Patents
Patents for G01B 9 - Instruments as specified in the subgroups and characterised by the use of optical measuring means (14,810)
12/2002
12/11/2002CN1384334A Double-frequency confocal step height microscope measuring device
12/11/2002CN1384332A Double-wavelength nanometer-precision real-time interferometer
12/11/2002CN1384331A Full-fiber nanometer-precision microdisplacement and microvibration interference measuring instrument
12/10/2002US6493170 Interference device and position detection device using the same
12/10/2002US6493094 Method and apparatus for beam directing
12/10/2002US6493093 Bat-wing attenuation in white-light interferometry
12/10/2002US6493090 Detection of a substance by refractive index change
12/10/2002US6493088 Method and apparatus for high resolution monitoring of optical signals
12/10/2002CA2272806C Method of spectroscopic investigation of electromagnetic radiation by means of a fourier spectrometer
12/05/2002US20020181864 Device and method for measuring angle of slant surface of an optical component
12/05/2002US20020180984 Support apparatus for optical wave interferometer reference plate
12/05/2002US20020180982 Interferometric measuring device
12/05/2002US20020180981 Multi-cavity resonator interferometer
12/05/2002US20020180980 Optical signal interleaver and deinterleaver devices with chromatic dispersion compensation
12/05/2002US20020180977 Apparatus and method for measuring intensity and phase of a light pulse with an interferometric asymmetric single-shot autocorrelator
12/05/2002US20020179866 System and method for determining a position or/and orientation of two objects relative to each other as well as beam guiding arrangement, interferometer arrangement and device for changing an optical path length for use in such a system and method
12/05/2002US20020179814 Optical recording and/or reproduction apparatus, tracking method, and optical recording medium
12/05/2002DE10126480A1 Measuring optical reference element angular position, defocusing involves reflecting light coupled out back using retroreflector so it can interfere with light reflected by reference element
12/04/2002EP1262735A1 Method for the absolute calibration of an interferometer
12/04/2002EP1262734A1 Device to measure an object without contact, in particular to measure distance and/or vibration
12/04/2002EP1261877A1 Method of measuring the movement of a material sheet and optical sensor for performing the method
12/04/2002CN1383597A 气体激光器和光学系统 Gas laser and an optical system
12/04/2002CN1095536C Instrument for measuring shift and vibration of object by polarized light interfrence of optical fibre
12/03/2002US6490300 Wavelength-stabilized light source apparatus
12/03/2002US6490046 Modulation interferometer and fiberoptically divided measuring probe with light guided
12/03/2002US6489625 Coordinate transforming method in position setting means of observation device and observation device equipped with coordinate transforming means
11/2002
11/28/2002WO2002095326A1 System and method for determining coordinates on three-dimensional space using beam phase interference
11/28/2002WO2002073122A3 Cyclic error reduction in average interferometric position measurements
11/28/2002US20020176085 Feedback position control system and method for an interferometer
11/28/2002DE10125785A1 Absolute calibration of interferometer by measuring optical element in four positions and two angular positions, inter-focally and extra-focally
11/27/2002EP1058812B1 Interferometric measuring device for determining the profile or the distance, especially of rough surfaces
11/27/2002EP0876595B1 Low-coherence interferometric device
11/26/2002US6486955 Shape measuring method and shape measuring device, position control method, stage device, exposure apparatus and method for producing exposure apparatus, and device and method for manufacturing device
11/26/2002US6485413 Methods and apparatus for forward-directed optical scanning instruments
11/21/2002WO2002075242A3 Method and apparatus for polarization-sensitive optical coherence tomography
11/21/2002WO2002063237A3 Interferometer
11/21/2002US20020171846 System and method for controlling tube thickness
11/21/2002US20020171845 System and method for controlling wafer temperature
11/21/2002US20020171844 Cyclic error reduction in average interferometric position measurements
11/20/2002EP1258781A2 Interferometer system
11/20/2002CN1380540A Static force loading measuring and controlling equipment for material microstructure tester and its method
11/19/2002US6483593 Hetrodyne interferometer and associated interferometric method
11/19/2002US6483592 Two-particle interferometer apparatus that removes an undesired anti-fringe output
11/15/2002CA2347546A1 Interferometer devices with highly compact footprint
11/14/2002WO2002091531A1 Optical interference apparatus and method
11/14/2002WO2002091116A2 Apparatus and method for measuring intensity and phase of a light pulse with an interferometric asymmetric single-shot autocorrelator
11/14/2002WO2002090882A1 Reducing coherent artifacts in an interferometer
11/14/2002WO2002090880A1 Reducing coherent artifacts in an interferometer
11/14/2002WO2002089661A1 Optical imaging device and optical imaging detecting method
11/14/2002US20020167675 Interferometer system
11/14/2002US20020167671 Linear translation apparatus for optical systems
11/13/2002CN1379224A Phase-conjugated interferometer for measuring surface shape of transparent plate
