Patents for G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671)
11/2010
11/18/2010US20100289190 Processing apparatus and method
11/17/2010CN101382505B X ray imaging arrangement and method
11/11/2010WO2010128992A1 X.ray apparatus for bone density assessment and monitoring
11/11/2010US20100284515 Apparatus for Bone Density Assessment and Monitoring
11/04/2010DE102009009384B4 Detektion von Druckschwankungen in einem heißen Medium auf Basis von Millimeterwellen Detection of pressure variations in a hot medium based on millimeter waves
11/03/2010EP1579170B1 Nondestructive characterization of thin films using measured basis spectra and/or based on acquired spectrum
11/03/2010CN101876105A Spinning preparation machine with microwave sensors
11/03/2010CN101457534B Impulse elastic wave energized residual signal restraining device and restraining method
11/02/2010US7826943 Method and system for diagnosing faults in a particular device within a fleet of devices
10/2010
10/21/2010WO2010119844A1 Surface microstructure measuring method, surface microstructure measurement data analyzing method, and x-ray scattering measuring device
10/21/2010WO2010119641A1 Pattern measuring apparatus and computer program
10/20/2010CN101865682A Multilayer printed wiring board interlayer dislocation detection method
10/19/2010US7817781 High voltage X-ray generator and related oil well formation analysis
10/19/2010US7816648 Electron interferometer or electron microscope
10/13/2010CN201607219U X射线测厚仪的c型架上的摆锤悬挂机构 X-ray thickness of c-type shelves pendulum suspension mechanism
10/07/2010WO2010112277A1 Network analyser with an n-port network having at least two ports for measuring the wave parameters of a measurement object
10/07/2010DE102009014804A1 Method for determining layer thickness of coating of tablet, involves measuring layer thickness of coating at three-dimensional volume model, and determining and storing minimum value and average value of layer thickness
10/07/2010CA2698878A1 Method and arrangement to measure the deflection of a wind-turbine blade
09/2010
09/30/2010US20100246762 Seedling counter
09/30/2010DE102009015465A1 Bewegungsvorrichtung mit Wellenleiter zur Positionsbestimmung Motion device with waveguide for position determination
09/28/2010US7803309 Infusion monitoring system and method
09/22/2010CN201589604U Paper money thickness real-time detection device
09/22/2010CN101839704A Power line and bridge swing measuring method
09/21/2010US7801268 Nondestructive method of measuring a region within an ultra-hard polycrystalline construction
09/21/2010US7800062 Method and system for the examination of specimen
09/16/2010WO2010077407A3 Thin film measurement technique
09/15/2010CN101836070A System and method for measuring installation dimensions for flow measurement system
09/15/2010CN101832954A Mobile assembly for pencil beam XCT (X-ray Computed Tomography) system and a method for carrying out image reconstruction and coordinate system origin calibration by using same
09/09/2010US20100224486 Dynamic Film Thickness Control System/Method and its Utilization
09/09/2010US20100224127 Dynamic Film Thickness Control System/Method and its Utilization
09/08/2010EP2226609A2 Nondestructive detection of anomalies (foreign objects, anomal dimensions) of an engine for example by means of computed tomography
09/08/2010CN101133300B Method for measuring surface layer oxide film thickness of galvanized steel plate
09/01/2010EP2224204A2 Method for measuring object geometries with a coordinate measuring device
09/01/2010CN101819031A Method for detecting length of perforated pipe in pipe roofing structure based on guided wave technology
09/01/2010CN101482401B Image-based measuring method for three-dimensional object incontinuous hollow volume
09/01/2010CN101363806B Tyre expanding mechanism for X-ray tyre detecting machine
08/2010
08/26/2010WO2010095392A1 Sample observing method and scanning electron microscope
08/26/2010WO2010094139A1 Electromagnetic bath level measurement for pyrometallurgical furnaces
08/26/2010US20100214555 Method and apparatus for thickness measurement
08/26/2010DE102010000473A1 Verfahren zum Messen eines Objektes A method for measuring an object
08/26/2010DE102009009384A1 Detektion von Druckschwankungen in einem heißen Medium auf Basis von Millimeterwellen Detection of pressure variations in a hot medium based on millimeter waves
08/26/2010CA2752098A1 Electromagnetic bath level measurement for pyrometallurgical furnaces
08/19/2010DE102008057505A1 Mikrowellenpositionsmesseinrichtung Microwave position measuring device
08/18/2010CN101413792B Porous material pore space boundary extracting and quantization method
08/12/2010WO2010091015A1 Systems and methods for measuring at least one thermal property of materials based on a thermal brewster angle
08/11/2010CN201548499U Multifunctional x-ray instrument unwheeling
08/11/2010CN101797589A Isotope thickness meter probe in novel structure
08/11/2010CN101308102B Computer tomography apparatus and method
08/05/2010WO2010087149A1 Charged particle beam device
08/04/2010EP2213977A1 Device for measuring thickness of paint film in non-contacting manner
