Patents for G01J 4 - Measuring polarisation of light (3,335)
09/2009
09/23/2009CN101542233A Image processing device and image processing method
09/23/2009CN101539458A Full automatic atmospheric polarization mode image acquisition system and system control method
09/22/2009US7593102 Polarization evaluation mask, polarization evaluation method, and polarization determination device
09/17/2009WO2009112174A1 Integrated polarization sensor
09/17/2009US20090231700 System and method for controlling intensity of a beam of electromagnetic radiation in ellipsometers and polarimeters
09/17/2009US20090231583 Local non-perturbative remote sensing devices and method for conducting diagnostic measurements of magnetic and electric fields of optically active mediums
09/17/2009US20090231582 Method and system for determining position and orientation of an object
09/16/2009CN101532881A Single factor atmospheric polarization modeling method based on Rayleigh scattering
09/16/2009CN101532851A Near infrared sensor system with nano-imprinted wire-grid polarizers and method using the same
09/16/2009CN100541332C Lithographic apparatus and methods for use thereof
09/16/2009CN100541149C Accuracy calibration of birefringence measurement systems
09/15/2009US7589311 Optoelectronic sensor and method for detecting objects with polarized light
09/10/2009US20090225317 Spectroscopic ellipsometer
09/10/2009DE102009011636A1 Spektroskopisches Ellipsometer Spectroscopic ellipsometer
09/08/2009US7586607 Polarization imaging
09/08/2009US7586606 Near-field polarized-light measurement apparatus
09/08/2009US7586605 Method for testing a polarization state, method for manufacturing a semiconductor device, and test substrate for testing a polarization state
09/03/2009WO2009106728A1 Method and device for one-shot measurement of the transient birefringence induced by a perturbation lying within the terahertz frequency range
09/01/2009US7583367 Catheter surgery simulation
08/2009
08/27/2009US20090213377 Reflective optical system
08/27/2009US20090213376 Optical equipment
08/27/2009US20090213375 Optical method for the characterization of laterally-patterned samples in integrated circuits
08/27/2009US20090213374 Optical Characteristic Measuring Apparatus and Optical Characteristics Measuring Method
08/26/2009EP2092282A1 Polarimetric imaging system having a matrix of programmable waveplates based on a material with an isotropic electrooptic tensor
08/25/2009US7580122 Image inspection method by polarized compensation for deformation of lens
08/20/2009US20090207409 Measuring Optical Spectral Property of Light Based on Polarization Analysis
08/20/2009US20090207408 System and method of aligning a sample
08/13/2009US20090201503 Torsion Sensor
08/13/2009US20090201458 Apparatus for testing liquid crystal display panel
08/06/2009US20090195779 System for scatterometric measurements and applications
07/2009
07/30/2009US20090189074 Detection of heavy oil using fluorescence polarization
07/29/2009CN100520357C Antiglare supports and contrast amplifying supports for reflected polarized light
07/28/2009US7567345 Ellipsometer meeting scheimpflug condition with provision of an essentially circular electromagnetic radiation spot on a sample
07/22/2009CN101487739A Full-polarization image measuring system
07/21/2009US7564553 Polarization evaluation mask, polarization evaluation method, and polarization determination device
07/21/2009US7564552 Systems and methods for measurement of a specimen with vacuum ultraviolet light
07/16/2009US20090180093 Evaluation method, control method, exposure apparatus, and memory medium
07/09/2009US20090174883 Optical metrology systems and methods
07/08/2009EP1883849A4 Molecular imaging and nanophotonics imaging and detection principles and systems, and contrast agents, media makers and biomarkers, and mechanisms for such contrast agents
07/08/2009CN101479577A Method for monitoring and measuring optical properties of device in polarization maintaining fibers by using reference fiber Bragg grating and fiber components manufactured thereby
07/07/2009US7557919 Apparatus for detecting position of substrate, ellipsometer, and film thickness measuring apparatus
07/07/2009US7557918 Spectral polarimetric image detection and analysis methods and apparatus
07/02/2009US20090168613 Optical devices based on internal conical diffraction
07/02/2009US20090168062 Inspection Method and Apparatus, Lithographic Apparatus, Lithographic Processing Cell, and Device Manufacturing Method to Measure a Property of a Substrate
07/01/2009EP2073689A2 Apparatus for caries detection
06/2009
06/30/2009US7554662 Spatial filter means comprising an aperture with a non-unity aspect ratio in a system for investigating samples with electromagnetic radiation
06/25/2009US20090161105 Method for Ascertaining and Monitoring Fill Level of a Medium In a Container Using the Travel-Time Method
06/24/2009EP2072947A1 Image processing device and image processing method
