Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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02/12/2003 | CN1396445A Dual-surface metal waveguide measuring method and its device |
02/12/2003 | CN1396435A Photoelectric detection method and device based on orthogonal dual polarized light beams for rolled angle |
02/12/2003 | CN1101579C Aerial work platform with pothole and/or obstacle detection and avoidance system |
02/12/2003 | CN1101540C Omnibearing position transducer |
02/11/2003 | US6519550 Object scanner |
02/11/2003 | US6519356 System and method for inspecting cans |
02/11/2003 | US6519043 Vector measurement for coordinate measuring machine |
02/11/2003 | US6519029 Low cost transmitter with calibration means for use in position measurement systems |
02/11/2003 | US6518997 Grid array inspection system and method |
02/11/2003 | US6518996 Compact video inspection apparatus with Y, Z, X compounded measurement axes |
02/11/2003 | US6518770 System and method for measuring dynamic loads in a magnetic bearing |
02/11/2003 | US6516533 Device and process for measuring the mutual orientation of hollow cylinder and an assigned cut edge |
02/06/2003 | WO2003010531A1 Method and apparatus for using a two-wave mixing ultrasonic detection in rapid scanning applications |
02/06/2003 | WO2003010518A2 Opto-acoustic apparatus with optical heterodyning for measuring solid surfaces and thin films |
02/06/2003 | WO2003010489A2 Method and apparatus for surface roughness measurement |
02/06/2003 | WO2003010488A1 Composite optical sensor unit and optical disk inspection device using it |
02/06/2003 | WO2002063239A3 Method and apparatus for mapping system calibration |
02/06/2003 | WO2002023918A3 Mehthod and device for measuring three-dimensional shapes |
02/06/2003 | US20030028358 Method and system of dynamic learning through a regression-based library generation process |
02/06/2003 | US20030028347 Object scanner |
02/06/2003 | US20030027201 Method for mapping a nucleic acid |
02/06/2003 | US20030026475 Three-dimensional measuring method and device, and computer program |
02/06/2003 | US20030025992 Method and microscope for detection of a specimen |
02/06/2003 | US20030025919 System and method for finding the center of rotation of an R-theta stage |
02/06/2003 | US20030025916 Interferometer system for measuring surface shape |
02/06/2003 | US20030025910 Interferometric measurement apparatus for wavelength calibration |
02/06/2003 | US20030025905 Method of detecting and classifying scratches, particles and pits on thin film disks or wafers |
02/06/2003 | US20030025904 Method and apparatus for inspecting defects |
02/06/2003 | US20030025902 Low cost transmitter with calibration means for use in position measurement systems |
02/06/2003 | US20030025901 Integrated circuit image sensor for wheel alignment systems |
02/06/2003 | US20030025899 Method and apparatus for simultaneous measurement of the refractive index and thickness of thin films |
02/06/2003 | US20030024481 System and method for obtaining animal and carcass measurements |
02/06/2003 | US20030024301 Method and measuring device for measuring at least one property of moving web |
02/06/2003 | DE10130623C1 Verfahren zur Bestimmung der Zustandsgrößen eines starren Körpers im Raum mittels eines Videometers Method for determining the state variables of a rigid body in space by means of a video meter |
02/05/2003 | EP1281932A2 Method and arrangement for measuring a bicycle frame |
02/05/2003 | EP1281931A1 Interferometer using an aspherical wavefront for measuring aspherical surfaces |
02/05/2003 | EP1281058A1 Method and apparatus for checking the slacks in the suspension and steering of a motor vehicle |
02/05/2003 | EP1281052A1 Method for imaging measurement, imaging measuring device and use of measured information in process control |
02/05/2003 | EP1281041A1 Measuring vehicle wheel alignment with video cameras and repeated approximation calculations |
02/05/2003 | EP1281040A1 Reduced coherence symmetric grazing incidence differential interferometer |
02/05/2003 | CN1395677A Method and arrangement for optically detecting position of moveable mirror |
02/05/2003 | CN1395608A Device and method for measuring width of furnace |
02/05/2003 | CN1101056C Method and device for producing subject distance image |
02/04/2003 | WO2002100743A2 Method for setting storage fee of article storage rack |
02/04/2003 | US6516150 Distance measuring equipment and camera |
02/04/2003 | US6516099 Image processing apparatus |
02/04/2003 | US6515772 Apparatus and method for engraving a gravure printing cylinder |
02/04/2003 | US6515754 Object-displacement detector and object-displacement controller |
02/04/2003 | US6515753 Optical alignment in capillary detection using capillary wall scatter |
