Patents for G01J 4 - Measuring polarisation of light (3,335)
11/2002
11/12/2002CA2289340C Polarimeter
10/2002
10/31/2002US20020159069 Optical characterization of retarding devices
10/31/2002US20020159063 Spectroscopic ellipsometer with adjustable detection area
10/31/2002US20020158871 Method and device to calculate and display the phase transformation of optical polarization
10/31/2002US20020158203 Method and system for dynamically polarizing electro-optic signals
10/31/2002US20020158189 Polarization mode dispersion measuring method and polarization mode dispersion measuring system
10/30/2002EP1253418A2 Spectroscopic ellipsometer
10/30/2002EP1252489A2 Optical spectrum analyzer
10/29/2002US6473181 Measurement of waveplate retardation using a photoelastic modulator
10/29/2002US6473179 Birefringence measurement system
10/23/2002EP1250575A1 Calibration process for birefringence measurement system
10/15/2002US6466320 Method of urinalysis, urinalysis apparatus, method of measuring angle of rotation and polarimeter
10/09/2002EP1247079A1 Ellipsometer and ellipsometry method
10/09/2002EP0914600B1 Broadband spectroscopic rotating compensator ellipsometer
10/08/2002US6462826 Measurement of brightness, flow velocity and temperature of radiant media
10/08/2002US6462539 Magnetic sensor with faraday element
10/08/2002US6461070 Document folder and method
10/03/2002WO2002077680A1 Apparatus and method for measuring polarization-dependent loss using repeated high speed polarization scrambling
10/03/2002US20020140943 System and method for measurement of the state of polarization over wavelength
09/2002
09/27/2002CA2342478A1 Three statuses measurement optical power extension ratio meter
09/24/2002US6456376 Rotating compensator ellipsometer system with spatial filter
09/18/2002EP1240484A1 A method and a device for measuring the spatially averaged intensity of a light beam and a method and a device for regulating a light source
09/18/2002CN1091254C Photoelectric sensing appts.
09/12/2002US20020126284 Spectral ellipsometer without chromatic aberrations
09/12/2002US20020126283 Method for real-time control of the fabrication of a thin-film structure by ellipsometric measurement
09/10/2002US6449043 Broadband spectroscopic rotating compensator ellipsometer
09/04/2002EP0980519B1 Ellipsometer with two lasers
09/03/2002US6445856 Optical beam monitoring device
09/03/2002US6444999 Quantum circuit
08/2002
08/29/2002WO2002066940A2 System and method for measurement of the state of polarization of an optical signal in a fibre
08/29/2002WO2001081949A3 Very fast time resolved imaging in multiparameter measurement space
08/29/2002US20020118368 Light wavelength measuring apparatus and method for measuring wavelength of subject light with high speed by using two-beam interferometer
08/27/2002US6441902 Method for evaluating sample system anisotropic refractive indices and orientations thereof in multiple dimensions
08/27/2002US6441901 Optical systems and methods for rapid screening of libraries of different materials
08/22/2002US20020113972 Determination of a property of an optical device
08/22/2002US20020113966 Parametric profiling using optical spectroscopic systems
08/20/2002US6437856 Imaging of superficial biological tissue layers using polarized light
08/14/2002EP1019947B1 Mass spectrometers and methods for rapid screening of libraries of different materials
08/14/2002EP0995087A4 Measurement of brightness, flow velocity and temperature of radiant media
08/08/2002US20020105647 Small spot ellipsometer
08/07/2002EP1038165B1 Regression calibrated spectroscopic rotating compensator ellipsometer system with photo array detector
07/2002
07/25/2002US20020098471 Generation of microarray; generate metal binding ligand, incubate with metal, recover microarray
07/24/2002EP1225431A1 Method and apparatus for polarisation mesaurements, in particular for monitoring polarisation mode dispersion in optical wavelength division multiplexed systems
07/18/2002WO2002056083A1 Method for measuring the microrelief of an object and optical characteristics of near-surface layer, modulation interference microscope for carrying out said method
07/18/2002WO2001007881A9 Parallel detecting, spectroscopic ellipsometers/polarimeters
07/11/2002WO2002054028A2 Device to calculate and display the phase transformation of optical polarization
07/09/2002CA2267908C Mass spectrometers and methods for rapid screening of libraries of different materials
07/03/2002EP1219938A2 Light wavelength measuring apparatus and method using a two-beam interferometer
