Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
02/2003
02/26/2003EP1285222A1 Interferometric apparatus and method
02/26/2003EP1285221A1 In-situ mirror characterization
02/26/2003EP0989800B1 Apparatus and method for recognising and determining the position of a part of an animal
02/26/2003EP0916071B1 Triangulation-based 3d imaging and processing method and system
02/26/2003EP0760932B1 Apparatus for detecting relative movement
02/26/2003CN2537954Y Optical fibre intelligent screw bolt
02/26/2003CN1399767A Aircraft identification and docking guidance systems
02/26/2003CN1399726A Measurement of wear of fireproof lining of metallurgical vessel
02/26/2003CN1399715A Distortion detector
02/25/2003US6526369 Apparatus and process for a cross-direction profile of a material web
02/25/2003US6525829 Method and apparatus for in-situ measurement of thickness of copper oxide film using optical reflectivity
02/25/2003US6525828 Confocal color
02/25/2003US6525809 Alignment device for a guided missile seeker
02/25/2003US6525724 Nail ornamenting device
02/25/2003US6525309 Optoelectronic sensor
02/25/2003US6524871 Defect inspection apparatus and defect inspection method
02/25/2003US6524441 Process for detecting and correcting a fiber orientation cross direction profile change
02/25/2003US6524165 Method and apparatus for measuring substrate layer thickness during chemical mechanical polishing
02/25/2003US6523467 Method for measuring engraving cups
02/25/2003US6523407 Apparatus and method for balancing a vehicular driveshaft
02/25/2003CA2079817C Real time three dimensional sensing system
02/20/2003WO2003015053A1 Method for determining a model travel path
02/20/2003WO2003014866A2 Method and system for dynamic learning through a regression-based library generation process
02/20/2003WO2003014827A1 An interferometer system for a semiconductor exposure system
02/20/2003WO2003014774A2 Amplified tree structure technology for fiber optic sensor arrays
02/20/2003WO2003014710A1 Multiple beam ellipsometer
02/20/2003WO2003014674A2 Two delay coil sagnac-based sensor array
02/20/2003WO2003014665A1 Device and method for 3d imaging
02/20/2003WO2003014664A1 Calibration object
02/20/2003WO2003014663A1 Three dimensional imaging by projecting interference fringes and evaluating absolute phase mapping
02/20/2003WO2003014662A1 Apparatus for measuring shape of article
02/20/2003WO2003014661A1 Apparatus and method for measuring shape of article on conveyor line
02/20/2003WO2003014660A1 Displacement detecting method, displacement detecting device and calibrating method thereof, and recording device of information recording medium original disk
02/20/2003WO2003014659A2 Method and system for measuring the topography of a sample
02/20/2003WO2003014658A2 Method and apparatus for process control in the semiconductor manufacturing
02/20/2003US20030036830 Three-dimensional mapping systems for automotive vehicles and other articles
02/20/2003US20030036196 Solid support for use in the propagation of preferential cells
02/20/2003US20030035566 Phase unwrapping method for fringe image analysis
02/20/2003US20030035117 Optical measurement system and method for determining height differential between two surfaces
02/20/2003US20030035116 Interferometer system
02/20/2003US20030035114 In-situ mirror characterization
02/20/2003US20030035113 Quadrature phase shift interferometer with unwrapping of phase
02/20/2003US20030035110 Film defect inspection method for a film formed on a substrate
02/20/2003US20030035098 Pose estimation method and apparatus
02/20/2003US20030035051 Device for and method of automatically tracking a moving object
02/20/2003US20030034971 Three-dimensional object surface shape modeling apparatus, method and program
02/20/2003DE20219383U1 Coordinate measurement system regularly corrects table position using reference
02/20/2003DE20023127U1 Optical measurement of diameter, thicknesses and eccentricity of elongated products, especially products moving on a roller path, to provide continuous monitoring ensuring products are within tolerance
02/20/2003DE10131610C1 Verfahren zur Kalibrierung des optischen Systems einer Lasermaschine zur Bearbeitung von elektrischen Schaltungssubstraten Method of calibrating the optical system of a laser machine for processing electrical circuit substrates
02/19/2003EP1284409A1 Method and apparatus for the inspection of the deformation of objects