02/04/2003 | US6515746 Thin film optical measurement system and method with calibrating ellipsometer |
02/04/2003 | US6515745 Optical measurement system using polarized light |
02/04/2003 | US6515658 3D shape generation apparatus |
02/04/2003 | US6515294 Device for precision alignment of shafts, rollers, axles, spindles or machine tools |
02/04/2003 | US6515293 Method and apparatus for detecting thickness of thin layer formed on a wafer |
02/04/2003 | US6513830 Method and apparatus for disabling an airbag system in a vehicle |
02/04/2003 | US6513390 Temperature insensitive fiber-optic torque and strain sensor |
02/04/2003 | US6513255 Machinist's accuracy testing tool |
02/04/2003 | CA2418660A1 Method of determining storage charge of storage rack |
01/30/2003 | WO2003009476A1 Optoelectronic device for detecting position and movement and method associated therewith |
01/30/2003 | WO2003009326A1 Coordinate measuring machine laser beam scanning type |
01/30/2003 | WO2003009070A2 Method for measuring an object by means of a co-ordinate measuring device with an image processing sensor |
01/30/2003 | WO2003009063A2 Real time analysis of periodic structures on semiconductors |
01/30/2003 | WO2003008905A1 Method for measuring surface properties and co-ordinate measuring device |
01/30/2003 | WO2003008904A1 Shape measuring device |
01/30/2003 | WO2003008903A1 Method and device for seismic surveillance |
01/30/2003 | WO2003008902A1 Methods and systems for alignment of detection optics |
01/30/2003 | WO2003008901A1 Method for measuring the spatial position and/or opening of a work piece |
01/30/2003 | WO2003008900A1 Method for the scanning measurement of a surface contour |
01/30/2003 | WO2003008898A1 Co-ordinate measuring device with additional heat source |
01/30/2003 | WO2001088467A9 Data age adjustments |
01/30/2003 | US20030023395 Self-calibrating position determination system and user interface |
01/30/2003 | US20030022400 Method and apparatus for measuring thickness of thin film and device manufacturing method using same |
01/30/2003 | US20030021480 Method, program product, and device for detecting branch point of random line pattern |
01/30/2003 | US20030021462 Defect detection method and its apparatus |
01/30/2003 | US20030021446 Simplified interpolation for an optical navigation system that correlates images of one bit resolution |
01/30/2003 | US20030020929 Method and apparatus for increasing signal to noise ratio in a photoacoustic film thickness measurement system |
01/30/2003 | US20030020927 Precision video gauging machine for vertically oriented workpieces |
01/30/2003 | US20030020924 Interferometer system |
01/30/2003 | US20030020923 Method and apparatus for using a two-wave mixing ultrasonic detection in rapid scanning applications |
01/30/2003 | US20030020921 Interferometric apparatus and method with phase shift compensation |
01/30/2003 | US20030020913 System and method for optical multiplexing and/or demultiplexing |
01/30/2003 | US20030020906 Scanning apparatus |
01/30/2003 | US20030020902 Method for inspection of optical elements |
01/30/2003 | US20030020896 Method and apparatus for measuring web strain in a confined area |
01/30/2003 | US20030020871 Anterior chamber diameter measurement system from limbal ring measurement |
01/30/2003 | US20030020009 Monitor, method of monitoring, polishing device, and method of manufacturing semiconductor wafer |
01/30/2003 | US20030020008 Optical position detecting device and recording medium |
01/30/2003 | US20030019294 3D angle measurement instrument |
01/30/2003 | DE10035876C2 Optischer Detektor An optical detector |
01/30/2003 | CA2454244A1 Optoelectronic device for detecting position and movement and method associated therewith |
01/29/2003 | EP1279922A2 Device to determine the position of the side of a web material |
01/29/2003 | EP1279921A2 Device to determine the position of a side of a web |
01/29/2003 | EP1279004A1 Scanning unit for an optical position measuring device |
01/29/2003 | EP1279002A1 Method and apparatus for measuring wall thickness of a plastic container |
01/29/2003 | EP1278998A1 Device for measuring an object across several axes |
01/29/2003 | EP1031026B1 device for detecting the location of components, light deflection body and insertion head with a device for detecting the location of components |
01/29/2003 | CN1393599A Rail construction machinery for measuring rail position and operating method |
01/28/2003 | US6512993 Integrated system for quickly and accurately imaging and modeling three-dimensional objects |
01/28/2003 | US6512968 Computerized automotive service system |
01/28/2003 | US6512843 Pattern comparison method and appearance inspection machine for performance comparison based on double detection without delay |