| Patents for G01J 4 - Measuring polarisation of light (3,335) |
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| 07/24/2003 | US20030138025 Parallel screen for rapid thermal characterization of materials |
| 07/23/2003 | EP1329702A1 Polarization effect averaging |
| 07/18/2003 | CA2369224A1 Optical polarization photodetector |
| 07/17/2003 | US20030133113 Rheo-optical indexer and method of screening and characterizing arrays of materials |
| 07/16/2003 | EP1327126A1 Differential numerical aperture methods and device |
| 07/08/2003 | US6591024 System comprising in-line wavelength sensitive polarimeter |
| 07/03/2003 | US20030123060 Thin film optical measurement system and method with calibrating ellipsometer |
| 07/02/2003 | EP1002221B1 Micropolarimeter |
| 06/26/2003 | US20030117626 Small spot ellipsometer |
| 06/26/2003 | US20030117624 Means and apparatus for analysing and filtering polarized light and synthesizing a scene in filtered light |
| 06/24/2003 | US6583415 Method and system for dynamically polarizing electro-optic signals |
| 06/19/2003 | US20030111998 Apparatus and method for measuring polarization-dependent loss using repeated high speed polarization scrambling |
| 06/18/2003 | CN1424570A Phase rotary angle test devices |
| 06/18/2003 | CN1111734C Ellipsometer with two lasers |
| 06/12/2003 | WO2003048723A2 Label-free detection of nucleic acids via surface plasmon resonance |
| 06/10/2003 | US6577394 Imaging system using polarization effects to enhance image quality |
| 06/10/2003 | US6577393 Polarimetric method for determining the (main) vibration plane of polarized light to about 0.1m° and miniaturized device for its implemention |
| 06/10/2003 | US6577384 Spatial averaging technique for ellipsometry and reflectometry |
| 06/10/2003 | US6576906 Semiconductor candidate materials on a common substrate, separated to avoid interdiffusion between library members; exposing to infrared radiation of varying wavelength, measuring the amount of radiation, R(lambda ), reflected |
| 06/05/2003 | US20030103214 Interferometric polarization interrogating filter assembly and method |
| 06/03/2003 | CA2146994C Polarization viewer |
| 05/28/2003 | EP1240484B1 A method and a device for measuring the spatially averaged intensity of a light beam and a method and a device for regulating a light source |
| 05/15/2003 | WO2003040671A1 Accuracy calibration of birefringence measurement systems |
| 05/15/2003 | CA2463768A1 Accuracy calibration of birefringence measurement systems |
| 05/13/2003 | US6563590 System and method for measurement of the state of polarization over wavelength |
| 05/08/2003 | US20030086076 Integrated polarization analyzer for fiber telecommunications |
| 04/24/2003 | US20030075767 High sensitivity polarized-light discriminator device |
| 04/24/2003 | US20030075676 Apparatus for measuring state of polarization of a lightwave |
| 04/22/2003 | US6552836 High performance polarization controller and polarization sensor |
| 04/16/2003 | EP1301764A1 High spatial resolution infrared ellipsometer |
| 04/16/2003 | EP1301763A2 Compact spectroscopic ellipsometer |
| 04/15/2003 | US6549283 Method and system for determining the degree of polarization of light |
| 04/10/2003 | WO2003029770A1 Scatterometric measuring array and measuring method |
| 04/10/2003 | US20030067641 Apparatus and methods for polarization measurements across a spectral range |
| 04/10/2003 | US20030067602 Polarization analysis unit, calibration method and optimization therefor |
| 04/09/2003 | EP1300670A2 Method of measuring angle of rotation and polarimeter |
| 04/09/2003 | CN1105297C Five-axis/six-axis laser measuring system and determining method for object position and rolling displacement |
| 04/08/2003 | US6545329 High sensitivity polarized-light discriminator device |
| 04/01/2003 | US6541271 Infrared spectroscopic imaging of libraries |
| 03/27/2003 | US20030058442 Method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope |
| 03/26/2003 | EP0805352B1 Method and apparatus for urinalysis, method of measuring optical rotation and polarimeter |
| 03/25/2003 | US6538744 Method for measuring simultaneously absolute molecular orientation with effective second order nonlinear optical constant and apparatus therefor |
| 03/25/2003 | US6536944 High-throughput determination of phase change melting points of combinatorial libraries of metal alloys; infrared camera to monitor temperature dependent changes in emissivity/reflectivity |
| 03/20/2003 | WO2003023373A1 Method for analyzing thin-film layer structure using spectroscopic ellipsometer |
| 03/18/2003 | US6535286 Positionable multiple detector system for spectrophotomer, ellipsometer, polarimeter and systems, and methodology of use |
| 03/18/2003 | US6535284 Rheo-optical indexer and method of screening and characterizing arrays of materials |
| 03/13/2003 | WO2003021822A1 Polarization mode dispersion compensator based on degree of polarization |
| 03/13/2003 | US20030049639 Label-free detection of nucleic acids via surface plasmon resonance |
