| Patents for G01J 4 - Measuring polarisation of light (3,335) |
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| 07/07/2005 | WO2005026673A3 Active illumination imaging polarimetry |
| 07/07/2005 | US20050146789 Device for polarization-specific examination, an optical imaging system and a calibration method |
| 07/05/2005 | US6914675 Ellipsometric method and control device for making a thin-layered component |
| 06/29/2005 | EP1548506A1 Lithographic apparatus and methods for use thereof |
| 06/28/2005 | US6911645 DWDM channel detection system |
| 06/23/2005 | US20050134849 Method of performing optical measurement on a sample |
| 06/22/2005 | EP1397651A4 Birefringence measurement at deep-ultraviolet wavelengths |
| 06/21/2005 | US6909506 Stokes parameter measurement device and method |
| 06/16/2005 | WO2005054825A1 Circularly polarized light method and device for determining wall thickness and orientations of fibrils of cellulosic fibres |
| 06/16/2005 | US20050128482 Differential optical technique for chiral analysis |
| 06/16/2005 | US20050128481 System and method for measuring birefringence in an optical material |
| 06/16/2005 | DE10355745A1 Automatic polarisation plane measurement procedure for pharmaceutical and chemical analysis has motor driven analyser with non linear regression or single point matching algorithms |
| 06/14/2005 | US6906800 Polarimeter using quantum well stacks separated by gratings |
| 06/09/2005 | US20050122515 Differential evalution of adjacent regions for change in reflectivity |
| 06/09/2005 | US20050122514 Circular polarized light method and device for determining wall thickness and orientations of fibrils of cellulosic fibres |
| 06/02/2005 | WO2004085670A3 Polarization detection |
| 06/02/2005 | DE10347978A1 Polarization-measuring system for determining laser beam's polarization has rotating Brewster element introduced into laser beam's path of spread |
| 05/31/2005 | US6900892 Parametric profiling using optical spectroscopic systems |
| 05/26/2005 | WO2005017826A3 Advanced polarization imaging method, apparatus, and computer program product for retinal imaging, liquid crystal testing, active remote sensing, and other applications |
| 05/25/2005 | EP1532432A1 Antiglare supports and contrast amplifying supports for reflected polarized light |
| 05/25/2005 | DE10333119B3 Nichtinvasives Verfahren zur Charakterisierung und Identifizierung eingebetteter Mikrostrukturen A noninvasive method for the characterization and identification of embedded microstructures |
| 05/19/2005 | WO2005029015A9 Multispectral, multifusion, laser-polarimetric optical imaging system |
| 05/19/2005 | US20050105089 Detector configurations for optical metrology |
| 05/19/2005 | US20050105088 Method and device for polarimetric measurement of the mueller matrix coefficients of a sample in the far ultraviolet to visible spectral range |
| 05/19/2005 | US20050105087 Exposure apparatus and method of measuring mueller matrix of optical system of exposure apparatus |
| 05/18/2005 | EP1530730A1 Calibration method, device and computer program |
| 05/17/2005 | US6894780 Pilot tone multiplexing of polarization states in heterodyne optical component analysis |
| 05/10/2005 | US6891616 Polarization analyzer using a plurality of Faraday rotators |
| 05/05/2005 | US20050094143 Polarization measuring apparatus |
| 04/28/2005 | CA2542758A1 Reaction monitoring of chiral molecules using fourier transform infrared vibrational circular dichroism spectroscopy |
| 04/27/2005 | CN1610817A Polarization bearing detection type two-dimensional light reception timing detecting device and surface shape measuring device using it |
| 04/21/2005 | WO2005036215A2 Differential optical technique for chiral analysis |
| 04/21/2005 | US20050083525 Fiber polarimeter, the use thereof, as well as polarimetric method |
| 03/31/2005 | WO2005029050A1 Ellipsometer and ellipsometry |
| 03/31/2005 | WO2005029015A2 Multispectral, multifusion, laser-polarimetric optical imaging system |
| 03/31/2005 | US20050068531 Performing retardation measurements |
| 03/31/2005 | US20050068530 Performing retardation measurements |
| 03/31/2005 | US20050068529 Performing retardation measurements |
| 03/30/2005 | EP1519170A1 Imaging polarimeter sensor with achromatic beam-splitting polarizer |
| 03/24/2005 | WO2005026673A2 Active illumination imaging polarimetry |
| 03/24/2005 | US20050062966 Imaging polarimeter sensor with achromatic beam-splitting polarizer |
| 03/22/2005 | US6870621 Small spot ellipsometer |
| 03/16/2005 | CN1192745C Concentration measuring instrument |
| 03/15/2005 | US6868312 Method for real-time control of the fabrication of a thin-film structure by ellipsometric measurement |
| 03/15/2005 | US6867863 Integrated diagnostic for photoelastic modulator |
| 03/15/2005 | US6867853 Residual stress measuring system for optical fibers |
| 03/10/2005 | WO2005022078A1 Method and apparatus for precision measurement of phase shifts |
| 03/10/2005 | US20050051712 Optical module with built-in wavelength locker |
| 03/02/2005 | CN1588139A Soft x-ray transmission type multilayer film wide-band phase shift sheet and its preparing method |
| 03/01/2005 | US6862377 System and method for PMD measurement from coherent spectral analysis |
