Patents for G01J 4 - Measuring polarisation of light (3,335) |
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11/12/2002 | CA2289340C Polarimeter |
10/31/2002 | US20020159069 Optical characterization of retarding devices |
10/31/2002 | US20020159063 Spectroscopic ellipsometer with adjustable detection area |
10/31/2002 | US20020158871 Method and device to calculate and display the phase transformation of optical polarization |
10/31/2002 | US20020158203 Method and system for dynamically polarizing electro-optic signals |
10/31/2002 | US20020158189 Polarization mode dispersion measuring method and polarization mode dispersion measuring system |
10/30/2002 | EP1253418A2 Spectroscopic ellipsometer |
10/30/2002 | EP1252489A2 Optical spectrum analyzer |
10/29/2002 | US6473181 Measurement of waveplate retardation using a photoelastic modulator |
10/29/2002 | US6473179 Birefringence measurement system |
10/23/2002 | EP1250575A1 Calibration process for birefringence measurement system |
10/15/2002 | US6466320 Method of urinalysis, urinalysis apparatus, method of measuring angle of rotation and polarimeter |
10/09/2002 | EP1247079A1 Ellipsometer and ellipsometry method |
10/09/2002 | EP0914600B1 Broadband spectroscopic rotating compensator ellipsometer |
10/08/2002 | US6462826 Measurement of brightness, flow velocity and temperature of radiant media |
10/08/2002 | US6462539 Magnetic sensor with faraday element |
10/08/2002 | US6461070 Document folder and method |
10/03/2002 | WO2002077680A1 Apparatus and method for measuring polarization-dependent loss using repeated high speed polarization scrambling |
10/03/2002 | US20020140943 System and method for measurement of the state of polarization over wavelength |
09/27/2002 | CA2342478A1 Three statuses measurement optical power extension ratio meter |
09/24/2002 | US6456376 Rotating compensator ellipsometer system with spatial filter |
09/18/2002 | EP1240484A1 A method and a device for measuring the spatially averaged intensity of a light beam and a method and a device for regulating a light source |
09/18/2002 | CN1091254C Photoelectric sensing appts. |
09/12/2002 | US20020126284 Spectral ellipsometer without chromatic aberrations |
09/12/2002 | US20020126283 Method for real-time control of the fabrication of a thin-film structure by ellipsometric measurement |
09/10/2002 | US6449043 Broadband spectroscopic rotating compensator ellipsometer |
09/04/2002 | EP0980519B1 Ellipsometer with two lasers |
09/03/2002 | US6445856 Optical beam monitoring device |
09/03/2002 | US6444999 Quantum circuit |
08/29/2002 | WO2002066940A2 System and method for measurement of the state of polarization of an optical signal in a fibre |
08/29/2002 | WO2001081949A3 Very fast time resolved imaging in multiparameter measurement space |
08/29/2002 | US20020118368 Light wavelength measuring apparatus and method for measuring wavelength of subject light with high speed by using two-beam interferometer |
08/27/2002 | US6441902 Method for evaluating sample system anisotropic refractive indices and orientations thereof in multiple dimensions |
08/27/2002 | US6441901 Optical systems and methods for rapid screening of libraries of different materials |
08/22/2002 | US20020113972 Determination of a property of an optical device |
08/22/2002 | US20020113966 Parametric profiling using optical spectroscopic systems |
08/20/2002 | US6437856 Imaging of superficial biological tissue layers using polarized light |
08/14/2002 | EP1019947B1 Mass spectrometers and methods for rapid screening of libraries of different materials |
08/14/2002 | EP0995087A4 Measurement of brightness, flow velocity and temperature of radiant media |
08/08/2002 | US20020105647 Small spot ellipsometer |
08/07/2002 | EP1038165B1 Regression calibrated spectroscopic rotating compensator ellipsometer system with photo array detector |
07/25/2002 | US20020098471 Generation of microarray; generate metal binding ligand, incubate with metal, recover microarray |
07/24/2002 | EP1225431A1 Method and apparatus for polarisation mesaurements, in particular for monitoring polarisation mode dispersion in optical wavelength division multiplexed systems |
07/18/2002 | WO2002056083A1 Method for measuring the microrelief of an object and optical characteristics of near-surface layer, modulation interference microscope for carrying out said method |
07/18/2002 | WO2001007881A9 Parallel detecting, spectroscopic ellipsometers/polarimeters |
07/11/2002 | WO2002054028A2 Device to calculate and display the phase transformation of optical polarization |
07/09/2002 | CA2267908C Mass spectrometers and methods for rapid screening of libraries of different materials |
07/03/2002 | EP1219938A2 Light wavelength measuring apparatus and method using a two-beam interferometer |
