| Patents for G01J 4 - Measuring polarisation of light (3,335) |
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| 03/30/2004 | US6714301 Spectral ellipsometer without chromatic aberrations |
| 03/30/2004 | US6714300 Optical inspection equipment for semiconductor wafers with precleaning |
| 03/25/2004 | WO2004025878A1 Coded polarization-dependent analyzing |
| 03/25/2004 | WO2004025242A1 Multi-signal determination of polarization dependent characteristic |
| 03/24/2004 | CN2607563Y Automatic digital display polarimeters |
| 03/23/2004 | US6710875 Imaging system using polarization effects to enhance image quality |
| 03/18/2004 | US20040051870 Method of noise cancellation in an unpolarized-laser instrument |
| 03/17/2004 | EP1397651A1 Birefringence measurement at deep-ultraviolet wavelengths |
| 03/17/2004 | EP1034413B1 Ellipsometer measuring instrument |
| 03/09/2004 | US6704106 Method and system for canceling system retardance error in an ophthalmological polarimeter |
| 03/04/2004 | US20040042009 Broadband spectroscopic rotating compensator ellipsometer |
| 03/02/2004 | US6700663 Method of monitoring a laser crystallization process |
| 02/26/2004 | WO2004017090A1 Calibration method, device and computer program |
| 02/26/2004 | US20040036889 Polarization effect averaging |
| 02/26/2004 | US20040036876 Retardance sweep polarimeter and method |
| 02/26/2004 | DE10329360A1 Doppelbrechungsmessgerät, Spannungsentfernungseinrichtung, Polarimeter und Belichtungsgerät Birefringence meter, tension remover, polarimeter and exposure apparatus |
| 02/24/2004 | US6697161 Optical characterization of retarding devices |
| 02/24/2004 | US6697160 Light wavelength measuring apparatus and method for measuring wavelength of subject light with high speed by using two-beam interferometer |
| 02/24/2004 | US6697157 Birefringence measurement |
| 02/19/2004 | WO2002066940A9 System and method for measurement of the state of polarization of an optical signal in a fibre |
| 02/19/2004 | US20040031909 Apparatus and method for detecting an amount of depolarization of a linearly polarized beam |
| 02/19/2004 | US20040031906 Very fast time resolved imaging in multiparameter measurement space |
| 02/18/2004 | EP1389730A1 Device and method for polarization-extinction-ratio-measurement |
| 02/17/2004 | US6693711 Ellipsometer using radial symmetry |
| 02/17/2004 | US6693710 Polarization imaging system |
| 02/12/2004 | US20040027571 High spatial resolution infrared ellipsometer |
| 02/12/2004 | DE10304822A1 Microlithography installation investigation device for determination of the effect of a microlithography UV light projecting installation on the polarization direction of UV radiation incident on it |
| 02/05/2004 | US20040023302 Method and apparatus for screening combinatorial libraries of semiconducting properties |
| 02/05/2004 | DE10236999B3 Polarized light examination device e.g. for light from astronomic objects, has rotating modulator combined with interference prevention prism and light deflection compensation prisms |
| 02/04/2004 | CN1473021A Concentration measuring instrument |
| 02/03/2004 | US6687002 Method and apparatus for ellipsometric metrology for a sample contained in a chamber or the like |
| 01/22/2004 | WO2004007017A2 Method of noise cancellation in an unpolarized-laser instrument |
| 01/22/2004 | US20040012783 Concentration measuring instrument |
| 01/22/2004 | DE10228311A1 Polarisationsempfindliches Photodetektorbauelement Polarization-sensitive photodetector device |
| 01/15/2004 | US20040008348 Birefringence measurement apparatus, strain remover, polarimeter and exposure apparatus |
| 01/14/2004 | CN1468367A Differential numerical aperture methods and device |
| 01/13/2004 | US6678632 Spectro-polarimetric remote surface-orientation measurement |
| 01/13/2004 | US6678046 Detector configurations for optical metrology |
| 01/06/2004 | US6674532 Interferometric polarization interrogating filter assembly and method |
| 01/02/2004 | EP1376100A1 Achromatic spectroscopic ellipsometer with high spatial resolution |
| 01/02/2004 | EP1376099A1 Infrared circular dichroism measuring apparatus and method |
| 01/02/2004 | EP1376091A2 Pilot tone multiplexing of polarization states in heterodyne optical component analysis |
| 12/31/2003 | WO2004001399A1 Antiglare supports and contrast amplifying supports for reflected polarized light |
| 12/31/2003 | CA2489581A1 Antiglare supports and contrast amplifying supports for reflected polarized light |
| 12/30/2003 | US6671045 Apparatus and method for measuring optical signal-to-noise ratio |
| 12/30/2003 | US6670298 Providing different, asymmetric first and second metal-binding ligands to first and second regions of substrate, delivering first metal ion to first region and second metal ion to second region, forming first and second metal-ligand compounds |
| 12/25/2003 | US20030234937 Infrared circular dichroism measuring apparatus and infrared circular dichroism measuring method |
| 12/25/2003 | US20030234348 Polarization state detecting system, light source, and exposure apparatus |
| 12/24/2003 | WO2003106979A1 Achromatic spectroscopic ellipsometer with high spatial resolution |
| 12/18/2003 | US20030231311 Pilot tone multiplexing of polarization states in heterodyne optical component analysis |
| 12/17/2003 | EP1252489B1 Optical spectrum analyzer |
| 12/11/2003 | US20030227623 Ellipsometry methods and apparatus using solid immersion tunneling |