07/03/2002EP1218707A1 Parallel detecting, spectroscopic ellipsometers/polarimeters
06/2002
06/27/2002WO2002050501A1 Parametric profiling using optical spectroscopic systems
06/25/2002US6411385 Thin film optical measurement system and method with calibrating ellipsometer
06/25/2002US6410917 Polarization-sensitive corrugated quantum well infrared photodetector array
06/25/2002CA2255762C Electro-optical and magneto-optical sensing apparatus and method for characterizing free-space electromagnetic radiation
06/19/2002EP1214562A1 Spatial averaging technique for ellipsometry and reflectometry
06/18/2002USRE37752 Polarization viewer
06/13/2002WO2002046723A1 Apparatus and method for detecting an amount of depolarization of a linearly polarized beam
06/13/2002WO2000065331A9 System for analyzing surface characteristics with self-calibrating capability
06/12/2002EP1213578A1 Apparatus and method for detecting an amount of depolarization of a linearly polarized beam
06/11/2002US6404904 System for the touchless recognition of hand and finger lines
06/11/2002US6401519 Systems and methods for characterization of materials and combinatorial libraries with mechanical oscillators
05/2002
05/29/2002CN1085835C Light reflecting difference method and appts. for prospecting and monitoring film eptitaxial growth and heat annealing
05/23/2002WO2002040953A1 Method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope
05/23/2002US20020060785 Technique for combined spectral, power, and polarization monitoring
05/22/2002EP1012641A4 Sensor apparatus with polarization maintaining fibers
05/21/2002US6392777 Opto-mechanical device
05/16/2002WO2002038048A1 Concentration measuring instrument
05/15/2002CN1349086A Method and device used for polarized measurement
05/14/2002US6389408 Neural network systems for chemical and biological pattern recognition via the Mueller matrix
05/09/2002US20020054290 Optical measurment system using polarized light
05/07/2002US6384916 Parallel detecting, spectroscopic ellipsometers/polarimeters
05/02/2002EP1202033A2 Spectral ellipsometer
04/2002
04/18/2002WO2001050100A3 Optical spectrum analyzer
04/18/2002US20020045284 Spatial averaging technique for ellipsometry and reflectometry
04/18/2002US20020044282 Method and apparatus for polarization measurements
04/17/2002EP1197741A2 Broadband spectroscopic rotating compensator ellipsometer
04/16/2002US6373871 Ellipsometer with two lasers
04/16/2002US6373614 High performance polarization controller and polarization sensor
04/16/2002US6373570 Optical systems and methods for rapid screening of libraries of different materials
04/11/2002WO2002029374A1 Differential numerical aperture methods and device
04/10/2002EP1195592A1 Polarization mode dispersion measuring method and polarization mode dispersion measuring system
04/04/2002US20020039184 Differential numerical aperture methods and device
03/2002
03/28/2002WO2002025235A1 Optical method and apparatus
03/28/2002WO2002006779A3 Compact spectroscopic ellipsometer
03/27/2002EP1191316A1 Determination of at least one optical parameter of an optical signal
03/14/2002US20020030186 Quantum circuit
03/13/2002CN1340152A Apparatus and method for detecting polarization
03/07/2002WO2002019016A1 High performance polarization controller and polarization sensor
03/05/2002US6353477 Regression calibrated spectroscopic rotating compensator ellipsometer system with pseudo-achromatic retarder system
02/2002
02/28/2002US20020024673 Measuring device and measuring method
02/28/2002US20020024669 Spectral ellipsometer having a refractive illuminating optical system
02/28/2002US20020024668 Method and apparatus for ellipsometric metrology for a sample contained in a chamber or the like
02/26/2002US6350056 Method for fiber optic temperature measurement and fiber optic temperature sensor
02/25/2002CA2351966A1 Method and apparatus for polarization measurements
02/19/2002US6348966 Measuring method of liquid crystal pretilt angle and measuring equipment of liquid crystal pretilt angle
02/14/2002US20020018205 Broadband spectroscopic rotating compensator ellipsometer
02/13/2002EP1179729A1 Process for real time control of the making of thin film structure through ellipsometric measurement
01/2002
01/31/2002US20020012123 Spatial averaging technique for ellipsometry and reflectometry
01/24/2002WO2002006780A1 High spatial resolution infrared ellipsometer
01/24/2002WO2002006779A2 Compact spectroscopic ellipsometer
01/24/2002US20020008874 System for measuring polarimetric spectrum and other properties of a sample
1 ... 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34