| Patents for G01J 4 - Measuring polarisation of light (3,335) |
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| 06/07/2011 | US7956998 Method and system for the polarmetric analysis of scattering media utilising polarization difference sensing (PDS) |
| 06/01/2011 | CN102080988A Device and method for detecting single photon polarization quantum state in real time |
| 05/31/2011 | US7952712 Method for detecting equatorial plane |
| 05/31/2011 | US7952711 Waveplate analyzer based on multiple tunable optical polarization rotators |
| 05/26/2011 | US20110122410 Optical Reflectometry Setup |
| 05/26/2011 | US20110120950 Processing and Analysis Techniques Involving In-Vessel Material Generation |
| 05/24/2011 | US7948623 Method for evaluating color filter, color filter and liquid crystal display device |
| 05/24/2011 | US7948622 System, method and apparatus for image processing and image format |
| 05/24/2011 | US7948514 Image processing apparatus, method and computer program for generating normal information, and viewpoint-converted image generating apparatus |
| 05/19/2011 | WO2011058987A1 Polarimeter |
| 05/11/2011 | CN101539458B Full automatic atmospheric polarization mode image acquisition system and system control method |
| 05/10/2011 | US7940389 Method and apparatus for detecting pressure distribution in fluids |
| 05/05/2011 | US20110102793 Inspection Apparatus for Lithography |
| 05/03/2011 | US7936944 Image processing device and image processing method |
| 05/03/2011 | US7936458 Polariscope toy and ornament with accompanying photoelastic and/or photoplastic devices |
| 04/28/2011 | US20110096328 Multi-Signal Determination of Polarization Dependent Characteristic |
| 04/28/2011 | US20110096292 Adaptive optics apparatus that corrects aberration of examination object and image taking apparatus including adaptive optics apparatus |
| 04/27/2011 | EP1685386B1 Reaction monitoring of chiral molecules using fourier transform infrared vibrational circular dichroism spectroscopy |
| 04/27/2011 | EP1666869B1 Polarization Analysis Device and corresponding method |
| 04/27/2011 | CN101561317B System for measuring the influence of object to polarization state of transmitted beams with high precision and automation |
| 04/21/2011 | US20110090502 Apparatus and method for detecting array substrate |
| 04/21/2011 | US20110090501 Assembly For Monitoring Power of Randomly Polarized Light |
| 04/19/2011 | US7929139 Spectroscopic ellipsometer, film thickness measuring apparatus, and method of focusing in spectroscopic ellipsometer |
| 04/14/2011 | WO2011043930A1 Scatterometry measurement of asymmetric structures |
| 04/14/2011 | US20110085167 Surface plasmon resonance spectrometer with an actuator driven angle scanning mechanism |
| 04/14/2011 | US20110085163 Method and apparatus of measuring relative phase of bio-cells |
| 04/12/2011 | US7922337 Method for establishing a light beam with substantially constant luminous intensity |
| 04/07/2011 | US20110080586 Optical device having polarizer and retarders for spectroscopic polarimetry |
| 04/07/2011 | US20110080585 Scatterometry Measurement of Asymmetric Structures |
| 04/06/2011 | EP2306166A2 Measurement of fourier coefficients using integrating photometric detector |
| 04/06/2011 | EP2304401A1 High throughput birefringence measurement |
| 04/05/2011 | US7920264 Horizontal attenuated total reflection system |
| 04/05/2011 | US7920263 Apparatus and system for electro magnetic field measurements and automatic analyses of phase modulated optical signals from electrooptic devices |
| 04/05/2011 | US7920253 Polarization optical time domain reflectometer and method of determining PMD |
| 03/31/2011 | WO2011036662A1 Apparatus and method for navigation |
| 03/31/2011 | US20110075151 Interferometric defect detection and classification |
| 03/31/2011 | CA2774119A1 Apparatus and method for navigation |
| 03/30/2011 | CN101995294A Integrated polarized light detector |
| 03/24/2011 | US20110071784 Goos-Hanchen compensation in autofocus systems |
| 03/24/2011 | US20110069312 Metrology systems and methods |
| 03/22/2011 | US7911611 Optical system of atomic oscillator and atomic oscillator |
| 03/17/2011 | US20110063616 Optical measurements of properties in substances using propagation modes of light |
| 03/17/2011 | US20110063603 Apparatus and method for inspecting defects |
| 03/17/2011 | DE102007045891B4 Vorrichtung zur Messung des Polarisationszustands von Licht Device for measuring the polarization state of light |
| 03/15/2011 | US7907280 Method of constructing a deviation angle self compensating substantially achromatic retarder to compensate beam traslation |
| 03/10/2011 | US20110058169 Line scanning measurement system |
| 03/09/2011 | CN101147049B Imaging method and apparatus |
| 03/08/2011 | US7903238 Combination of ellipsometry and optical stress generation and detection |
| 03/03/2011 | WO2011023765A1 Metrology module for laser system |
| 03/01/2011 | US7898661 Spectroscopic scatterometer system |