| 12/11/2003 | US20030227622 Automated system for measurement of an optical property |
| 12/10/2003 | EP1369662A2 System and method for removing the relative phase uncertainty in device characterizations performed with a polarimeter |
| 12/10/2003 | EP1368678A4 Apparatus and method for measuring polarization dependent loss using repeated high speed polarization scrambling |
| 12/10/2003 | EP1368678A1 Apparatus and method for measuring polarization dependent loss using repeated high speed polarization scrambling |
| 12/04/2003 | US20030223073 System and method for removing the relative phase uncertainty in device characterizations performed with a polarimeter |
| 12/04/2003 | US20030223064 Method and system for canceling system retardance error in an ophthalmological polarimeter |
| 12/02/2003 | US6657709 Apparatus and method for measuring polarization-dependent loss using repeated high speed polarization scrambling |
| 12/02/2003 | US6657708 Apparatus for optically characterising thin layered material |
| 11/27/2003 | WO2003048723A3 Label-free detection of nucleic acids via surface plasmon resonance |
| 11/26/2003 | CN1459037A Apparatus and method for measuring polarization - dependent loss using repeated high speed polarization scrambling |
| 11/25/2003 | US6654121 Apparatus and method for detecting polarization |
| 11/20/2003 | WO2003076910A8 Method and device for polarimetric measurement of the mueller matrix coefficients of a sample in the far ultraviolet to visible spectral range |
| 11/20/2003 | US20030214713 Method and device to calculate and display the transformation of optical polarization states |
| 11/20/2003 | US20030214654 Spatial averaging technique for ellipsometry and reflectometry |
| 11/19/2003 | CN1128363C Method for transfusion of material to be tested for testing optical characteristics, and device and polarimeter thereof |
| 11/18/2003 | US6650415 Broadband spectroscopic rotating compensator ellipsometer |
| 11/18/2003 | US6649896 Method and a device for measuring the spatially averaged intensity of a light beam and a method and a device for regulating a light source |
| 11/13/2003 | WO2002066940A3 System and method for measurement of the state of polarization of an optical signal in a fibre |
| 11/12/2003 | CN1455236A High-precision calibration for polarizing device |
| 11/05/2003 | EP1359451A1 Method for measuring the microrelief of an object and optical characteristics of near-surface layer, modulation interference microscope for carrying out said method |
| 10/30/2003 | WO2003089890A1 Imaging spectrometer |
| 10/21/2003 | US6636309 Application of spectroscopic ellipsometry to in situ real time fabrication of multiple alternating high/low refractive index narrow bandpass optical filters |
| 10/16/2003 | WO2003014866A3 Method and system for dynamic learning through a regression-based library generation process |
| 10/16/2003 | US20030193667 Highly accurate calibration of polarimeters |
| 10/15/2003 | EP1353158A1 Method and apparatus for high precision calibration of polarimeters |
| 10/15/2003 | EP1353157A1 Method and apparatus for precision calibration of polarimeters |
| 10/02/2003 | US20030184751 Polarization analyzer using a plurality of faraday rotators |
| 10/02/2003 | US20030184750 Ellipsometer or reflectometer with elliptical aperture |
| 10/02/2003 | US20030184749 Birefringence measurement apparatus and method |
| 09/25/2003 | US20030179375 System for measuring of both circular and linear birefringence |
| 09/18/2003 | WO2003076910A1 Method and device for polarimetric measurement of the mueller matrix coefficients of a sample in the far ultraviolet to visible spectral range |
| 09/18/2003 | US20030174328 Calibration system and method for calibration of various types of polarimeters |
| 09/17/2003 | EP1345024A1 Method and device for polarimetric measurement of the Mueller matrix coefficients of a sample in the far ultraviolet to visible spectral range |
| 09/12/2003 | WO2003074967A1 Polarization bearing detection type two-dimensional light reception timing detecting device and surface shape measuring device using it |
| 09/09/2003 | US6618129 Technique for combined spectral, power, and polarization monitoring |
| 09/03/2003 | EP1340064A1 Apparatus and method for detecting an amount of depolarization of a linearly polarized beam |
| 09/03/2003 | CN1439864A Laser multiple degree-of-freedom measuring system and method |
| 08/28/2003 | US20030160951 Measurement of optical properties of passive optical devices using the matrix method |
| 08/27/2003 | CA2420293A1 Measurement of optical properties of passive optical devices using the matrix method |
| 08/26/2003 | US6611330 System for measuring polarimetric spectrum and other properties of a sample |
| 08/21/2003 | WO2003069291A1 Photopolarimeters and spectrophotopolarimaters with multiple diffraction gratings |
| 08/21/2003 | US20030156286 Stokes parameter measurement device and method |
| 08/13/2003 | EP1334339A1 Method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope |
| 08/12/2003 | US6606158 Determination of a property of an optical device |
| 08/06/2003 | EP1332720A1 Concentration measuring instrument |
| 08/06/2003 | CN1434289A Method for detecting surface defect and device thereof |
| 07/29/2003 | US6600148 Polarization mode dispersion measuring method and polarization mode dispersion measuring system |
| 07/24/2003 | WO2003060445A1 Method and device to calculate and display the transformation of optical polarization states |