02/19/2003EP1283960A1 System and method for measuring dynamic loads in a magnetic bearing
02/19/2003EP0941448B1 Interferometric measurement of positions, position changes and physical quantities derivated therefrom
02/19/2003CN1397479A Appts. related to coiled products
02/18/2003US6522993 Method and system for marking surface deviations on a three dimensional surface
02/18/2003US6522777 Combined 3D- and 2D-scanning machine-vision system and method
02/18/2003US6522415 Device and method for determining a relative position of two objects with regard to one another
02/18/2003US6522413 Apparatus for evaluating metalized layers on semiconductors
02/18/2003US6522412 Measuring system with improved method of reading image data of an object
02/18/2003US6522409 Method and device for non-destructive inspection of objects by means of optical holographic interferometry
02/18/2003US6522405 Method and apparatus for monitoring sub-micron particles
02/18/2003US6522400 Portable front wheel alignment apparatus and method
02/18/2003US6522393 Distance measuring device
02/18/2003US6521906 Method and apparatus for measuring the distortion angle of a strip of textile, wherein a sensor array scans at progressively altered angles
02/18/2003US6521905 Method and device for detecting the position of a transparent moving conveyor belt
02/18/2003US6521889 Dust particle inspection apparatus, and device manufacturing method using the same
02/18/2003US6521885 Linear scale measuring device and position detection method using the same
02/18/2003US6521884 Distance measuring device with magneto-optical effect and measuring chain incorporating same
02/18/2003US6521878 Radial tilt detector for an optical disc
02/18/2003US6521854 Article classifying system
02/18/2003US6521385 Using computers
02/18/2003US6519866 Belt drive alignment detection device and method
02/13/2003WO2003012548A2 System for measuring an optical system, especially an objective
02/13/2003WO2003012510A1 System and method for optical multiplexing and/or demultiplexing
02/13/2003WO2003012407A1 Phase technique for determining thickness, volume and refractive index
02/13/2003WO2003012405A2 Aspects of basic oct engine technologies for high speed optical coherence tomography and light source and other improvements in oct
02/13/2003WO2003012368A1 Surface shape measurement apparatus, surface shape measurement method, surface state graphic apparatus
02/13/2003WO2003012366A1 Common element confocal interferometer
02/13/2003WO2003011135A1 Anterior chamber diameter measurement system from limbal ring measurements
02/13/2003WO2002074038A3 Method and arrangement for photographically detecting the spatial form of an object
02/13/2003WO2002039099A3 Measurement of surface defects
02/13/2003WO2002029356A3 End point system for resist recess etch
02/13/2003US20030033112 Method for generating a control output for a position control loop
02/13/2003US20030033066 Image processing system for estimating the energy transfer of an occupant into an airbag
02/13/2003US20030032377 Measuring apparatus
02/13/2003US20030031383 Method for establishing the position of a temprary on an object relative to know features of the object
02/13/2003US20030031359 Method and apparatus of measuring three-dimensional posture of sphere and method of measuring rotational amount of sphere and direction of rotational axis thereof
02/13/2003US20030031356 Pattern inspection apparatus and method
02/13/2003US20030030869 Active real-time alignment system for optoelectronic (OE) devices
02/13/2003US20030030853 Method and apparatus for picking up 2D image of an object to be sensed
02/13/2003US20030030822 Method and apparatus for process control in semiconductor manufacture
02/13/2003US20030030821 Bonding apparatus
02/13/2003US20030030820 Marker used for measuring displacement of moving object and method therefor
02/13/2003US20030030817 Multifunctional opto-electronic biochip detection system
02/13/2003US20030030806 Multiple beam ellipsometer
02/13/2003US20030030805 Measurement of waveplate retardation using a photoelastic modulator
02/13/2003US20030030792 Process for reading fractioin of an in terval between contiguous photo-sensitive
02/13/2003US20030030791 Portable wheel alignment system
02/13/2003US20030029220 Surface inspection system
02/12/2003EP1283499A1 Moving object tracking apparatus and method
02/12/2003EP1135744B1 Indicating device with touch sensor
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