| 02/24/2011 | US20110043494 Portable electronic device and method for testing polarizing ability of glass using the same |
| 02/22/2011 | US7894049 Method and device for measuring polarization state and polarization mode dispersion in photonic transmission systems |
| 02/17/2011 | WO2010144866A3 Microgrid imaging polarimeters with frequency domain reconstruction |
| 02/17/2011 | US20110038526 Method and Device for Testing Cigarette Packages Wound with Film |
| 02/17/2011 | US20110037981 Wave-guide coupling spr sensor chip and sensor chip array thereof |
| 02/16/2011 | EP2283401A1 Fast sample height, aoi and poi alignment in mapping ellipsometer or the like |
| 02/15/2011 | US7889352 Integrated polarization beam splitter with quarter-wave plate for polarimeter and PMD compensation applications |
| 02/15/2011 | US7889347 Surface plasmon resonance spectrometer with an actuator driven angle scanning mechanism |
| 02/15/2011 | US7889343 Method and system for optical detection of nano-objects in a light refracting medium |
| 02/15/2011 | US7889340 Normal incidence ellipsometer with complementary waveplate rotating compensators |
| 02/15/2011 | US7889339 Complementary waveplate rotating compensator ellipsometer |
| 02/15/2011 | US7889338 Coordinate measuring machine and method for structured illumination of substrates |
| 02/10/2011 | US20110032524 Glass Thickness Measurement Using Fluorescence |
| 02/10/2011 | US20110032502 Polarization evaluation mask, exposure device, and polarization evaluation method |
| 02/10/2011 | US20110032500 Inspection apparatus for lithography |
| 02/08/2011 | US7884934 Method and apparatus for biogenic substance concentration measurement |
| 02/03/2011 | US20110026026 Apparatus for characterizing fibrous materials using stokes parameters |
| 01/27/2011 | WO2011011511A1 Angle-resolved antisymmetric scatterometry |
| 01/27/2011 | US20110019190 Resistivity testing method and device therefor |
| 01/27/2011 | US20110019189 Sub-wavelength structures, devices and methods for light control in material composites |
| 01/27/2011 | US20110019188 In-Flight Multiple Field of View Detector for Supercooled Airborne Water Droplets |
| 01/27/2011 | DE102005063524B4 Vorrichtung zur Messung und Erzeugung der Polarisation von Licht Device for measuring and generating the polarization of light |
| 01/25/2011 | US7876437 Glass container wall thickness measurement using fluorescence |
| 01/20/2011 | WO2011007374A1 Method and apparatus for identifying the orientation of wood fibres |
| 01/20/2011 | WO2011006250A1 Interface plasmon polariton waveguide |
| 01/20/2011 | US20110013186 Optical displacement meter |
| 01/20/2011 | DE102008062908B4 Augenchirurgiesystem Eye surgery system |
| 01/19/2011 | EP2275790A2 Integrated polarization sensor |
| 01/19/2011 | CN101949734A Method for improving measurement precision of beam polarization degree |
| 01/18/2011 | US7872751 Fast sample height, AOI and POI alignment in mapping ellipsometer or the like |
| 01/13/2011 | US20110007316 Inspection Method and Apparatus, Lithographic Apparatus, Lithographic Processing Cell and Device Manufacturing Method |
| 01/11/2011 | US7869062 Apparatus for supporting substrate, apparatus for measuring surface potential, apparatus for measuring film thickness, and apparatus for inspecting substrate |
| 01/11/2011 | US7869040 Measurement systems configured to perform measurements of a specimen and illumination subsystems configured to provide illumination for a measurement system |
| 01/11/2011 | US7869039 Microscopic-measurement apparatus |
| 01/11/2011 | US7869024 Method and its apparatus for inspecting defects |
| 01/06/2011 | WO2011003041A1 Quasi - longitudinal mode electro-optic) high power microwave sensor |
| 01/06/2011 | US20110003279 Monitoring devices and processes based on transformation, destruction and conversion of nanostructures |
| 01/06/2011 | US20110001972 Method And Equipment For Detecting Pattern Defect |
| 01/06/2011 | US20110001971 Electromagnetic field measurement device |
| 01/05/2011 | CN101936774A Method for measuring apparatus error in polarization detection device |
| 01/05/2011 | CN101936773A Computer-aided-based high-precision polarized light positioning system and high-precision positioning method |
| 01/04/2011 | US7864318 Spectroscopic ellipsometer and ellipsometry |
| 12/30/2010 | US20100328666 Polarization-independent up-conversion photon detection apparatus |
| 12/30/2010 | US20100328640 Polarization state measurement apparatus and exposure apparatus |
| 12/29/2010 | WO2010151304A1 Terahertz-infrared ellipsometer system, and method of use |
| 12/29/2010 | EP2267422A1 Method and device for malignancy determination of biological materials |
| 12/28/2010 | US7859666 Electric field sensor |
| 12/28/2010 | US7859665 Polarization analyzing system, exposure method, and method for manufacturing semiconductor device |
| 12/23/2010 | US20100321773 Method and system for three-dimensional polarization-based confocal microscopy |
| 12/23/2010 | US20100321693 Minute measuring instrument for high speed and large area and the method of thereof |