| 03/13/2003 | US20030048973 Polarization analyzing apparatus capable of outputting light in analysis |
| 03/12/2003 | EP1290417A1 Low-noise spectroscopic ellipsometer |
| 03/06/2003 | US20030043445 State of polarization detector |
| 03/06/2003 | US20030043375 Detector configurations for optical metrology |
| 02/27/2003 | WO2003016844A1 Apparatus and methods for polarization measurements |
| 02/26/2003 | EP1285245A1 System for measuring of both circular and linear birefringence |
| 02/20/2003 | WO2003014866A2 Method and system for dynamic learning through a regression-based library generation process |
| 02/20/2003 | WO2003014710A1 Multiple beam ellipsometer |
| 02/20/2003 | WO2001065236A9 Identification by measurement of polarization of light scattered by target |
| 02/18/2003 | US6522406 Correcting the system polarization sensitivity of a metrology tool having a rotatable polarizer |
| 02/13/2003 | US20030030806 Multiple beam ellipsometer |
| 02/13/2003 | US20030030805 Measurement of waveplate retardation using a photoelastic modulator |
| 02/06/2003 | US20030028358 Method and system of dynamic learning through a regression-based library generation process |
| 02/04/2003 | US6515746 Thin film optical measurement system and method with calibrating ellipsometer |
| 02/04/2003 | US6515745 Optical measurement system using polarized light |
| 02/04/2003 | US6515744 Small spot ellipsometer |
| 01/30/2003 | US20030020911 Birefringence measurement |
| 01/29/2003 | EP1280185A1 A conduit system for mass spectrometers and methods for rapid screening of libraries of different materials |
| 01/29/2003 | CN1394275A Optical spectrum analyzer |
| 01/23/2003 | WO2003006938A1 Polarization state conversion in optically active spectroscopy |
| 01/23/2003 | US20030016358 Polarization analyzing apparatus and method for polarization analysis |
| 01/21/2003 | US6509199 Spatial averaging technique for ellipsometry and reflectometry |
| 01/15/2003 | CN1099031C Method for detecting surface defects and apparatus thereof |
| 01/09/2003 | US20030007152 Optical systems and methods for rapid screening of libraries of different materials |
| 01/09/2003 | US20030007151 Method and system for determining the degree of polarization of light |
| 01/08/2003 | CN1389720A Measuring device and method for half-wave voltage and optical uniformity of electro-optical crystal material |
| 01/07/2003 | CA2349085C Apparatus and method of measuring polarization mode dispersion, and recording medium |
| 01/02/2003 | US20030002042 Polarization detector and method for fabricating the polarization detector |
| 01/02/2003 | US20030002041 Fiber polarimeter, the use thereof, as well as polarimetric method |
| 01/02/2003 | EP1271115A2 Polarization analyzing apparatus and method for polarization analysis |
| 01/02/2003 | EP0951653B1 Optoelectronic device |
| 12/27/2002 | WO2002103310A1 Birefringence measurement at deep-ultraviolet wavelengths |
| 12/26/2002 | US20020197731 Infrared spectroscopy imaging of libraries |
| 12/19/2002 | US20020191186 Broadband spectroscopic rotating compensator ellipsometer |
| 12/19/2002 | US20020190194 Method and a device for measuring the spatially averaged intensity of a light beam and a method and a device for regulating a light source |
| 12/12/2002 | US20020186373 Determination of an optical parameter of an optical signal |
| 12/12/2002 | DE10124773A1 Polarization detector has beam divider, filters with doubly refracting layer for converting linearly polarized light into elliptically polarized light and layer of material in cholesterinic phase |
| 12/05/2002 | WO2002054028A3 Device to calculate and display the phase transformation of optical polarization |
| 12/05/2002 | US20020181761 Method for processing spatial-phase characteristics of electromagnetic energy and information conveyed therein |
| 12/05/2002 | US20020181066 High performance polarization controller and polarization sensor |
| 12/05/2002 | US20020180385 Low-noise spectroscopic ellipsometer |
| 12/04/2002 | EP1262752A2 Fiber polarimeter, its use, and polarimetric method |
| 11/28/2002 | US20020176081 Thin film optical measurement system and method with calibrating ellipsometer |
| 11/28/2002 | US20020176080 Polarization compensator and wavelength division multiplexing apparatus using same |
| 11/26/2002 | US6486952 Semiconductor test apparatus |
| 11/26/2002 | US6486951 Method of evaluating an anisotropic thin film and an evaluating apparatus |
| 11/21/2002 | WO2002093237A1 Polarization analysis unit, calibration method and optimization therefor |
| 11/21/2002 | US20020171829 Apparatus and method of measuring polarization mode dispersion, and recording medium |
| 11/21/2002 | DE10209826A1 Fiber type polarimeter for determination of the four different polarization states with the fiber has specially produced fiber Bragg gratings each of which generates two polarization states |
| 11/19/2002 | US6483586 Beam splitting analyzer means in rotating compensator ellipsometer |
| 11/14/2002 | WO2002091534A1 Wavelength monitoring apparatus |
| 11/12/2002 | CA2321842C Video imaging of superficial biological tissue layers using polarized light |