08/04/2010CN101793845A X-raying detecting system and method for coal mine leather belt
08/03/2010US7769213 Apparatus for predicting bone fracture risk
08/03/2010US7769131 Estimating strengths of wooden supports
07/2010
07/29/2010WO2010033282A3 Pipeline inspection
07/29/2010DE102009043823A1 Object i.e. stent, structure and geometry determining method for use in coordinate measuring device, involves arranging tactile, image processing and X-ray sensors in X, Y and Z directions of coordinate measuring device relative to object
07/29/2010DE102009005745A1 Vorrichtung zur Überwachung der Lage eines Werkzeugs oder Maschinenelements Device for monitoring the position of a tool or machine element
07/22/2010WO2010082477A1 Charged beam device
07/22/2010US20100185086 Bone strength diagnosing device and bone strength diagnosing method
07/22/2010US20100180818 Dynamic Film Thickness Control System/Method and its Utilization
07/21/2010CN1646743B Spinning preparation machine with microwave sensors
07/21/2010CN101782538A Forensic medical diatom detection automation method
07/15/2010WO2010042544A3 Apparatus and method of detecting electromagnetic radiation
07/15/2010DE102008061227A1 Abstandsmessvorrichtung und Verfahren zur Ermittlung eines Abstands in einer Leitungsstruktur The distance measuring apparatus and method for calculating a distance in a conduit structure
07/14/2010EP2205932A1 System and method for measuring installation dimensions for flow measurement system
07/14/2010CN101779118A Device for measuring the thickness of a layer of material
07/08/2010WO2010077407A2 Thin film measurement technique
07/08/2010US20100170437 Dynamic Film Thickness Control System/Method and its Utilization
07/06/2010US7751035 Method and device to quantify active carrier profiles in ultra-shallow semiconductor structures
07/06/2010US7750329 Optical tweezers
07/01/2010WO2010073478A1 Charged particle radiation device and image capturing condition determining method using charged particle radiation device
07/01/2010WO2010073360A1 Pattern measuring apparatus and pattern measuring method
07/01/2010US20100163466 Apparatus for analysing a security document
07/01/2010DE102008064259A1 Fluidischer Zylinder mit einer Mikrowellen-Messanordnung und Verfahren zur Erfassung wenigstens eines Parameters Fluidic cylinder with a microwave measuring arrangement and method for detecting at least one parameter
06/2010
06/30/2010EP2202481A1 Non-contact film thickness measurement method and device
06/24/2010WO2010070815A1 Scanning electron microscope
06/24/2010US20100158190 Estimating strengths of wooden supports
06/23/2010CN101750033A X-ray inspection apparatus
06/22/2010CA2383263C Level transmitter
06/17/2010WO2010067491A1 Semiconductor wafer testing apparatus
06/17/2010US20100147216 Dynamic Film Thickness Control System/Method and its Utilization
06/17/2010US20100147214 Dynamic Film Thickness Control System/Method and its Utilization
06/17/2010DE102008047055A1 Microwave-based human body surface area detection/reconstruction method for e.g. medical imaging application, involves providing antenna axis parallel to coordinate axis, during bistatic measurements
06/16/2010EP2196766A1 Device and method for measuring thickness of paint film in non-contacting manner
06/16/2010CN101738407A X-ray diffractometer-based ultra-smooth surface measuring method
06/15/2010US7738631 Energy discriminating scatter imaging system
06/15/2010US7737416 Sample transfer unit and sample transferring method
06/10/2010DE102008061104A1 Linear drive i.e. pneumatic cylinder, has channel sections penetrating front wall with openings, where wall is formed for axial limitation of chamber and openings are arranged at distance to each other in outer region of front wall
06/10/2010DE102008060522A1 X-ray measurement body for use in x-ray template, has marking i.e. scale, which is visible on X-ray image, and is in form of grooves, where body possesses longitudinally elongated shape
06/09/2010CN1628381B System and method for inspecting charged particle responsive resist
06/09/2010CN101728573A Battery inspection system
06/09/2010CN101726537A Apparatus and method for measuring parameters of a mixture having liquid droplets suspended in a vapor flowing in a pipe
06/08/2010US7732227 Method and apparatus for wall film monitoring
06/03/2010WO2010061516A1 Image formation method and image formation device
06/02/2010EP0986745B1 Single beam photoneutron probe and x-ray imaging system for contraband detection and identification
06/02/2010DE102008009334B4 Werkzeugmaschine und Verfahren zur Bearbeitung von Werkstücken Machine tool and method for machining workpieces
06/02/2010CN201493317U C-shaped frame cooling device of hot-rolling strip steel X-ray thickness gauge
05/2010
05/26/2010EP2190002A1 Apparatus for detecting a fine geometry and device manufacturing method
05/20/2010WO2010056434A1 System and method for measuring thickness of a refractory wall of a gasifier using electromagnetic energy
05/19/2010CN201476774U Single-vehicle movable container detecting system
05/18/2010US7720632 Dimension measuring apparatus and dimension measuring method for semiconductor device
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