07/03/2002 | EP1218707A1 Parallel detecting, spectroscopic ellipsometers/polarimeters |
06/27/2002 | WO2002050501A1 Parametric profiling using optical spectroscopic systems |
06/25/2002 | US6411385 Thin film optical measurement system and method with calibrating ellipsometer |
06/25/2002 | US6410917 Polarization-sensitive corrugated quantum well infrared photodetector array |
06/25/2002 | CA2255762C Electro-optical and magneto-optical sensing apparatus and method for characterizing free-space electromagnetic radiation |
06/19/2002 | EP1214562A1 Spatial averaging technique for ellipsometry and reflectometry |
06/18/2002 | USRE37752 Polarization viewer |
06/13/2002 | WO2002046723A1 Apparatus and method for detecting an amount of depolarization of a linearly polarized beam |
06/13/2002 | WO2000065331A9 System for analyzing surface characteristics with self-calibrating capability |
06/12/2002 | EP1213578A1 Apparatus and method for detecting an amount of depolarization of a linearly polarized beam |
06/11/2002 | US6404904 System for the touchless recognition of hand and finger lines |
06/11/2002 | US6401519 Systems and methods for characterization of materials and combinatorial libraries with mechanical oscillators |
05/29/2002 | CN1085835C Light reflecting difference method and appts. for prospecting and monitoring film eptitaxial growth and heat annealing |
05/23/2002 | WO2002040953A1 Method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope |
05/23/2002 | US20020060785 Technique for combined spectral, power, and polarization monitoring |
05/22/2002 | EP1012641A4 Sensor apparatus with polarization maintaining fibers |
05/21/2002 | US6392777 Opto-mechanical device |
05/16/2002 | WO2002038048A1 Concentration measuring instrument |
05/15/2002 | CN1349086A Method and device used for polarized measurement |
05/14/2002 | US6389408 Neural network systems for chemical and biological pattern recognition via the Mueller matrix |
05/09/2002 | US20020054290 Optical measurment system using polarized light |
05/07/2002 | US6384916 Parallel detecting, spectroscopic ellipsometers/polarimeters |
05/02/2002 | EP1202033A2 Spectral ellipsometer |
04/18/2002 | WO2001050100A3 Optical spectrum analyzer |
04/18/2002 | US20020045284 Spatial averaging technique for ellipsometry and reflectometry |
04/18/2002 | US20020044282 Method and apparatus for polarization measurements |
04/17/2002 | EP1197741A2 Broadband spectroscopic rotating compensator ellipsometer |
04/16/2002 | US6373871 Ellipsometer with two lasers |
04/16/2002 | US6373614 High performance polarization controller and polarization sensor |
04/16/2002 | US6373570 Optical systems and methods for rapid screening of libraries of different materials |
04/11/2002 | WO2002029374A1 Differential numerical aperture methods and device |
04/10/2002 | EP1195592A1 Polarization mode dispersion measuring method and polarization mode dispersion measuring system |
04/04/2002 | US20020039184 Differential numerical aperture methods and device |
03/28/2002 | WO2002025235A1 Optical method and apparatus |
03/28/2002 | WO2002006779A3 Compact spectroscopic ellipsometer |
03/27/2002 | EP1191316A1 Determination of at least one optical parameter of an optical signal |
03/14/2002 | US20020030186 Quantum circuit |
03/13/2002 | CN1340152A Apparatus and method for detecting polarization |
03/07/2002 | WO2002019016A1 High performance polarization controller and polarization sensor |
03/05/2002 | US6353477 Regression calibrated spectroscopic rotating compensator ellipsometer system with pseudo-achromatic retarder system |
02/28/2002 | US20020024673 Measuring device and measuring method |
02/28/2002 | US20020024669 Spectral ellipsometer having a refractive illuminating optical system |
02/28/2002 | US20020024668 Method and apparatus for ellipsometric metrology for a sample contained in a chamber or the like |
02/26/2002 | US6350056 Method for fiber optic temperature measurement and fiber optic temperature sensor |
02/25/2002 | CA2351966A1 Method and apparatus for polarization measurements |
02/19/2002 | US6348966 Measuring method of liquid crystal pretilt angle and measuring equipment of liquid crystal pretilt angle |
02/14/2002 | US20020018205 Broadband spectroscopic rotating compensator ellipsometer |
02/13/2002 | EP1179729A1 Process for real time control of the making of thin film structure through ellipsometric measurement |
01/31/2002 | US20020012123 Spatial averaging technique for ellipsometry and reflectometry |
01/24/2002 | WO2002006780A1 High spatial resolution infrared ellipsometer |
01/24/2002 | WO2002006779A2 Compact spectroscopic ellipsometer |
01/24/2002 | US20020008874 System for measuring polarimetric spectrum and other properties of a sample |