Patents for G01J 4 - Measuring polarisation of light (3,335)
07/2007
07/19/2007US20070165227 Device and method for object recognition for an automotive safety device
07/19/2007US20070165226 Method for optically detecting leaks in gas-tight housing especially of micro-electro-mechanical systems (mems)
07/18/2007EP0866954A4 Five-axis/six-axis laser measuring system
07/17/2007US7245376 Combined spatial filter and relay systems in rotating compensator ellipsometer/polarimeter
07/17/2007US7245375 Optical measurement device and method
07/12/2007WO2007077312A2 Method and device for observing an object
07/12/2007US20070159630 Beam profile ellipsometer with rotating compensator
07/12/2007US20070159629 Ellipsometric biosensor comprising an amplification layer
07/11/2007EP1805498A2 On-chip polarimetry for high-throughput screening of nanoliter and smaller sample volumes
07/10/2007US7242000 Method and apparatus for screening combinatorial libraries of semiconducting properties
07/05/2007WO2007074429A1 Opto-electronic system and method for detecting perturbations
07/05/2007US20070153273 Material independent profiler
07/05/2007US20070153272 Systems and methods for optical measurement
07/05/2007CA2634632A1 Opto-electronic system and method for detecting perturbations
07/04/2007EP1685386A4 Reaction monitoring of chiral molecules using fourier transform infrared vibrational circular dichroism spectroscopy
07/03/2007US7239395 Optical interrogation systems with reduced parasitic reflections and a method for filtering parasitic reflections
07/03/2007US7239392 Polarization modulation photoreflectance characterization of semiconductor electronic interfaces
07/03/2007US7239391 Method of analysis of multiple layer samples
07/03/2007US7239390 Modulated scatterometry
07/03/2007US7239389 Determination of irradiation parameters for inspection of a surface
07/03/2007US7239388 Retardance measurement system and method
07/03/2007US7239382 Polarizing plates grading method
06/2007
06/28/2007WO2007071480A1 A broadband ellipsometer/polarimeter system
06/28/2007US20070146716 Device and method for non-contact sensing of low-concetration and trace substances
06/28/2007US20070146706 Broadband ellipsometer / polarimeter system
06/28/2007US20070146632 Advanced polarization imaging method, apparatus, and computer program product for retinal imaging, liquid crystal testing, active remote sensing, and other applications
06/26/2007US7236244 Alignment target to be measured with multiple polarization states
06/21/2007US20070139651 Miniature optical beam recombiner using polarization maintaining fibers
06/19/2007US7233396 Polarization based interferometric detector
06/19/2007US7233395 Performing retardation measurements
06/14/2007US20070133005 Optical analyzers of polarization properties
06/14/2007DE10314185B4 Doppelbrechungsmessgerät- und Verfahren Doppelbrechungsmessgerät- and procedures
06/13/2007EP1796295A1 Method for detection and location of faults on an optical transmission path and optical transmission system
06/13/2007CN2911623Y Measurer for extinctivity and related parameters
06/12/2007US7230701 Compact spectroscopic ellipsometer
06/12/2007US7230700 Simultaneous 4-stokes parameter determination using a single digital image
06/12/2007US7230699 Sample orientation system and method
06/07/2007WO2007003840A3 Electronic polarimetric imaging system for a colposcopy device and an adapter housing
06/07/2007US20070127024 Polarization evaluation mask, polarization evaluation method, and polarization determination device
06/06/2007EP1397651B1 Birefringence measurement at deep-ultraviolet wavelengths
06/05/2007US7228037 Integrated polarization beam splitter with quarter-wave plate for polarimeter and PMD compensation applications
06/05/2007US7227649 Surface inspection apparatus
06/05/2007US7227645 Method and apparatus for measuring polarization mode dispersion
06/05/2007US7227638 Calibration system and method for calibration of various types of polarimeters
06/05/2007US7227116 Very fast time resolved imaging in multiparameter measurement space
05/2007
05/31/2007WO2007061460A2 Combined spatial filter and relay systems in ellipsometers and polarimeters
05/30/2007EP1247079A4 Ellipsometer and ellipsometry method
05/29/2007US7224471 Azimuthal scanning of a structure formed on a semiconductor wafer
05/29/2007US7224458 Phase-shifting test mask patterns for characterizing illumination polarization balance in image forming optical systems
05/29/2007US7224457 Performing retardation measurements
05/22/2007US7221458 Method for measuring the microrelief of an object and optical characteristics of near-surface layer, modulation interference microscope for carrying out said method