| 02/24/2005 | WO2005017826A2 Advanced polarization imaging method, apparatus, and computer program product for retinal imaging, liquid crystal testing, active remote sensing, and other applications |
| 02/24/2005 | US20050041249 Active multiple-color imaging polarimetry |
| 02/23/2005 | CN1584536A Device for specific research on polarization, optical image system and its calibration |
| 02/17/2005 | WO2005015141A1 Instantaneous polarization measurement system and method |
| 02/17/2005 | US20050036143 Reference calibration of metrology instrument |
| 02/16/2005 | EP1507137A1 Method and apparatus for polarisation dependent and spatially resolved inspection of a surface or layer |
| 02/15/2005 | US6856391 Method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope |
| 02/15/2005 | US6856385 Spatial averaging technique for ellipsometry and reflectometry |
| 02/10/2005 | US20050031245 Polarization controller using spatial filtering |
| 02/10/2005 | US20050030535 Microarray scanning |
| 02/03/2005 | US20050024642 Imaging method and apparatus |
| 02/01/2005 | US6850326 Determination of an optical parameter of an optical signal |
| 02/01/2005 | US6849460 Classifying preferential particles in sample; obtain substrate, synthesize microarray, expose to gas, monitor infrared emission from sample |
| 02/01/2005 | US6849397 Classifying organism; obtain sample, incubate with surface plasmon resonance substrate, analyze nucleotide sequences immobilized on the substrate, classify |
| 01/27/2005 | US20050018189 Photopolarimeters and spectrophotopolarimaters with multiple diffraction gratings |
| 01/27/2005 | US20050018171 Noninvasive method for characterizing and identifying embedded micropatterns |
| 01/26/2005 | CN1571918A Accuracy calibration of birefringence measurement systems |
| 01/25/2005 | US6847448 Polarization analyzing apparatus and method for polarization analysis |
| 01/19/2005 | EP1060369A4 Birefringence measurement system |
| 01/13/2005 | WO2005003862A1 Device for the polarization-specific examination of an optical system |
| 01/13/2005 | US20050009081 Optical systems and methods for rapid screening of libraries of different materials |
| 01/13/2005 | US20050007591 Instantaneous polarization measurement system and method |
| 01/13/2005 | US20050007590 Retardance measurement system and method |
| 01/12/2005 | EP1496398A1 Apparatus for polarisation related inspection, optical projection system and calibration method |
| 01/12/2005 | EP1495293A1 Imaging spectrometer |
| 01/12/2005 | CN1563915A Passive light splitting offset detector |
| 01/06/2005 | US20050004778 Method for producing library |
| 01/06/2005 | US20050002033 Multiple beam ellipsometer |
| 12/30/2004 | US20040265477 Method for analyzing thin-film layer structure using spectroscopic ellipsometer |
| 12/30/2004 | US20040262500 Method and apparatus for spatially resolved polarimetry |
| 12/28/2004 | US6836328 Detector configurations for optical metrology |
| 12/28/2004 | US6836327 In-line optical polarimeter based on integration of free-space optical elements |
| 12/28/2004 | US6836326 Rheo-optical indexer and method of screening and characterizing arrays of materials |
| 12/23/2004 | US20040257588 Parametric profiling using optical spectroscopic systems |
| 12/23/2004 | US20040257565 Polarization bearing detection type two-dimensional light reception timing detecting device and surface shape measuring device using it |
| 12/23/2004 | US20040257564 Integrated polarization beam splitter with quarter-wave plate for polarimeter and PMD compensation applications |
| 12/23/2004 | DE10321356A1 Verfahren zur reflexions-polarimetrischen Bestimmung der Konzentration optisch aktiver Bestandteile in Medien sowie eine Vorrichtung zur Durchführung dieses Verfahrens Method for reflexions-polarimetric determination of the concentration of optically active constituents in media and device for carrying out said method |
| 12/22/2004 | CN1556422A Flexible X-ray reflection type multipayer film broad band poarizer and its preparation method |
| 12/21/2004 | US6833921 Optical systems and methods for rapid screening of libraries of different materials |
| 12/14/2004 | US6831743 Broadband spectroscopic rotating compensator ellipsometer |
| 12/09/2004 | US20040246481 Differential numerical aperture methods |
| 12/09/2004 | DE10324478B3 Vorrichtung zum Ermitteln der Lichtleistung eines Lichtstrahles und Scanmikroskop A device for determining the light power of a light beam and scanning microscope |
| 12/02/2004 | WO2004104563A1 Spectrometer |
| 12/02/2004 | US20040239929 Apparatus for ascertaining the light power level of a light beam, and scanning microscope |
| 12/01/2004 | EP1482273A1 Polarization bearing detection type two-dimensional light reception timing detecting device and surface shape measuring device using it |
| 11/25/2004 | WO2004102138A1 Method and device for the reflective polarimetric determination of the concentration of optically active components in media |
| 11/25/2004 | US20040233437 Spectroscopic ellipsometer |
| 11/25/2004 | US20040233436 Self-calibrating beam profile ellipsometer |
| 11/25/2004 | US20040233434 Accuracy calibration of birefringence measurement systems |
| 11/24/2004 | CN1177214C Measuring device and method for half-wave voltage and optical uniformity of electro-optical crystal material |