Verfahren zur Bestimmung der (Haupt-)Schwingungsebene polarisierten Lichts auf etwa 0,1m DEG und miniaturisierbare Vorrichtung zu seiner Durchführung Polarimetric method for determining the (main) plane of oscillation of polarized light at about 0.1m DEG miniaturizable and apparatus for its implementation |
| 01/26/2000 | EP0974042A1 Polarimeter and corresponding measuring method |
| 01/20/2000 | WO2000003228A1 Spectroscopic ellipsometer |
| 01/13/2000 | DE19816974C1 Device to identify relative position of sample to be tested |
| 01/04/2000 | US6011626 Characterization of highly scattering media by measurement of diffusely backscattered polarized light |
| 01/04/2000 | US6011253 Methods and apparatus for analyzing polarization mode dispersion of an optical device |
| 12/23/1999 | WO1999066309A1 POLARIMETRIC METHOD FOR DETERMINING THE (MAIN-)OSCILLATION PLANE OF POLARISED LIGHT ON ABOUT 0.1 m° AND MINIATURISABLE DEVICE FOR ITS IMPLEMENTATION |
| 12/23/1999 | WO1999066286A1 Ellipsometric method and control device for making a thin-layered component |
| 12/14/1999 | US6002485 Multivariable measuring ellipsometer method and system |
| 12/08/1999 | EP0902896A4 Electro-optical and magneto-optical sensing apparatus and method for characterizing free-space electromagnetic radiation |
| 11/30/1999 | US5995228 Wavelength dispersion measuring apparatus and polarization dispersion measuring apparatus |
| 11/24/1999 | CN1236098A Method for measuring double refraction and its device |
| 11/23/1999 | US5991022 Reflectance spectrophotometric apparatus with toroidal mirrors |
| 11/04/1999 | WO1999056237A1 System for contactless recognition of hand and finger lines |
| 11/02/1999 | US5978087 Optical collector head ETC |
| 10/28/1999 | DE19818229A1 Contactless method for hand- and fingerprint recognition |
| 10/27/1999 | EP0951653A1 Optoelectronic device |
| 10/26/1999 | US5973787 Broadband spectroscopic rotating compensator ellipsometer |
| 10/24/1999 | CA2270102A1 Wavelength monitoring system |
| 10/21/1999 | WO1999053296A1 Method for miniaturizing a polarimeter in order to analyze low concentrated constituents in a fluid measuring product on an optical basis and device for the implementation thereof |
| 10/21/1999 | DE19815932A1 Verfahren zur Miniaturisierung eines Polarimeters zur Analyse niedrig konzentrieter Komponenten im flüssigen Meßgut auf optischer Basis sowie Vorrichtung zu seiner Durchführung Process for the miniaturization of a polarimeter for analyzing low concentrated sulfuric components in the liquid material to be measured optically based and device for its implementation |
| 10/20/1999 | EP0950881A2 Method and device for automatically positioning samples relative to an ellipsometer |
| 10/14/1999 | WO1999051955A1 Spectroscopic measurement system using an off-axis spherical mirror and refractive elements |
| 10/14/1999 | DE19825390C1 Sign correction method for reflectance anisotropy measurements on rotating samples |
| 10/12/1999 | US5966195 Method of determining cell thickness and twist angle parameters of liquid crystal cell |
| 10/12/1999 | US5965874 Method and apparatus for measuring the polarization characteristics of optical transmission medium |
| 10/05/1999 | US5963326 For measuring a sample |
| 10/05/1999 | US5963325 Dual vertically oriented triangular shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systems |
| 09/28/1999 | US5959297 Mass spectrometers and methods for rapid screening of libraries of different materials |
| 09/21/1999 | US5956147 Two modulator generalized ellipsometer for complete mueller matrix measurement |