05/22/2007US7221454 Photopolarimeters and spectrophotopolarimaters with multiple diffraction gratings
05/22/2007US7220978 System and method for detecting defects in semiconductor wafers
05/18/2007WO2006124396A3 Optical beam-shaper
05/17/2007US20070110242 Communication system and communication method using the same
05/17/2007US20070110241 Active stabilization of a one-way qkd system
05/16/2007EP1786123A1 Polarization mode dispersion compensator based on degree of polarization
05/15/2007US7218436 Optical instrument and measurements using multiple tunable optical polarization rotators
05/10/2007US20070103684 Phase wavelength and polarization insensitive optical devices
05/10/2007US20070103683 Optically measuring substances using propagation modes of light
05/09/2007EP1340064B8 Apparatus and method for detecting an amount of depolarization of a linearly polarized beam
05/08/2007US7215469 Confocal microscope
05/08/2007US7215424 Broadband ellipsometer or polarimeter system including at least one multiple element lens
05/08/2007US7215423 Control of beam spot size in ellipsometer and the like systems
05/03/2007US20070097373 System for and method of investigating the exact same point on a sample substrate with multiple wavelengths
05/02/2007CN2896248Y Apparatus for conducting polarization-relative consumption and polarization degree measure using optical polarization controller
05/01/2007US7211812 Entangled photon pair generating apparatus
04/2007
04/26/2007US20070091311 Normal incidence rotating compensator ellipsometer
04/26/2007US20070091310 Adaptive polarization adjustment apparatus for controlling polarization of light inputed to polarization-maintaining waveguide components
04/26/2007US20070091309 Method of inspecting unevenness of partition surface of honeycomb structure and inspecting device
04/24/2007US7209234 Combined use of oscillating means and ellipsometry to determine uncorrelated effective thickness and optical constants of material deposited from a fluid
04/24/2007US7209232 Device for ellipsometric two-dimensional display of a sample, display method and ellipsometric measurement method with spatial resolution
04/19/2007WO2005116598A3 Imaging method and apparatus
04/18/2007CN2890933Y Electric current sensing device based on polarization degree demodulation
04/17/2007US7206071 Detector configurations for optical metrology
04/17/2007US7206069 Optical analyzers of polarization properties
04/11/2007EP1771607A2 Systems and methods for generating images of crystals
04/10/2007US7202953 Scanning microscopic method having high axial resolution
04/10/2007US7202951 Laser-based cleaning device for film analysis tool
04/10/2007US7202950 Retardance measurement system and method
04/05/2007WO2006004905A3 Systems and methods for generating images of crystals
04/05/2007US20070076204 Optical detection device with reduced light throughput oscillations
04/05/2007US20070076203 Exposure apparatus
03/2007
03/29/2007WO2006133258A3 Measuring overlay and profile asymmetry using symmetric and anti-symmetric scatterometry signals
03/29/2007WO2006086579A3 Methods and apparatus for noninvasive determinations of analytes
03/27/2007US7196794 Systems and methods for limiting power using photo-induced anisotropy
03/27/2007US7196793 Method for analyzing thin-film layer structure using spectroscopic ellipsometer
03/27/2007US7196792 Liquid crystal based polarimetric system, a process for the calibration of this polarimetric system, and a polarimetric measurement process
03/20/2007US7193712 Methods and apparatus for measuring an electromagnetic radiation response property associated with a substrate
03/20/2007US7193711 Imaging method and apparatus
03/20/2007US7193710 Rotating or rotatable compensator spectroscopic ellipsometer system including multiple element lenses
03/20/2007US7193709 Ellipsometric investigation of thin films
03/20/2007US7193708 Time efficient method for investigating sample systems with spectroscopic electromagnetic radiation
03/20/2007US7193214 Sensor having differential polarization and a network comprised of several such sensors
03/15/2007US20070058167 Smart Thin-Film Coatings and Smart Polarization Devices, Smart Ellipsometric Memory, and Smart Ellipsometers
03/15/2007US20070058166 Image acquisition, processing, and display
03/14/2007EP1340064B1 Apparatus and method for detecting an amount of depolarization of a linearly polarized beam
03/13/2007US7190453 Film measurement
03/08/2007WO2007027408A1 Method of evaluating fiber pmd using potdr trace
03/08/2007WO2007025648A1 Differential measuring method for determining variations in concentration for determining oversaturation
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