11/12/2002US6480285 Multiple layer confocal interference microscopy using wavenumber domain reflectometry and background amplitude reduction and compensation
11/12/2002US6480284 Multiple plane reference mirror for interferometric testing of optical systems
11/12/2002US6480126 Phase digitizer
11/07/2002WO2002088705A2 Method and apparatus for determination of atherosclerotic plaque type by measurement of tissue optical properties
11/07/2002WO2002088684A1 Method and apparatus for improving image clarity and sensitivity in optical coherence tomography using dynamic feedback to control focal properties and coherence gating
11/07/2002WO2002071042A3 Frequency-encoded parallel oct and associated systems and methods
11/07/2002US20020164829 Measuring apparatus and film formation method
11/07/2002US20020163648 Microinterferometer for distance measurements
11/07/2002US20020163647 Optical interference apparatus and position detection apparatus
11/07/2002US20020163643 Optical interference apparatus and method
11/07/2002US20020163622 Apparatus and method for selective data collection and signal to noise ratio enhancement using optical coherence tomography
11/07/2002DE10121516A1 Illuminating apparatus for an object under test in an interferometer with an optical axis (OA) has radiation director directing radiation at object from different locations distant from axis
11/07/2002DE10118392A1 System und Verfahren zum Bestimmen einer Position oder/und Orientierung zweier Objekte relativ zueinander sowie Strahlführungsanordnung, Interferometeranordnung und Vorrichtung zum Ändern einer optischen Weglänge zum Einsatz in einem solchen System und Verfahren System and method for determining a position and / or orientation of two objects relative to each other as well as beam guidance arrangement, and the interferometer apparatus for changing an optical path length for use in such a system and method
11/07/2002CA2473587A1 Method and apparatus for determination of atherosclerotic plaque type by measurement of tissue optical properties
11/06/2002CN1378078A Temperature compensation Fabry-perot optical fiber strain sensor specially for concrete
11/06/2002CN1378066A Micro displacement self-mixing interference measurer and its signal controller and measuring method
10/2002
10/31/2002WO2002086587A1 Compliant mechanism and method of forming same
10/31/2002WO2002086582A1 Mems-based tunable fabry-perot filters and method of forming same
10/31/2002WO2002010831A3 Differential interferometric scanning near-field confocal microscopy
10/31/2002US20020159068 Interferometer
10/31/2002US20020158966 Method and arrangement for imaging and measuring microscopic three-dimensional structures
10/31/2002DE10118760A1 Verfahren zur Ermittlung der Laufzeitverteilung und Anordnung Method for determining the transit time distribution and arrangement
10/30/2002EP1253398A1 Optical interferometer (variants)
10/30/2002EP1208350A4 Interferometer having reduced ghost beam effects
10/29/2002US6473185 Alignment free interferometer and alignment free method of profiling object surfaces
10/29/2002US6473184 Interferometer which divides light beams into a plurality of beams with different optical paths
10/29/2002US6473179 Birefringence measurement system
10/24/2002WO2002084263A1 Interferometric arrangement for determining the transit time of light in a sample
10/24/2002WO2002084259A1 High-speed optical delay generating method by rotation reflector in optical coherence tomography and optical coherence tomography device
10/24/2002WO2002084211A1 Support for a movable mirror in an interferometer
10/24/2002US20020154317 Confocal microscopy
10/24/2002US20020154316 Method and apparatus to minimize effects of ase in optical measurements
10/23/2002EP1251328A2 System and method for determining the position or/and the orientation of two objects relative to each other, as well as beam guidance device, interferometer system and device for modifying the optical pathlength for use in such a system and method
10/23/2002CN1375682A Trackless large-part measuring device and method
10/23/2002CN1092949C Corneal map ping apparatus of optical coherence tomography
10/22/2002US6469790 Tilt-compensated interferometers
10/17/2002WO2002082011A1 Illumination device and method for illuminating an object
10/17/2002WO2002082008A1 A method and apparatus of two wavelength interferometry for measuring accurate height of small step composed of two different materials
10/17/2002WO2002082007A1 Interferometric measuring device
10/17/2002US20020149781 Bat-wing attenuation in white-light interferometry
10/17/2002US20020149778 Method for three-dimensionally, optically measuring measuring objects
10/17/2002US20020149777 Support for a movable mirror in an interferometer
10/17/2002DE10123844A1 Interferometrische Messvorrichtung Interferometric measurement device
10/13/2002CA2381687A1 System and method for determining a position or/and orientation of two objects relative to each other as well as beam guiding arrangement, interferometer arrangement and device for changing an optical path length for use in such a system and method
10/10/2002WO2002079720A1 Microinterferometer for distance measurements
10/10/2002WO2002079719A2 Microinterferometers with performance optimization
10/10/2002WO2002079718A1 System and method for surface profiling
10/10/2002US20020145738 Monolithic corrector plate