06/23/2009US7551285 Methods and apparatus for spectroscopic imaging of materials in an array
06/23/2009US7551281 Position sensor
06/23/2009US7551280 Method for manufacturing optical element, method for manufacturing projector, optical element and projector
06/18/2009US20090153859 Polishing end point detection method, polishing end point detection apparatus and polishing apparatus
06/18/2009US20090153858 Method and apparatus for colour imaging a three-dimensional structure
06/18/2009US20090153849 Plate inspection system and plate inspection method
06/16/2009US7548315 System and method to compensate for critical dimension non-uniformity in a lithography system
06/11/2009US20090147257 Low-Loss Polarized Light Diversion
06/09/2009US7545504 Imaging systems using unpolarized light and related methods and controllers
06/04/2009WO2009069127A1 Polarimeter employing a fizeau interferometer
06/04/2009WO2007061981A3 Surface plasmon resonance spectrometer with an actuator-driven angle scanning mechanism
06/04/2009US20090141274 Polarization Dependent Loss Analyzer
06/04/2009US20090141264 Method and Apparatus for Observing and Inspecting Defects
06/04/2009US20090141027 Image processing device and image processing method
06/03/2009CN101449135A Polarization based interferometric detector
06/03/2009CN101449134A Measurement of linear and circular diattenuation in optical elements
06/02/2009US7542136 Flipping stage arrangement for reduced wafer contamination cross section and improved measurement accuracy and throughput
05/2009
05/28/2009US20090135422 Visualizing Birefringent Structures in Samples
05/28/2009US20090135409 Optical waveguide rotator mechanism, birefringence-inducing element and polarization control devices employing either or both and methods of using same
05/27/2009EP2061372A1 Apparatus for caries detection
05/27/2009CN101441169A Plane four-channel atmosphere polarization information detection sensor
05/26/2009US7538876 Efficient and accurate alignment of stereoscopic displays
05/26/2009US7538875 Lithographic apparatus and methods for use thereof
05/21/2009US20090128815 Remote control pointing technology with roll detection
05/21/2009US20090128814 Modulated polarizer-based polarimeter, and method for determining the polarization state of an optical signal
05/20/2009DE102007053632A1 Beam analysis method comprises reflecting a defined percentage of the beam coaxially or under a small angle at an optical surface present perpendicular to main beams and separating the partial beam from the main beams by a beam splitter
05/19/2009US7535566 Beam chromatic shifting and directing means
05/19/2009US7534984 Very fast time resolved imaging in multiparameter measurement space having means for separating reflected light to form plural beam images
05/19/2009CA2394329C Optical spectrum analyzer
05/13/2009EP2013594A4 Measurement of linear and circular diattenuation in optical elements
05/13/2009CN100487405C Method and device for measuring polarization mode dispersion
05/13/2009CN100487396C Measurements of polarization-dependent loss (pdl) and degree of polarization (dop) using optical polarization controllers and method thereof
05/07/2009WO2009059313A1 Apparatus and methods for concentration determination using polarized light
05/07/2009WO2009039274A3 Method for mapping of dispersion and other optical properties of optical waveguides
05/07/2009US20090116012 Apparatus and methods for concentration determination using polorized light
05/07/2009CA2703982A1 Apparatus and methods for concentration determination using polorized light
05/05/2009US7528952 Hand-held fluorescence polarimeter
04/2009
04/30/2009US20090109438 Spectroscopic ellipsometer and ellipsometry
04/30/2009US20090109437 Method and device for measuring polarization state and polarization mode dispersion in photonic transmission systems
04/30/2009US20090108185 Optoelectronic sensor and method for detecting objects with polarized light
04/28/2009US7526147 Sensor array for perimeter defense
04/28/2009US7525657 System and method for active optical target detection with polarized receiver
04/28/2009US7525656 Exposure apparatus and device fabrication method
04/23/2009WO2006116701A3 Imaging systems and methods to improve backscattering imaging using circular polarization memory
04/21/2009US7522825 Method and device for skin cancer screening
04/21/2009US7522279 System for and method of investigating the exact same point on a sample substrate with multiple wavelengths
04/21/2009US7522278 Real-time linear-birefringence-detecting polarization microscope
04/16/2009WO2009048003A1 Surface examining device
04/16/2009WO2008147575A3 Systems, methods, and devices for handling terahertz radiation
04/15/2009CN101410706A Focused droplet nebulizer for evaporative light scattering detector
04/14/2009US7518725 Temperature controlled lens
04/14/2009US7518724 Image acquisition, processing, and display
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